John Woollam
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American physicist
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Physics
Why Is John Woollam Influential?
(Suggest an Edit or Addition)According to Wikipedia, John Arthur Woollam is an American educator, research physicist, electrical engineer, and George Holmes Distinguished Professor at the University of Nebraska–Lincoln in Lincoln, Nebraska. He is also a successful entrepreneur who in 1987 founded the J.A. Woollam Company, an ellipsometry company based in Lincoln, Nebraska, and a world leader in the research, development, and commercialization of ellipsometry instruments. Woollam is also a known as a philanthropist and nature conservationist.
John Woollam 's Published Works
Number of citations in a given year to any of this author's works
Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author
Published Works
- Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon films (1984) (963)
- Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation (1998) (945)
- Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications (1999) (213)
- Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO 2 (1996) (149)
- Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry (1999) (133)
- Overview of variable-angle spectroscopic ellipsometry (VASE): II. Advanced applications (1999) (126)
- Giant photoresistivity and optically controlled switching in self-assembled nanowires (2001) (122)
- Techniques for ellipsometric measurement of the thickness and optical constants of thin absorbing films (1993) (118)
- Optical constants of GaxIn1−xP lattice matched to GaAs (1995) (109)
- InP optical constants between 0.75 and 5.0 eV determined by variable‐angle spectroscopic ellipsometry (1995) (107)
- Variable angle of incidence spectroscopic ellipsometry: Application to GaAs‐AlxGa1−xAs multiple heterostructures (1986) (104)
- Application of IR variable angle spectroscopic ellipsometry to the determination of free carrier concentration depth profiles (1998) (99)
- Infrared switching electrochromic devices based on tungsten oxide (2000) (98)
- Optical properties of bulk and thin-film SrTiO3 on Si and Pt (2000) (97)
- Modeling AlxGa1−xAs optical constants as functions of composition (1990) (93)
- Variable wavelength, variable angle ellipsometry including a sensitivities correlation test (1986) (88)
- Temperature dependence of optical properties of GaAs (1991) (84)
- Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry (2000) (80)
- Superconducting critical fields of alkali and alkaline-earth intercalates of MoS2 (1976) (76)
- Variable-wavelength frequency-domain terahertz ellipsometry. (2010) (76)
- Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis (1995) (75)
- Visible and infrared optical constants of electrochromic materials for emissivity modulation applications (1998) (74)
- Fundamentals and applications of variable angle spectroscopic ellipsometry (1990) (71)
- Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry. (1999) (70)
- Prospects for IR emissivity control using electrochromic structures 1 Presentented at the ICMCTF 97 (1999) (69)
- Optical analysis of complex multilayer structures using multiple data types (1994) (63)
- Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared (2003) (61)
- Variable angle spectroscopic ellipsometry: A non-destructive characterization technique for ultrathin and multilayer materials☆ (1988) (61)
- Spectroscopic ellipsometry studies of indium tin oxide and other flat panel display multilayer materials (1994) (60)
- Generalized transmission ellipsometry for twisted biaxial dielectric media: Application to chiral liquid crystals (1996) (59)
- Graded refractive index silicon oxynitride thin film characterized by spectroscopic ellipsometry (1992) (58)
- All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region (2000) (57)
- Electronic properties of Bi2Se3 crystals (1974) (57)
- Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry (1996) (56)
- The process‐controlled magnetic properties of nanostructured Co/Ag composite films (1991) (55)
- Modified Forouhi and Bloomer dispersion model for the optical constants of amorphous hydrogenated carbon thin films (1994) (53)
- Positive curvature of the Hc2-versus-Tc boundaries in layered superconductors (1974) (52)
- Physics and chemistry of MoS2 intercalation compounds (1977) (51)
- Isotropic dielectric functions of highly disordered AlxGa1−xInP (0⩽x⩽1) lattice matched to GaAs (1999) (48)
- The alkaline earth intercalates of molybdenum disulfide (1975) (48)
- Spectroscopic ellipsometry studies of HF treated Si (100) surfaces (1993) (47)
- Recent developments in spectroscopic ellipsometry for in-situ applications (2001) (45)
- Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example (1997) (44)
- Invited article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument. (2014) (43)
- Terahertz ellipsometry and terahertz optical-Hall effect (2011) (43)
- Optical characterization of porous alumina from vacuum ultraviolet to midinfrared (2005) (43)
- Optical properties of "diamondlike" carbon films: An ellipsometric study (1983) (41)
- Preparation of high Tc Tl‐Ba‐Ca‐Cu‐O thin films by pulsed laser evaporation and Tl2O3 vapor processing (1989) (41)
- Graphite carrier locations and quantum transport to 10 T /100 kG/ (1971) (41)
- UV-vis-infrared optical and AFM study of spin-cast chitosan films. (2005) (41)
- Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry (2011) (41)
- Thermopowers and resistivities of silver-palladium and copper-nickel alloys (1965) (40)
- Determination of optical anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry (1998) (39)
- Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures (2012) (39)
- Determination of the mid-IR optical constants of water and lubricants using IR ellipsometry combined with an ATR cell (1998) (39)
- Radio-frequency plasma chemical vapor deposition growth of diamond (1989) (37)
- Galvanomagnetic effects in graphite—I: Low field data and the densities of free carriers (1978) (36)
- Kerr effect of two-medium layered systems (1990) (36)
- Temperature and thickness dependence of coercivity and magnetization of Co/Cu and Co/Si multilayers (1991) (35)
- Hydrogen analysis as a function of depth for hydrogenous films and polymers by proton recoil detection (1985) (35)
- Optical properties of RuO2 films deposited by reactive sputtering (1992) (34)
- Convolutional Neural Network for Seismic Phase Classification, Performance Demonstration over a Local Seismic Network (2019) (33)
- THz dielectric anisotropy of metal slanted columnar thin films (2011) (33)
- Infrared emittance modulation devices using electrochromic crystalline tungsten oxide, polymer conductor, and nickel oxide (1999) (33)
- Magneto-optical Kerr effect and perpendicular magnetic anisotropy of evaporated and sputtered Co/Pt multilayer structures (1991) (33)
- Optical constants and roughness study of dc magnetron sputtered iridium films (2002) (32)
- Highly oriented Tl2Ba2Ca2Cu3O10 thin films by pulsed laser evaporation (1989) (31)
- Ellipsometric measurements of molecular‐beam‐epitaxy‐grown semiconductor multilayer thicknesses: A comparative study (1987) (31)
- OPTICAL CONSTANTS OF CRYSTALLINE WO3 DEPOSITED BY MAGNETRON SPUTTERING (1999) (30)
- Electronic properties of PbMo6S8 and CuxMo6S8 (1979) (30)
- Optical determination of shallow carrier profiles using Fourier transform infrared ellipsometry (1998) (29)
- Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV (2001) (28)
- Interfacial effects due to tunneling to insulator gap states in amorphous carbon on silicon metal‐insulator‐semiconductor structures (1984) (28)
- Dielectric properties of ‘‘diamondlike’’ carbon prepared by rf plasma deposition (1985) (28)
- Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells (2010) (27)
- Metallic conductivity and air stability in copper chloride intercalated carbon fibers (1982) (26)
- Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices (2002) (26)
- Optical and magneto-optical constants of MnPt3 (1997) (26)
- Effects of Ion Concentration on Refractive Indices of Fluids Measured by the Minimum Deviation Technique (2008) (25)
- Minority carriers in graphite. (1971) (25)
- Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures (2011) (25)
- Critical currents in sputtered copper molybdenum sulphide (1977) (25)
- Which Picker Fits My Data? A Quantitative Evaluation of Deep Learning Based Seismic Pickers (2021) (24)
- Optical, spin-resonance, and magnetoresistance studies of /tetrathiatetracene/2/iodide/3 - The nature of the ground state (1978) (24)
- Interfacial electrical properties of ion-beam sputter deposited amorphous carbon on silicon (1983) (24)
- Infrared ellipsometry characterization of porous silicon bragg reflectors. (2001) (24)
- Spin Splitting, Fermi Energy Changes, and Anomalous g Shifts in Single-Crystal and Pyrolytic Graphite (1970) (24)
- Optical constants of Ga x In 1- x P lattice matched to GaAs (1995) (24)
- ‘‘Diamondlike’’ carbon films: Optical absorption, dielectric properties, and hardness dependence on deposition parameters (1985) (23)
- Critical currents and scaling laws in sputtered copper molybdenum sulfide (1978) (23)
- Self-organization in porous 6H-SiC (2000) (23)
- Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range (1997) (23)
- Sputtering pressure effect on microstructure of surface and interface, and on coercivity of Co/Pt multilayers (1991) (22)
- Electrical and mechanical properties of copper chloride-intercalated pitch-based carbon fibers (1983) (22)
- Variable angle spectroscopic ellipsometry - Application to GaAs-AlGaAs multilayer homogeneity characterization (1988) (22)
- Bi2Se3 Hall Effect Magnetometer for Reliable Low Temperature Use (1973) (22)
- Enhanced magneto‐optic Kerr effects in thin magnetic/metallic layered structures (1989) (22)
- High frequency capacitance-voltage and conductance-voltage characteristics of d.c. sputter deposited a-carbon/silicon MIS structures (1984) (22)
- Characterization of polycrystalline silicon thin‐film multilayers by variable angle spectroscopic ellipsometry (1992) (21)
- IR ellipsometry studies of polymers and oxygen plasma-treated polymers (1998) (21)
- An enhanced sensitivity null ellipsometry technique for studying films on substrates: Application to silicon nitride on gallium arsenide (1983) (21)
- Optical and magneto‐optical characterization of TbFeCo thin films in trilayer structures (1991) (21)
- Mass density and hydrogen concentration in “diamond-like” carbon films: Proton recoil, Rutherford backscattering and ellipsometric analysis (1986) (20)
- Growth Of Diamond By Rf Plasma Assisted Chemical Vapor Deposition (1988) (20)
- Polarization selection rules for inter-Landau-level transitions in epitaxial graphene revealed by the infrared optical Hall effect. (2013) (20)
- Dielectric tensor for magneto-optic NiMnSb (1999) (19)
- Oxygen plasma effects on optical properties of ZnSe films (2002) (19)
- Hole diffusion profile in a p-p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry (2009) (19)
- Near-band-gap CuPt-order-induced birefringence in Al 0.48 Ga 0.52 InP 2 (1999) (19)
- Magnetic phase diagram of CsMnCl3 · 2H2O (1969) (19)
- Upper critical field of copper molybdenum sulfide (1978) (19)
- Variable angle of incidence spectroscopic elUpsometric characterization of Ti021 Ag/Ti02 optical coatings (1988) (19)
- Variable angle spectroscopic ellipsometry in the vacuum ultraviolet (2000) (19)
- Critical currents in sputtered PbMo6S8 (1978) (19)
- Study of surface chemical changes and erosion rates for CV-1144-O silicone under electron cyclotron resonance oxygen plasma exposure (2001) (18)
- Mobility in single crystal Bi2Se3. (1972) (18)
- Critical currents in A‐15 structure Nb3Al converted from cold‐worked bcc structure (1980) (18)
- Interface magnetism and superparamagnetism of Co/Cu multilayers (1993) (18)
- In-situ spectroscopic ellipsometry of HgCdTe (1996) (18)
- VUV and IR spectroellipsometric studies of polymer surfaces (2003) (17)
- Scaling laws for pinning forces in inhomogeneous superconductors (1978) (17)
- In situ ellipsometry in microelectronics (1995) (17)
- Infrared optical properties and AFM of spin-cast chitosan films chemically modified with 1,2 Epoxy-3-phenoxy-propane. (2005) (17)
- Spectroscopic ellipsometric characterization of Si/Si1−xGex strained-layer supperlattices (1993) (17)
- Behavior of disordered Co-Pd, Co-Ag, and Co-Mo alloys in multilayer interfaces (1993) (17)
- Silicon nitride/silicon oxynitride/silicon dioxide thin film multilayer characterized by variable angle spectroscopic ellipsometry (1992) (17)
- In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films (2000) (17)
- Roughness studies of ion beam processed molybdenum surfaces (1986) (16)
- In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures (1998) (16)
- In situ ellipsometric diagnostics of multilayer thin film deposition during sputtering (1998) (16)
- Evaporated films of superconducting copper molybdenum sulfide (1977) (15)
- VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY. (1988) (15)
- Thin-film hermeticity - A quantitative analysis of diamondlike carbon using variable angle spectroscopic ellipsometry (1988) (15)
- Controlled index of refraction silicon oxynitride films characterized by variable angle spectroscopic ellipsometry (1991) (15)
- Physical and chemical properties of sputter-deposited TaCxNy films (2006) (15)
- Magnetic and magneto-optic properties of sputtered Co/Ni multilayers (1994) (15)
- Optical properties of ion-beam-deposited ion-modified diamondlike (a-C:H) carbon (1988) (15)
- Optical and interfacial electronic properties of diamond-like carbon films (1984) (15)
- INFRARED ELLIPSOMETRY ON HEXAGONAL AND CUBIC BORON NITRIDE THIN FILMS (1997) (14)
- Properties and performance of fine-filament bronze-process Nb3Sn conductors (1979) (14)
- Elevated temperature dependence of the anisotropic visible-to-ultraviolet dielectric function of monoclinic beta-Ga2O3 (2017) (14)
- Variable Angle Spectroscopic Ellipsometry (VASE) for the Study of Ion-Beam and Growth-Modified Solids (1987) (14)
- Detection of ultrathin biological films using vacuum ultraviolet spectroscopic ellipsometry (2008) (14)
- Electrical properties of ICl, Br2 and CuCl2 intercalated pitch-based carbon fibers (1983) (14)
- Anisotropy and magneto-optical properties of sputtered Co/Ni multilayer thin films (1994) (13)
- In situ spectroscopic ellipsometry studies of electron cyclotron resonance (ECR) plasma etching of oxides of silicon and GaAs (1993) (13)
- Analytic solutions for optimized ellipsometric measurements of interfaces and surface layers in thin film structures (1985) (13)
- Ellipsometric analysis of built‐in electric fields in semiconductor heterostructures (1987) (13)
- Studies of metallic multilayer structures, optical properties, and oxidation using in situ spectroscopic ellipsometry (1998) (13)
- Thermal characterization of thin films by photothermally induced laser beam deflection (1993) (13)
- Measurement of superlattice optical properties by variable angle spectroscopic ellipsometry (1988) (13)
- Summary Abstract: Optical, Raman, and photoemission results on amorphous ‘‘diamondlike’’ carbon films (1984) (13)
- Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers (1997) (12)
- Reactively evaporated films of copper molybdenum sulfide (1978) (12)
- PICOSS: Python Interface for the Classification of Seismic Signals (2019) (12)
- Thermal diffusivity measurements by photothermal laser beam deflection (PTD) : data analysis using the Levenberg-Marquardt algorithm (1992) (12)
- Characterization of UV irradiated space application polymers by spectroscopic ellipsometry (2000) (12)
- Summary Abstract: Multiple‐wavelength‐angle‐of‐incidence ellipsometry: Application to silicon nitride–gallium arsenide structures (1983) (11)
- Metal slanted columnar thin film THz optical sensors (2012) (11)
- Optical characterization and modeling of amorphous hydrogenated carbon films (1994) (11)
- Intercalation Compounds of Molybdenum Disulfide (1979) (11)
- Ellipsometry, Variable Angle Spectroscopic (2014) (11)
- Characterization of Multilayer GaAs/AlGaAs Transistor Structures by Variable Angle Spectroscopic Ellipsometry (1989) (10)
- Thin film materials exposure to low Earth orbit aboard Space Shuttle (1995) (10)
- ELECTRONIC PROPERTIES OF METAL CHLORIDE INTERCALANTS OF GRAPHITE (1980) (10)
- Complete measurement of Kerr parameters by using rotating-analyzer magneto-optic spectroscopy (1992) (10)
- Piezo-optical response of Si1−yCy alloys grown pseudomorphically on Si (001) (1995) (10)
- Determination of optical constants of silver layers in ZnO/Ag/ZnO coatings using variable angle spectroscopic ellipsometry (1989) (10)
- Vacuum ultra-violet spectroscopic ellipsometry study of single- and multi-phase nitride protective films (2006) (10)
- Application of spectroscopic ellipsometry to characterization of optical thin films (2003) (10)
- Study of Mo-, Au-, and Ni-implanted molybdenum laser mirrors by multiple angle of incidence spectroscopic ellipsometry (1986) (10)
- 148. Use of Raman scattering to investigate disorder and crystallite formation in AS-deposited and annealed carbon films (1984) (10)
- Real-Time Analysis Of In-Situ Spectroscopic Ellipsometric Data During Mbe Growth Of III-V Semiconductors (1991) (9)
- Ex situ variable angle spectroscopic ellipsometry studies of electron cyclotron resonance etching of Hg1−xCdxTe (1993) (9)
- The Origin of the Berreman Effect in SiC Homostructures (1998) (9)
- In Situ Spectroscopic Ellipsometry for Real Time Semiconductor Growth Monitor (1990) (9)
- Application of generalized ellipsometry to complex optical systems (1997) (9)
- Magneto-optical and structural properties of BiAlDyIG/Fe multilayers (1994) (9)
- Spectroscopic ellipsometric monitoring of electron cyclotron resonance plasma etching of GaAs and AlGaAs (1995) (9)
- InP MIS structures with diamondlike amorphous carbon films deposited by ion-beam sputtering and from plasma☆ (1986) (9)
- Process monitoring and control of low temperature reactively sputtered AlN (1998) (9)
- Low Earth Orbit Effects on Indium Tin Oxide and Polyester and Comparison With Laboratory Simulations (1993) (9)
- Amorphous Hydrogenated “Diamondlike” Carbon Films and Arc-Evaporated Carbon Films (1997) (8)
- Critical current and scaling laws in evaporated two-phase Cu2.5Mo6S8 (1978) (8)
- Comparison of projected critical currents in PbMo6S8 and Nb3Ge (1979) (8)
- Ellipsometric and magneto‐optic properties of sputtered dysprosium‐iron multilayers (1988) (8)
- High-Pressure and Low-Temperature Physics (2012) (8)
- Infrared ellipsometry studies of thermal stability of protein monolayers and multilayers (2008) (8)
- Photoellipsometry: a modulation spectroscopy method applied to n-type GaAs (1993) (8)
- Photoellipsometry determination of surface Fermi level in GaAs (100) (1993) (8)
- FREE-CARRIER RESPONSE AND LATTICE MODES OF GROUP III-NITRIDE HETEROSTRUCTURES MEASURED BY INFRARED ELLIPSOMETRY (1999) (8)
- Sputtering pressure effects and temperature‐dependent magnetism of Co/Pd multilayers (1994) (8)
- Anomalous Galvanomagnetic Properties of Graphite in Strong Magnetic Fields (1978) (8)
- In-situ ellipsometric characterization of the electrodeposition of metal films (1995) (8)
- Spectroscopic ellipsometry from the vacuum ultraviolet to the far infrared (2001) (8)
- Multiple-layered effective medium approximation approach to modeling environmental effects on alumina passivated highly porous silicon nanostructured thin films measured by in-situ Mueller matrix ellipsometry (2017) (8)
- Magnetic Breakdown and Thermoelectricity in Metallic Tin (1968) (8)
- Ellipsometric measurement of the optical properties and electrical conductivity of indium tin oxide thin films (1994) (8)
- Infrared Ellipsometry – a Novel Tool for Characterization of Group‐III Nitride Heterostructures for Optoelectronic Device Applications (2001) (8)
- Shubnikov-de Haas effects in Bi2Se3 with high carrier concentrations (1973) (7)
- Ellipsometric analysis of CdZnTe preparation for HgCdTe MBE growth (1997) (7)
- HEX: Hyperbolic Event eXtractor, a Seismic Phase Associator for Highly Active Seismic Regions (2020) (7)
- Ellipsometric characterization of multilayer transistor structures (1990) (7)
- Temperature and field dependencies of galvanomagnetic effects in graphite (1977) (7)
- Low Earth Simulation and Materials Characterization (1993) (7)
- Nanostructural effects and interface magnetism in Co/Pd multilayers (1993) (7)
- Oxygen plasma ashing effects on aluminum and titanium space protective coatings (1991) (7)
- In situ and ex situ optical characterization of electro deposited magneto-optic materials (1996) (7)
- Determination of the interfacial magneto-optical effects in Co/Pt multilayer structures (1997) (7)
- 7.3 – VASE: Variable Angle Spectroscopic Ellipsometry (1992) (7)
- Magnetic transitions in CsMnCl3·2H2O studied by magnetostriction and magnetothermal techniques (1973) (7)
- Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry (1998) (7)
- Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs (2001) (7)
- Thermal and structural stability of cosputtered amorphous Ta(x)Cu(1-x) alloy thin films on GaAs (1986) (7)
- Degradation of thin films: comparison between low Earth orbit experiments and laboratory simulations of the space environment (1994) (6)
- Electronic Properties of Carbon Fibers Intercalated with Copper Chloride (1984) (6)
- Non-linear extreme quantum limit resistivity in graphite (1970) (6)
- GaAs(100) Surface Modifications at Elevated Temperatures, Studied By In-Situ Spectroscopic Ellipsometry (1990) (6)
- ION IRRADIATION SMOOTHING AND FILM BONDING FOR LASER MIRRORS. (1983) (6)
- DIRECT EVIDENCE FOR MAJORITY-CARRIER LOCATIONS IN THE BRILLOUIN ZONE OF GRAPHITE. (1970) (6)
- Diamondlike Carbon Applications in Infrared Optics and Microelectronics (1990) (6)
- In-situ and ex-situ ellipsometric characterization for semiconductor technology (Invited Paper) (1992) (6)
- Ellipsometric Study Of ZnO/Ag/ZnO Optical Coatings: Determination Of Layer Thicknesses And Optical Constants (1987) (6)
- Repeatability of ellipsometric data in cholera toxin GM1–ELISA structures (2007) (6)
- Enhancement of magneto-optical Kerr effects (1990) (6)
- Passivating coatings for intercalated graphite fiber electrical conductors (1986) (6)
- Infrared free carrier response of In0.15Ga0.85As0.17Sb0.83 epilayers on GaSb (1998) (6)
- Photoconductive and optical properties of amorphous selenium (1971) (6)
- Low temperature normal state resistance of ternary molybdenum sulfides (1978) (6)
- Magneto-optic properties of uranium-based compounds (1991) (6)
- Ellipsometric study of Al2O3/Ag/Si and SiO2/Ag/quartz ashed in an oxygen plasma. [protective coatings to prevent degradation of materials in low earth orbits] (1989) (6)
- Gold-alumina cermet photothermal films (2004) (6)
- Cubic Silicon Carbide (β-SiC) (1997) (5)
- Annealing effects of Co/Ni multilayers (1995) (5)
- Study of InGaAs-based modulation doped field effect transistor structures using variable-angle spectroscopic ellipsometry (1991) (5)
- Optimization of quadrilayer structures for various magneto-optical recording materials (1991) (5)
- Variable Angle of Incidence Spectroscopic Ellipsometric Study of Semiconductor Multilayer Structures (1986) (5)
- In-situ monitor and control using fast spectroscopic ellipsometry (1996) (5)
- International conference on metallurgical coatings and thin films (1991) (5)
- Hall effect and magnetoresistivity in the ternary molybdenum sulfides (1978) (5)
- Normal state properties of the ternary molybdenum sulfides (1978) (5)
- DIAMONDLIKE CARBON: A BIBLIOGRAPHY OF PUBLISHED PAPERS AND REPORTS. (1986) (5)
- In situ and Ex situ Applications of Spectroscopic Ellipsometry (1993) (5)
- Evanohm resistance to 18 T (180 kG) at 4.2 K (Notes) (1970) (5)
- Optical Characterization of Silicon Oxynitride Thin Films by Variable Angle Spectroscopic Ellipsometry (1992) (5)
- Variable Angle of Incidence Spectroscopic Ellipsometric Measurement of the Franz-Keloysh Effect in Modfet Structures (1986) (5)
- Ion beam smoothing of metallic mirrors (1987) (5)
- Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multi-wavelength ellipsometry (1997) (5)
- Oxygen plasma asher contamination: An analysis of sources and remedies (1996) (5)
- 3D Local Earthquake Tomography of the Ecuadorian Margin in the Source Area of the 2016 Mw 7.8 Pedernales Earthquake (2020) (5)
- Measurement of silicon doping profiles using infrared ellipsometry combined with anodic oxidation sectioning (1998) (5)
- Superconducting properties of evaporated copper molybdenum sulfide films (1978) (5)
- Superconducting Nb3Ge for high-field magnets (1978) (5)
- Thermomagnetic effects and Fermi surface topology - Results in metallic tin at low temperatures. (1969) (4)
- Critical currents in Nb 3 Ge based pseudobinaries (1979) (4)
- Characterizing antireflection coatings on textured monocrystalline silicon with Spectroscopic Ellipsometry (2009) (4)
- Indirect measurements of Fermi surface parameters of some Chevrel phase materials (1979) (4)
- Terahertz Ellipsometry Using Electron-Beam Based Sources (2007) (4)
- Anomalous Shubnikov-De Haas amplitudes in white tin (1968) (4)
- Resonant Moke Spectra in Magnetic Layers on Silver (1989) (4)
- Study of Ion Implanted Copper Laser Mirrors by Spectroscopic Ellipsometry (1987) (4)
- GaAs/AlGaAs Superlattice Characterization By Variable Angle Spectroscopic Ellipsometry (1988) (4)
- Magnetostriction, thermal expansion, and phase transitions in CsMnCl3 · 2H2O (1971) (4)
- Optical modeling of Iridium thin film erosion under oxygen plasma exposure (2004) (4)
- Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry (2017) (4)
- In-situ ellipsometry on sputtered dielectric and magneto-optic thin films (1995) (4)
- Surface states at the GaAs-germanium nitride interface (1983) (4)
- Optical- and magneto-optical measurements using a variable angle of incidence spectroscopic ellipsometer: Application to DyCo multilayers (1989) (4)
- Upper limit for magnetoresistance in silicon bronze and phosphor bronze wire (1977) (4)
- Vacuum ultraviolet optical analysis of spin‐cast chitosan films modified by succinic anhydride and glycidyl phenyl ether (2007) (3)
- Optical Measurement Of Built-In And Applied Electric Fields In AlxGa1-xAs/GaAs Heterostructures (1988) (3)
- Thickness dependence of interfacial magneto-optic effects in Pt/Co multilayers (1998) (3)
- Spacecraft Thermal Control Management Using Electrochromics (2000) (3)
- The NVESD microfactory: a new approach to infrared focal plane array manufacturing [HgCdTe] (1996) (3)
- Electrochromic emittance modulation devices for spacecraft thermal control (2001) (3)
- Spectroscopic ellipsometry in optical coatings manufacturing (2001) (3)
- Superlattice Optical Properties Measured by Variable Angle Spectroscopic Ellipsometry (1987) (3)
- Optical and magneto-optical characterization of thin films (1992) (3)
- Graphite minority carriers (1971) (3)
- Magnetic and Magneto-Optical Properties of Nanostructured Rare Earth-Transition Metal Multilayered Films (1989) (3)
- Thin-Film Ternary Superconductors (1982) (3)
- Mechanical, geometrical, and electrical characterization of silicon membranes for open stencil masks (2001) (3)
- Substrate wobble compensation for in situ spectroscopic ellipsometry measurements (2017) (3)
- Infrared spectroscopic ellipsometry for nondestructive characterization of free-carrier and crystal-structure properties of group-III-nitride semiconductor device heterostructures (2001) (3)
- Electron cyclotron resonance etching of semiconductor structures studied by in-situ spectroscopic ellipsometry (1993) (3)
- Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry (2005) (3)
- Ellipsometric Analysis of Plasma Deposited and Plasma Etched Materials (1997) (3)
- Effects of oxygen “ashing” on indium-tin oxide thin films (1989) (3)
- Metrology applications in lithography with variable angle spectroscopic ellipsometry (1998) (3)
- Atomic Oxygen Plasma Effects on Cvd Deposited Diamond-Like Carbon Films (1991) (3)
- Upper critical field of two-phase CuxMo6S8 (1979) (3)
- Laboratory Simulation of Low Earth Orbit (1999) (3)
- Amorphous Ta‐rich Ta–Cu films as diffusion barriers between Au and GaAs (1988) (3)
- Substructure-Magnetic Property Correlation in Co/ag Composite Thin Films (1991) (3)
- Synergistic Degradation of CV-1144-O Due to Ultraviolet Radiation and Heat (2004) (3)
- Characterization of Polysilicon Thin Films by Variable Angle Spectroscopic Ellipsometry (1990) (3)
- Infrared optical properties of aged porous GaAs (2001) (3)
- Critical current density in wire drawn and hydrostatically extruded Nb-Ti superconductors (1979) (2)
- Comparative Thickness Measurements of Heterojunction Layers by Ellipsometric, RBS, and XTEM Analysis (1986) (2)
- Electrical resistivity (4K to 2100K) of annealed vapor grown carbon fibers (1987) (2)
- The longitudinal magnetoresistance of graphite ϱzz(Hz) in high magnetic fields (1971) (2)
- Superconducting critical field of Nb3Ge1-xSnx pseudobinaries (1981) (2)
- Thickness analysis of silicon membranes for stencil masks (2000) (2)
- Synthesis and characterization of albumin binding surfaces for implantable surfaces. (2004) (2)
- Oxygen plasma ashers as space simulators: a quantitative analysis of contamination with identification of sources and remedies (1993) (2)
- Ion-beam processing for laser mirrors (1983) (2)
- Structural and Chemical Analysis of a Silicon Nitride Film on GaAs by Null Ellipsometry (1984) (2)
- THIN FILM COMPOSITIONAL ANALYSIS USING NULL OR FIXED WAVELENGTH ELLIPSOMETRY. (1984) (2)
- R.F. Plasma CVD Of Diamond From Oxygen Containing Gases (1989) (2)
- Pulsed Laser Deposition of Magneto-Optic Material (1990) (2)
- Enhancing infrared response of adsorbed biomaterials using ellipsometry and textured surfaces (2005) (2)
- Low-Earth-Orbit Exposure of Carbon-Based Materials Aboard Shuttle Flight STS-46 (1995) (2)
- Quantum galvanomagnetic and thermomagnetic effects in graphite to 18.3 teslas /180 kG/ at low temperatures (1971) (2)
- Ellipsometric analysis of computer disk structures (1990) (2)
- Magnetooptics of multilayer systems (1989) (2)
- Diamondlike Carbon as a Moisture Barrier and Antireflecting Coating on Optical Materialst (1989) (2)
- Magnetic phase diagram of Cs3Cu2Cl7.2H2O (1970) (2)
- Ellipsometric characterization of thin Porous GaAs layers formed in HF solutions (2000) (2)
- Variable angle of incidence analysis of magneto‐optic multilayers (1990) (2)
- Spectroscopic ellipsometry as a sensitive monitor of materials contamination (1995) (2)
- In-Situ Spectroscopic Ellipsometry Applied to ZnSe and ZnCdSe Growth Process in Organometallic Vapor Phase Epitaxy (1992) (2)
- OPTICAL AND MAGNETO-OPTICAL PERFORMANCE OF OPTIMIZED DISK STRUCTURES (1991) (2)
- In situ process diagnostics and intelligent materials processing : symposium held December 2-5, 1997, Boston, Massachusetts, U.S.A. (1998) (2)
- Magnetic and magneto-optic study of a layered Co/Pt-Dysprosium-iron-garnet system (1998) (2)
- Ellipsometric studies of the diffusion of automic oxygen through silicon dioxide thin films (1990) (2)
- Recent Developments in Spectroscopic Ellipsometry for Materials and Process Control (2003) (1)
- In-Situ Ellipsometric Monitoring of the Electron Cyclotron Resonance Etching of Diamond-Like Carbon (1994) (1)
- Uncertainty Of Multiple Determination Of Optical Constants And Layer Thicknesses Of Thin Films Case Of TiO2/Ag/TiO2 Coating On Glass (1989) (1)
- Automated spectroscopic ellipsometry (1996) (1)
- Diffusion length measurements in solar cells: An analysis and comparison of techniques (1982) (1)
- Monitoring Organic Thin Film Growth In Aqueous Solution In-situ With A Combined Quartz Crystal Microbalance and Ellipsometry (2008) (1)
- Characterization of an Asymmetric Triangular Multiple Quantum Well, by Variable Angle Spectroscopic Ellipsometry (1989) (1)
- Applicability of scaling laws for superconducting critical currents in pseudo-binaries based on Nb3Ge (1978) (1)
- Diamondlike Carbon For Infrared Optics (1989) (1)
- Ellipsometric Monitoring of Defects Induced by Electron Cyclotron Resonance Etching of GaAs (1995) (1)
- INTEGRATED MID-INFRARED, FARINFRARED AND TERAHERTZ OPTICALHALL EFFECT (OHE) INSTRUMENT, ANDMETHOD OF USE (2017) (1)
- Interactions of amorphous TaxCu1−x (x=0.93 and 0.80) alloy films with Au overlayers and GaAs substrates (1987) (1)
- Non-Destructive Evaluation in Manufacturing using Spectroscopic Ellipsometry (1991) (1)
- Optical Properties Of A Silver Layer In ZnO/Ag/ZnO and TiO2/Ag/TiO2 Systems (1989) (1)
- Pulsed Laser Evaporation of Tl-Ba-Ca-Cu-O Films (1989) (1)
- Spectroscopic Ellipsometry and Band Structure of Si 1–y C y Alloys Grown Pseudomorphically on Si (001) (1995) (1)
- Quantitative oscillator analysis of IR-optical spectra on spin-cast chitosan films (2005) (1)
- Apparatus for trapping and thermal detection of atomic hydrogen in high magnetic fields at low temperatures (1980) (1)
- Characterization of component films in multilayer magneto-optic structures (1990) (1)
- Galvanomagnetic and thermomagnetic effects in white tin in fields to 3.3 tesla and at temperatures between 1.2 and 4.2 K (1969) (1)
- Magneto-optic and optical characterization of Tb/Co compositionally modulated amorphous films (1991) (1)
- Electrical Properties of Sbcl 5 , Icl, Hno 3 , and Br 2 Intercalated Pitch Based Carbon Fibers * (1982) (1)
- Temperature dependence (4K to 300K) of the electrical resistivity of methane grown carbon fibers (1987) (1)
- Spin orbit coupling and energy shifts in single crystal and pyrolytic graphite (1971) (1)
- Spectroscopic Ellipsometry Characterization of Polymers Modified by Atomic Oxygen and Ultraviolet Radiation (2001) (1)
- Study of temperature-dependent ultrathin oxide growth on Si(111) using variable-angle spectroscopic ellipsometry (1990) (1)
- Optical properties of thin films of methalene-blue, and crystal-violet organic dyes using variable angle spectroscopic ellipsometry (1992) (1)
- Coloration of glass exposed to atomic oxygen (1991) (1)
- Spectroscopic ellipsometry and band structure of Si{sub 1{minus}y}C{sub y} alloys grown pseudomorphically on Si (001) (1995) (1)
- Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells (2008) (1)
- 33. Electronic properties of PdCl2 and CuCl2 intercalated natural single crystals, HOPG and pitch based carbon fibers☆ (1982) (1)
- In Situ and Ex Situ Ellipsometric Characterization of Oxygen Plasma and UV Radiation Effects on Spacecraft Materials (1997) (1)
- Ellipsometric, Magneto-Optic, and Magnetic Properties of Sputtered Rare Earth-Transition Metal Multilayers (1987) (1)
- Pulsed Laser Deposition of HTSC Thallium Films (1990) (1)
- Positive curvature of the H/sub c2/-vs-T/sub c/ boundaries in layered superconductors (1974) (1)
- SURFACE ANALYSIS OF AMORPHOUS Ta-Cu ALLOY THIN FILMS. (1987) (1)
- Review of electrical and thermal properties of carbon and graphite (1975) (1)
- Dielectric Function of Polycrystalline SiC from 190 nm to 15 μm (1999) (1)
- Optical and magneto-optical properties of MnPt3 films (abstract) (1997) (1)
- De Haas-Shubnikov effect in tungsten (1971) (1)
- Optical constants for ellipsometric thickness determination of strained AlAs and InAs layers on InP (1994) (1)
- Variable Angle Spectroscopic Ellipsometric Characterization of Polycrystalline Silicon thin Film Multilayer Structures (1991) (1)
- NMR relaxation rate and the libron energy of solid hydrogen (1978) (1)
- Optical and Magneto-Optical Dielectric Constants of MnPt_3. (1996) (1)
- Minority carrier diffusion length measurements - A review and comparison of techniques (1982) (1)
- A simple A.C. technique for galvanomagnetic and shubnikov-de haas measurements (1968) (1)
- Effects of El Niño on the population dynamics of the Malay civet east of the Wallace line (2017) (1)
- SeisBench: A toolbox for benchmarking and applying machine learning in seismology. (2021) (1)
- Nucleation and Growth of CVD Si Thin Films: AFM, SE and Tem Analysis (1994) (1)
- Magnetic and Magneto-Optic Study of Co/pt Multilayers on Bismuth and Aluminum-Doped Dysprosium Iron Garnet (1998) (1)
- Dielectric Function of InGaAs in the Visible (1990) (1)
- Quantum limit studies in single crystal and pyrolytic graphite. (1972) (1)
- Ellipsometric study of InGaAs MODFET material (1990) (1)
- Ellipsometric study of silicon nitride on gallium arsenide (1982) (1)
- Variable angle spectroscopic magneto-optics and ellipsometry: Application to DyCo multilayers (abstract) (1988) (1)
- Ellipsometric studies of sputtered silicon nitride on n-GaAs (1982) (1)
- Optical property influence on magneto-optics of CoNi and TbCo multilayers on noble metal alloy substrates (1994) (1)
- Dielectric tensor for interfaces and individual layers in magnetic multilayer structures (2000) (1)
- Effective masses, relaxation times, and carrier mobilities in some chloride intercalants of graphite (1981) (1)
- Atomic oxygen effects on thin film space coatings studied by spectroscopic ellipsometry, atomic force microscopy, and laser light scattering (1992) (0)
- Iridium Metal as Potential Substrates for Experiments in Space (2004) (0)
- Infrared Ellipsometry Studies on Protein Layers : Model Dielectric Functions and Temperature Effects (2006) (0)
- 149. X-Ray photoelectron and Auger spectra of AS-deposited and annealed R.F. and I.B. deposited carbon films☆☆☆ (1984) (0)
- Maximum direct-gap reduction in CuPt ordered Al x Ga 1-x InP (0≤1) determined by generalized ellipsometry (1999) (0)
- Carbon Shields for Intercalated Fiber Conductors (1986) (0)
- Cermet film space optical coatings (2003) (0)
- Electronic properties of PbMo6S8 and CuxMo6S8. [for superconductivity] (1979) (0)
- Parametric Dispersion Models for the Index of Refraction of Transparent Materials (1995) (0)
- High field superconductivity in alkali metal intercalates of MoS2 (1973) (0)
- NON-DESTRUCTIVEAPPROACHTO ELLIPSOMETRIC MONITORING OF A FILM COATING ON THE INNER SURFACE OF A TUBE SHAPED SAMPLE (2020) (0)
- Optimized ellipsometric analysis of computer disk structures (1990) (0)
- Graphite minority carriers, from transport measurements to 10 teslas (1971) (0)
- Films of indium tin oxide (ITO) are ubiquitous in display applications as they combine optical (2016) (0)
- Studies of the Early Oxidation of Silicon (111) in Atomic Oxygen (1989) (0)
- Metrology standards with ellipsometers (1998) (0)
- Model dielectric functions for adsorbed protein layers (2005) (0)
- High Temperature, Electrically Conductive Graphite Composites For Space Nuclear Power. (1988) (0)
- 150. Interfacial electrical properties of amorphous, d.c. sputter-deposited carbon films on crystalline silicon☆ (1983) (0)
- SYSTEM FOR AND METHOD OF INVESTIGATING THE EXACT SAME POINT ON A SAMPLE SUBSTRATE WITH MULTIPLE WAVELENGTHS (2020) (0)
- DIELECTRIC RESPONSE OF 'DIAMONDLIKE' CARBON FILMS PREPARED BY RF PLASMA DEPOSITION. (1985) (0)
- Semiconductor materials analysis and fabrication process control : proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992 (1993) (0)
- In Situ Studies of Electron Cyclotron Resonance Plasma Etching of Semiconductors by Spectroscopic Ellipsometry (1992) (0)
- Galvanomagnetic effects in pyrolytic graphite in high magnetic fields (1972) (0)
- TERAHERTZ-INFRARED ELLIPSOMETER SYSTEM, AND METHOD OF USE (2020) (0)
- Pulsed laser deposition of Tl-Ca-Ba-Cu-O films (1990) (0)
- Study of Mo, Au, and Ni implanted molybdenum laser mirrors by spectroscopic ellipsometry (1985) (0)
- Multiple Order Dispersive Optics System and Method of Use (2013) (0)
- System and Method for Improving Data Acquisition Capability in Spectroscopic Ellipsometers (2013) (0)
- Method of Calibrating Effects of Field of Classification Search Multi-AOI-System for Easy Changing Angles-of-Incidence In Ellipsometers and The Like (2007) (0)
- Materials characterization using THz ellipsometry (2009) (0)
- Magnetic field effects on superconductivity in alkali metal intercalates of MoS2 (1972) (0)
- Optical Properties of Epitaxial Graphene (2011) (0)
- Diamondlike Carbon Coatings for Optical Systems (1989) (0)
- Spectroscopic Ellipsometric Characterization of TiO2/Ag/TiO2 Optical Coatings (1988) (0)
- Thickness Dependence of Interfacial Magneto-Optic Effects in Co/Pt Multilayers (1998) (0)
- Optical and Magneto-optical modeling of Ultra-thin Film Multilayers (1991) (0)
- Inorganic optical dielectric films (1996) (0)
- FLYING MOBILE ON-BOARD ELLIPSOMETER, POLARIMETER, REFLECTOMETER AND THE LIKE SYSTEMS (2020) (0)
- Self-calibrating modulation ellipsometer (1996) (0)
- Optical characterization of radio-frequency plasma-deposited amorphous carbon films (A) (1984) (0)
- Majority and minority carriers in graphite (1972) (0)
- Superconductivity in sputtered CuMo6S8 (1977) (0)
- Optical Constants of Electrochromic WO3 Determined by Variable Angle Spectroscopic Ellipsometry (1995) (0)
- Reflection of Polarized Light from Multiply Overcoated Magneto-Optic Materials: A Simplified Analysis Method (1989) (0)
- Applications of variable angle spectroscopic ellipsometry in semiconductor technology (1993) (0)
- Iridium substrates for space contamination studies: Erosion rates under atomic oxygen exposure (2003) (0)
- Magnetic field generated resistivity maximum in graphite (1976) (0)
- Real-time space materials degradation monitor using ellipsometer (1995) (0)
- United States Patent ( 19 ) Woollam 54 ATOMIC HYDROGEN STORAGE 75 ) Inventor : (2017) (0)
- Summary Abstract: Interfacial properties of ‘‘diamondlike’’ amorphous carbon films on InP: Metal–insulator–semiconductor structures (1986) (0)
- Isotropic and anisotropic Landau level transitions in epitaxial graphene revealed by infrared optical Hall effect (2013) (0)
- Intercalated-Carbon Low-Resistivity Fibers (1985) (0)
- Annealing time dependence of optical and magneto-optical properties of bi-substituted garnet films (1992) (0)
- Pulsed Laser Deposition of Tl-Ca-Ba-Cu-O Films at 248 nm (1990) (0)
- Degradation of thin films in low earth orbit and comparisons with laboratory simulation (1994) (0)
- 3D seismic velocity structure in the rupture area of the 2014 M8.2 Iquique earthquake in Northern Chile (2016) (0)
- Electron Transport Properties of Metallic Tin in High Magnetic Fields and at Liquid Helium Temperatures. (1967) (0)
- Ellipsometric analysis of materials degradation in space (1990) (0)
- Infrared ellipsometric characterization of Si x N y films on textured Si photovoltaic cells (2008) (0)
- In-situ ellipsometric control of magnetic multilayer deposition (abstract) (1997) (0)
- Dielectric tensor for magneto-optic NiMnSb Dielectric tensor for magneto-optic NiMnSb (2019) (0)
- Study of coloration effects on glass slides exposed in an oxygen plasma asher (1989) (0)
- A new figure of merit for solar selective surfaces (2005) (0)
- Analysis of variable angle spectroscopic ellipsometric measurements on uncoated magneto-optic materials (1988) (0)
- Self-organization in porous 6H–SiC Self-organization in porous 6H–SiC (2019) (0)
- Commercial development of a variable angle spectroscopic ellipsometer (1996) (0)
- ZnSe Coatings for Spacecraft Electrochromic Thermal Control Surfaces (2004) (0)
- Atomic hydrogen storage. [cryotrapping and magnetic field strength (1980) (0)
- Microstructural characterization of SiOx surface contaminants on ashed aluminum thin films (1997) (0)
- United States Patent: Ellipsometer (1994) (0)
- Real-time space materials degradation monitor using an ellipsometer (2008) (0)
- 147. Optical properties of r.f. plasma deposited and ion beam deposited amorphous carbon films (1984) (0)
- The Iquique 2014 sequence: understanding its nucleation and propagation from the seismicity evolution (2017) (0)
- Characteristics of component flims in multilayer magneto-optic strucures (1990) (0)
- and Optical Materials Research Departments of Electrical Engineering and Physics (2017) (0)
- Temperature Stability of Protein Monolayers Studied by Ellipsometry in the Infrared, Visible and Ultraviolet Spectral Regions (2006) (0)
- SYSTEM AND METHOD OFSELECTIVELY MONITORING SAMPLE FRONT AND BACKSIDE REFLECTIONS IN ELLIPSOMETER AND THE LIKE SYSTEMS (2020) (0)
- Anticorrelation of Shubnikov-deHaas amplitudes and negative magnetoresistance magnitudes in intercalated pitch based graphite fibers (1986) (0)
- SAMPLE INVESTIGATING SYSTEM AND METHOD OF USE SAMPLE INVESTIGATING SYSTEM AND METHOD OF USE (2020) (0)
- THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in HfO$_{2}$ passivated AlGaN/GaN HEMT structures (2011) (0)
- Self-organization in porous 6 H – (2013) (0)
- Optical and magneto-optical constants of MnPt 3 (2013) (0)
- Ellipsometer or Polarimeter and The Like System with Multiple Detector Element Detector in Environmental Control Chamber Including Secure Sample Access (2013) (0)
- Optical characterization of anisotropic plastics (1997) (0)
- Study of InGaAs based MODFET structures using variable angle spectroscopic ellipsometry (1991) (0)
- Broadband Ellipsometer Or Polarimeter System Including at Least One Multiple Element Lens (2013) (0)
- HEX: Hyperbolic Event eXtractor, a seismic phase association algorithm for regions of intense seismicity (2019) (0)
- Investigation of the use of IR ellipsometry for the detection of biological molecules (2006) (0)
- Characterizing UV induced polymer degradation with spectroscopic ellipsometry (1997) (0)
- Summary Abstract: Surface analysis of amorphous Ta–Cu thin films deposited on GaAs (1988) (0)
- Infrared and visible ellipsometric studies of cholera toxin in ELISA structures (2003) (0)
- Effects of ion bombardment on optical properties and microstructure of molybdenum laser mirror surfaces (A) (1983) (0)
- Structural and Chemical Analysis of a Silicon Nitride Film on GraAs by Null Ellipsometry (1984) (0)
- LEO degradation of graphite and carbon-based composites aboard Space Shuttle Flight STS-46 (1995) (0)
- A melt-processible high temperature superconductor (1987) (0)
- Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multiwave ellipsometry (1997) (0)
- Materials, Structures, and Devices for High-Speed Electronics (1992) (0)
- Ground and space based optical analysis of materials degradation in low-Earth-orbit (1991) (0)
- Optical properties of bulk SrTiO 3 and thin-films on Si and Pt (2000) (0)
- Prize for Industrial Applications of Physics Lecture: A physicist in Business (2013) (0)
- Magneto-optical and structural properties of BiAlDylG/Fe multilayers (2019) (0)
- CERMET THERMAL CONVERSION COATINGS FOR SPACE APPLICATIONS (2006) (0)
- AMORPHOUS HYDROGENATED 'DIAMONDLIKE' CARBON DIELECTRIC FILMS. (1985) (0)
- A Physicist in Business: Opportunities, Pitfalls, and Lifestyle. (2007) (0)
- MOLECULAR MOTIONS WITHIN SELF-ASSEMBLED MONOLAYERS (2014) (0)
- Phase transitions and magnetostriction in CsMnCl3-2H2O (1971) (0)
- SAMPLE INVESTIGATING SYSTEM SAMPLE INVESTIGATING SYSTEM (2020) (0)
- Improved apparatus for trapped radical and other studies down to 1.5 K. (1978) (0)
- OPTICAL AND MICROSTRUCTURAL STUDIES OF 'DIAMONDLIKE' CARBON FILMS USING SPECTROSCOPIC ELLIPSOMETRY. (1985) (0)
- Errata-Low Earth Orbit Simulation and Materials Characterization (1993) (0)
- Characterization of Inhomogeneous and Absorbing Thin Films by Combined Spectroscopic Ellipsometry/ Reflection, and Transmission Measurements (1992) (0)
- Optical properties of (1983) (0)
- Amorphous diamondlike carbon (a-C:H): a possible Cohen-Fritzsche-Ovshinsky system (1988) (0)
- MAGNETISM, DIMENSIONAL CHANGES, AND MAGNETIC TRANSITIONS IN HYDRATED CESIUM MANGANESE CHLORIDE (1972) (0)
- Obituary of Rodney Dillon (1942-2011) (2012) (0)
- Direct evidence for carrier locations in graphite - Thermoelectric and Hall quantum resonances (1970) (0)
- Optical properties of graded-index silicon oxynitride coatings (1991) (0)
- Thickness dependence of interfacial magneto-optic effects (1998) (0)
- Silicon dioxide space coatings studied ellipsometrically (1990) (0)
- Infrared ellipsometry studies of temperature effects on multilayers of ANTI-human serum albumin and its antigen (2005) (0)
- High Temperature Stability of Amorphous TaxCu1-x Diffusion Barriers on GaAs (1986) (0)
- The rmal and structural stability of cosputt ered amorphous Ta x Cu 1-x alloy thin fi lms on GaAs (1986) (0)
- Magnetic phase diagram of Cs3Cu2C17.2H20 (1970) (0)
- United States Patent: SYSTEM AND METHOD FOR COMPENSATING POLARIZATION-DEPENDENT SENSITIVITY OF DISPERSIVE OPTICS IN A ROTATING ANALYZER ELLIPSOMETER SYSTEM (1996) (0)
- Ellipsometric study of GaAs(100) surface changes induced at elevated temperatures (1993) (0)
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