David Cockayne
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British physicist
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Physics
David Cockayne's Degrees
- Masters Physics University of Oxford
Why Is David Cockayne Influential?
(Suggest an Edit or Addition)According to Wikipedia, David John Hugh Cockayne FRS FInstP was Professor in the physical examination of materials in the Department of Materials at the University of Oxford and professorial fellow at Linacre College from 2000 to 2009. He was the president of the International Federation of Societies for Microscopy from 2003 till 2007, then vice-president 2007 to 2010.
David Cockayne's Published Works
Number of citations in a given year to any of this author's works
Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author
Published Works
- Investigations of dislocation strain fields using weak beams (1969) (585)
- The measurement of stacking-fault energies of pure face-centred cubic metals (1971) (255)
- Effects of interdiffusion on the luminescence of InGaAs/GaAs quantum dots (1996) (244)
- The structure of the C70 molecule (1992) (187)
- The dissociation of dislocations in silicon (1971) (175)
- Electron diffraction analysis of polycrystalline and amorphous thin films (1988) (142)
- Dissociation of near-screw dislocations in germanium and silicon (1975) (121)
- Damage to epitaxial GaN layers by silicon implantation (1996) (112)
- The principles and practice of the weak‐beam method of electron microscopy (1973) (110)
- Rare earth element trends and cerium-uranium-manganese associations in weathered rock from Koongarra, Northern Territory, Australia (1996) (105)
- Inhibited carrier transfer in ensembles of isolated quantum dots (1999) (99)
- The Study of Nanovolumes of Amorphous Materials Using Electron Scattering (2007) (97)
- Electrical and structural analysis of high-dose Si implantation in GaN (1997) (94)
- A versatile double aberration-corrected, energy filtered HREM/STEM for materials science. (2005) (92)
- Strain relaxation by alloying effects in Ge islands grown on Si(001) (1999) (84)
- The observation of dissociated dislocations in silicon (1970) (73)
- The weak-beam technique applied to superlattice dislocations in iron-aluminium alloys: II. fourfold dissociation in do3-type order (1973) (73)
- Annealing of ion implanted gallium nitride (1998) (70)
- Electron optical characterization of cubic boron nitride thin films prepared by reactive ion plating (1991) (70)
- An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging (1997) (67)
- The weak-beam technique applied to superlattice dislocations in an iron—aluminium alloy (1970) (65)
- A study of the relationship between lattice fringes and lattice planes in electron microscope images of crystals containing defects (1971) (65)
- Abnormal grain growth in undoped strontium and barium titanate (2010) (64)
- Indium segregation and enrichment in coherent InxGa1-xAs/GaAs quantum dots (1999) (64)
- Misfit dislocations and critical thickness in InGaAs/GaAs heterostructure systems (1993) (63)
- Ion damage buildup and amorphization processes in AlxGa1−xAs (1995) (63)
- Synthesis, structure and applications of amorphous diamond (1991) (63)
- Three-dimensional organization of rare-earth atoms at grain boundaries in silicon nitride (2005) (61)
- The structure of hydrogenated fullerene (C60H36) (1993) (60)
- TRANSMISSION-ELECTRON MICROSCOPY STUDY OF THE SHAPE OF BURIED INXGA1-XAS/GAAS QUANTUM DOTS (1998) (57)
- Analysis of films prepared by plasma polymerization of acetylene in a D.C. magnetron (1983) (56)
- Composition and its impact on shape evolution in dislocated Ge(Si)/Si islands (2000) (54)
- Dissociation of dislocations in diamond (1983) (54)
- A study of Guinier-Preston zones in aluminium-copper alloys using the weak-beam technique of electron microscopy (1976) (52)
- Bulk Nanocrystalline Fe3Al‐Based Material Prepared by Aluminothermic Reaction (2006) (51)
- Probing the atomic structure of amorphous Ta2O5 coatings (2011) (51)
- STABLE AND METASTABLE INGAAS/GAAS ISLAND SHAPES AND SURFACTANTLIKE SUPPRESSION OF THE WETTING TRANSFORMATION (1998) (48)
- Alloying, elemental enrichment, and interdiffusion during the growth of Ge(Si)/Si(001) quantum dots (2002) (48)
- Experimental evaluation of a spherical aberration-corrected TEM and STEM. (2005) (46)
- Understanding atomic structures of amorphous C-doped Ge2Sb2Te5 phase-change memory materials (2011) (46)
- Effect of Core Structure on the Determination of the Stacking-Fault Energy in Close-Packed Metals (1974) (46)
- Gliding dissociated dislocations in hexagonal CdS (1980) (44)
- The Structure of Grain Boundaries in Strontium Titanate: Theory, Simulation, and Electron Microscopy (2010) (42)
- Investigation of dislocation geometries in the diamond cubic structure (1973) (42)
- Novel impurity-free interdiffusion in GaAs/AlGaAs quantum wells by anodization and rapid thermal annealing (1997) (42)
- Arrangement of rare-earth elements at prismatic grain boundaries in silicon nitride (2004) (42)
- Ensemble interactions in strained semiconductor quantum dots (1999) (41)
- Nanoscale Phase Separation and Building Blocks of Ge2Sb2Te5N and Ge2Sb2Te5N2 Thin Films (2009) (41)
- Electron energy loss spectra of C60 and C70 fullerenes (2005) (41)
- Structural study of hydrogenated amorphous silicon–carbon alloys (1986) (41)
- Doping-dependent nanofaceting on silicon nanowire surfaces (2009) (39)
- Orientation-dependent work function of in situ annealed strontium titanate (2009) (39)
- 50 Years of TEM of dislocations: Past, present and future (2006) (39)
- X-ray microanalysis of cell elements in normal and cystic fibrosis jejunum: evidence for chloride secretion in villi. (1996) (37)
- Medium-range order in amorphous silicon investigated by constrained structural relaxation of two-body and four-body electron diffraction data (2012) (35)
- Transmission electron microscopy study of InxGa1-xAs quantum dots on a GaAs(001) substrate (1999) (35)
- Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis. (2003) (35)
- Lattice fringe imaging of modulated structures (1981) (34)
- The structure and properties of ion‐beam‐synthesized boron nitride films (1988) (33)
- Sign conventions in electron diffraction and imaging (1983) (33)
- Local structure variations in Al89La6Ni5 metallic glass (2009) (33)
- Real time observation of GeSi/Si(001) island shrinkage due to surface alloying during Si capping. (2006) (32)
- AlloyedGe(Si)∕Si(001)islands: The composition profile and the shape transformation (2005) (32)
- Self-assembled periodical polycrystalline-ZnO/a-C nanolayers on Zn nanowire. (2004) (32)
- Partial separations of extended α and β dislocations in II-VI semiconductors (1986) (30)
- Silver-magnesium fluoride cermet films. 1: Preparation and microstructure. (1989) (30)
- A Theoretical Analysis of the Weak-beam Method of Electron Microscopy (1972) (30)
- Anodic-oxide-induced interdiffusion in GaAs/AlGaAs quantum wells (1998) (29)
- The structure of nanovolumes of amorphous materials (2003) (29)
- Ion-Implantation-Induced Extended Defect Formation in (0001) and (1120) 4H-SiC (2005) (28)
- Subsurface structure of alumina associated with single-point scratching (1998) (28)
- Electron diffraction of amorphous thin films using PEELS (1991) (28)
- The determination of the geometry and nature of small Frank loops using the weak‐beam method (1973) (28)
- Surface relaxation of strained heterostructures revealed by Bragg line splitting in LACBED patterns (1994) (27)
- Oxygen vacancy induced structural variations of exfoliated monolayer MnO2 sheets (2010) (26)
- Alternative mechanism for misfit dislocation generation during high-temperature Ge(Si)/Si (001) island growth (2002) (25)
- Adatom condensation and quantum dot sizes in InGaAs/GaAs (001) (2000) (25)
- Multilayered carbon films for tribological applications (2003) (25)
- Using Elnes with Parallel Eels for Differentiating Between A-Si-X Thin-Films (1989) (24)
- Structural study of amorphous CoFeB thin films exhibiting in-plane uniaxial magnetic anisotropy (2009) (24)
- Critical thickness determination of InxGa1-xAs/GaAs strained-layer system by transmission electron microscopy (1991) (24)
- The crystal/glass interface in doped Si3N4 (2006) (24)
- Electron optical techniques for microstructural andcompositional analysis of thin films (1990) (23)
- Role of implantation-induced defects on the response time of semiconductor saturable absorbers (1999) (23)
- Nucleation of semicircular misfit dislocation loops from the epitaxial surface of strained‐layer heterostructures (1996) (23)
- Carrier capture and relaxation in Stranski-Krastanow In x Ga 1 − x As / GaAs ( 311 ) B quantum dots (2000) (22)
- Investigation of grain boundaries for abnormal grain growth in polycrystalline SrTiO3 (2010) (22)
- Nanoscale yttrium distribution in yttrium-doped ceria powder (2009) (22)
- Design and Operation of an Electron Diffraction Camera for the Study of Small Crystalline Regions (1967) (21)
- Theoretical consideration of equilibrium dissociation geometries of 60° misfit dislocations in single semiconductor heterostructures (1995) (21)
- Interfacial structure in silicon nitride sintered with lanthanide oxide (2006) (21)
- Orientation‐dependent surface composition of in situ annealed strontium titanate (2008) (21)
- Annealing effects on the microstructure of Ge/Si(001) quantum dots (2001) (21)
- The calculation and interpretation of high‐resolution electron microscope images of lattice defects (1979) (20)
- Theoretical consideration of misfit dislocation nucleation by partial dislocations in [001] strained‐layer heterostructures (1993) (20)
- Effect of Eshelby twist on core structure of screw dislocations in molybdenum: atomic structure and electron microscope image simulations (2011) (19)
- Optical transition in infrared photodetector based on V-groove Al0.5Ga0.5As/GaAs multiple quantum wire (2001) (19)
- Building blocks of amorphous Ge{sub 2}Sb{sub 2}Te{sub 5} (2007) (18)
- The encapsulation of Ni in graphitic layers using C60 as a precursor (2001) (18)
- Microstructure of zi rcon is films deposited with ion assistance (1987) (18)
- Effects of anodic oxide induced intermixing on the structural and optical properties of quantum wire structure grown on nonplanar GaAs substrate (1996) (18)
- Environmentally dependent bond-order potentials: New developments and applications (2003) (17)
- Building blocks of amorphous Ge2Sb2Te5 (2007) (17)
- Weak-Beam Electron Microscopy (1981) (17)
- Ion implantation in 4H–SiC (2008) (17)
- Mechanism of dopant distribution: An example of nickel-doped ceria nanoparticles (2009) (17)
- Rapid fabrication of nanoneedle arrays by ion sputtering (2008) (17)
- Extracting composition and alloying information of coherent Ge(Si)/Si(001) islands from [001] on-zone bright-field diffraction contrast images (2001) (17)
- Atomic-scale characterization of theSrTiO3Σ3(112)[1¯10]grain boundary (2010) (17)
- Reduced density function analysis using convergent electron illumination and iterative blind deconvolution (1999) (17)
- THE WEAK-BEAM TECHNIQUE AS APPLIED TO DISSOCIATION MEASUREMENTS (1974) (16)
- Electron diffraction from nanovolumes of amorphous material using coherent convergent illumination. (2003) (16)
- Phase-sequenced deposition of calcium titanate/hydroxyapatite films with controllable crystallographic texture onto Ti6Al4V by triethyl phosphate-regulated hydrothermal crystallization (2009) (15)
- Direct imaging and chemical identification of the encapsulated metal atoms in bimetallic endofullerene peapods. (2010) (15)
- A quantitative analysis of image contrast from extrinsic stacking faults (1984) (14)
- DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON MICROSCOPY (1979) (14)
- ADF STEM imaging of screw dislocations viewed end-on (2010) (14)
- Nonuniform alloying in Ge(Si)/Si(001) quantum dots (2003) (13)
- Fullerene blacks and cathode deposits derived from plasma arcing of graphite with naphthalene (2000) (13)
- Equilibrium dissociation configuration of misfit dislocations in low strained In0.1Ga0.9As/GaAs single heterostructures (1993) (13)
- Dislocation-induced changes in quantum dots: Step alignment and radiative emission (1999) (13)
- Calculated asymmetry for weak beam intrinsic stacking fault images (1985) (13)
- Ion damage buildup and amorphization processes in GaAs–AlxGa1−xAs multilayers (1996) (13)
- Twin structures, transformation and symmetry of superconducting Y1Ba2Cu3O7−x observed by transmission electron microscopy (1988) (12)
- Self-organization of nanoneedles in Fe/GaAs (001) epitaxial thin film (2006) (12)
- Lomer–Cottrell misfit dislocations in [001] In0.2Ga0.8As/GaAs single heterostructures (1996) (12)
- Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam. (2003) (12)
- Determination of the sign of screw dislocations viewed end-on by weak-beam diffraction contrast (2007) (12)
- Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature (1998) (11)
- Structural and compositional comparison of Si3N4 ceramics with different fracture modes (2006) (11)
- Misfit dislocations generated from inhomogeneous sources and their critical thicknesses in a InGaAs/GaAs heterostructure grown by molecular beam epitaxy (1997) (11)
- Misfit dislocations lying along 〈100〉 in [001] GaAs/In0.25Ga0.75As/GaAs quantum well heterostructures (1994) (11)
- Dependence of surface facet period on the diameter of nanowires. (2010) (11)
- Self-organized amorphous material in silicon (0 0 1) by focused ion beam (FIB) system (2005) (10)
- An electron diffraction and microscopy investigation of quasi-periodic Ta-Al superlattices (1992) (10)
- Island shape instabilities and surfactant-like effects in the growth of InGaAs/GaAs quantum dots (1999) (10)
- Natural Analogue Study of the Distribution of Uranium Series Radionuclides between the Colloid and Solute Phases in the Hydrogeological System of the Koongarra Uranium Deposit N.T., Australia (1987) (10)
- A concerted rational crystallization/amorphization mechanism of Ge2Sb2Te5 (2009) (10)
- Spatially resolved luminescence investigation of AlGaAs/GaAs single quantum wires modified by selective implantation and annealing (1999) (9)
- Transmission electron microscopy characterization of secondary defects created by MeV Si, Ge, and Sn implantation in silicon (2000) (9)
- Proximal tubular cell sodium concentration in early diabetic nephropathy assessed by electron microprobe analysis (1991) (9)
- The formation of Pt8Cr in Pt 10 at.% Cr (2006) (9)
- THE WEAK-BEAM METHOD OF ELECTRON MICROSCOPY (1978) (9)
- Dislocation structures and motion in II–VI semiconductors (1983) (8)
- Temperature‐dependent generation of misfit dislocations in In0.2Ga0.8As/GaAs single heterostructures (1996) (8)
- Dark field microscopy for diffraction analysis of amorphous carbon solids (2005) (8)
- Control of nanostructures induced by ion sputtering (2007) (8)
- Strain effect in a GaAs-In0.25Ga0.75As-Al0.5Ga0.5As asymmetric quantum wire (2000) (8)
- Energy loss straggling of MeV 12C and 16O ions in carbon (1993) (8)
- Microstructural observations of Ta/Al superlattices by TEM (1992) (8)
- Applications of a Cs Corrected HRTEM in Materials Science (2002) (7)
- Radial Distribution Function Analysis of the Amorphous Barrier Layer in Magnetic Spin Tunnel Junctions (2004) (7)
- The technique of RDF of nanovolumes using electron diffraction (2010) (7)
- Electron diffraction study of the structure of boron-and phosphorus-doped hydrogenated amorphous silicon (1988) (7)
- Distribution of Σ3 misorientations in polycrystalline strontium titanate (2009) (7)
- Size and charge characteristics of kaolinitic soils in SE Queensland (1987) (7)
- Acute cisplatin nephrotoxicity in the rat (1989) (7)
- Cathodic arc ablation as a new method of high-Tc superconductor deposition (1992) (7)
- Dislocation structure and motion in CdS (1986) (7)
- Investigation of oval defects in InGaAs/GaAs strained-layer heterostructures using cathodoluminescence and wavelength dispersive spectroscopy (1998) (7)
- New possibilities with aberration-corrected electron microscopy (2009) (6)
- Selection rules for Bloch wave scattering for HREM imaging of imperfect crystals along symmetry axes (2008) (6)
- Four‐fold dissociations of super‐lattice dislocations (1973) (6)
- Building blocks of amorphous Ge 2 Sb 2 Te (2007) (6)
- The preferred CSL misorientation distribution in polycrystalline SrTiO3 (2007) (5)
- Wavelength shifting of adjacent quantum wells in V-groove quantum wire structure by selective implantation and annealing (2000) (5)
- Spatial variations in the stoichiometry of sputtered YBaCuO thin films: theory and experiment (1990) (5)
- Modelling of crystalline C60 EEL spectra (2006) (5)
- Erratum: Indium Segregation and Enrichment in CoherentInxGa1−xAs/GaAsQuantum Dots [Phys. Rev. Lett. 82, 5148 (1999)] (1999) (5)
- The geometry of misfit dislocations with respect to the strained interface in [001] In0.1Ga0.9As/GaAs single heterostructures (1994) (4)
- On the core structure of ⟨112] edge dislocations in γ-TiAl (2004) (4)
- The Structure of C60H36 (1993) (4)
- Use of weak Bragg reflections for analysing superlattice dislocations in Ni3(Al, Ti) (1993) (4)
- Glide of Misfit Dislocations through Multi-Layer Heterostructures (1994) (4)
- Potentialities and limitations of high-resolution electron microscopy of crystal lattices and their imperfections (1975) (4)
- The interpretation of indexing of high Σ CSL grain boundaries from ceramics (2007) (4)
- Investigation of threading dislocation blocking in strained-layer InGaAs/GaAs heterostructures using scanning cathodoluminescence microscopy (2000) (4)
- Local structures of two metallic glasses with good plasticity (2010) (4)
- Modelling Ge/Si quantum dots using finite element analysis and atomistic simulation (2006) (4)
- Simulated electron energy loss spectra from a C70 crystal. (2006) (4)
- Precise determination of the periodicity for Mo/Si and W/C metallic multilayers by electron and x‐ray diffraction (1995) (4)
- Better vision with electron lenses (2002) (4)
- Indium Segregation and Enrichment in Coherent In x Ga 1 2 x As y GaAs Quantum Dots (1999) (4)
- Studies of grain orientations and grain boundaries in polycrystalline SrTiO3 (2008) (3)
- Colloid and Crystal Formation in Parotid Saliva of Cystic Fibrosis Patients and Non-Cystic Fibrosis Subjects. II. Electron Microscopy and Electrophoresis (1976) (3)
- The determination of coordination numbers for binary alloys using energy selected electron diffraction (1993) (3)
- Electron energy loss spectra of C 60 and C 70 fullerenes (2005) (3)
- Quantitative high resolution electron microscopy image matching applied to the strontium titanate Σ3(112) grain boundary (2010) (3)
- Effect of oxidation and annealing on tunnel barrier structure and composition in IrMn/CoFe/TiOx/CoFe magnetic tunnel junctions (2009) (3)
- Transmission Electron Microscopy Investigations of Misfit Dislocation Interactions in GaAs/InGaAs Superlattices on GaAs (001) Substrates (1992) (3)
- Uptake of Boronated Monoclonal Antibodies by Melanoma Cells Visualised by Track Etch Autoradiography and Electron Energy Loss Spectroscopy (1992) (3)
- Nanostructural physical and chemical information derived from the unit cell scattering amplitudes of a spider dragline silk (2005) (3)
- Chemical microanalysis of semiconductor heterostructures by thickness fringe imaging (1993) (3)
- Carrier transfer between V-grooved quantum wire and vertical quantum well (2001) (2)
- Optical properties of arsenic ions implanted GaAs/AlGaAs V-grooved quantum wires (2000) (2)
- [001] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(001). (2004) (2)
- Gliding dissociated dislocations in CdS (1980) (2)
- The Effect Of Ion-Implantation Induced Defects On Strain Relaxation In Ge x Si 1−x /Si Heterostuctures (1996) (2)
- The effect of structural changes on ELNES for C60 (2009) (2)
- Probing the atomic structure of amorphous Ta2O5 mirror coatings for advanced gravitational wave detectors using transmission electron microscopy (2010) (2)
- In0.2Ga0.8As/GaAs interface revealed by an AlAs marker layer (1993) (2)
- TEM study of intermetallic phases in 55Al-Zn coatings (1998) (2)
- Imaging and analysis of axial heterostructured silicon nanowires (2010) (2)
- Cs Corrector for Illumination (2004) (2)
- A CS Corrected HRTEM : Initial Applications in Materials Science (2006) (1)
- The effect of irradiation temperature on post-irradiation strain levels in Ge/sub x/Si/sub 1-x//Si strained layer heterostructures (1996) (1)
- Cs Corrector for Imaging (2004) (1)
- Ion implantation processing of GaN epitaxial layers (1996) (1)
- A method for rigid body expansion measurement in the presence of secondary grain boundary dislocations applied to a SrTiO3 near-Σ3(112) grain boundary (2010) (1)
- Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling (2000) (1)
- FOR THE ANALYSIS OF HIGH-ANGLE ANNULAR DARK-FIELD ( HAADF ) IMAGES OF AlXGa 1-XAs AT HIGH RESOLUTION (2003) (1)
- Aberration-corrected HREM/STEM for semiconductor research (2005) (1)
- High Resolution Imaging Using the Oxford Aberration Corrected TEM. (2006) (1)
- Misfit Dislocations in Inx Ga1-xAs/GaAs Heterostructures near the Critical Thickness (1989) (1)
- Electron energy loss spectroscopy of fullerene materials (2006) (1)
- Misfit Dislocations in Inx Ga1-xAs/GaAs Heterostructures near the Critical Thickness (1989) (1)
- Transmission electron microscopy determination of quantum dot profile (1998) (1)
- Diffraction behaviour of three-component fibonacci Ta/Al multilayer films (1997) (1)
- Inhomogeneous sources of misfit dislocation generation in In xGa1− xAs/GaAs strained-layer heterostructures grown by molecular beam epitaxy (1997) (1)
- Structural Refinement of Amorphous Alloy Nanovolumes Using RDF Analysis (2005) (1)
- Celebrations in Pioneering Electron Microscopy: A Symposium in Honor of Professor Archie Howie—Introduction (2000) (0)
- Defects formed during 1 MeV Si ion-irradiation of GeSi/Si strained-layer heterostructures at elevated temperatures (1999) (0)
- Misfit Dislocation Generation from Dissociated Threading Dislocations in Strained-Layer Heterostrutures (1995) (0)
- Strain relaxation in epitaxial self-assembled Ge(Si)/Si islands (2003) (0)
- Studies of lattice defects using weak diffracted beams (1975) (0)
- Structures of epitaxial quantum dots (2006) (0)
- Characterisation of the structure and composition of quantum dots (2001) (0)
- Transmission electron microscopy investigations of misfit dislocations in lattice mismatched semiconductor heterostructures (2001) (0)
- Three-dimensional Arrangement of Rare-earth Atoms at Grain Boundaries in Silicon Nitride Ceramics Using Aberration-Corrected HAADF-STEM (2005) (0)
- The effect of ion-implantation induced defects on strain relaxation in GexSi1-x/Si heterostructures (1997) (0)
- The Study of the Formation of Pt8Cr in the Platinum-rich Portion of the Pt-Cr Binary System (2003) (0)
- Transmission Electron Microscopy Study of InGaAs/GaAs Structural Evolution Near the Stranski-Krastanow Transformation (1999) (0)
- Misfit dislocations nucleated from the surface in strained-layer heterostructures (1996) (0)
- Short editorial note (2011) (0)
- Fullerenes as precursors for nanocapsule formation (2000) (0)
- Electron Imaging and Energy Loss Studies of the Crystallization of Hydrogenated Amorphous Silicon (1986) (0)
- Study of Medium-range Order in Amorphous Carbon by Efficient ab-initio Tight-Binding Technique (2004) (0)
- Editorial (1991) (0)
- Oxford CyberSEM: remote microscopy (2008) (0)
- How the bond length can affect C70 DOS and EEL spectra (2008) (0)
- Surface orientation dependent termination and work-function of in situ annealed strontium titanate (2008) (0)
- Electron Energy Loss Spectroscopy of La@C82 peapods (2008) (0)
- TEM Investigations of the Compositions in Ge(Si)/Si(001) Quantum Dots (2003) (0)
- Modified Stranski-Krastanow Mode for Ge Island Growth on (001) Si at High Temperature (1999) (0)
- Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy (2008) (0)
- {111} and (311) rod-like defects in silicon ion implanted silicon (1996) (0)
- Anomalous voltage-current characteristics in the sputtering of YBaCuO (1991) (0)
- Cathodoluminescence study of oval defects in MBE grown InGaAs/GaAs (1996) (0)
- A Double Aberration Corrected , Energy Filtered HREM / STEM (2011) (0)
- Building blocks of amorphousGe2Sb2Te5 (2007) (0)
- TEM measurement of Al profiles in interdiffused GaAs/AlGaAs quantum-wells (1998) (0)
- The composition profile and the shape transformation (2005) (0)
- HAADF Studies of the Si3N4 IGF Interface (2006) (0)
- GeSi quantum dots: the effect of alloying on the shape transformation (2018) (0)
- TEM studies of misfit dislocations in strained-layer heterostructures (1994) (0)
- Energetics of non-uniformly alloyed Ge(Si)/Si(001) Quantum Dots (2005) (0)
- Al Compositional Profile In Algaas/Gaas Quantum Wells (1999) (0)
- Acute infusion of amphotericin B: Proximal tubular effects (1996) (0)
- Structural studies of amorphous materials using RDF, RMC and DFT refinement (2008) (0)
- Composition distributions in Ge(Si)/Si(001) quantum dots (2002) (0)
- Interpretation of lattice fringe images of spinodally decomposed alloys (1980) (0)
- V-grooved GaAs/AlGaAs quantum wires with side wall quantum wells intermixed by pulsed anodization and rapid thermal annealing (1996) (0)
- Transmission electron microscopy investigation of semiconductor quantum dots (2000) (0)
- IMAGE SIMULATIONS OF QUANTUM DOTS (2001) (0)
- HREM study of the SrTiO3 Σ3 (112) grain boundary (2008) (0)
- A New Double-Corrected HREM/STEM and its Applications for Advanced Materials (2004) (0)
- The morphology and composition of quantum dots (2001) (0)
- Experimental and Theoretical Characterisation of Structure in Thin Disordered Films (1998) (0)
- The structure of boron- and phosphorus-doped amorphous silicon thin films (1987) (0)
- Oval defects in InGaAs/GaAs heterostructures (1998) (0)
- We can see atoms (2005) (0)
- Ordering, Tunability, and Stability in the Formation of Semiconductor Quantum Dots (1998) (0)
- Dopant Impurity Induced Nanofaceting on Silicon Nanowire Sidewalls (2010) (0)
- TEM study of compositional profile in AlGaAs/GaAs quantum wells (1998) (0)
- Grain boundary interfaces in ceramics (2008) (0)
- HAADF STEM and EELS Investigations of Grain Boundaries in SrTiO3 (2010) (0)
- TEM investigations of Si ion-implanted GaN (1998) (0)
- Structural Study of Amorphous CoFeB Magnetic Thin Films by Electron Diffraction (2010) (0)
- The structure of amorphous and polycrystalline materials using energy-filtered RDF analysis (1992) (0)
- Composition distribution in Ge(Si) islands grown on Si (001) substrate (2000) (0)
- Advanced transmission electron microscopy characterization of semiconductor quantum structures (2006) (0)
- Ion damage buildup and amorphization processes in Al x Ga 1 − x As (2016) (0)
- Ion-implanted GaAs for ultrafast saturable absorber applications (2000) (0)
- Strain relaxation in self-assembled Ge(Si)/Si quantum dots (2003) (0)
- On-zone axis electron diffraction contrast study of the size of InGaAs/GaAs quantum dots (1998) (0)
- Local structures of metallic glasses studied by experimental RDF and model refinement (2008) (0)
- The nanoworld through aberration corrected lenses (2010) (0)
- Ion irradiation of GeSi Si strained-layer heterostructures (1998) (0)
- Strain Relaxation Mechanisms in Coherent and Incoherent Ge(Si)/Si Islands (2003) (0)
- Morphological Transitions During Si Capping in Ge/Si Nanoislands (2008) (0)
- The interpretation of indexing of high Sigma CSL grain boundaries from ceramics. (2007) (0)
- Characterisation of Amorphous Materials By Electron Diffraction and Atomistic Modelling (1999) (0)
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