Dale E. Newbury

Dale E. Newbury's AcademicInfluence.com Rankings

Dale E. Newbury

Engineering

#6222

World Rank

#7536

Historical Rank

Materials Science

#348

World Rank

#352

Historical Rank

Applied Physics

#1956

World Rank

#1991

Historical Rank

engineering Degrees

Dale E. Newbury

Physics

#6804

World Rank

#8789

Historical Rank

physics Degrees

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Engineering
Physics

Dale E. Newbury's Degrees

PhD Physics University of Maryland, College Park
Bachelors Physics University of Maryland, College Park

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Dale E. Newbury's Published Works

Number of citations in a given year to any of this author's works

Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author

Published Works

Scanning Electron Microscopy and X-Ray Microanalysis (2017) (987)
Electron Probe Quantitation (1991) (392)
Electron channeling patterns in the scanning electron microscope (1982) (309)
Advanced Scanning Electron Microscopy and X-Ray Microanalysis (1986) (306)
Is scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) quantitative? (2013) (293)
Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS) (2014) (231)
High‐resolution, energy‐dispersive microcalorimeter spectrometer for X‐ray microanalysis (1997) (209)
Low Voltage Scanning Electron Microscopy (1996) (166)
Self-diffusion of 30Si in polycrystalline β-SiC (1980) (118)
Superconducting transition-edge-microcalorimeter X-ray spectrometer with 2eV energy resolution at 1.5keV (2000) (97)
SEM Microcharacterization of Semiconductors (1986) (97)
Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy (1976) (93)
Mistakes encountered during automatic peak identification of minor and trace constituents in electron-excited energy dispersive X-ray microanalysis. (2009) (85)
An electron microprobe study of a mature cement paste (1984) (84)
Postdetonation nuclear debris for attribution (2010) (79)
X-Ray Spectrometry in Electron Beam Instruments (2012) (73)
EDS Measurements of X-Ray Intensity at WDS Precision and Accuracy Using a Silicon Drift Detector (2012) (68)
A new method of observing magnetic domains by scanning electron microscopy I. Theory of the image contrast (1973) (65)
X-Ray Microanalysis in the Variable Pressure (Environmental) Scanning Electron Microscope (2002) (63)
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy (1990) (62)
"Standardless" quantitative electron probe microanalysis with energy-dispersive X-ray spectrometry: is it worth the risk? (1995) (59)
Elemental mapping of microstructures by scanning electron microscopy-energy dispersive X-ray spectrometry (SEM-EDS): extraordinary advances with the silicon drift detector (SDD) (2013) (58)
Special Topics in Scanning Electron Microscopy (2003) (54)
Modeling of the bremsstrahlung radiation produced in pure‐element targets by 10–40 keV electrons (1987) (48)
Energy Dispersive X-Ray Spectrometry (1981) (48)
The electron microscope: the materials characterization tool of the millennium☆ (2000) (47)
A new method of observing magnetic domains by scanning electron microscopy. II. Experimental confirmation of the theory of image contrast (1974) (47)
Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy (2002) (46)
Electron-Beam-Specimen Interactions (1975) (45)
Trace elemental analysis at nanometer spatial resolution by parallel-detection electron energy loss spectroscopy. (1993) (45)
Examination of Multiphase (Zr,Ti)(V,Cr,Mn,Ni)2 Ni-MH Electrode Alloys: Part II. Solid-State Transformation of the Interdendritic B2 Phase (2010) (40)
Monte Carlo calculations of magnetic contrast from cubic materials in the scanning electron microscope (1973) (39)
Diffusion-induced grain boundary migration in the Cu?Zn system? (1982) (37)
Monte carlo electron trajectory simulation of beam spreading dm thin foil targets (1978) (36)
Low Voltage Scanning Electron Microscopy (2002) (36)
Microstructure and mineral composition of dystrophic calcification associated with the idiopathic inflammatory myopathies (2009) (36)
Calcium hydroxide distribution and calcium silicate hydrate composition in tricalcium silicate and β-dicalcium silicate pastes (1984) (35)
Development of national bureau of standards thin glass films for X-ray fluorescence spectrometry (1986) (34)
Monte Carlo modelling for electron microscopy and microanalysis (1996) (33)
Misidentification of Major Constituents by Automatic Qualitative Energy Dispersive X-ray Microanalysis: A Problem that Threatens the Credibility of the Analytical Community (2005) (32)
Compositional Mapping with the Electron Probe Microanalyzer: Part I (1990) (30)
Methods for quantitative analysis in secondary ion mass spectrometry (1980) (30)
Mistakes encountered during automatic peak identification in low beam energy X-ray microanalysis. (2007) (29)
X-ray spectrometry and spectrum image mapping at output count rates above 100 kHz with a silicon drift detector on a scanning electron microscope. (2006) (26)
Electron-Specimen Interactions (1992) (26)
Microcalorimeter energy‐dispersive spectrometry using a low voltage scanning electron microscope (2000) (26)
The SEM and Its Modes of Operation (2003) (25)
Scanning electron microscope selected area channelling patterns from 1 micron specimen areas (1972) (24)
The New X-ray Mapping: X-ray Spectrum Imaging above 100 kHz Output Count Rate with the Silicon Drift Detector (2006) (24)
Quantitative X-Ray Analysis: The Basics (1992) (22)
Backscattered Electron Imaging (1990) (22)
Concentration histogram imaging: A scatter diagram technique for viewing two or three related images (1991) (22)
Uncertainty estimates for electron probe X-ray microanalysis measurements. (2012) (21)
X-Ray Microanalysis Case Studies (2018) (21)
Generation of X-Rays in the SEM Specimen (2003) (19)
Band positions used for on-line crystallographic orientation determination from electron back scattering patterns. Discussion (1991) (19)
Quantitative X-Ray Microanalysis (1981) (19)
Surface and bulk analysis of a deactivated raney nickel methanation catalyst (1983) (19)
Electron Channeling Contrast in the SEM (1986) (19)
Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-II (2015) (19)
THE ROLE OF FAST SECONDARY ELECTRONS IN DEGRADING SPATIAL RESOLUTION IN THE ANALYTICAL ELECTRON MICROSCOPE (1982) (19)
Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive Spectrometry (2016) (18)
Image Formation in the Scanning Electron Microscope (1975) (18)
Digital X-ray compositional mapping with standard map corrections for wavelength dispersive spectrometer defocusing (1987) (18)
The use of lead isotopic abundances in trace uranium samples for nuclear forensics analysis (2010) (18)
SiO2Al2O3 ratios of ZSM—5 crystals measured by electron microprobe and X-ray diffraction (1984) (17)
Bridging the Micro-to-Macro Gap: A New Application for Micro X-Ray Fluorescence (2011) (17)
Relevance of electron channeling patterns to embrittlement studies (1974) (17)
Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure! † (2016) (17)
Coating and Conductivity Techniques for SEM and Microanalysis (1992) (17)
Electron Beam-Specimen Interactions in the Analytical Electron Microscope (1986) (17)
Electron-Excited Energy Dispersive X-Ray Spectrometry at High Speed and at High Resolution: Silicon Drift Detectors and Microcalorimeters (2006) (16)
Wheatleyite, Na 2 Cu(C 2 O 4 ) 2 .2H 2 O, a natural sodium copper salt of oxalic acid (1986) (16)
Color metallography of diffusion-induced grain boundary migration in Cu-Zn and Cu-As alloys☆ (1983) (15)
Observations on the Mechanisms of High Resistance Junction Formation in Aluminum Wire Connections. (1980) (15)
Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region (1996) (15)
DTSA-II: A New Tool for Simulating and Quantifying EDS Spectra - Application to Difficult Overlaps (2008) (15)
Lowering the Limit of Detection in High Spatial Resolution Electron Beam Microanalysis With the Microcalorimeter Energy Dispersive X-Ray Spectrometer (1999) (15)
Diffusion-induced grain boundary migration in the AuAg system☆ (1984) (15)
Microanalysis of precipitates in aluminum-lithium alloys with a scanning ion microprobe (1989) (15)
"Derived spectra" software tools for detecting spatial and spectral features in spectrum images. (2006) (13)
Concentration Histogram Imaging (1991) (13)
Milli X-ray fluorescence X-ray spectrum imaging for measuring potassium ion intrusion into concrete samples (2009) (13)
Contrast Mechanisms of Special Interest in Materials Science (1975) (13)
Revisiting the zinc composition limit of cementation brass (2005) (13)
Computer-aided imaging: Quantitative compositional mapping with the electron probe microanalyzer (1988) (13)
Microanalysis to nanoanalysis: measuring composition at high spatial resolution (1990) (13)
Domain wall image contrast in the SEM (1976) (12)
The X-Ray Crystallography of Tavorite from the Tip Top Pegmatite, Custer, South Dakota (1988) (12)
Quantitative electron probe microanalysis of rough targets: testing the peak-to-local background method. (2006) (12)
Electron-Excited X-ray Microanalysis by Energy Dispersive Spectrometry at 50: Analytical Accuracy, Precision, Trace Sensitivity, and Quantitative Compositional Mapping (2019) (12)
Qualitative X-Ray Analysis (1992) (12)
X-Ray Spectral Measurement: WDS and EDS (1981) (11)
Energy Dispersive Spectrometry (2012) (11)
Faults and foibles of quantitative scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS) (2012) (10)
Fransoletite, a new calcium beryllium phosphate from the Tip Top Pegmatite, Custer, South Dakota (1983) (10)
Ti12.5Zr21V10Cr8.5MnxCo1.5Ni46.5−x AB2-type metal hydride alloys for electrochemical storage application: Part 1. Structural characteristics (2012) (10)
Observation of magnetic domains in nickel using the scanning electron microscope (1974) (10)
Image Formation and Interpretation (1992) (10)
Monte Carlo modeling of secondary x-ray fluorescence across phase boundaries in electron probe microanalysis (2006) (10)
A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications (2004) (10)
Electron Energy Loss Spectrometry (1990) (10)
Quantitative Compositional Mapping with the Electron Probe Microanalyzer (1991) (9)
Magnetic Contrast in the SEM (1986) (9)
Quantitative Energy-Dispersive X-Ray Microanalysis (1990) (9)
Strategies for background subtraction in electron probe microanalysis/x-ray compositional mapping (1989) (9)
Quantitative X-Ray Analysis: Theory and Practice (1992) (9)
Quantitative SEM/EDS, Step 1: What Constitutes a Sufficiently Flat Specimen? (2013) (9)
On the production of X-rays by low energy ion beams. (2007) (9)
Assessing Charging Effects on Spectral Quality for X-ray Microanalysis in Low Voltage and Variable Pressure/Environmental Scanning Electron Microscopy (2004) (9)
Tensile testing of strain-rate-sensative materials at constant imposed strain rate (1970) (9)
Measures for spectral quality in low-voltage X-ray microanalysis. (2000) (9)
Trace element detection at nanometer scale spatial resolution (1998) (8)
Secondary ion imaging of the distribution of δ′ (Al3Li) in Al-Li alloys (1991) (8)
The Approaching Revolution in X-Ray Microanalysis: The Microcalorimeter Energy Dispersive Spectrometer (2000) (8)
Microstructure and characterization of electron‐trapping stimulable phosphor SrS:(Eu,Sm) thin film on glass (1995) (8)
The R Factor: The X-Ray Loss Due to Electron Backscatter (1991) (7)
Electron and ion microscopy studies of Fe-rich second-phase particles in AlLi alloys (1992) (7)
High-Resolution Microcalorimeter Energy-Dispersive Spectrometer for X-Ray Microanalysis and Particle Analysis (1998) (7)
Low Voltage Scanning Electron Microscopy | NIST (2001) (7)
Energy Dispersive X-Ray Spectrometry by Microcalorimetry for the SEM (2002) (7)
Fredrikssonite, a new member of the pinakiolite group, from Långban, Sweden (1983) (7)
Rigorous quantitative elemental microanalysis by scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS) with spectrum processing by NIST DTSA-II (2014) (7)
Simulation of electron‐excited X‐ray spectra with NIST–NIH Desktop Spectrum Analyzer (DTSA) (2005) (7)
What is causing failures of aluminum wire connections in residential circuits (1982) (7)
Electron Probe Microanalyzer (1997) (6)
Morphological and microchemical phenomena in the high-temperature oxidation of binary Al-Li alloys (1991) (6)
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences (2011) (6)
Imaging Deep Holes in Structures with Gaseous Secondary Electron Detection in the Environmental Scanning Electron Microscope (2006) (6)
Procedures for Elimination of Charging in Nonconducting Specimens (2003) (6)
Characterization of SiGe Films for Use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905) (2009) (6)
Raman microprobe studies of two mineralizing tissues: enamel of the rat incisor and the embryonic chick tibia. (1979) (6)
Loudounite, a new zirconium silicate from Virginia (1983) (6)
Electron Probe Microanalysis (2005) (6)
Practical Techniques of X-Ray Analysis (1981) (6)
Chemical Compositional Mapping by Microbeam Analysis at the Micrometer Scale and Finer (1997) (6)
Microcalorimeter EDS Measurement of Chemical Shifts in Fe Compounds | NIST (1998) (6)
Special Topics in Electron Beam X-Ray Microanalysis (2003) (6)
The Role of Standards in Secondary Ion Mass Spectrometry (1984) (6)
Superplasticity in the ternary PbBiSn eutectic (1972) (6)
Convergent Beam Electron Diffraction (1990) (6)
High-Energy-Resolution Microcalorimeter Spectrometer for EDS X-Ray Microanalysis | NIST (1997) (6)
Artifacts in Energy Dispersive X-Ray Spectrometry in Electron Beam Instruments. Are Things Getting Any Better? (1995) (6)
Depth Distribution of Lithium in Oxidized Binary Al-Li Alloys Determined by Secondary Ion Mass Spectrometry and Neutron Depth Profiling (1993) (5)
Castaing’s Electron Microprobe and Its Impact on Materials Science (1999) (5)
Energy-Dispersive X-Ray Microanalysis (1990) (5)
Modeling Electron Beam-Specimen Interactions (1986) (5)
Computer-Aided Imaging and Interpretation (1986) (5)
A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications (2004) (5)
Electron-Induced X-ray Emission (2001) (5)
Exploring the limits of EDS microanalysis: rare earth element analyses (2018) (5)
Artifacts in energy dispersive x-ray spectrometry in the scanning electron microscope (II). (1980) (5)
Electron Channeling Contrast (1990) (5)
Improving energy stability in the National Institute of Standards and Technology Microcalorimeter X-ray detector (2005) (5)
Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters (2018) (5)
Standardless Analysis - Better but Still Risky (2014) (5)
Coating Techniques for SEM and Microanalysis (1981) (4)
Stereo presentation of Monte Carlo electron trajectory simulations (1984) (4)
Trace Element Microanalysis (1990) (4)
Uncertainty Propagation for Energy Dispersive X-ray Spectrometry (2018) (4)
Characterizing heterogeneous particles with SEM/SDD-EDS mapping and NIST Lispix (2009) (4)
Variable Pressure Scanning Electron Microscopy (VPSEM) (2018) (4)
“Standardless” Quantitative Electron Beam X-ray Microanalysis: The Situation Remains caveat emptor! (2002) (4)
Can X-ray spectrum imaging replace backscattered electrons for compositional contrast in the scanning electron microscope? (2011) (4)
Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials (1992) (4)
Low Beam Energy X-Ray Micro Analysis: How Useful Is It? (1997) (4)
An Iterative Qualitative–Quantitative Sequential Analysis Strategy for Electron-Excited X-ray Microanalysis with Energy Dispersive Spectrometry: Finding the Unexpected Needles in the Peak Overlap Haystack (2018) (4)
Beam broadening in a strongly scattering target in the analytical electron microscope (1982) (4)
Errors Observed in Quantitative Ion Microprobe Analysis (1976) (4)
Breaking the 1% Accuracy Barrier in EPMA (2012) (4)
Advances in Specimen Preparation for Biological SEM (1986) (4)
The New X-ray Mapping: Applying the Silicon Drift Detector (SDD) for X-ray Spectrometry and Spectrum Imaging with Output Count Rates above 100 kHz (2005) (4)
Solving the micro-to-macro spatial scale problem with milliprobe x-ray fluorescence/x-ray spectrum imaging (2009) (4)
Modeling Electron Beam Interactions in Semiconductors (1989) (3)
MICROBEAM ANALYSIS OF SAMPLES OF UNUSUAL SHAPE (1984) (3)
Energy Dispersive X-ray Spectrometry in the Scanning Electron Microscope (2004) (3)
SEM/EDS Trace Analysis: Limits Imposed by Fluorescence of the Detector (2017) (3)
The Visibility of Features in SEM Images (2018) (3)
Pushing the envelope with SEM/SDD-EDS mapping: X-ray spectrum image mapping in 30 seconds or less, but what are the real limits? (2010) (3)
X-ray Mapping Is 50 Years Young; the Best Is Yet to Come; the Future Is Now! (2006) (3)
How To Do Really Bad SEM/EDS Quantitative Analysis, and Never Even Notice! (2012) (3)
Electron Beam—Specimen Interactions: Interaction Volume (2018) (3)
Energy Dispersive X-Ray Microanalysis Checklist (2018) (3)
Manganese-enhanced magnetic resonance microscopy of mineralization. (2007) (3)
Fabrication of Platinum-Gold Alloys in Pre-Hispanic South America: Issues of Temperature and Microstructure Control. (1990) (3)
The Development of Microcalorimeter EDS Arrays (2002) (3)
Moydite (Y, REE)B(OH) 4 (CO 3 ), a new mineral species from the Evans-Lou Pegmatite, Quebec (1986) (3)
Trace Analysis by SEM/EDS (2018) (3)
Reply to discussion by S. Chatterji on the paper “calcium hydroxide distribution and calcium silicate hydrate composition in tricalcium and β-dicalcium silicate pastes”, by H.F.W. Taylor and D.E. Newbury☆ (1985) (3)
INTRODUCTION TO ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY ISSUE (1996) (3)
Scanning Microscopies 2014 (2014) (3)
Characterizing Crystalline Materials in the SEM (2018) (3)
Compton Scattering Artifacts in Electron Excited X-Ray Spectra Measured with a Silicon Drift Detector (2011) (3)
Recent Advances in the Electron Microscopy of Materials (1984) (3)
Developments in Instrumentation for Microanalysis in Low-Voltage Scanning Electron Microscopy (2008) (3)
Diagnostics for Assessing Spectral Quality for X-Ray Microanalysis in Low Voltage and Variable Pressure Scanning Electron Microscopy (2001) (3)
Secondary Electron Generation by Low Energy Ion Beams (2006) (3)
X-Ray Microanalysis in the AEM (1990) (2)
Application of parallel computing to the Monte Carlo simulation of electron scattering in solids: A rapid method for profile deconvolution (1990) (2)
Specimen Preparation of Hard Materials: Metals, Ceramics, Rocks, Minerals, Microelectronic and Packaged Devices, Particles, and Fibers (2003) (2)
Quantitative Electron Probe Microanalysis of Fly Ash Particles (1982) (2)
Quantitative Analysis: The SEM/EDS Elemental Microanalysis k-ratio Procedure for Bulk Specimens, Step-by-Step (2018) (2)
A CATALOGUE OF ARTIFACTS OBSERVED IN ENERGY-DISPERSIVE X-RAY SPECTROMETRY AND THEIR INFLUENCE ON ANALYSIS (1979) (2)
Designing the Optimal Quantitative Electron Probe X-ray Microanalysis Measurement (2013) (2)
Scanning Electron Microscope (SEM) Instrumentation (2018) (2)
Application of Digital SIMS Imaging to Light Element and Trace Element Mapping (1986) (2)
Investigating a Moche Cast Copper Artifact for Its Manufacturing Technology (2017) (2)
Microcalorimeter Energy Dispersive Spectrometry for Low Voltage SEM (1999) (2)
Low-Overvoltage Microanalysis: an Alternative High Resolution Strategy to Low-Voltage Microanalysis (2002) (2)
Microbeam analysis : proceedings of the 23rd Annual Conference of the Microbeam Analysis Society, Milwaukee, Wisconsin, 8-12 August 1988 (1988) (2)
A Seasonal Record of Total Particulate Matter Embedded in Greenland Surface Snow (2001) (2)
Electron Probe Microanalysis with Cryogenic Detectors (2005) (2)
ImageJ and Fiji (2018) (2)
Improving the Sensitivity of Electron Beam Microanalytical Techniques by Enhanced X-ray Spectrometry: X-ray Microcalorimetry, Silicon Drift Detector Energy Dispersive X-ray Spectrometry, and Polycapillary X-ray Optics (2003) (2)
Alternative Microanalytical Techniques (1986) (2)
3.5 – EPMA: Electron Probe X-Ray Microanalysis1 (1992) (2)
Specimen Preparation of Polymer Materials (2003) (2)
Rapid X-ray Spectrum Imaging with the Silicon Drift Detector (SDD): Multivariate Statistical Analysis (2007) (2)
Preparation of Biological Samples for Scanning Electron Microscopy (1981) (2)
Cryogenic Microcalorimeters for X-Ray Microanalysis | NIST (1999) (2)
Quantitative Analysis: From k-ratio to Composition (2018) (2)
Scanning electron microscopy/energy dispersive spectrometry fixedbeam or overscan x-ray microanalysis of particles can miss the real structure: x-ray spectrum image mapping reveals the true nature (2013) (2)
Microcalorimeter EDS Measurements of Chemical Shifts in Fe Compounds (1998) (2)
Is scanning electron microscopy/energy dispersive x-ray spectroscopy (SEM/EDS) quantitative? Effect of specimen shape (2011) (2)
Quantitative Electron-excited X-ray Microanalysis with Low Energy L-Peaks (2020) (2)
Measuring Trace Level Constituents with SEM/SDD-EDS (2009) (2)
Instrumental Effects on Quantitative Analysis by Secondary Ion Mass Spectrometry (1979) (2)
Improve X-ray Microanalysis in Variable-Pressure SEMs with Polycapillary X-ray Optics (2005) (2)
Large Area Silicon Multi-Cathode Detector Developments for Microanalysis and High Speed Elemental Mapping (2005) (2)
Secondary Ion Mass Spectrometry for Particulate Analysis (1978) (2)
Microbeam analysis 1979 : proceedings of the 14th annual conference of the Microbeam Analysis Society San Antonio, Texas, 12-17 August 1979 (1979) (2)
Quantitative X-ray Microanalysis of Low Atomic Number Elements by SEM/SDD-EDS with NIST DTSA II: Carbides and Nitrides and Oxides, Oh My! (2014) (2)
Advanced SEM imaging (1998) (2)
Standard Bundles Simplify Standards-based Quantification in NIST DTSA-II (2017) (2)
Energy Dispersive Spectrometry at Wavelength Precision (2011) (2)
Trace analysis of transition elements and rare earths by parallel EELS (1992) (1)
Milli-X-ray Fluorescence X-Ray Spectrum Imaging: Problem Solving Through Mapping on the Centimeter Scale (2008) (1)
Using the EDS Clues: Peak Fitting Residual Spectrum and Analytical Total (2019) (1)
The f(χ) Machine: An Experimental Bench for the Measurement of Electron Probe Parameters (1991) (1)
Determination of the Number of Molecules Bonded to a CdSe Nanocrystallite Surface (1994) (1)
High Speed Particle Analysis with a Silicon Drift Detector (2006) (1)
Image Contrast and Quality (1990) (1)
Neutron-induced reactions and secondary-ion mass spectrometry: complementary tools for depth profiling. Final report (1982) (1)
Specimen Preparation, Special Techniques, and Applications of the Scanning Electron Microscope (1975) (1)
Rigorous Quantitative SEM/EDS Microanalysis Requires Careful Inspection of the Peak-Fitting Residual Spectrum to Reveal Hidden Constituents (2016) (1)
Quantitative Compositional Mapping on a Micrometer Scale (1988) (1)
Compositional Mapping by X-ray Spectrum Imaging at 1 MHz Output Count Rate with the Silicon Drift Detector (2008) (1)
The Hazard of UV-Induced Oxidation to Solar-Viewing Spacecraft Optics (2023) (1)
Visualizing Low Contrast Compositional Microstructures with SDD-EDS X-ray Spectrum Imaging in the Scanning Electron Microscope (2010) (1)
Microcalorimeter EDS for Low Voltage Microanalysis (2000) (1)
Misidentification of X-ray Peaks by Automatic Peak Identification Procedures: Exploring the Situation for Minor and Trace Elemental Constituents (2006) (1)
Attempting Electron-Excited X-Ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VPSEM) (2018) (1)
Blunders in Automatic Qualitative Analysis (Peak Identification) for Energy Dispersive X-ray Spectrometry: The Low Voltage Microanalysis Situation (2005) (1)
Microcalorimeter EDS: Benefits and Drawbacks (2000) (1)
Comments on “Constant stress creep and constant true strain-rate tensile tests of the superplastic alloy PbSn” (1973) (1)
Characterization of Nanoparticles by Microbeam Analysis and Microscopy (1997) (1)
High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials (2005) (1)
High Precision Multiple Kev X-Ray Analysis: Tests of Ionization Cross Sections and Monte Carlo Algorithms (1997) (1)
“Standardless” Quantitative Analysis by Electron-Excited Energy Dispersive X-Ray Spectrometry: What is its Proper Role? (1998) (1)
Low Beam Energy X-Ray Microanalysis (2018) (1)
Standardless Analysis by Electron-Exited Energy Dispersive X-Ray Spectrometry: What is its Proper Role? | NIST (1998) (1)
Trace Analysis Is Worthless If the Peaks Are Misidentified! (2012) (1)
Secondary ion mass spectrometry (2020) (1)
Extracting Low Energy X-Ray Peaks From EDS and WDS Spectra (1998) (1)
Microcalorimeter EDS with 3 eV Energy Resolution | NIST (1998) (1)
Scanning Transmission Imaging in the SEM (1990) (1)
Compositional Changes in Aluminum-Lithium-Base Alloys Caused by Oxidation (1)
Can X-ray Spectrum Imaging (XSI) Replace Backscattered Electron (BSE) Imaging for Compositional Contrast in the Scanning Electron Microscope? (2009) (1)
Microcalorimeter X-ray Spectrometer with 2 eV Energy Resolution (2000) (1)
A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems (2002) (1)
Monte Carlo electron trajectory simulation of x-ray emission from films supported on substrates (1990) (1)
X-ray Mapping in the Spectrum Image Mode at Output Count Rates above 100 kHz with the Silicon Drift Detector (SDD) (2006) (1)
Is SEM/EDS Quantitative? (2011) (1)
Low-Temperature Specimen Preparation (2003) (1)
Investigation of a Pre - Columbian Vicus Nose Filigree (2006) (1)
Bulk Specimens for SEM and X-Ray Microanalysis (1990) (1)
Role of second-phase particles in the oxidation of Al-Li alloys (1992) (1)
Determining Limits of Detection from Energy Dispersive X-ray Spectra (2003) (1)
Materials Specimen Preparation for SEM and X-Ray Microanalysis (1981) (1)
High Resolution Imaging (2018) (1)
The “Great VPSEM Gotcha”: Great VPSEM Imaging Does Not Imply Great VPSEM X-ray Microanalysis! Degraded Spatial Resolution Is Always Imposed by Gas Scattering (2017) (1)
Application of Standards-Based Quantitative SEM-EDS Analysis to Oxide Minerals (2016) (1)
Qualitative Elemental Analysis by Energy Dispersive X-Ray Spectrometry (2018) (1)
SEM Image Interpretation (2018) (1)
Electron Probe Microanalysis ( EPMA ) (1998) (1)
Wavelength-Dispersive X-Ray Spectrometry and Microanalysis (1990) (1)
Peak Shifts in the NIST Microcalorimeter X-ray Detector (2004) (1)
Comprehensive Quantitative Elemental Microanalysis with Electron-Excited Energy Dispersive X-ray Spectrometry (EDS): 50 Years Young and Getting Better Every Day! (2018) (0)
Chuck Fiori 1938-1992: In Memoriam (1992) (0)
Parallel Monte Carlo Simulation Using Desktop Computers (1999) (0)
Electron Beam Parameters (1990) (0)
Spectral Simulation With Nist-Nih Desktop Spectrum Analyzer (Dtsa): A Critical Tool for Estimating Limits of Detection (2000) (0)
A Remembrance of David C. Joy, a True Microscopy and Microanalysis Pioneer (2022) (0)
Electron Probe Microanalysis of C-N Films using the NIST FFAST Mass Absorption Coefficients (2007) (0)
He Ion Induced Secondary Electron and Backscattered Electron Images Compared Side-by-side With Electron Beam Induced Secondary Electron, Backscattered, and Transmission Electron Images (2008) (0)
Characterization of Colloidal Material Fom Natural and Engineered Waters Investigating Structure-Function Relationships Through Microanalysis | NIST (2004) (0)
Electrons, X-rays and Archaeometallurgy (2005) (0)
Tweezergate: A Cautionary Tale about Sample Preparation (2011) (0)
Ion microscope and microprobe studies of surfaces and interfaces (1993) (0)
Chuck Fiori (1938–1992): A tribute (1993) (0)
High-Resolution SEM Imaging (1990) (0)
Using DTSA-II Tools for Electron-Excited X-ray Microanalysis of Thin Films (2021) (0)
Report from the NIST-MAS-AMAS Roadmap Workshop on Variable Pressure Scanning Electron Microscopy/Environmental Scanning Electron Microscopy (2006) (0)
High-Energy-Resolution Microcalorimeter Spectrometer for EDS X-ray Micro Analysis (1997) (0)
Hyperspectral Analysis of Portland Cement Concrete Using the Silicon Drift Detector (2007) (0)
Analysis of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry (2016) (0)
Light Element Microanalysis (1990) (0)
ELECTRON MICROSCOPY AT THE LIQUID FRONTIER: APPLICATION OF ENVIRONMENTAL SEM (ESEM) TO THE STUDY OF COMPLEX FLUIDS & SOFT CONDENSED MATTER (2000) (0)
Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles (2018) (0)
Oxidation of Metals , Vol . 37 , Nos . 1 / 2 , 1992 Role of Second-Phase Particles in the Oxidation of A 1-Li Alloys (0)
Specialist workshop on energy dispersive X-ray spectrometry National Bureau of Standards – April 23–25, 1979 (1980) (0)
Front Matter: Volume 9236 (2014) (0)
Advances in Energy Dispersive X-ray Spectrometry: The Impact of Silicon Drift Detectors (SDD) on the Characterization of Nanostructures and Nanomaterials (2007) (0)
Microanalysis to nanoanalysis: analytical techniques for chemical characterization of micrometer- to nanometer-scale structures (1995) (0)
Quantitative Metrics for Classifying Candidate Gun-Shot Residue Particles (2016) (0)
Rapid X-ray Spectrum Imaging with the Silicon Drift Detector (SDD): Microstructural Characterization with NIST Lispix (2007) (0)
Microstructural Studies of Multiphase (Zr,Ti)(V,Cr,Mn,Co,Ni) 2 Alloys for NiMH Negative Electrodes (2011) (0)
Low Energy X-Ray Detection with a Silicon Multi-Cathode Detector for Microanalysis (2006) (0)
SEM Imaging Checklist (2018) (0)
Solving the Micro to Macro Problem: A New Application for Milli X-ray Fluorescence X-ray Spectrum Imaging (2009) (0)
Front Matter: Volume 7729 (2010) (0)
Predicting Visibility in Elemental Maps Derived from X-ray Spectrum Images (2008) (0)
Quantitative Wavelength-Dispersive X-Ray Microanalysis (1990) (0)
Spectrum Image Mapping with a Silicon Drift Detector (SDD) in an SEM (2004) (0)
Proposal: Let's Develop a Community Consensus K-ratio Database (2020) (0)
The role of standards in electron microprobe technique (1986) (0)
Preface for special issue of Surface and Interface Analysis with the proceedings of the NIST workshop on ‘Modeling electron transport for applications in electron and X‐ray analysis and metrology’ (2005) (0)
Introduction: 40 Years of EDS (2009) (0)
Preparation of Biological Samples for X-Ray Microanalysis (1981) (0)
Compton Scattering in Electron Excited Energy Dispersive X-ray Spectra (2010) (0)
Compositional Mapping by Scanning Electron Microscopy With Energy Dispersive X-Ray Spectrometry: Recognizing Facts and Artifacts (1998) (0)
Determination of the depth distribution of x-ray generation, phi (rho z), for tilted specimens of Au in the analytical electron microscope (1983) (0)
Specimen Preparation for Inorganic Materials: Microstructural and Microchemical Analysis (1992) (0)
X-Ray Peak and Background Measurements (1992) (0)
Uncertainty Is Our Friend-Rethinking Microanalysis Around Uncertainty Metrics (2016) (0)
Energy-Dispersive X-Ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra (2022) (0)
Magnetic Domain Studies in Iron‐3 1/4 Weight Percent Silicon Transformer Sheet Using the Scanning Electron Microscope (1974) (0)
Quantitative Electron-Excited X-ray Microanalysis at Low Beam Energy (2015) (0)
Ambient-Temperature Specimen Preparation of Biological Material (2003) (0)
Out of the crystal maze: Chapters from the history of solid-state physics By Lillian Hoddeson, Ernest Braun, Jürgen Teichman, and Spencer Weart Oxford University Press, New York (1992) ISBN: 0-19-505329-X; 697 pages, illustrated, $75.00 (1993) (0)
C-4 Improving Energy Stability in the NIST Microcalorimeter X-ray Detector (2004) (0)
Low Beam Energy SEM (2018) (0)
Castaing’s Electron Microprobe and its Impact on Materials Science (1999) (0)
Investigation of Interfaces in a Ni/Cr Multilayer Film with Secondary Ion Mass Spectrometry (1986) (0)
Low-Vacuum SEM / ESEM in Materials Science : Wet SEM { The Liquid Frontier of Microscopy (2000) (0)
Electron-excited energy dispersive x-ray spectrometry in the variable pressure scanning electron microscope (EDS/VPSEM): it's not microanalysis anymore! (2015) (0)
Microcalorimeter Energy Dispersive X-ray Spectrometer for Low Voltage Microanalysis | NIST (2000) (0)
Computer-Aided Imaging (1990) (0)
SEM Case Studies (2018) (0)
Low voltage microanalysis using microcalorimeter EDS (2001) (0)
Energy Dispersive X-ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra (2022) (0)
CRYOGENICMICROCALORIMETERS FOR (1999) (0)
NeXL: A Platform for Innovation in Microanalysis (2021) (0)
Basic literacy in electron-excited x-ray microanalysis (1993) (0)
Particle and Rough Surface Microanalysis (1990) (0)
Castaing's Electron Microprobe and its Impact On Materials Science (2000) (0)
'High Resolution' Is Often Sought in SEM Imaging, But Establishing Visibility May Be the Challenge: Always Ask "What Might I Be Missing?" (2018) (0)
Special Issue Scanning (2011) (0)
Electron and ion microscopy and microanalysis principles and applications, 2nd ed., revised and expanded by Lawrence E. Murr Marcel Dekker, New York (1991) ISBN 08247 8556‐8; 837 pages + xiv price: $195.00 (1992) (0)
Front Matter: Volume 7378 (2009) (0)
Boron Substrates for the X-Ray Microanalysis of Particles (1999) (0)
Focused Ion Beam Applications in the SEM Laboratory (2018) (0)
Synthesis and Characterization of Fe-Co Alloy Nanoparticles (1998) (0)
Energy Dispersive X-Ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis | NIST (1999) (0)
Front Matter: Volume 8729 (2013) (0)
Improving the Accuracy of Particle Analysis (2000) (0)
Quantitative Electron-Excited X-ray Microanalysis With Low-Energy L-shell X-ray Peaks Measured With Energy-Dispersive Spectrometry (2021) (0)
The Journal of Microscopy would like to thank all those referees who reviewed papers for the Journal during 2011. Your assistance and contribution to the Journal is greatly appreciated. (2011) (0)
Use of an Automated SEM to Detect Laboratory Contamination (2013) (0)
The Journal of Microscopy would like to thank all those referees who reviewed papers for the Journal during 2014. Your assistance and contribution to the Journal is greatly appreciated. (2014) (0)
Microanalysis: What Is It, Where Did It Come From, and Where Is It Going? (2017) (0)
Energy Dispersive X-ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis (1999) (0)
Basic SEM Imaging (1990) (0)
"Maximum Channel Spectrum": An Intuitive Software Tool for Detecting and Recovering Rare Features in Spectrum Image Datacubes (2004) (0)
High Resolution Micro-calorimeter Arrays for Micro-probe Analysis (2005) (0)
Parallel Monte Carlo Simulation Using Desktop Computers (1999) (0)
Simulating electron-excited energy dispersive X-ray spectra with the NIST DTSA-II open-source software platform. (2022) (0)
Scanning Microscopy 2010 (2010) (0)
A Silicon Multi-Cathode Detector For Microanalysis Applications (2003) (0)
Elemental Mapping with SDD-EDS: Solving the Hard Problems (2011) (0)
Front Matter: Volume 8036 (2011) (0)
Voltage Contrast and EBIC (1990) (0)
Application of the SEM and EPMA to Solid Samples and Biological Materials (1981) (0)
Thin Specimens for TEM and AEM (1990) (0)
High Speed Spectrum Imaging of Raney Nickel Alloy Using a Large Area Silicon Multi-Cathode Detector (Vortex-EM) and Event Streaming Technique (2006) (0)
X-Ray Mapping with Energy-Dispersive and Wavelength-Dispersive X-Ray Spectrometry in the Scanning Electron Microscope: a Tutorial (1999) (0)
Development of a Spectral Database for Testing Quantitative Electron Probe Microanalysis of Rough, Bulk Samples (2000) (0)
F17 Boron X-ray detection with a silicon multi-cathode detector (2006) (0)
Part II of the special issue on environmental scanning electron microscopy (2006) (0)
Quantitative Electron Probe Microanalysis of Si-Ge Reference Materials (2005) (0)
Scanning Microscopies 2015 (2015) (0)
DTSA-II EDS Software (2018) (0)
SE Signal Components (1990) (0)
Ion Imaging In Secondary Ion Mass Spectrometry (1977) (0)
Ion Beam Microscopy (2018) (0)
Report from the NIST-MAS Workshop on “The Accuracy Barrier in Quantitative EPMA and the Role of Standards” (2003) (0)
Trace Analysis of Nanoscale Materials by Analytical Electron Microscopy (1994) (0)

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