Milton Ohring

Milton Ohring's AcademicInfluence.com Rankings

Milton Ohring

Engineering

#7261

World Rank

#8625

Historical Rank

Materials Science

#438

World Rank

#443

Historical Rank

engineering Degrees

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Engineering

Milton Ohring's Degrees

PhD Physics University of Pennsylvania
Masters Physics University of Pennsylvania
Bachelors Physics City College of New York

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Milton Ohring's Published Works

Number of citations in a given year to any of this author's works

Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author

Published Works

The Materials Science of Thin Films (1991) (3258)
Materials science of thin films : deposition and structure (2002) (620)
Reliability and Failure of Electronic Materials and Devices, Second Edition (1998) (344)
Void Formation and Growth During Electromigration in Thin Films (1971) (174)
Engineering Materials Science (1995) (118)
Band offset determination in analog graded parabolic and triangular quantum wells of GaAs/AlGaAs and GaInAs/AlInAs (1992) (112)
Chapter 6 – Characterization of Thin Films (1991) (111)
Chapter 1 – A Review of Materials Science (1992) (88)
Chapter 7 – Substrate Surfaces and Thin-Film Nucleation (2002) (70)
Network oxygen exchange during water diffusion in SiO2 (1981) (64)
Tracer self‐diffusion and electromigration in thin tin films (1976) (61)
Chapter 9 – Film Structure (2002) (47)
Tracer study of diffusion and electromigration in thin tin films (1984) (46)
Chapter 2 – Vacuum Science and Technology (1992) (46)
Dependence of the Si‐SiO2 barrier height on SiO2 thickness in MOS tunnel structures (1977) (44)
Electromigration Damage in Thin Films due to Grain Boundary Grooving Processes (1971) (43)
A Versatile Arc Melting Apparatus for Quenching Molten Metals and Ceramics (1971) (29)
Grain‐boundary electromigration in thin films II. Tracer measurements in pure Au (1977) (27)
Chapter 3 – Thin-Film Evaporation Processes (2002) (26)
Chapter 3 – Physical Vapor Deposition (1992) (22)
Chapter 9 – Mechanical Properties of Thin Films (1992) (21)
Low temperature compound formation in CuSn thin film couples (1982) (21)
Conversion‐electron Mössbauer spectroscopy of thin films (1976) (21)
Chapter 12 – Metallurgical and Protective Coatings (1992) (20)
Chapter 5 – Plasma and Ion Beam Processing of Thin Films (2002) (19)
Chapter 12 – Mechanical Properties of Thin Films (2002) (18)
Time-dependent void nucleation during electromigration☆ (1971) (18)
Conversion electron Mössbauer study of amorphous FeSi thin films (1978) (18)
1 – INTRODUCTION TO MATERIALS SCIENCE AND ENGINEERING (1995) (17)
Compound growth in platinum/tin-lead solder diffusion couples (1996) (17)
Chapter 4 – Discharges, Plasmas, and Ion–Surface Interactions (2002) (15)
Chapter 5 – Film Formation and Structure (1992) (14)
Chapter 10 – Degradation and Failure of Electro-optical Materials and Devices (1998) (14)
Reactions between tungsten and molybdenum thin films and polycrystalline diamond substrates (1996) (11)
Lateral self-diffusion and electromigration in thin metal films (1975) (10)
Grain‐boundary electromigration in thin films. I. Low‐temperature theory (1977) (10)
A digital tracer scanner for studies of longitudinal self‐diffusion in thin films (1974) (10)
Observation of a marker shift in a Cu-Sn thin film diffusion couple by Auger electron spectroscopy methods (1981) (10)
Chapter 11 – Interdiffusion, Reactions, and Transformations in Thin Films (2002) (10)
Growth rate and composition calibration of III/V materials on GaAs and InP using reflection high‐energy electron diffraction oscillations (1991) (10)
Chapter 6 – Chemical Vapor Deposition (2002) (9)
A dislocation dynamics study in alkali halides as revealed by deformation currents (1969) (9)
Electronic Devices: How They Operate and Are Fabricated (2011) (8)
Nucleation of small metal particles on ultrathin SiO2 films on Si (1974) (8)
Chapter 10 – Characterization of Thin Films and Surfaces (2002) (8)
Chapter 10 – Electrical and Magnetic Properties of Thin Films (1992) (7)
Why are thin films different from the bulk? (1994) (7)
Marker Motion during Electromigration in Thin Films (1972) (7)
15 – FAILURE AND RELIABILITY OF ELECTRONIC MATERIALS AND DEVICES (1995) (6)
9 – HOW ENGINEERING MATERIALS ARE STRENGTHENED AND TOUGHENED (1995) (6)
Chapter 11 – Optical Properties of Thin Films (1992) (6)
Gas‐Filled Bubbles in Ionic Solids (1969) (5)
A new experimental technique for studying mass transport in liquid metals (1989) (5)
7 – MECHANICAL BEHAVIOR OF SOLIDS (1995) (4)
Contact potential measurements on thin SiO2 films (1974) (4)
Void marker motion during electromigration in SnIn thin films (1971) (4)
Chapter 9 – Degradation of Contacts and Package Interconnections (1998) (4)
Mass transport effects in centrifuged bilayer liquid metals (1984) (3)
Deformation‐induced mössbauer spectra in NaCl (1973) (3)
Chapter 8 – Epitaxy (2002) (3)
8 – MATERIALS PROCESSING AND FORMING OPERATIONS (1995) (3)
Packaging Materials, Processes, and Stresses (2011) (3)
Chapter 1 – An Overview of Electronic Devices and Their Reliability (1998) (3)
11 – ELECTRICAL PROPERTIES OF METALS, INSULATORS, AND DIELECTRICS (1995) (2)
6 – KINETICS OF MASS TRANSPORT AND PHASE TRANSFORMATIONS (1995) (2)
Chapter 4 – Chemical Vapor Deposition (1992) (2)
Solute effects in very dilute ternary CuMnSe alloys (1988) (2)
Defects, Contaminants, and Yield (2011) (2)
Microtexture Measurements of Aluminum VLSI Metallization (1995) (2)
The Mathematics of Failure and Reliability (2015) (2)
Chapter 11 – Characterization and Failure Analysis of Materials and Devices (1998) (2)
Role of alloy valence on electromigration in thin tin alloy films (1976) (1)
An Overview of Electronic Devices and Their Reliability (2011) (1)
Chapter 8 – Interdiffusion and Reactions in Thin Films (1992) (1)
Environmental Damage to Electronic Products (2011) (1)
Experimental Measurements of Grain Boundary Rotation Toward Bamboo in Post-Pattern Annealing (1996) (1)
Device to Produce Crystallographic Bubbles in Solids (1967) (1)
Chapter 7 – Environmental Damage to Electronic Products (1998) (1)
Chapter 13 – Modification of Surfaces and Films (1992) (1)
Chapter 2 – Electronic Devices: How They Operate and Are Fabricated (1998) (1)
Chapter 8 – Packaging Materials, Processes, and Stresses (1998) (1)
Chapter 5 – Mass Transport–Induced Failure (1998) (1)
2 – ELECTRONS IN ATOMS AND SOLIDS: BONDING (1995) (1)
Abstract: Conversion electron Mössbauer studies of amorphous Fe–Si thin films (1978) (1)
Chapter 4 – The Mathematics of Failure and Reliability (1998) (1)
12 – SEMICONDUCTOR MATERIALS AND DEVICES: SCIENCE AND TECHNOLOGY (1995) (1)
Characterization and Failure Analysis of Materials and Devices (1998) (1)
Chapter 6 – Electronic Charge-Induced Damage (1998) (1)
Electronic Charge-Induced Damage (2015) (1)
14 – MAGNETIC PROPERTIES OF MATERIALS (1995) (1)
A note on electromigration-induced surface extrusions (1974) (0)
3 – STRUCTURE OF SOLIDS (1995) (0)
Degradation and Failure of Electro-Optical Materials and Devices (2011) (0)
Degradation of Contacts and Package Interconnections (2011) (0)
/ Network oxygen exchange during water diffusion in SiOa 00 ! > CO APR 131983 (2016) (0)
Abstract: Contact potential measurement of the charge distribution in thin SiO2 films (1974) (0)
Mass Transport-Induced Failure (2011) (0)
TEM observations of early nucleation and growth stages in aluminum films on liquid gallium droplets (1994) (0)
5 – THERMODYNAMICS OF SOLIDS (1995) (0)
Chapter 7 – Epitaxy (1992) (0)
Future Directions and Reliability Issues (2011) (0)
International Workshop on Thin Films Held in Iran (2003) (0)
On a correlation between impurity diffusion in metals and electrical resistivity due to impurities (1967) (0)
Chapter 3 – Defects, Contaminants and Yield (1998) (0)
13 – OPTICAL PROPERTIES OF MATERIALS (1995) (0)
Chapter 14 – Emerging Thin-Film Materials and Applications (1992) (0)
Chapter 12 – Future Directions and Reliability Issues (1998) (0)
4 – POLYMERS, GLASSES, CERAMICS, AND NONMETALLIC MIXTURES (1995) (0)
10 – DEGRADATION AND FAILURE OF STRUCTURAL MATERIALS (1995) (0)
Deformation-Induced Môssbauer Spectra in NaCl (1973) (0)

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