Carol Trager-Cowan

Carol Trager-Cowan's AcademicInfluence.com Rankings

Carol Trager-Cowan

Physics

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Physics

Carol Trager-Cowan's Degrees

PhD Physics University of Strathclyde
Bachelors Physics University of Strathclyde

Why Is Carol Trager-Cowan Influential?

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According to Wikipedia, Carol Trager-Cowan is a Scottish physicist who is a Reader in physics and Science Communicator at the University of Strathclyde. She works on scanning electron microscopy, including Electron backscatter diffraction , diffraction contrast and cathodoluminescence imaging.

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Carol Trager-Cowan's Published Works

Number of citations in a given year to any of this author's works

Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author

Published Works

Many-beam dynamical simulation of electron backscatter diffraction patterns. (2007) (172)
Compositional pulling effects in InxGa1-x N/GaN layers: A combined depth-resolved cathodoluminescence and Rutherford backscattering/channeling study (2001) (170)
Structural and optical properties of InGaN/GaN layers close to the critical layer thickness (2002) (95)
Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films (2007) (75)
Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. (2012) (63)
Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns (2015) (43)
Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films (2017) (38)
Photoluminescence of wide bandgap II–VI superlattices (1990) (36)
Band alignments in Zn(Cd)S(Se) strained layer superlattices (1992) (35)
Morphology of luminescent GaN films grown by molecular beam epitaxy (1996) (33)
Imaging of Cathodoluminescence Zoning in Calcite by Scanning Electron Microscopy and Hyperspectral Mapping (2005) (31)
The dependence of the optical energies on InGaN composition (2001) (31)
Luminescence from porous silicon (1993) (28)
Coincident Electron Channeling and Cathodoluminescence Studies of Threading Dislocations in GaN (2013) (27)
The optical properties of wide bandgap binary II-VI superlattices (1992) (23)
Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction (2017) (23)
Electron channelling contrast imaging for III-nitride thin film structures (2016) (22)
Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N (2015) (22)
Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope (2013) (21)
Growth and Optical Properties of GaN Grown by MBE on Novel Lattice-Matched Oxide Substrates (1995) (20)
Spatially-resolved optical and structural properties of semi-polar $$\mathrm{(11}\bar{2}\mathrm{2)}$$(112¯2) AlxGa1−xN with x up to 0.56 (2017) (20)
Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope (2012) (19)
Improving EBSD precision by orientation refinement with full pattern matching (2020) (19)
Electron beam pumping of CdZnSe quantum well laser structures using a variable energy electron beam (1996) (16)
Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors (2014) (16)
Nanomechanical Behaviour of Individual Phases in WC-Co Cemented Carbides, from Ambient to High Temperature (2020) (15)
Determining GaN Nanowire Polarity and its Influence on Light Emission in the Scanning Electron Microscope. (2019) (14)
Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging (2020) (13)
The optical and structural properties of InGaN epilayers with very high indium content (1999) (13)
Diffraction effects and inelastic electron transport in angle‐resolved microscopic imaging applications (2017) (13)
Practical application of direct electron detectors to EBSD mapping in 2D and 3D. (2018) (12)
Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope. (2018) (12)
Dislocation contrast in electron channelling contrast images as projections of strain-like components (2018) (11)
Stress distribution of GaN layer grown on micro-pillar patterned GaN templates (2013) (11)
Characterisation of nitride thin films by electron backscattered diffraction (2001) (11)
Alternative substrates for gallium nitride epitaxy: photoluminescence and morphological investigations (1997) (10)
The morphology and cathodoluminescence of GaN thin films (1996) (10)
AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy (2020) (10)
Blue cathodoluminescence from thulium implanted AlxGa1−xN and InxAl1−xN (2006) (10)
Depth Resolved Studies of Indium Content and Strain in InGaN Layers (2001) (10)
Hexagonal ZnCdS epilayers and CdSSe/ZnCdS QW structures on CdS(0001) and ZnCdS(0001) substrates grown by MOVPE (2003) (9)
Energy-dispersive x-ray imaging of an InGaN/GaN bilayer on sapphire. (1998) (9)
Growth and optical characterisation of binary II–VI SLS (1993) (9)
Electron beam excitation and profiling of strained CdS epilayers grown by metalorganic vapour phase epitaxy on GaAs(111)A, GaAs(100), ZnSe(100) and ZnS(100) substrates (1992) (9)
Design and fabrication of enhanced lateral growth for dislocation reduction in GaN using nanodashes (2017) (9)
Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films (2019) (8)
Time-resolved optical studies of piezoelectric effects in wurtzite strained-layer superlattices (1990) (8)
Rare earth doping of III‐nitride alloys by ion implantation (2008) (8)
Depth profiling of ion-implanted AlInN using time-of-flight secondary ion mass spectrometry and cathodoluminescence (2006) (8)
Europium doping of zincblende GaN by ion implantation (2009) (8)
Report on the evening rump session on InN - July 21, 2004 at the 2004 international workshop on nitride semiconductors (2005) (8)
The emission spectrum of pulsed laser deposited GaN and its powder precursor (1999) (7)
Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging (2018) (7)
Spatially resolved cathodoluminescence of semiconductors (1993) (7)
GaN epilayers on misoriented substrates (1999) (7)
Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence (2003) (7)
Exploring transmission Kikuchi diffraction using a Timepix detector (2017) (7)
In situ and ex situ Evaluation of Mechanisms of Lateral Epitaxial Overgrowth (2001) (7)
Comparison of luminescence and physical morphologies of GaN epilayers (1997) (7)
Materials Science in Semiconductor Processing (2016) (6)
Characterization of nitride thin films by electron backscatter diffraction (2002) (6)
Luminescent properties of GaN thin films prepared by pulsed laser deposition (1999) (6)
Hexagonal growth hillocks in GaN epilayers (1996) (6)
Buried dielectric mirrors for the lateral overgrowth of GaN-based microcavities (2001) (5)
Electron Backscattered Diffraction Patterns from Cooled Gallium Nitride Thin Films (2001) (5)
The effect of growth temperature on the luminescence and structural properties of GaN:Tm films grown by gas-source MBE (2008) (5)
Multiple-element electrostatic lenses: I. The five-element lens (1990) (5)
Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging (2006) (4)
Microscopy of defects in semiconductors (2019) (4)
Diffractive triangulation of radiative point sources (2016) (4)
Electron beam excitation of II?VI compound strained layer superlattices (1991) (4)
Optical and structural properties of GaN epitaxial layers on LiAlO2 substrates and their correlation with basal-plane stacking faults (2016) (4)
Spatially-resolved optical and structural properties of semi-polar \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\ma (2017) (4)
Kikuchi pattern simulations of backscattered and transmitted electrons (2021) (4)
Depth-resolved cathodoluminescence of ZnSe epilayers (1994) (4)
Nanoscale fissure formation in AlxGa1–xN/GaN heterostructures and their influence on Ohmic contact formation (2017) (4)
Electron Channelling Contrast Imaging in a Low Voltage Scanning Electron Microscope (2019) (3)
Characterization of the blue emission of Tm/Er co-implanted GaN (2005) (3)
Optical and structural properties of Eu-implanted InxAl1−xN (2009) (3)
Influence of an InGaN superlattice pre-layer on the performance of semi-polar (11–22) green LEDs grown on silicon (2020) (3)
Properties of GaN epilayers grown on misoriented sapphire substrates (1998) (3)
Cathodoluminescence from an InGaN/GaN MQW Grown on an Epitaxially Laterally Overgrown GaN Epilayer (1999) (2)
Probing The Indium Mole Fraction In An Ingan Epilayer By Depth Resolved Cathodoluminescence (1997) (2)
Corrigendum to "Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope" Ultramicroscopy 187 (2018) 98-106. (2018) (2)
Luminescence spectroscopy of Eu‐implanted zincblende GaN (2008) (2)
Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films (2008) (2)
Disorder in laser materials (1991) (2)
Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope. (2020) (2)
Scanning Tunneling Luminescence Studies of Nitride Semiconductor Thin Films under Ambient Conditions (2001) (2)
High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors (2015) (2)
Optical spectroscopy of Cr3+ ions in LiF single crystals (1991) (2)
Multiple-element electrostatic lenses: II. A multiple disc lens (1990) (2)
Crystalline grain engineered CsPbIBr2 films for indoor photovoltaics (2022) (1)
Luminescence behavior of semipolar ( 10 1 ¯ 1 ) InGaN/GaN “bow-tie” structures on patterned Si substrates (2020) (1)
Strain and Compositional Analysis of InGaN/GaN Layers (2000) (1)
Café Scientifique: Nobel Laureate Communicates Science Across the World (2010) (1)
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope (2020) (1)
Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors (2014) (1)
Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films (2012) (1)
You Do What in Your Microprobe?! The EPMA as a Multimode Platform for Nitride Semiconductor Characterization (2018) (1)
Characterisation of Epitaxial Lateral Overgrown GaN by Electron Backscatter Diffraction Correlated with Cross-Sectional Cathodoluminescence Spectroscopy (2006) (1)
Optimisation of AlGaN/GaN Heterostructures for Field Effect Transistors Grown by Metalorganic Vapour Phase Epitaxy (2001) (1)
Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy (2022) (1)
E-BEAM PUMPED VCSEL ON MOVPE-GROWN HEXAGONAL CdSSe/CdS MQW STRUCTURE (2004) (1)
MOCVD growth and characterisation of ZnS/ZnSe distributed Bragg reflectors and ZnCdSe/ZnSe heterostructures for green VCSEL (2001) (1)
Dynamical Simulations of Transmission Kikuchi Diffraction (TKD) Patterns (2017) (0)
Microanalysis Society (2011) (0)
Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction (2017) (0)
Glasgow : city of light - materials walking tour (2005) (0)
Influence of micro-patterning of the growth template on defect reduction and optical properties of non-polar (112ˉ0) GaN (2020) (0)
Pulsed Laser Deposited (PLD) GaN and Its Powder Precursor (1998) (0)
Visualization of defects in nitride semiconductors by electron channeling (Conference Presentation) (2020) (0)
Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope (2020) (0)
E-beam longitudinal pumped laser on MOVPE-grown hexagonal CdSSe/CdS MQW structure (2004) (0)
Mapping Anti-phase Domains by Polarity Sensitive Orientation Imaging Using Electron Backscatter Diffraction (2017) (0)
Probing nitride thin films in 3-dimensions using a variable energy electron beam (1999) (0)
The rank prize funds: nurturing advancement in optoelectronics (2008) (0)
Introduction (2008) (0)
Electron beam excitation and profiling of CdSe-ZnSe multiple quantum well and strained layer superlattice structures (1991) (0)
Light Makes an Impact on the Lives and Healthcare of Scots (2007) (0)
Hexagonal growth hillocks of MOCVD-grown GaN on (0001) sapphire. (1997) (0)
Roqan, Iman and Trager-Cowan, Carol and Hourahine, Ben and Lorenz, Katharina and Nogales, Emilio and O'Donnell, Kevin P. and Martin, Robert W. and Alves, Eduardo and Ruffenach, S. and Briot, Olivier (2006) Characterization of the blue emission of Tm/Er (2018) (0)
Characterization of Nitride Thin Films by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging (2006) (0)
Introduction - Journal of Microscopy (2008) (0)
Reprint of: Electron channelling contrast imaging for III-nitride thin film structures (2016) (0)
Pascal, Elena and Singh, Saransh and Callahan, Patrick G. and Hourahine, Ben and Trager-Cowan, Carol and De Graef, Marc (2018) Energy-weighted dynamical scattering simulations of electron diffraction modalites in the scanning electron microscope. Ultramicroscopy, 187 (2018) (0)
Two beam toy model for dislocation contrast in ECCI (2019) (0)
In-situ reflectometry based studies of lateral epitaxial overgrowth (2001) (0)
Future Prospects for SEM-based Defect Analysis using Fast Electrons (2010) (0)
Polarity Determination in GaN Nanowires by Electron Backscatter Diffraction (2019) (0)
Development of CdSSe/CdS VCSELs for Application to Laser Cathode Ray Tubes (2004) (0)
Naresh-Kumar, G. and Thomson, D. and Nouf-Allehiani, M. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Martin, R.W. and Trager-Cowan, C. (2016) Electron channelling contrast imaging for III-nitride thin film (2018) (0)
behavior semipolar (101¯1) InGaN/GaN “bow-tie” structures on patterned Si substrates (2020) (0)
Vespucci, S. and Naresh-Kumar, G. and Trager-Cowan, C. and Mingard, K. P. and Maneuski, D. and O'Shea, V. and Winkelmann, A. (2017) Diffractive triangulation of radiative point sources. Applied Physics (2018) (0)
Al0.82Ga0.18N (2015) (0)
Imaging Extended Defects in Low Z materials using Electron Channelling Contrast Imaging – New Approaches and Challenges (2019) (0)
Dataset for 'Design and fabrication of enhanced lateral growth for dislocation reduction and strain management in GaN using nanodashes' (2017) (0)
Cathodoluminescence hyperspectral imaging of nitride semiconductors : introducing new variables (2014) (0)
Non-destructive Imaging of Extend Defects in III-nitride Thin film Structures Using Electron Channelling Contrast Imaging (2017) (0)
3-D Mapping of Strain and Defects in a ZnSE Epilayer Using a Variable Energy Electron Beam (1995) (0)
Edwards, Paul R. and Wallace, Michael J. and Kusch, Gunnar and Naresh-Kumar, Gunasekar and Bruckbauer, Jochen and Trager-Cowan, Carol and O'Donnell, Kevin P. and Martin, Robert W. (2014) Cathodoluminescence hyperspectral imaging of nitride (2018) (0)
Towards a New Homogeneous Immunoassay for Gonadotropin-releasing Hormone based on Time-resolved Fluorescence Anisotropy (2011) (0)
Vilalta-Clemente, A. and Naresh-Kumar, G. and Nouf-Allehiani, M. and Gamarra, P. and di Forte-Poisson, M.A. and Trager-Cowan, C. and Wilkinson, A.J. (2017) Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and disloc (2018) (0)

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