Franz Josef Giessibl
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Franz Josef Giessibl's Degrees
- PhD Physics University of Regensburg
Why Is Franz Josef Giessibl Influential?
(Suggest an Edit or Addition)According to Wikipedia, Franz Josef Gießibl is a German physicist and university professor at the University of Regensburg. Life Giessibl studied physics from 1982 to 1987 at the Technical University of Munich and at Eidgenössische Technischen Hochschule Zürich. He received a diploma in experimental physics in 1988 with Professor Gerhard Abstreiter and continued with a PhD in physics with Nobel Laureate Gerd Binnig at the IBM Physics Group Munich on atomic force microscopy. After submitting his PhD thesis in the end of 1991, he continued for 6 months as a Postdoctoral Fellow at the IBM Physics Group Munich and moved to Silicon Valley to join Park Scientific Instruments, Inc as a senior scientist and later director of vacuum products from mid 1992 until the end of 1994. He joined the Munich office of management consulting firm McKinsey & Company from 1995 to 1996 as a senior associate. During that time, he invented the qPlus sensor, a new probe for atomic force microscopy and continued experimental and theoretical work on the force microscope at the chair of Professor Jochen Mannhart at University of Augsburg where he received a habilitation in 2001.
Franz Josef Giessibl's Published Works
Number of citations in a given year to any of this author's works
Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author
Published Works
- Advances in atomic force microscopy (2003) (1762)
- Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy (1995) (944)
- Forces and frequency shifts in atomic-resolution dynamic-force microscopy (1997) (582)
- HIGH-SPEED FORCE SENSOR FOR FORCE MICROSCOPY AND PROFILOMETRY UTILIZING A QUARTZ TUNING FORK (1998) (516)
- Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork (2000) (469)
- The Force Needed to Move an Atom on a Surface (2008) (378)
- Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy. (2000) (313)
- Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy (2009) (302)
- A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy (2001) (245)
- The qPlus sensor, a powerful core for the atomic force microscope. (2019) (160)
- Noncontact Atomic Force Microscopy: Volume 3 (2009) (154)
- Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy (1999) (149)
- Revealing the hidden atom in graphite by low-temperature atomic force microscopy (2003) (134)
- Force Microscopy with Light-Atom Probes (2004) (127)
- Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy (2012) (116)
- Physical interpretation of frequency-modulation atomic force microscopy (2000) (115)
- Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters (2015) (111)
- Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy (2014) (109)
- AFM's path to atomic resolution (2005) (107)
- Interplay of conductance, force, and structural change in metallic point contacts. (2011) (105)
- Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators (2011) (95)
- Influence of surface properties of resin-based composites on in vitro Streptococcus mutans biofilm development. (2012) (93)
- Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite. (2005) (90)
- Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum (1994) (85)
- Friction traced to the single atom (2002) (84)
- Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor (2004) (76)
- Phantom force induced by tunneling current: a characterization on Si(111). (2011) (64)
- A low‐temperature atomic force/scanning tunneling microscope for ultrahigh vacuum (1991) (60)
- Probing the shape of atoms in real space (2003) (58)
- Atomic Force Microscopy in Ultrahigh Vacuum (1994) (56)
- Optimizing atomic resolution of force microscopy in ambient conditions (2013) (55)
- Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum (1992) (55)
- Image correction for atomic force microscopy images with functionalized tips (2014) (53)
- Atomically resolved graphitic surfaces in air by atomic force microscopy. (2014) (51)
- Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations (2001) (51)
- Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum (2002) (49)
- Streptococcus mutans biofilm formation and release of fluoride from experimental resin-based composites depending on surface treatment and S-PRG filler particle fraction. (2014) (48)
- Observation of 4 nm pitch stripe domains formed by exposing graphene to ambient air. (2013) (48)
- Chemical bond formation showing a transition from physisorption to chemisorption (2019) (45)
- CO tip functionalization inverts atomic force microscopy contrast via short-range electrostatic forces. (2014) (45)
- Low noise current preamplifier for qPlus sensor deflection signal detection in atomic force microscopy at room and low temperatures. (2017) (42)
- Exploring the nanoworld with atomic force microscopy (2006) (41)
- Atomic structure affects the directional dependence of friction. (2013) (40)
- Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes. (2011) (37)
- Spin resolution and evidence for superexchange on NiO(001) observed by force microscopy. (2013) (37)
- Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy. (1992) (34)
- Atomic Force Microscopy-(7x7) Surface by Atomic Force Microscopy (1995) (34)
- Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy (2012) (34)
- The influence of chemical bonding configuration on atomic identification by force spectroscopy. (2013) (31)
- Influence of matrix and filler fraction on biofilm formation on the surface of experimental resin-based composites (2015) (28)
- Investigating atomic details of the CaF2(111) surface with a qPlus sensor (2004) (28)
- Interatomic force laws that evade dynamic measurement (2017) (28)
- Higher‐harmonic atomic force microscopy (2006) (27)
- A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics (1999) (27)
- Atomically Resolved Chemical Reactivity of Small Fe Clusters. (2020) (26)
- Chemical and crystallographic characterization of the tip apex in scanning probe microscopy. (2013) (26)
- Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy (2010) (25)
- Self-oscillating mode for frequency modulation noncontact atomic force microscopy (1997) (25)
- Vibrations of a molecule in an external force field (2018) (24)
- Force field analysis suggests a lowering of diffusion barriers in atomic manipulation due to presence of STM tip. (2015) (24)
- Intramolecular Force Contrast and Dynamic Current-Distance Measurements at Room Temperature. (2015) (23)
- Simultaneous current-, force-, and work-function measurement with atomic resolution (2005) (23)
- Subatomic Features on the Silicon (111)-(7×7) (2008) (23)
- Application of the equipartition theorem to the thermal excitation of quartz tuning forks (2011) (21)
- Electron scattering in scanning probe microscopy experiments (2005) (20)
- Imaging in Biologically-Relevant Environments with AFM Using Stiff qPlus Sensors (2018) (20)
- Response of the topological surface state to surface disorder in TlBiSe2 (2015) (19)
- Atomic Resolution of Calcium and Oxygen Sublattices of Calcite in Ambient Conditions by Atomic Force Microscopy Using qPlus Sensors with Sapphire Tips. (2015) (19)
- Edge channels of broken-symmetry quantum Hall states in graphene visualized by atomic force microscopy (2020) (18)
- Searching atomic spin contrast on nickel oxide (001) by force microscopy (2006) (18)
- Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy (2016) (17)
- Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy, and density functional theory (2015) (16)
- Principle of NC-AFM (2002) (16)
- In-situ characterization of O-terminated Cu tips for high-resolution atomic force microscopy (2019) (15)
- Analysis of STM images with pure and CO-functionalized tips: A first-principles and experimental study (2017) (15)
- qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution (2011) (14)
- Oligolayer-coated nanoparticles: impact of surface topography at the nanobio interface. (2015) (14)
- Principles and Applications of the qPlus Sensor (2009) (14)
- Quantifying the evolution of atomic interaction of a complex surface with a functionalized atomic force microscopy tip (2020) (12)
- Very weak bonds to artificial atoms formed by quantum corrals (2021) (11)
- The effect of sample resistivity on Kelvin probe force microscopy (2012) (11)
- Higher Harmonics and Time-Varying Forces in Dynamic Force Microscopy (2010) (10)
- Imaging silicon by atomic force microscopy with crystallographically oriented tips (2001) (10)
- Localization of the phantom force induced by the tunneling current (2012) (10)
- Achieving μeV tunneling resolution in an in-operando scanning tunneling microscopy, atomic force microscopy, and magnetotransport system for quantum materials research. (2020) (10)
- Lateral manipulation of single iron adatoms by means of combined atomic force and scanning tunneling microscopy using CO-terminated tips (2018) (9)
- Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures (2014) (8)
- Attempts to test an alternative electrodynamic theory of superconductors by low-temperature scanning tunneling and atomic force microscopy (2016) (8)
- Preparation of light-atom tips for scanning probe microscopy by explosive delamination (2010) (8)
- Analysis of Airborne Contamination on Transition Metal Dichalcogenides with Atomic Force Microscopy Revealing That Sulfur Is the Preferred Chalcogen Atom for Devices Made in Ambient Conditions (2019) (7)
- Erratum: “High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork” [Appl. Phys. Lett. 73, 3956 (1998)] (1999) (7)
- Characterization of hydrogen plasma defined graphene edges (2019) (7)
- Device for in situ cleaving of hard crystals (2005) (7)
- Noncontact Atomic Force Microscopy and Its Related Topics (2005) (6)
- High-precision atomic force microscopy with atomically-characterized tips (2020) (6)
- A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data (2019) (6)
- Non-contact AFM (2012) (5)
- Lateral Force Microscopy Reveals the Energy Barrier of a Molecular Switch. (2021) (5)
- Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy. (2011) (5)
- Probing the Nature of Chemical Bonds by Atomic Force Microscopy (2021) (5)
- Ion mobility and material transport on KBr in air as a function of the relative humidity (2019) (4)
- Identifying the atomic configuration of the tip apex using STM and frequency-modulation AFM with CO on Pt(111) (2020) (4)
- Experimental use of the inflection point test for force deconvolution in frequency-modulation atomic force microscopy to turn an ill-posed situation into a well-posed one by proper choice of amplitude (2020) (4)
- Evaluating the potential energy landscape over single molecules at room temperature with lateral force microscopy (2018) (4)
- Strumming a Single Chemical Bond. (2020) (4)
- Evidence for temporary and local transition of sp2 graphite-type to sp3 diamond-type bonding induced by the tip of an atomic force microscope (2021) (4)
- Radio frequency filter for an enhanced resolution of inelastic electron tunneling spectroscopy in a combined scanning tunneling- and atomic force microscope. (2019) (4)
- Interatomic force laws that corrupt their own measurement (2017) (3)
- Higher-Harmonic Force Detection in Dynamic Force Microscopy (2007) (3)
- Designer magnetic topological graphene nanoribbons (2022) (3)
- Atomic force microscopy's path to atomic resolution (2005) (3)
- Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes. (2021) (3)
- Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions. (2020) (3)
- Atomare Ladungszustände unter dem Rasterkraftmikroskop (2009) (2)
- Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllers. (2013) (2)
- Rasterkraftmikroskop sieht erstmals ins Innere des Atoms (2001) (2)
- Edge Channels of Broken-Symmetry Quantum Hall States in Graphene probed by Atomic Force Microscopy (2020) (2)
- Advances in AFM: Seeing Atoms in Ambient Conditions (2018) (2)
- Auf die Spitze getrieben (2009) (2)
- The Phantom Force (2015) (1)
- Silicon and Its Vital Role in The Evolution of Scanning Probe Microscopy (2004) (1)
- Determining amplitude and tilt of a lateral force microscopy sensor (2021) (1)
- Seeing the Reaction (2013) (1)
- Experimental demonstration of pitfalls and remedies for precise force deconvolution in frequency-modulation atomic force microscopy (2020) (1)
- A comparative study of force sensors for scanning probe microscopy based on quartz tuning forks and length extensional resonators (2011) (1)
- Erratum: Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy [Phys. Rev. Lett. 112, 066101 (2014)] (2015) (1)
- Noncontact Atomic Force Microscopyand Related Topics (2010) (1)
- A combined atomic force- and tunneling microscopy system at 10mK temperature (2018) (1)
- Three decades of atomic force microscopy (2016) (0)
- Leo Gross , Noncontact Atomic Force Microscopy Measuring the Charge State of an Adatom with (2010) (0)
- Atomic charge state determination by AFM (2010) (0)
- Atomic resolution observation on KBr(100) surface with bimodal FM-AFM in ambient (2016) (0)
- Wie viel Kraft ist nötig, um ein Atom zu bewegen? (2008) (0)
- Atomic-Force Microscopy with piezoresistive cantilevers (1994) (0)
- Publisher's Note: Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy [Phys. Rev. Lett. 112, 066101 (2014)] (2014) (0)
- Means for providing an evacuated low-temperature environment for a sample and using the apparatus (2004) (0)
- SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY (2006) (0)
- The Interplay of Conductance , Force , and Structure Change in Metallic Point Contacts (2014) (0)
- 1 3 O ct 2 00 5 Electron scattering in atomic force microscopy experiments (2022) (0)
- The influence of electrostatic interaction on lateral manipulation of single iron atoms using tilted CO and metal tips in atomic force microscopy (2018) (0)
- Simulations of atomic force microscopy image “flickering” on a doped Si (111) 7x7 surface using real-space pseudopotential calculations. (2018) (0)
- Visualizing broken symmetry states in the zeroth Landau level of the graphene quantum Hall system (2020) (0)
- Spin Resolution on NiO(001) by Force Microscopy utilizing Bulk Ferromagnetic tips (2013) (0)
- Atomic imaging of nickel oxide with nonmagnetic, ferromagnetic and antiferromagnetic tips (2006) (0)
- Measuring sliding friction at the atomic scale (2022) (0)
- Zooming into atomic interactions with lateral force microscopy (2018) (0)
- Surface Observed by Atomic Force Microscopy Subatomic Features on the Silicon (111)-(7×7) (2008) (0)
- 20pGP-5 Tracking free and localized electrons by scanning probe microscopy(Force Spectroscopy and Tunneling Spectroscopy by SPM and related techniques) (2010) (0)
- Imaging in Biologically-Relevant Environments with AFM Using Stiff qPlus Sensors (2018) (0)
- Ein atomarer Fingerabdruck (2007) (0)
- Rasterkraftmikroskopie und Rastertunnelmikroskopie bei 4.2 K im Ultrahochvakuum (1991) (0)
- Spin Spin Spin Around - Der Sonderforschungsbereich 689 (2014) (0)
- Abbildung der Symmetrien chemischer Bindungen (2013) (0)
- Calvin F. Quate (1923–2019) (2019) (0)
- Revealing buckling of an apparently flat monolayer of NaCl on Pt(111) (2022) (0)
- Role of tip apex in inelastic electron tunneling spectroscopy of CO/Cu(111) with an STM/AFM (2015) (0)
- Revealing a spatially inhomogeneous broadening effect in artificial quantum structures caused by electron-adsorbate scattering (2023) (0)
- Joseph F. Keithley Award: Force microscopy with subatomic spatial resolution (2014) (0)
- Force Microscopy in Vacuum with Atomic Resolution (1999) (0)
- Intramolecular Imaging at Room Temperature (2015) (0)
- Attempts to test an alternative electrodynamic theory of superconductors by LT STM and AFM (2018) (0)
- Atomic Force Microscopy on Its Way to Adolescence (2003) (0)
- Dynamic friction unraveled using an atomically defined model system (2021) (0)
- Publisher Correction: Interatomic force laws that evade dynamic measurement (2019) (0)
- From a free electron gas to confined states: A mixed island of PTCDA and copper phthalocyanine on Ag(111) (2022) (0)
- Relationship between the Geometrical Structure of a Tip Apex of a Scanning Probe Microscope and the Intensity of the Signal in Inelastic Electron Tunneling Spectroscopy (2018) (0)
- Leo Gross Force Microscopy Measuring the Charge State of an Adatom with Noncontact Atomic (2013) (0)
- Test of Alternative Electrodynamic Theory of Superconductivity by using Ultra Low Temperature Scanning Probe Spectroscopy (2018) (0)
- Probing chemical bonds to natural and artificial atoms by atomic force microscopy (2021) (0)
- Structural Characterization of Defects in the Topological Insulator Bi2Se3 at the Picometer Scale (2022) (0)
- Pushing the Resolution Limits of the Force Microscope: from Steps to Atoms and Atomic Orbitals (2002) (0)
- Principle of High-Resolution Atomic Force Microscopy (2003) (0)
- How local is the Phantom Force (2012) (0)
- On the origin and elimination of cross coupling between tunneling current and excitation in scanning probe experiments that utilize the qPlus sensor (2023) (0)
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