Alfred Benninghoven

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Alfred Benninghoven

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Why Is Alfred Benninghoven Influential?

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According to Wikipedia, Alfred Benninghoven was a German physicist and mass spectrometry researcher known for his work on static secondary ion mass spectrometry. Career and Research Benninghoven graduated from the University of Cologne in 1961 where he worked with Fritz Kirchner and completed his habilitation in surface physics in Cologne two years later. He first worked as professor in Cologne from 1965 to 1973 until he moved to a full professor position in experimental physics at the University of Münster in 1972. He worked on static secondary ion mass spectrometry and its applications, and developed SIMS instruments. In 1989 he co-founded IonTOF, a company that became a world-leader in TOF-SIMS instrumentation. He has written over 300 scientific articles and several books on the topic of SIMS, many of which have become reference works on SIMS.

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Alfred Benninghoven's Published Works

Number of citations in a given year to any of this author's works

Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author

Published Works

Secondary ion mass spectrometry (1990) (1116)
Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends (1987) (556)
Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS) (1994) (402)
Developments in secondary ion mass spectroscopy and applications to surface studies (1975) (396)
Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS) (1973) (396)
Detection, identification and structural investigation of biologically important compounds by secondary ion mass spectrometry. (1978) (322)
Secondary-ion emission of amino acids (1976) (229)
Secondary Ion Mass Spectrometry SIMS V (1986) (173)
Ion Formation from Organic Solids (1983) (171)
Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment (1998) (157)
Surface analysis by Secondary Ion Mass Spectrometry (SIMS) (1994) (136)
Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxides (1977) (129)
Interaction of nitrogen and ammonia plasmas with polystyrene and polycarbonate studied by X-ray photoelectron spectroscopy, neutron activation analysis and static secondary ion mass spectrometry (1989) (127)
Static time‐of‐flight secondary ion mass spectrometry and x‐ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films (2001) (116)
Secondary ion mass spectrometery: A new analytical technique for biologically important compounds (1977) (115)
Design and performance of a reflectron based time‐of‐flight secondary ion mass spectrometer with electrodynamic primary ion mass separation (1987) (112)
Structural analysis of human apolipoprotein A-I variants. Amino acid substitutions are nonrandomly distributed throughout the apolipoprotein A-I primary structure. (1990) (103)
Optimized time-of-flight secondary ion mass spectroscopy depth profiling with a dual beam technique (1997) (102)
Investigation of surface reactions by the static method of secondary ion mass spectrometry: II. The oxidation of chromium in the monolayer range (1973) (95)
Time-of-flight secondary ion mass spectrometry of polymers in the mass range 500-10000 (1987) (95)
Apolipoprotein A-I variants. Naturally occurring substitutions of proline residues affect plasma concentration of apolipoprotein A-I. (1989) (93)
Secondary ion mass spectrometry: SIMS VI (1988) (92)
Correction of dead time effects in time‐of‐flight mass spectrometry (1994) (88)
High mass resolution surface imaging with a time‐of‐flight secondary ion mass spectroscopy scanning microprobe (1991) (87)
Secondary Ion Mass Spectrometry SIMS III (1982) (85)
Surface MS: Probing Real-World Samples (1993) (84)
A time‐of‐flight mass spectrometer for static SIMS applications (1985) (81)
ANALYSIS OF SUBMONOLAYERS ON SILVER BY NEGATIVE SECONDARY ION EMISSION. (1969) (78)
Analysis of lung surfactant model systems with time-of-flight secondary ion mass spectrometry. (2000) (78)
Site-specific methionine sulfoxide formation is the structural basis of chromatographic heterogeneity of apolipoproteins A-I, C-II, and C-III. (1991) (76)
Tandem Mass Spectrometer for Secondary Ion Studies (1971) (73)
Molecular weight distributions of polymers using time-of-flight secondary-ion mass spectrometry (1991) (72)
Some aspects of secondary ion mass spectrometry of organic compounds (1983) (69)
Secondary Ion Mass Spectrometry SIMS IV (1984) (68)
Secondary ion yields near 1 for some chemical compounds (1972) (68)
Quasisimultaneous SIMS, AES, XPS, and TDMS study of preferential sputtering, diffusion, and mercury evaporation in CdxHg1−xTe (1981) (68)
Ion Formation from Organic Solids (IFOS III) (1986) (68)
In situ ToF‐SIMS/XPS investigation of nitrogen plasma‐modified polystyrene surfaces (1994) (65)
Investigation of surface reactions by the static method of secondary ion mass spectrometry: V. The oxidation of titanium, nickel, and copper in the monolayer range (1974) (63)
Time‐of‐flight secondary ion mass spectrometry of polymer materials (1989) (63)
Time-of-flight secondary ion mass spectrometry of nylons: detection of high mass fragments (1985) (62)
Secondary ion mass spectrometry of nucleic acid components: Pyrimidines, purines, nucleosides and nucleotides (1980) (59)
Static SIMS applications—From silicon single crystal oxidation to DNA sequencing (1985) (57)
Secondary Ion Mass Spectrometry SIMS II (1979) (55)
High mass resolution time‐of‐flight secondary ion mass spectrometry. Application to peak assignments (1989) (53)
Performance of a new ion optics for quasisimultaneous secondary ion, secondary neutral, and residual gas mass spectrometry (1985) (53)
An improved method for quantification of cholesterol and cholesteryl esters in human monocyte-derived macrophages by high performance liquid chromatography with identification of unassigned cholesteryl ester species by means of secondary ion mass spectrometry. (1997) (53)
New developments in the surface analysis of solids (1973) (52)
Investigation of surface reactions by the static method of secondary ion mass spectrometry: III. The oxidation of vanadium, niobium and tantalum in the monolayer range (1973) (51)
Secondary ion emission from UHV-deposited amino acid overlayers on metals (1984) (50)
Comparative study of Si(111), silicon oxide, SiC and Si3N4 surfaces by secondary ion mass spectroscopy (SIMS) (1975) (48)
Time-of-flight secondary ion mass spectrometry investigations of self-assembled monolayers of organic thiols, sulfides, and disulfides on gold surfaces (1993) (47)
Time-of-flight secondary ion mass spectrometry of insulators with pulsed charge compensation by low-energy electrons (1989) (45)
Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment (1999) (45)
Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z .ltoreq. 4500 (1988) (45)
Static secondary ion mass spectrometry analysis of polycarbonate surfaces. Effect of structure and of surface modification on the spectra (1988) (42)
Time-of-flight secondary ion mass spectrometric analysis of polymer surfaces and additives (1993) (41)
Combined ToF-SIMS/XPS study of plasma modification and metallization of polyimide (1999) (39)
Application of a secondary ion mass spectrometer as a detector in liquid chromatography (1980) (38)
Hydrogen detection by secondary ion mass spectroscopy: Hydrogen on polycrystalline nickel (1981) (37)
Simultaneous SIMS, ElD, and Flash-Filament Investigations of the Interaction of Gases with a Tungsten Surface (1972) (37)
SIMS, EID and flash-filament investigation of O2, H2, (O2 + H2) and H2O interaction with vanadium (1977) (36)
Imaging time-of-flight secondary ion mass spectrometry allows visualization and analysis of coexisting phases in Langmuir-Blodgett films (1996) (35)
Secondary ion emission from polymethacrylate LB-layers under 0.5–11 keV atomic and molecular primary ion bombardment (2000) (35)
High‐spatial‐resolution surface imaging of inorganic and organic structures by multiphoton post‐ionization of sputtered neutrals and time‐of‐flight mass spectrometry (1992) (35)
Simultaneous SIMS and EID investigation on the interaction of oxygen with a W (100) surface (1973) (35)
Secondary ion mass spectrometry : SIMS VIII : Proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry (SIMS VIII) (1992) (34)
Measurements of relative secondary ion yields from oxidized tungsten (100) under bombardment by ions with different masses and energies (1974) (34)
Novel sophorose lipids from microbial conversion of 2-alkanols (1995) (34)
Time-of-flight secondary ion mass spectrometry of perfluorinated polyethers (1990) (34)
Imaging of Domain Structures in a One-Component Lipid Monolayer by Time-of-Flight Secondary Ion Mass Spectrometry (2000) (33)
Oxidation of cobalt at room temperature, studied by combined static SIMS, static AES, XPS and work function investigations (1983) (33)
Carbon cluster emission from polymers under kiloelectronvolt and megaelectronvolt ion bombardment (1990) (33)
Secondary ion mass spectrometry of biomolecules in the pico- and femto-mol range (1984) (33)
Formation of very large gold superclusters (clusters of clusters) as secondary ions up to (Au13)55 by SIMS (1990) (32)
Analysis of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry (TOF-SIMS) (1992) (31)
Comparative and complementary plasma desorption mass spectrometry/secondary ion mass spectrometry investigations of polymer materials (1991) (31)
Supercritical fluid chromatography and time-of-flight secondary ion mass spectrometry of poly(dimethylsiloxane) oligomers in the mass range 1000-10000 Da (1991) (30)
Time-of-flight secondary ion mass spectrometry of poly(alkyl methacrylates) (1993) (30)
Depth profile analysis of hydrogenated carbon layers on silicon by x‐ray photoelectron spectroscopy, Auger electron spectroscopy, electron energy‐loss spectroscopy, and secondary ion mass spectrometry (1987) (30)
The time of flight static secondary negative ion mass spectra of poly(methylmethacrylate), poly(ethylmethacrylate), and poly(methylmethacrylate‐co‐ethylmethacrylate). Ion structures and quantification (1989) (29)
Characterization of coatings (1976) (29)
Comparative in situ ToF‐SIMS/XPS study of polystyrene modified by argon, oxygen and nitrogen plasmas (1994) (29)
Sims and flash filament study of the interaction of polycrystalline nickel with oxygen (1979) (28)
Investigation of the surface oxidation of metals in the sub-monolayer and monolayer range with the static method of secondary ion mass spectrometry☆ (1972) (28)
Structural characterization of model polyester polyurethanes using time-of-flight secondary ion mass spectrometry (1990) (28)
On the mechanism of secondary ion formation from poly(methylmethacrylate) under static secondary ion mass spectrometry conditions (1989) (28)
Secondary Ion Mass Spectrometry of Organic Compounds (Review) (1983) (27)
Observing surface oxidation of molybdenum with the statical method of secondary ion mass spectroscopy (1970) (27)
Organic secondary ion mass spectrometry (SIMS) and its relation to Fast Atom Bombardment (FAB) (1983) (27)
Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces (2001) (26)
Structural characterization of model polyurethanes using time-of-flight secondary ion mass spectrometry (1989) (26)
High performance liquid chromatography and time-of-flight secondary ion mass spectrometry: a new dimension in structural analysis of apolipoproteins. (1986) (26)
Investigation of multi-component surface reactions by SIMS: The interaction between hydrogen and oxygen on polycrystalline nickel (1979) (25)
Secondary ion formation from amino acids by proton and cation transfer (1981) (24)
Investigations on the mechanism of secondary ion formation from organic compounds: Amino acids (1982) (23)
Study of silicon‐oxygen interaction with the statical method of secondary ion mass spectroscopy (SIMS) (1973) (23)
Surface and trace analysis by high‐resolution time‐of‐flight secondary ion mass spectrometry (1989) (22)
High-resolution TOF-SIMS studies of substituted polystyrenes (1992) (22)
Quantification of metal trace contaminants on Si wafer surfaces by Laser‐SNMS and TOF‐SIMS using sputter deposited submonolayer standards (1996) (22)
UHV preparation of organic overlayers by a molecular beam technique (1984) (22)
Surface oxidation studies of iron using the static method of secondary ion mass spectrometry (SIMS) (1974) (22)
Surface analysis by means of ion beams (1976) (22)
Quantitative time‐of‐flight secondary ion mass spectrometry of a perfluorinated polyether (1991) (21)
Antioxidant segregation and crystallisation at polyester surfaces studied by ToF-SIMS (2003) (21)
TOF‐SIMS analysis of the surface of insulators. Examples of chemically modified polymers and glass (1988) (21)
Design and Performance of a New Time-of-Flight Instrument for SIMS (1983) (21)
Resonant photoionization of sputtered organic molecules by femtosecond UV laser pulses (1992) (20)
Nonresonant Laser–SNMS and TOF–SIMS analysis of sub-μm structures (2003) (20)
Quasisimultaneous SIMS‐AES‐XPS investigation of the oxidation of Ti in the monolayer range (1977) (20)
Secondary ion mass spectrometry of folic acid analogs (1983) (20)
Secondary ion emission from mixtures of stimulants, barbiturates, opiates and amino acids (1981) (20)
Secondary ion emission from molecular overlayers: Thiols on gold (2000) (19)
Quasisimultaneous SIMS, AES, and XPS investigations of the oxidation of Mo, Ti, and Co in the monolayer range (1978) (19)
Combined SIMS, AES, and XPS investigations of tantalum oxide layers (1979) (19)
Smith-Lemli-Opitz syndrome diagnosed by using time-of-flight secondary-ion mass spectrometry. (1995) (19)
An Analytical System for Secondary Ion Mass Spectrometry in Ultra High Vacuum (1972) (19)
Determination of molecular weight and composition of a perfluorinated polymer from fragment intensities in time-of-flight secondary ion mass spectrometry (1990) (18)
Investigation of non-volatile organic substances in biological samples by secondary ion mass spectrometry (SIMS) (1980) (18)
The interaction of hydrogen and ammonia plasmas with polymethacrylic esters, studied by static secondary ions mass spectrometry (1989) (18)
Analysis of monomolecular layers of solids by the static method of secondary ion mass spectroscopy (SIMS) (1972) (17)
Static aes-the adequate mode of aes for surface reaction and submonolayer adsorption studies (1978) (17)
Static SIMS investigation of immobilized molecules on polymer surfaces (1994) (17)
Analysis of surface contaminants on gallium arsenide and silicon by high‐resolution time‐of‐flight secondary ion mass spectrometry (1989) (16)
Molecular secondary particle emission from molecular overlayers under 10 keV Ar+ primary ion bombardment (2001) (16)
Surface and in‐depth analysis of hydrogenated carbon layers on silicon and germanium by mass and electron spectroscopy (1989) (16)
The kinetics of a surface-chemical reaction. A time-of-flight secondary ion mass spectrometry study (1989) (16)
Secondary ion mass spectrometry depth profiling of ultralow-energy ion implants: Problems and solutions (1998) (16)
Resonance and nonresonant laser ionization of sputtered uranium atoms from thin films and single microparticles: evaluation of a combined system for particle trace analysis. (2003) (15)
SIMS and flash desorption studies of nickel oxygen interaction (1978) (15)
CCall—Healthy and Successful Work in Call Centres (2005) (14)
Sputtered neutrals mass spectrometry of organic molecules using multiphoton postionization (1992) (14)
Analysis of stoichiometry and oxide growth of HF treated GaAs (100) by x‐ray photoelectron spectroscopy and time‐of‐flight secondary ion mass spectrometry (1994) (14)
Hydrogen detection by SIMS: Hydrogen on polycrystalline vanadium (1978) (14)
Comparison of ‘soft ionization’ techniques with electron impact mass spectrometry for desoxinojirimycin and folic acid derivatives (1984) (13)
Analysis and classification of individual outdoor aerosol particles with SIMS time-of-flight mass spectrometry (1995) (13)
Secondary ion and sputtered neutral formation from oxygen loaded Si(100) (1985) (13)
Static SIMS Investigation of Ag-Supported Amino Acids (1984) (13)
Secondary ion mass spectrometry of organic compounds (1982) (13)
Investigation of surface reactions by SIMS and TDMS: Interaction of ethylene and acetylene with hydrogen on polycrystalline nickel (1980) (13)
Quantification of molecular secondary ion mass spectrometry by internal standards (1992) (13)
Combined depth profile analysis with SNMS, SIMS and XPS: Preferential sputtering and oxygen transport in binary metal oxide multilayer systems (1994) (12)
THE ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION. (1970) (12)
Study of molecular surface diffusion by imaging static secondary ion mass spectrometry (SIMS): polymers on Ag-surfaces (1998) (12)
Surface characterization of carbon-supported iron catalysts for carbon monoxide hydrogenation: Influence of catalyst distribution and coal minerals (1991) (12)
Organic Secondary Ion Mass Spectrometry (1984) (12)
Secondary ion emission from perfluorinated polyethers using megaelectronvolt and kiloelectronvolt ion bombardment (1993) (11)
Secondary ion mass spectra of gold super clusters up to 140000 dalton (1990) (11)
Time‐of‐flight static secondary ion mass spectrometry of additives on polymer surfaces (1991) (11)
Influence of the metal–adsorbate interaction on secondary ion emission from UHV‐prepared amino acid overlayers on metals (1985) (11)
Chemisorption of poly(methylhydrogensiloxane) on oxide surfaces: a quantitative investigation using static SIMS (1995) (11)
Thermal stability of oxide films on Cd0.2 Hg0.8Te: A combined SIMS, AES, and XPS study (1983) (10)
High Resolution TOF Secondary Ion Mass Spectrometer (1986) (10)
Calibration of secondary neutral and secondary ion mass spectrometry: A comparative study (1987) (10)
Detection of phenylthiohydantoin derivatives of amino acids by SIMS (1984) (10)
Secondary ion mass spectrometry (Chemical analysis, vol. 86.) : Wiley, New York, 1987 (ISBN 0-471-01056-1). xxxv+1227 pp. Price £143.00 (1987) (10)
The development of SIMS and international SIMS conferences: a personal retrospective view (2011) (10)
Formation of (M+Me)± ions from ultrahigh‐vacuum‐prepared amino acid layers on metals (1987) (10)
Organic surface analysis with time-of-flight SIMS (1990) (9)
XPS and SIMS/SNMS measurements on thin metal oxide layers (1993) (9)
Surface Characterization of Particulate Video Tapes by Static SIMS (1988) (9)
Characterization of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry (1992) (9)
Molecular weight determination of bulk polymer surfaces by static secondary ion mass spectrometry (1997) (8)
Surface investigations of silylated substrates by TOF‐SIMS (1994) (8)
High Mass Resolution Plasma Desorption and Secondary Ion Mass Spectrometry of Neutral Nickel Thiolate Complexes. Crystal Structure of [Ni6(SC3H7)12] (1992) (8)
Analysis of passivating oxide and surface contaminants on GaAs (100) by temperature‐dependent and angle resolved x‐ray photoelectron spectroscopy, and time‐of‐flight secondary ion mass spectrometry (1992) (8)
Contamination of clean metal surfaces associated with electron bombardment in conventional AES analysis (1978) (8)
Secondary ion emission from ethylene exposed nickel surfaces (1982) (8)
Ultrashallow secondary ion mass spectroscopy depth profiling of doping spikes and Si/SiGe/Si heterostructures using different primary species (1998) (7)
Experimental study of the response of a liquid metal field ion source to short HV-extraction pulses (1990) (7)
Quantification of metal contaminants on GaAs with time-of-flight secondary ion mass spectrometry (1998) (7)
Dimerization of polystyrene during static SIMS measurements (1993) (7)
Combined SIMS/TPD investigations of UHV-prepared tolyltriazole overlayers on Cu, Ni and Au (1989) (7)
Molecular secondary ion emission from adenine overlayers in dependence on the primary ion species and substrate material (2003) (6)
Detection and quantification of metals in organic materials by laser-SNMS with nonresonant multiphoton ionization. (2000) (6)
Analytical surface spectroscopy of phospholipid Langmuir-Blodgett films (1992) (6)
Combined chemical and surface analytical investigation of the calcium catalyzed coal gasification process (1991) (5)
Comparison of Laser (LMS), Californium-252 Plasma Desorption (252Cf-PDMS), Fast Atom Bombardment (FAB), Secondary Ion (SIMS), and Field Desorption (FD) Mass Spectra of a Series of Internal Salts (1987) (5)
A combined instrument for the investigation of catalytic reactions by means of gas chromatography, secondary ion and gas phase mass spectrometry, Auger and photoelectron spectroscopy, and ion scattering spectroscopy (1983) (5)
High sensitivity quasisimultaneous secondary neutral, secondary ion, and residual gas mass spectrometry by a new electron impact postionizer (1985) (5)
A New Time-of-Flight Instrument for SIMS and Its Application to Organic Compounds (1984) (5)
Characterization of native and heterooxide layers on compound semiconductors by combined use of surface analysis methods (1984) (5)
Detection and identification of steroids by secondary ion mass spectrometry (SIMS) (1982) (5)
Characterization of glucuronidated phase II metabolites of the immunosuppressant cyclosporine in urine of transplant patients using time-of-flight secondary-ion mass spectrometry. (1996) (5)
Molecular Secondary Ion Emission (1979) (4)
A comparison of spectroscopical techniques in surface analysis (1984) (4)
Determination of silicon oxide layer thickness by time-of-flight secondary ion mass spectroscopy (1999) (4)
A supercritical fluid chromatography inlet source for secondary ion mass spectrometry (1989) (4)
Radiation effects in static SIMS of polymers (1994) (4)
Ion formation from organic solids (IFOS III) : mass spectrometry of involative material : proceedings of the third International Conference, Münster, Fed. Rep. of Germany, September 16-18, 1985 (1986) (4)
Investigation of electron induced damaging of molecular overlayers by imaging static secondary ion mass spectroscopy (1998) (4)
Secondary ion mass spectrometry : SIMS IX : Proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX) : the Hotel Yokohama and the Sangyo-Boeki Center Building Yokohama, Japan 7-12 November, 1993 (1994) (4)
Molecular secondary ion formation and H/D exchange in amino acid-metal systems (1987) (4)
HPLC-SIMS off-line coupling for the determination of 8-hydroxyquinolinates and some other metal chelates (1987) (4)
TOF-SIMS of Polymers in the High Mass Range (1986) (4)
Comparative investigations of the secondary ion emission of metal complexes under MeV and keV ion bombardment (1993) (3)
Static SIMS Investigations of Amino Acid Mixtures (1979) (3)
Ion Gun Systems for Submicron SIMS (1984) (3)
Examination of organosilicon impregnating mixtures by static SIMS and diffuse reflectance FT-IR (1997) (3)
A versatile spectrometer system for quantitative surface and in‐depth analysis with secondary ion and secondary neutral mass spectroscopy, Auger electron and x‐ray photoelectron spectroscopy (1989) (3)
Structural Analysis of Human Apolipoprotein A-I Variants (2001) (3)
Secondary ion emission from phosphatidic acid sandwich films under atomic and molecular primary ion bombardment (2001) (3)
Secondary Ion Emission from Adsorption Layers on Nickel (1983) (3)
Chlorine's effects on triazole inhibitor layers on copper (1994) (3)
Secondary Ion Emission from UHV-Deposited Amino Acid Overlayers on Clean Metal Surfaces (1982) (3)
Analytical Applications of High-Performance TOF-SIMS (1986) (3)
Secondary Ion masse spectrometry (Proceedings of the 6th int. conf. on Secondary Ion Mass Spectrometry (SIMS VI) Paris Sept. 13-18, 1987) (1988) (3)
Ultra-shallow junction depth profile analysis using TOF-SIMS and TXRF (1998) (3)
COMBINED INSTRUMENT FOR THE ON-LINE INVESTIGATION OF PLASMA DEPOSITED OR ETCHED SURFACES BY MONOCHROMATIZED X-RAY PHOTOELECTRON SPECTROSCOPY AND TIME- OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (1994) (3)
Mass spectrometry of molecular neutrals sputtered from amino acid overlayers on Au and Ni (1988) (2)
Secondary Ion Mass Spectrometry of Amino Acids by Proton and Alkali Ion Attachment (1979) (2)
Analysis of ionic metal complexes by time-of-flight secondary ion mass spectrometry and plasma desorption mass spectrometry (1991) (2)
Surface analysis of polymer materials by secondary ion mass spectrometry (1994) (2)
Ion Formation from Organic Solids (Ifos V : Proceedings of the Fifth International Conference, Lovanger, Sweden, June 18-21, 1989) (1990) (2)
TLC—TOF SIMS Monitoring of Zinc Complex Origin — Carboxylate Ligand Movement (2002) (2)
Poisoning by iron of silver catalysts for partial oxidation of methanol (1985) (2)
Secondary ion mass spectrometry (SIMS) sample preparation utilizing supercritical fluid carbon dioxide (1990) (2)
Biological and Medical Applications of Organic SIMS (1983) (2)
Detection of bacterial products of granaticin by secondary ion mass spectrometry (SIMS) (1982) (2)
Low Energy Oxygen Ion Implantation and Ion-Bombardment Induced Oxidation of Silicon, Studied by SIMS, AES, and XPS (1984) (1)
Influence of the Target Preparation on the SI-Emission of Organic Molecules (1986) (1)
Secondary Ion Emission from Glycerol and Silver Supported Organic Molecules (1986) (1)
TOF-SIMS depth profiling of SIMON (2003) (1)
Combined SIMS, AES, and XPS Investigations of Oxygen-Covered 3d Transition Metal Surfaces (1979) (1)
Secondary ion mass spectrometry SIMS-II. Proceedings of the second international conference, held at Stanford, CA, USA, 27 - 31 August 1979. (1980) (1)
Surface and In-Depth Analysis of Anodic Oxide Layers on Cd0.2Hg0.8Te (1981) (1)
THE INFLUENCE OF BOMBARDMENT ENERGY ON PREFERENTIAL SPUTTERING AND DEPTH PROFILE ANALYSIS OF MERCURY CADMIUM TELLURIDE (MCT) WITH SNMS, AES AND XPS (1990) (1)
Summary Abstract: Oxidation of cobalt at room temperature, studied by combined static SIMS, static AES, XPS, and work function investigations (1983) (1)
TOF-SIMS of Polymers in the Range of M/Z = 500 to 5000 (1986) (1)
MECHANISM OF ION FORMATION AND ION EMISSION DURING SPUTTERING. (1969) (1)
Combined SIMS, AES and XPS Study of CdxHg1-xTe (1979) (1)
Formation of Very Large Gold Superclusters (Clusters of Clusters) as Secondary Ions up to (Au13)55 by Secondary Ion Mass Spectrometry. (1991) (1)
Secondary ion mass spectrometry : SIMS III : proceedings of the third international conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 (1982) (1)
TOF-SIMS and FT-IR investigations of surface modified silicon wafers — porous silicon (1994) (1)
SIMS Investigation of Adsorption of O2, H2O, CO, CO2, CH2O, and CH3OH and Coadsorption of O2 with CH2O and CH3OH on Polycrystalline Silver Surfaces (1982) (1)
Combined SIMS-AES-XPS Investigation of the Composition and Interface Structure of Anodic Oxide Layers on Cd 0.2 Hg 0.8 Te (CMT) (1982) (1)
Design Concept of a New Secondary Ion Optics System for Use with Quadrupole Mass Spectrometers (1982) (1)
Ion formation from organic solids : proceedings of the second international conference, Münster, Fed. Rep. of Germany, September 7-9, 1982 (1983) (1)
A Static‐Secondary‐Ion‐Mass‐Spectrometry study of the surfaces of poly(hydroxyalkyl methacrylates) before and after chemical modification (2010) (1)
Ion formation from organic solids (IFOS IV) : mass spectrometry of involatile material : proceedings of the fourth international conference, Münster, Federal Republic of Germany, September 21-23, 1987 (1989) (1)
The Application of Time-of-Flight Secondary Ion Mass Spectrometry in the Characterization of Apolipoprotein Mutants (1986) (1)
Secondary Ion Formation Processes in Amino Acid — Metal Adsorption Systems (1986) (1)
Molecular Secondary Ion Emission from Different Amino Acid Adsorption States on Metals (1986) (1)
SIMS method of material wear diagnosis (2009) (1)
Depth profile analysis of Pt, Cu, and Au overlayers on p-Hg1−xCdxTe (1991) (1)
Method for determination of depth profiles in the thin film region (1996) (0)
Deterioration of Depth Resolution in Sputter Depth Profiling by Raster Scanning an Ion Beam at Oblique Incidence and Constant Slew Rate (1986) (0)
Secondary ion mass spectrometry : SIMS X : Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X) : University of Muenster, Muenster, Germany October 1-6th, 1995 (1997) (0)
Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 (1986) (0)
Surfaces under ion bombardment. The static method of the secondary ion mass spectroscopy for the surface analysis of solids (1975) (0)
Adsorbed protein configuration and orientation probed by ESCA and time-of-flight SIMS (1996) (0)
Surface segregation in poly(styrene-b-isoprene): Correlation of TOF-SIMS with XPS and contact angle measurements (1996) (0)
Elimination of Ion-Bombardment Induced Artefacts in Compound Identification During Thin Film Analysis: Detection of Interface Carbides in “Diamond-Like” Carbon Films on Silicon (1986) (0)
Chemical characterization of modified nanotips by TOF-SIMS and Laser-SNMS (1999) (0)
TOF-SIMS studies of adsorbed protein films (1996) (0)
Poisoning of silver catalysts for partial oxidation of methanol by iron and chlorine (1986) (0)
Secondary ion mass spectrometry. SIMS_III. Proceedings of the third international conference, held at Budapest, Hungary, 30 August - 5 September 1981. (1982) (0)
Sputtering techniques, especially secondary ion mass spectrometry (1984) (0)
Hockney u. Eastwood: Computer Simulation Using Particles/Zangwill: Physics at Surfaces/Zirnbauer/Watt u. Grime: Principles and Applications of High-Energy Ion Microbeams/Batalin, Isham u. Vilkovisky: Quantum Field Theory and Quantum Statistics: Essays in (1988) (0)
High performance liquid chromatography and time-of-flight secondary ion mass spectrometry : a new dimension in structural analysis of apolipoproteins HU (2002) (0)
A process for the analysis of gases and liquids (1981) (0)
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 (1983) (0)
Quantitative surface analysis of molecular overlayers by resonantly enhanced multiphoton ionization of sputtered molecules (2002) (0)
Secondary ion mass spectra of gold super clusters up to 140 000 (0)
Quantitative Analysis of Iron and Steel by Mass Spectrometry (1986) (0)
Evaluation of a system for trace and particle analysis based on resonance ionization of sputtered atoms (2002) (0)
Secondary ion mass spectrometry : SIMS II : proceedings of the second international conference, Stanford Univ.,Stanford, California, August 27-31, 1979 (1979) (0)
Smith-Lemli-Opitz Syndrome Diagnosed by Using Time-of-Flight Secondary-Ion (1995) (0)
Spectroscopic Investigations on Silylated Inorganic Substrates (2008) (0)
SIMS/TDMS Studies of Hydrocarbon Interaction with Nickel (1982) (0)
Depth profile measurements of PtxSi1-x layers by combined SIMS, SNMS, AES and XPS (1990) (0)
Peptide Analysis by Time-of-flight Secondary Ion Mass Spectrometry (1989) (0)
Effect of Ga+ backscattering in static SIMS (1994) (0)
Investigation of Surface Reactions by SIMS: Nickel-Oxygen-Hydrogen-Interaction (1979) (0)
Silver Catalyst for Partial Oxidation of Methanol. Reaction Path and Catalyst Poisoning by Iron. A Combined SIMS, TDMS, AES, XPS and ISS Study (1984) (0)
Diffuse Reflectance IR and Time‐of‐Flight SIMS Investigation of Methoxysilane SA‐Layers on Silica and Alumina (2008) (0)
ON A DOUBLE-FOCUSING MASS SPECTROMETER WITH COUNTER-INDICATOR AS HIGH- SENSITIVITY LEAK DETECTOR (1963) (0)
Thick Siloxane Films from Tetraethoxysilane on Silicon Wafers (2008) (0)

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