David C. Joy
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Physics
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(Suggest an Edit or Addition)David C. Joy's Published Works
Number of citations in a given year to any of this author's works
Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author
Published Works
- Scanning Electron Microscopy and X-Ray Microanalysis (2017) (987)
- Introduction to analytical electron microscopy (1979) (772)
- Monte Carlo Modeling for Electron Microscopy and Microanalysis (1995) (505)
- An empirical stopping power relationship for low‐energy electrons (1989) (427)
- Principles of Analytical Electron Microscopy (1986) (333)
- Introduction to electron holography (1999) (329)
- Electron channeling patterns in the scanning electron microscope (1982) (309)
- Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000 (2007) (309)
- Advanced Scanning Electron Microscopy and X-Ray Microanalysis (1986) (306)
- Silver nanocrystallites: biofabrication using Shewanella oneidensis, and an evaluation of their comparative toxicity on gram-negative and gram-positive bacteria. (2010) (289)
- Effects of Engineered Cerium Oxide Nanoparticles on Bacterial Growth and Viability (2010) (289)
- Ion‐beam‐deposited polycrystalline diamondlike films (1976) (278)
- A new examination of secondary electron yield data (2005) (245)
- Biofabrication of discrete spherical gold nanoparticles using the metal-reducing bacterium Shewanella oneidensis. (2011) (228)
- Calculations of Mott scattering cross section (1990) (228)
- A database on electron‐solid interactions (2006) (188)
- Fouling mechanisms of membranes during protein ultrafiltration (1992) (179)
- Low Voltage Scanning Electron Microscopy (1996) (166)
- EXAFS Spectroscopy: Techniques and Applications (1981) (157)
- Fundamentals of Scanning Electron Microscopy (SEM) (2006) (154)
- A model for calculating secondary and backscattered electron yields (1987) (153)
- Surface characterization and functionalization of carbon nanofibers (2008) (142)
- A model of secondary electron imaging in the helium ion scanning microscope. (2009) (135)
- CASINO: A new monte Carlo code in C language for electron beam interactions—part III: Stopping power at low energies (1997) (120)
- High-resolution scanning electron microscopy. (1989) (109)
- SMART – a program to measure SEM resolution and imaging performance (2002) (99)
- SEM Microcharacterization of Semiconductors (1986) (97)
- Nanoscale Imaging of Whole Cells Using a Liquid Enclosure and a Scanning Transmission Electron Microscope (2009) (95)
- An introduction to Monte Carlo simulations (1991) (94)
- Beam interactions, contrast and resolution in the SEM (1984) (90)
- Empirical forms for the electron/atom elastic scattering cross sections from 0 (1994) (88)
- Electron holographic study of ferroelectric domain walls (1992) (72)
- Limiting factors in sub- 10 nm scanning-electron-beam lithography (2009) (72)
- Low-voltage scanning electron microscopy of polymers (1986) (70)
- Controlling resist thickness and etch depth for fabrication of 3D structures in electron-beam grayscale lithography (2007) (69)
- Direct observation of magnetic domains by scanning electron microscopy (1968) (67)
- Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams (2016) (66)
- Metrics of resolution and performance for CD-SEMs (2000) (65)
- A new method of observing magnetic domains by scanning electron microscopy I. Theory of the image contrast (1973) (65)
- Submicrometer Microelectronics Dimensional Metrology: Scanning Electron Microscopy (1987) (64)
- Helium Ion Microscopy: Principles and Applications (2013) (64)
- Control of charging in low-voltage SEM (1989) (63)
- Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy (1990) (62)
- Experimental secondary electron spectra under SEM conditions (2004) (59)
- Special Topics in Scanning Electron Microscopy (2003) (54)
- Experimental determinations of electron stopping power at low energies (1991) (53)
- The theory and practice of high resolution scanning electron microscopy (1991) (52)
- The formation and interpretation of defect images from crystalline materials in a scanning transmission electron microscope. (1976) (51)
- A surfactant and template-free route for synthesizing ceria nanocrystals with tunable morphologies (2010) (51)
- Energy Dispersive X-Ray Spectrometry (1981) (48)
- Fluorinated molecule as a tracer: difluoroserotonin in human platelets mapped by electron energy-loss spectroscopy. (1978) (47)
- Secondary electron imaging in the variable pressure scanning electron microscope (1998) (47)
- Structure of the Ionomer Film in Catalyst Layers of Proton Exchange Membrane Fuel Cells (2013) (47)
- A new method of observing magnetic domains by scanning electron microscopy. II. Experimental confirmation of the theory of image contrast (1974) (47)
- Condensed phase growth of single-wall carbon nanotubes from laser annealed nanoparticulates (2001) (47)
- Calibration of atomic force microscope tips using biomolecules (1992) (47)
- Contrast in high‐resolution scanning electron microscope images (1991) (46)
- Electron-Beam-Specimen Interactions (1975) (45)
- Measuring the performance of scanning electron microscope detectors. (2006) (45)
- Introduction to the Scanning Electron Microscope (2003) (44)
- Nanoscale electron-beam-stimulated processing (2003) (44)
- Fundamentals of Scanning Electron Microscopy (2007) (43)
- Monte Carlo simulation of focused helium ion beam induced deposition (2010) (42)
- Maskless Lithography and in situ Visualization of Conductivity of Graphene using Helium Ion Microscopy (2015) (40)
- The spatial resolution limit of electron lithography (1983) (40)
- Resolution in low voltage scanning electron microscopy (1985) (38)
- Diverse and conserved nano‐ and mesoscale structures of diatom silica revealed by atomic force microscopy (2009) (38)
- THE BASIC PRINCIPLES OF ELECTRON ENERGY LOSS SPECTROSCOPY (1979) (38)
- Design and optimization of directly heated LaB6 cathode assemblies for electron‐beam instruments (1978) (36)
- Low Voltage Scanning Electron Microscopy (2002) (36)
- Electron energy loss spectroscopy: Detectable limits for elemental analysis (1980) (36)
- Magnetic domain contrast from cubic materials in the scanning electron microscope (1973) (33)
- Low work function electron emitter hexaborides (1978) (32)
- A crystallographic study of massive precipitates in Cu-Zn and Ag-Zn alloys utilizing selected area electron channelling (1972) (32)
- Scanning electron microscope imaging in liquids – some data on electron interactions in water (2006) (31)
- Electron beam pattern generation in thin‐film organic dianhydrides (1982) (30)
- The quantitation of electron energy loss spectra (1981) (30)
- Ferromagnetic domain structure of metallic glasses (1975) (29)
- Single- and Few-Chain Polystyrene Particles by Electrospray† (1997) (28)
- Initial lithography results from the digital electrostatic e-beam array lithography concept (2004) (28)
- Scanning electron microscope study of the magnetic domain structure of cobalt single crystals (1969) (27)
- Pressure effect of growing with electron beam-induced deposition with tungsten hexafluoride and tetraethylorthosilicate precursor. (2007) (26)
- Technique to automatically measure electron-beam diameter and astigmatism: BEAMETR (2006) (26)
- Electron-Specimen Interactions (1992) (26)
- The SEM and Its Modes of Operation (2003) (25)
- EXPERIMENTAL MEASUREMENTS OF ELECTRON STOPPING POWER AT LOW ENERGIES (1996) (24)
- Low Energy Electron/Atom Elastic Scattering Cross Sections from 0.1-30 keV (2006) (24)
- High resolution SE-I SEM study of enamel crystal morphology. (1990) (24)
- Scanning electron microscopy for materials characterization (1997) (24)
- Scanning electron microscope selected area channelling patterns from 1 micron specimen areas (1972) (24)
- Nanoscale Science, Engineering and Technology Research Directions (1999) (23)
- The functional form of energy‐differential cross sections for carbon using transmission electron energy‐loss spectroscopy (1979) (23)
- Diffraction Imaging in a He+ Ion Beam Scanning Transmission Microscope (2010) (23)
- A transmission stage for the scanning electron microscope (1972) (23)
- Is Microanalysis Possible in the Helium Ion Microscope? (2011) (22)
- Post‐Growth Annealing Treatments of Epitaxial CaF2 on Si(100) (1986) (22)
- Practical aspects of electron holography (1993) (22)
- Dynamic Charging in the Low Voltage SEM (1995) (22)
- Nanoparticle adhesion in proton exchange membrane fuel cell electrodes (2013) (22)
- Scanning electron microscopy: Second best no more. (2009) (22)
- Quantitative X-Ray Analysis: The Basics (1992) (22)
- The energy dispersive x‐ray detector: A quantitative model (1985) (22)
- Backscattered Electron Imaging (1990) (22)
- The choice of operating parameters for microanalysis by electron energy-loss spectroscopy (1978) (21)
- The early history and future of the SEM (2006) (21)
- A practical electron spectrometer for chemical analysis (1978) (21)
- X-Ray Microanalysis Case Studies (2018) (21)
- Graphene engineering by neon ion beams (2016) (20)
- Adhesion of spores of Bacillus thuringiensis on a planar surface. (2010) (20)
- Electron holography techniques for study of ferroelectric domain walls (1993) (20)
- Effects of molecular entanglements during electrospray of high molecular weight polymers (1998) (20)
- Electron Channeling Contrast in the SEM (1986) (19)
- The crystallization of vitreous and metastable Pb5Ge3O11 (1977) (19)
- THE ROLE OF FAST SECONDARY ELECTRONS IN DEGRADING SPATIAL RESOLUTION IN THE ANALYTICAL ELECTRON MICROSCOPE (1982) (19)
- Experimental resolution measurement in critical dimension scanning electron microscope metrology. (2003) (19)
- Anisotropy of thermionic electron emission values for LaB6 single‐crystal emitter cathodes (1976) (19)
- Study of temperature influence on electron beam induced deposition (2006) (19)
- Generation of X-Rays in the SEM Specimen (2003) (19)
- Band positions used for on-line crystallographic orientation determination from electron back scattering patterns. Discussion (1991) (19)
- Quantitative X-Ray Microanalysis (1981) (19)
- The interpretation of EBIC images using Monte Carlo simulations (1986) (18)
- Fast Monte Carlo method for simulating electron scattering in solids (1989) (18)
- Noise and Its Effects on the Low-Voltage SEM (2008) (17)
- Coating and Conductivity Techniques for SEM and Microanalysis (1992) (17)
- Holography of electrostatic fields (1995) (17)
- Relevance of electron channeling patterns to embrittlement studies (1974) (17)
- STEM Imaging of Lattice Fringes and beyond in a UHR In-Lens Field-Emission SEM (2007) (16)
- Energy loss spectroscopy in materials science (1983) (16)
- Trapping of oxygen at homoepitaxial Si‐Si interfaces (1986) (15)
- Inner-Shell Electron Spectroscopy for Microanalysis (1979) (15)
- Simultaneous display of micrograph and selected-area channelling pattern using the scanning electron microscope (1971) (15)
- Monte Carlo simulation of CL and EBIC contrasts for isolated dislocations (1990) (15)
- Effect of electron beam-induced deposition and etching under bias. (2007) (15)
- Fundamental Constants for Quantitative X-Ray Microanalysis (2001) (14)
- Reduced Subboundary Misalignment in SOI Films Scanned at Low Velocities (1985) (14)
- Low Voltage Electron Beam Lithography in PMMA (2005) (14)
- Structure of single‐molecule single crystals of isotactic polystyrene and their radiation resistance (1998) (14)
- Impact of oxidation on nanoparticle adhesion to carbon substrates (2013) (14)
- The observation of crystalline materials in the scanning electron microscope (SEM) (1975) (14)
- Computation of polar angle of collisions from partial elastic mott cross-sections (2008) (14)
- Microelectronics Dimensional Metrology in the Scanning Electron Microscope, Part II (1986) (14)
- Improved Crystal Perfection in Zone-Recrystallized Si Films on Sio 2 (1984) (14)
- Some issues in SEM-based metrology (1998) (14)
- Evaluating SEM performance from the contrast transfer function (2010) (13)
- Challenges in Achieving High Resolution at Low Voltages in the SEM (2009) (13)
- Microcalorimeter Detectors and Low Voltage SEM Microanalysis (2004) (13)
- Effects of fast secondary electrons to low-voltage electron beam lithography (2007) (13)
- A study of electron beam-induced conductivity in resists. (2006) (13)
- Future of e-beam metrology: obstacles and opportunities (2002) (12)
- Factors affecting resolution in scanning electron beam induced patterning of surface adsorption layers (1998) (12)
- Domain wall image contrast in the SEM (1976) (12)
- Qualitative X-Ray Analysis (1992) (12)
- Scanning Electron Microscopy (2006) (12)
- The nature of defocus fringes in scanning‐transmission electron microscope images (1976) (11)
- Biological serial block face scanning electron microscopy at improved z-resolution based on Monte Carlo model (2018) (11)
- X-Ray Spectral Measurement: WDS and EDS (1981) (11)
- Electron energy-loss spectroscopy (1980) (11)
- Polarization Control via He-Ion Beam Induced Nanofabrication in Layered Ferroelectric Semiconductors. (2016) (11)
- Scanning Transmission Electron Microscopy of Biological Specimens in Water (2007) (11)
- Electron channelling patterns from ferromagnetic crystals in the scanning electron microscope (1969) (11)
- The Aberration Corrected SEM (2008) (10)
- Do SE(II) electrons really degrade SEM image quality? (2013) (10)
- Image Formation and Interpretation (1992) (10)
- Defect Characterization Using SEM–CCM Relative Contrast Measurements (1984) (10)
- Electron Energy Loss Spectrometry (1990) (10)
- Deconvolution for ELS quantitation (1982) (10)
- Determination of UTW kXSi factors for seven elements from oxygen to iron (1984) (10)
- Quantitative X-Ray Analysis: Theory and Practice (1992) (9)
- Tensile testing of strain-rate-sensative materials at constant imposed strain rate (1970) (9)
- On the production of X-rays by low energy ion beams. (2007) (9)
- Imaging thin and thick sections of biological tissue with the secondary electron detector in a field-emission scanning electron microscope. (2006) (9)
- Protons, ions, electrons and the future of the SEM (2010) (9)
- Limits of SEM Resolution (1996) (9)
- Measurements of absolute x-ray generation efficiency for selected K, L, and M-lines. (2003) (9)
- Quantitative measurements of charging in a gaseous environment. (2006) (9)
- Relative lattice parameter measurement of submicron quaternary (InGaAsP) device structures grown on InP substrates (1987) (9)
- Is SEM Noise Gaussian? (2003) (9)
- Magnetic Contrast in the SEM (1986) (9)
- Monte Carlo model of charging in resists in e-beam lithography (2000) (9)
- Quantitative Energy-Dispersive X-Ray Microanalysis (1990) (9)
- A method to measure the effective gas path length in the environmental or variable pressure scanning electron microscope. (2002) (8)
- Modeling the electron-gas interaction in low-vacuum SEMS (1996) (8)
- Fast Fourier Transform Techniques for Measuring SEM Resolution (1990) (8)
- Two-dimensional dopant profiling of ultrashallow junctions by electron holography (2002) (8)
- Polarization Control via He-ion Beam Induced Nanofabrication in Layered Ferroelectric Semiconductors (2016) (8)
- Fabrication of a Fresnel zone plate through electron beam lithographic process and its application to measuring of critical dimension scanning electron microscope performance (2007) (8)
- Chemical and instrumental analysis of ferrites. (1983) (7)
- Scanning reflection electron micrographs of stacking faults in a Co‐4wt% Ti alloy (1974) (7)
- Low Voltage Scanning Electron Microscopy | NIST (2001) (7)
- A Comparison of a Luminescence-based VPSE and an Electron-based GSED for SE and CL Imaging in Variable Pressure SEM with Conventional SE imaging (2010) (7)
- Modeling the Energy Dispersive X-Ray Detector (1995) (7)
- Tools to measure CD-SEM performance (2006) (7)
- Improving the Structural and Electrical Properties of Epitaxial CaF2 on Si By Rapid Thermal Anneaing (1985) (7)
- SCANNING Celebrates 30 Years (2008) (7)
- Damage mechanisms and fiber orientation effects on the load-bearing capabilities of a NEXTEL/BLACKGLAS low-cost ceramic composite (2000) (7)
- Building with ions: towards direct write of platinum nanostructures using in situ liquid cell helium ion microscopy. (2017) (7)
- An experimental model of beam broadening in the variable pressure scanning electron microscope. (2005) (7)
- The Basic Principles of Eels (1986) (6)
- Device metrology with high-performance scanning ion beams (2007) (6)
- The Structure of Sputtered Superconducting Nb3Ge Films Revealed By X-Ray Diffraction, Transmission Electron Diffraction, and by Tunneling (1976) (6)
- Improved Accuracy For SEM Linewidth Measurements (1987) (6)
- Characterization of hydrogen responsive nanoporous palladium films synthesized via a spontaneous galvanic displacement reaction (2012) (6)
- Thermal Stress During Zone-Melting-Recrystallization of Silicon on Insulator Films: The Origin of Subboundaries and In-Plane Orientation of SOI (1985) (6)
- Overview of CD‐SEM — and beyond (2003) (6)
- Practical Techniques of X-Ray Analysis (1981) (6)
- Use of sample bias voltage for low-energy high-resolution imaging in the SEM. (2010) (6)
- Special Topics in Electron Beam X-Ray Microanalysis (2003) (6)
- Low Voltage Scanning Electron Microscopy - Current Status, Present Problems, and Future Solutions - (2006) (6)
- Procedures for Elimination of Charging in Nonconducting Specimens (2003) (6)
- Nanofabrication by direct epitaxial growth (1998) (6)
- Modeling for metrology with a helium beam (2008) (6)
- Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences (2011) (6)
- Convergent Beam Electron Diffraction (1990) (6)
- Microcomputer control of a stem (1982) (6)
- Automatic measurement of electron-beam diameter and astigmatism: BEAMETR (2008) (5)
- Holographic voltage profiling on 75 nm gate architecture CMOS devices. (2003) (5)
- Computer modeling of charging-induced electron beam deflection in electron beam lithography (2000) (5)
- Miniature Scanning Electron Microscope for In-Situ Planetary Studies: Electron Gun Development (2009) (5)
- Modeling ion-solid interactions for imaging applications (2014) (5)
- A monte carlo study of the position of phase boundaries in backscattered electron images (2006) (5)
- Computer-Aided Imaging and Interpretation (1986) (5)
- Modeling Electron Beam-Specimen Interactions (1986) (5)
- The rotation between selected area channelling patterns and micrographs in the SEM (1975) (5)
- Ultralow-energy imaging for metrology (1998) (5)
- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters (2018) (5)
- Multi-Beam Ion Microscopy (2012) (5)
- Energy-Dispersive X-Ray Microanalysis (1990) (5)
- Electron Channeling Contrast (1990) (5)
- Calculation of secondary electron production using a diffusion matrix (1991) (4)
- SEM for the 21st Century: Scanning Ion Microscopy (2012) (4)
- Parametrization of The Range of Electron At Low Energy (Eo < 10 Kev) Using The Casino Monte Carlo Program (1997) (4)
- Trace Element Microanalysis (1990) (4)
- Electron channeling patterns (1977) (4)
- X-ray Quantitative Microanalysis with an Annular Silicon Drift Detector (2013) (4)
- On the Measurement of Total Elastic Cross-sections in the ESEM or VPSEM Using X-Ray Microanalysis (2000) (4)
- Fluorescence yields: a new parameterization (2007) (4)
- Nanotip electron gun for the scanning electron microscope. (2006) (4)
- Variable Pressure Scanning Electron Microscopy (VPSEM) (2018) (4)
- Coating Techniques for SEM and Microanalysis (1981) (4)
- Advances in Specimen Preparation for Biological SEM (1986) (4)
- Feasibility Study for High Energy SEM‐Based Reference Measurement System for Litho Metrology (2005) (4)
- Quantitative Microanalysis Using EELS (1986) (4)
- Applications of image diagnostics to metrology quality assurance and process control (2003) (4)
- Resin Based Standards for Biological Energy Dispersive X-Ray and Electron Energy Loss Microanalysis (1989) (4)
- Electron beam induced radiation damage in the catalyst layer of a proton exchange membrane fuel cell. (2014) (4)
- Characteristics of Secondary Electron Images From In-lens and Conventional Everhart-Thornley Detectors - Evidence for the Energy-based Differentiation of High Resolution SE1 and Delocalized SE2 Signals (2009) (4)
- Choosing a Beam-Electrons,Protons, He or Ga ions? (2009) (4)
- Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials (1992) (4)
- Variation of Rutherford Backscattered Ion and Ion-induced Secondary Electron Yield with Atomic Number in the “Orion” Scanning Helium Ion Microscope (2008) (3)
- Characterizing Crystalline Materials in the SEM (2018) (3)
- Trace Analysis by SEM/EDS (2018) (3)
- Measurement of total gas scattering cross‐section (2006) (3)
- Electron Beam—Specimen Interactions: Interaction Volume (2018) (3)
- Critical-Voltage Effects in Electron-Channeling Patterns (1980) (3)
- SE and BSE Information from CNT Containing Fe at Various Accelerating Voltages (2004) (3)
- A parametric partial cross section for ELS (1984) (3)
- Energy Dispersive X-Ray Microanalysis Checklist (2018) (3)
- The Contrast Transfer Function of the SEM (2007) (3)
- Monte Carlo model of charging in resists in e-beam lithography (2001) (3)
- Electron-beam focusing characteristics of double-gated carbon nanofiber based field emission sources (2007) (3)
- A new high‐speed simulation method for electron‐beam critical dimension metrology profile modeling (1991) (3)
- Secondary-electron image profiles using bias voltage technique in deep contact hole (2001) (3)
- Secondary Electron Generation by Low Energy Ion Beams (2006) (3)
- Scanning electron microscopy: Present capability, future improvements and potential replacements (2001) (3)
- The Visibility of Features in SEM Images (2018) (3)
- Secondary electron spectroscopy for microanalysis and defect review (1999) (3)
- Low-voltage-point source microscope for interferometry (2002) (3)
- Fabrication of Au/p‐Si Schottky barrier for EBIC study (1994) (3)
- In Situ Localization of Ribonucleic Acids in Biological Specimens by Electron Energy Loss Spectroscopya (1986) (2)
- Convolution and correlation: a case study of scanning imaging and analysis systems. (2006) (2)
- Specimen Preparation of Hard Materials: Metals, Ceramics, Rocks, Minerals, Microelectronic and Packaged Devices, Particles, and Fibers (2003) (2)
- Advanced SEM imaging (1998) (2)
- A PRACTICAL ELECTRON ENERGY LOSS SPECTROMETER (1979) (2)
- Selective Electron Beam Erosion and Deposition of Materials (2005) (2)
- A novel technique for visualizing electron beam induced charging. (2006) (2)
- Optimization of Electron Optics for Low Voltage Scanning Electron Microscopy (1992) (2)
- Quantitative Analysis: The SEM/EDS Elemental Microanalysis k-ratio Procedure for Bulk Specimens, Step-by-Step (2018) (2)
- Sub-Surface Serial Block Face SEM of Biological Structures at Near Isotropic Spatial Resolution (2017) (2)
- Specimen Preparation of Polymer Materials (2003) (2)
- Improving Matrix Corrections (2002) (2)
- A Novel Technique for Visualizing Electron Beam Induced Charging (2003) (2)
- Preparation of Biological Samples for Scanning Electron Microscopy (1981) (2)
- Transmission and Reflection Holography at Low Energies (2004) (2)
- Measurements of electron channeling pattern linewidths in silicon (1979) (2)
- A Study of Helium ion induced Secondary Electron Emission (2008) (2)
- The Introduction and Application of a Selective Directional Capability of the Image Contrast Transfer Function in the ImageJ ``SMARTeR'' Package (2010) (2)
- Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films (2008) (2)
- Quantitative Analysis: From k-ratio to Composition (2018) (2)
- The scanning transmission electron microscope: a micro—area analytical system (1977) (2)
- Introduction to Helium Ion Microscopy (2013) (2)
- Orion NanoFab - 2nd Generation Helium Ion Microscope (2013) (2)
- Nanoindentation Results from Direct Molded vs. Machined UHMWPE Tibial Bearings (1999) (2)
- Soft electron beam etching for precision TEM sample preparation (2003) (2)
- Secondary Electron Yield at High Voltages up to 300 keV (2015) (2)
- A simple specimen holder for EBIC imaging on the Hitachi S800 (1993) (2)
- Two-dimensional dopant profiling of ultrashallow junction with off-axis electron holography: A round robin experiment (2004) (2)
- Mac X‐ray: The NIST ‘DTSA’ program and the 4pi analysis board (1992) (2)
- Electron holography of P-N junctions (1996) (2)
- Identification of Cleavage Planes in an Al 3 Ti-Base Alloy by Electron Channeling in the SEM (1988) (2)
- Alternative Microanalytical Techniques (1986) (2)
- System considerations for maskless lithography (2004) (2)
- Ultra-Low Voltage Scanning Electron Microscopy (1996) (2)
- Scanning Electron Microscope (SEM) Instrumentation (2018) (2)
- X-Ray Microanalysis in the AEM (1990) (2)
- ImageJ and Fiji (2018) (2)
- High Resolution Imaging and X-Ray Microanalysis at High Count Rate: The Supreme Achievement in Materials Characterization (2013) (2)
- Lattice parameter measurement of sub-micron device structures in compound semiconductors via convergent-beam electron diffraction (1987) (2)
- Initial results with a point projection microscope (2001) (1)
- Separation and characterization of single-chain polymer particles (1996) (1)
- Electron Time of Transit Spectroscopy for Analysis and Imaging (2005) (1)
- Deconvolution of Closely Spaced Spectral Features with a Microcalorimeter EDS (2005) (1)
- Calibration and Test Structures for Nanometrology (2006) (1)
- Wavelength-Dispersive X-Ray Spectrometry and Microanalysis (1990) (1)
- Resolution in the low-voltage SEM (1984) (1)
- Relative Lattice Parameter Measurement in Quaternary (InGaAsP) Layers on InP Substrates Using Convergent Beam Electron Diffraction (1986) (1)
- Microanalysis using secondary electrons in scanning electron microscopy. (2006) (1)
- Secondary Electron Imaging - Doing it Better (2011) (1)
- Low Voltage Nanotip Interferometry (2002) (1)
- Evidence for the Gaussian Scttering of Electrons in a Gas (2006) (1)
- The Aberration-corrected SEM - the Ultimate Accessory? (2004) (1)
- Scanning Surface Potential Microscopy of Spores on Planar Surfaces (2009) (1)
- Texture and Stability and the Effect of the Sample on Thin Metal Film Coatings for High Resolution and Low Voltage SEM (2007) (1)
- Low vacuum microscopy for mask metrology (2004) (1)
- Measurement of Elastic Cross-Sections for Gases (2002) (1)
- Attempting Electron-Excited X-Ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VPSEM) (2018) (1)
- Practical Materials Microanalysis by Electron Spectrometry (1977) (1)
- Scanning Transmission Imaging in the SEM (1990) (1)
- Electron Beam Induced Current Studies of Nickel Silicide/Silicon Schottky Barrier Heights (1985) (1)
- Damage mechanisms and fiber orientation effects on the load-bearing capabilities of a NEXTEL/BLACKGLAS low-cost ceramic composite (2000) (1)
- Low-Temperature Specimen Preparation (2003) (1)
- Study of ferroelectric domain wall structures using electron holographic techniques (1994) (1)
- A formula to explain electron backscattering in solids (1995) (1)
- Bulk Specimens for SEM and X-Ray Microanalysis (1990) (1)
- Monte Carlo Modeling of Ion Beam Induced Secondary Electrons (2014) (1)
- Variations in Peak Position and Energy Resolution for a Microcalorimeter EDS by Temporal X-ray Spectroscopy (2006) (1)
- Materials Specimen Preparation for SEM and X-Ray Microanalysis (1981) (1)
- Image Contrast in Energy-Filtered BSE Images at Ultra-Low Accelerating Voltages (2016) (1)
- Three Dimensional Characterization of Interfaces in Semiconductors by Scanning Electron Microscopy (1986) (1)
- High Resolution Imaging (2018) (1)
- Low Beam Energy X-Ray Microanalysis (2018) (1)
- Microanalysis with a Low Energy Helium Ion Beam (2007) (1)
- Nano-tip Electron Gun for the Scanning Electron Microscope (2005) (1)
- Simulation of imaging in projection microscope using multibeam probe (2002) (1)
- Advanced Instrumentation for Low Voltage Scanning Microscopy (2002) (1)
- Scanning Electron Microscopy: Theory, History and Development of the Field Emission Scanning Electron Microscope (2019) (1)
- What EBID Can Tell Us About Contamination ? (2006) (1)
- 1999 ITRS metrology roadmap and its implications for lithography (2000) (1)
- Re-examining mechanisms of radiation damage in organic specimens (1990) (1)
- Qualitative Elemental Analysis by Energy Dispersive X-Ray Spectrometry (2018) (1)
- Quantitative elemental analysis by transmission electron spectroscopy (1978) (1)
- Electron Probe Microanalysis ( EPMA ) (1998) (1)
- SEM Image Interpretation (2018) (1)
- Simulation of repairing thin-film phase defect in masks for EUV lithography (2003) (1)
- The Resolution of the SEM (1997) (1)
- Modulation electron energy loss spectroscopy and its application of quantitative analysis (1993) (1)
- Digital BSE Imaging on SEMs (2011) (1)
- Scanning He+ Ion Beam Microscopy and Metrology (2011) (1)
- The Energy Spectra of Secondary Electrons (2000) (1)
- Direct epitaxial growth of thin-film structures (1997) (1)
- Low Voltage SEM (1985) (1)
- Image Contrast and Quality (1990) (1)
- Fish-eye Optics for the Scanning Electron Microscope (2002) (1)
- Length calibration standards for nano-manufacturing (2007) (1)
- Thin Specimens for TEM and AEM (1990) (0)
- SEM Case Studies (2018) (0)
- Application of the SEM and EPMA to Solid Samples and Biological Materials (1981) (0)
- Effects of low-voltage electron beam lithography (2006) (0)
- The Effect of Gas Atmospheres on Charging (2002) (0)
- Improved Z-axis Resolution in Serial Block Face SEM with Dual Primary Energies and Monte Carlo Simulation of Electron Scattering (2018) (0)
- A Study of Electrostatic Phase Plates using Electron Holography (1996) (0)
- Biological serial block face scanning electron microscopy at improved z-resolution based on Monte Carlo model (2018) (0)
- Investigation of Image Contrast of Energy-Filtered BSE Image at Ultra Low Voltage (2015) (0)
- The Importance of the Detector Angle in STEM Imaging of Crystals (1975) (0)
- Divergent-beam holography with a 200keV FE TEM (1991) (0)
- Electron Beam Parameters (1990) (0)
- High-resolution Transmission Electron Microscopy studies of microstructures in blended cement pastes (1994) (0)
- The Energy Spectra of Secondary Electrons (2000) (0)
- DTSA-II EDS Software (2018) (0)
- A simple and inexpensive fast scan system for a scanning electron microscope (1970) (0)
- Ambient-Temperature Specimen Preparation of Biological Material (2003) (0)
- Serial Block Face Sem of Biological Structures at Near Isotropic Spatial Resolution using Multiple Beam Energies and Monte Carlo Simulations (2016) (0)
- Analytical electron microscopy (1984) (0)
- Is Microanalysis Possible in He+ Ion Microscopes? (2010) (0)
- SE Signal Components (1990) (0)
- Trapping of Oxygen at Homoepitaxial Si-Si Interfaces Grown by Molecular Beam Epitaxy (1985) (0)
- The emissive mode and X-ray microanalysis (1989) (0)
- QUANTITATIVE ELEMENTAL ANALYSIS USING ELECTRON ENERGY-LOSS SPECTROSCOPY (1981) (0)
- Imaging and X-ray Spectroscopy in an SEM during In Situ Heating (2012) (0)
- Electron holography: A new view of material structure (1995) (0)
- Electron Energy Loss Spectroscopy for Extended Fine Structure Studies — an Introduction (1981) (0)
- Absolute Calibration of Auger Spectrometer for Measuring SE and BSE Yield (2005) (0)
- Conference-ALC ’ 03-Off-Axis Electron Holography for 2 D Dopant Profiling of Ultra-Shallow Junctions (2004) (0)
- The First International Workshop on Electron Holography - Concluding Remarks - (1995) (0)
- A new method for quantitative analysis of EELS (1994) (0)
- Laser synthesis of single-wall carbon nanotubes with time-resolved in situ diagnostics (2002) (0)
- The influence of the objective lens current in low magnification electron holography (1995) (0)
- Imaging Growth and Artifact in Natural Zircon – a simplified Preparation Protocol that allows “improved” High Resolution SE and BSE imaging and enhanced Geochronology “Targeting”: the “before” and “after” effect (2012) (0)
- Modern microscopies—techniques and applications Edited by P.J. Duke and A.G. Michette Plenum Press, New York and London (1990) ISBN 0-306-43288-9 (1992) (0)
- Analytical electron microscopy : proceedings of a workshop held at Bethlehem, Pennsylvania, 16-20 July 1984 (1984) (0)
- The Low Voltage Scanning Electron Microscope (1997) (0)
- Evidence for the Gaussian Scattering of Electrons in a Gas (2006) (0)
- Processing of x-ray and electron spectra (1987) (0)
- Measurements of Absolute X-ray Generation Efficiency (2002) (0)
- Computer-Aided Imaging (1990) (0)
- The Spatial Resolution and Defect Contrast of Optical Beam Induced Reflectance (OBIR) Scans (1987) (0)
- Nanoscale characterization of surfaces and interfaces. By N. John DiNardo, VCH, Weinheim 1994, X, 163 pp., hardcover, ISBN 3‐527‐29247‐0 (1996) (0)
- Basic SEM Imaging (1990) (0)
- Modeling for Multi-Beam Microscopy (2012) (0)
- SEM Imaging Checklist (2018) (0)
- Special issue in honor of Professor D.B. Holt. (2008) (0)
- An Investigation of X-ray Mapping/Imaging and the Artifacts Present Using a Silicon Drift Detector - Is Post-Collection Pile-Up Correction Essential? (2011) (0)
- Simulation of in - Line Holograms (2000) (0)
- The Sensitivity of Moire Fringes in SEM Images to Instrumental and Environmental Artifacts (2007) (0)
- Ion Beam Microscopy (2018) (0)
- Front Matter: Volume 7729 (2010) (0)
- EELS and stopping-power calculation of the superconductor Bi1.8Pb0.3Sr2Ca2Cu3O10 (1993) (0)
- Specimen Preparation for Inorganic Materials: Microstructural and Microchemical Analysis (1992) (0)
- Microscopy with Ions: A Brief History (2013) (0)
- Electron-beam deposition of metals for mask repair (2003) (0)
- Detecting Localized Variation of Chemistry via Atomic-Resolution Secondary Electron Imaging (2015) (0)
- Lattice Fringe observations in a Field Emission SEM (2007) (0)
- Ion–Solid Interactions and Image Formation (2013) (0)
- Ion-Generated Damage (2013) (0)
- Modeling for Multi-Beam Microscopy (2012) (0)
- Response to ‘‘Comment on ‘Electron holographic study of ferroelectric domain wells’ ’’ (1993) (0)
- Modeling Ion Beam Induced Secondary Electrons (2015) (0)
- Microstructural Characterization of a 2‐D Woven Nicalon/SiC Ceramic Composite by Scanning Electron Microscopy Line‐Scan Technique (2008) (0)
- X-Ray Peak and Background Measurements (1992) (0)
- High resolution lithography and the role of secondary electrons (2020) (0)
- High-Resolution SEM Imaging (1990) (0)
- Voltage Contrast and EBIC (1990) (0)
- Ollie was Right! A Review of Angular Dependence, Detector Bandwidth and Sample Preparation on Contrast in Secondary and Backscattered Electron Images in the SEM (2014) (0)
- Radiation effects in Langmuir-Blodgett films (1984) (0)
- Focused Ion Beam Applications in the SEM Laboratory (2018) (0)
- The Field Emission Gun Scanning Electron Microscopehigh Resolution at Low Beam Energies (1994) (0)
- Fundamental Constants for Quantitative X-ray Microanalysis (2001) (0)
- Quantitative Wavelength-Dispersive X-Ray Microanalysis (1990) (0)
- 247 CGE Approach to Estimating Employment , Income , and Revenue Impacts of Biofuel Mandates in Pacific Northwest Regions (2010) (0)
- A Study of Temperature Influence on Electron Beam Induced Deposition (2005) (0)
- A Point Projection Microscope for Electron Interferometry in the Reflection Mode (2003) (0)
- Low Beam Energy SEM (2018) (0)
- Three Dimensional Mask Metrology by Off-Axis Electron Holography (2001) (0)
- The Difference Between Secondary Electron Imaging In Variable Pressure SEM And Conventional SEM: Can They Ever Be The Same? (2013) (0)
- Spaceflight Microfabricated Scanning Electron Microscope and X-Ray Spectrometer (MSEMS) (2007) (0)
- Physical Considerations in Low Energy Biological Analysis (1999) (0)
- Electron Sources: Past, Present, and Future (1994) (0)
- Scanning Beam Methods (2012) (0)
- Monte Carlo modeling of ion beam induced secondary electrons. (2016) (0)
- Maskless Lithography of Nanometer-Scale Circuit Structures in Supported, Single-Layer Graphene Using Helium Ion Microscopy (2014) (0)
- Scanning Helium Ion Microscopy-Induced Secondary Electron Yields of Composite Materials (2015) (0)
- Scanning Transmission Ion Microscopy and Diffraction Imaging (2010) (0)
- Quantifying SEM Resolution and Performance (1998) (0)
- Analytical electron microscopy 1987 : proceedings of a workshop held at Kona, Hawaii, 13-17 July 1987 (1987) (0)
- Progress toward realization of the digital electrostatic e-beam array lithography (DEAL) concept (2005) (0)
- Off -Axis Electron Holography for 2D Dopant Profiling of Ultra-Shallow Junctions (2004) (0)
- Type of presentation: Poster (2014) (0)
- Electron Holographic Characterization of Ferroelectric Thin Films (1992) (0)
- Recent Advances in Scanning Electron Microscopy at Oak Ridge (2012) (0)
- The TriFieldTM field meter (1993) (0)
- Critical Voltage Effect in Tungsten ECP (1980) (0)
- Time-resolved diagnostics and mechanisms of single-wall carbon nanotube synthesis by the laser vaporization technique (2001) (0)
- Modeling iSE Emission for Ion Beam Imaging (2013) (0)
- Front Matter: Volume 7378 (2009) (0)
- What do we know about fundamental parameters for microanalysis? (2008) (0)
- Image simulation in scanning electron microscopy (1987) (0)
- Sub-surface Serial Block Face Scanning Electron Microscopy (2015) (0)
- Laser synthesis of single-wall carbon nanotubes with time-resolved in-situ diagnostics (2002) (0)
- Operating the Helium Ion Microscope (2013) (0)
- Fundamental Parameters For Microanalysis (1996) (0)
- Particle and Rough Surface Microanalysis (1990) (0)
- Low Voltage X-ray Microanalysis with a Microcalorimeter Detector (2004) (0)
- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles (2018) (0)
- Image Simulation for Secondary Electron Micrographs in the Scanning Electron Microscope (2021) (0)
- A Route to Electron- Transparent Specimens via FIBing (1999) (0)
- Practical methods in electron microscopy vol. 11: Thin foil preparation for electron microscopy By P.J. Goodhew Edited by A.M. Glauert Elsevier Science Publishing Co., New York (1985) ISBN 0‐444‐806‐997; illustrated, $31.50 (2008) (0)
- Studies of the Effect of Rapid Thermal Annealing on the Structural and Electrical Properties of Heteroepitaxial CaF 2 /CoSi 2 /Si(111) Structures (1986) (0)
- Electron Energy Loss Spectroscopy in the Electron Microscope Egerton R.F. (Plenum Press, 1986) (1987) (0)
- Practical Considerations for Electron Holography on Doped Semiconductor Devices (2002) (0)
- Electron Beam Testing and Characterization – Past, Present, and Future (2000) (0)
- Light Element Microanalysis (1990) (0)
- Scanning Microscopy 2010 (2010) (0)
- Is It Possible to Image the Auger Electron Signal in a Conventional SEM Using a Segmented Annular BSED and Stage Bias? (2016) (0)
- Secondary Electron Imaging in the Helium Ion Microscope (2014) (0)
- Patterning and Nanofabrication (2013) (0)
- Charging and Damage (2013) (0)
- The Possibility of TEM-based X-ray Microanalysis with a Microcalorimeter Detector (2004) (0)
- A Monte Carlo thin Film Simulation for Microcomputers (1982) (0)
- In-line holography using a point source (1999) (0)
- Oliver Wells (1931-2013) A Brief Memorial (2014) (0)
- Scanning tunneling microscopy I Edited by H.‐J. Güntherodt, R. Wiesendanger Springer‐Verlag, New York (1992) ISBN 0‐387‐54308‐2; $59.00 (1993) (0)
- The Joy in imaging the Auger Electron Signal in a FESEM using a Segmented Annular BSED and Stage Bias (2018) (0)
- Building with Ions: Development of In-situ Liquid Cell Microscopy for the Helium Ion Microscope. (2016) (0)
- Microanalysis with HIM (2013) (0)
- Electron-Channelling Patterns: Principles and Techniques (1976) (0)
- Electron microbeam analysis A. Boekestein and M.K. Pavicevic Springer Verlag, New York (1992) ISBN 82359 X Price: $120.00 (1993) (0)
- Variation in Band Gap Contrast in Natural Molybdenum Disulphide (MoS2) with BSE Collection Angle and Stage Bias using a Segmented Annular BSED (2015) (0)
- Secondary electron image profiles using bias voltage technique in deep contact hole (2001) (0)
- Post-Growth Annealing Treatments of Epitaxial CaF2on Si(l00). (1986) (0)
- Defect Characterization Using SEM-CCM Relative Contrast Measurements (1984) (0)
- Preparation of Biological Samples for X-Ray Microanalysis (1981) (0)
- Laser-synthesis of single-wall carbon nanotubes with time-resolved in situ diagnostics (2001) (0)
- Progress TowardRealization oftheDigital Electrostatic e-beamArray Lithography (DEAL)Concept1 (2008) (0)
- A Comparison of Microcalorimeter and Conventional Semiconductor EDS (2004) (0)
- Front Matter: Volume 8036 (2011) (0)
- Thermal wave microscopy of doped silicon crystals (1981) (0)
- Magnification calibration standards for sub-100nm metrology (2007) (0)
- Dual-Energy Serial Block Face SEM Imaging of Biological Structures at Near Isotropic Spatial Resolution (2018) (0)
- Limitations of Sem Characterization of Semiconductors (1997) (0)
- Low Voltage Electron Holography - High Voltage Electron Holography (2002) (0)
- Microscopy of semiconducting materials, 1985 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 25-27 March 1985 (1981) (0)
- Working with Other Ion beams (2013) (0)
- 6 – Electron Beam Induced Current (EBIC) Microscopy (1993) (0)
- Electron Beam Induced Radiation Damage in Nafion and the Lifetime of Fuel Cells (2011) (0)
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