Milton Ohring
#164,973
Most Influential Person Now
Milton Ohring's AcademicInfluence.com Rankings
Milton Ohringengineering Degrees
Engineering
#7261
World Rank
#8625
Historical Rank
Materials Science
#438
World Rank
#443
Historical Rank

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Engineering
Milton Ohring's Degrees
- PhD Physics University of Pennsylvania
- Masters Physics University of Pennsylvania
- Bachelors Physics City College of New York
Why Is Milton Ohring Influential?
(Suggest an Edit or Addition)Milton Ohring's Published Works
Number of citations in a given year to any of this author's works
Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author
Published Works
- The Materials Science of Thin Films (1991) (3258)
- Materials science of thin films : deposition and structure (2002) (620)
- Reliability and Failure of Electronic Materials and Devices, Second Edition (1998) (344)
- Void Formation and Growth During Electromigration in Thin Films (1971) (174)
- Engineering Materials Science (1995) (118)
- Band offset determination in analog graded parabolic and triangular quantum wells of GaAs/AlGaAs and GaInAs/AlInAs (1992) (112)
- Chapter 6 – Characterization of Thin Films (1991) (111)
- Chapter 1 – A Review of Materials Science (1992) (88)
- Chapter 7 – Substrate Surfaces and Thin-Film Nucleation (2002) (70)
- Network oxygen exchange during water diffusion in SiO2 (1981) (64)
- Tracer self‐diffusion and electromigration in thin tin films (1976) (61)
- Chapter 9 – Film Structure (2002) (47)
- Tracer study of diffusion and electromigration in thin tin films (1984) (46)
- Chapter 2 – Vacuum Science and Technology (1992) (46)
- Dependence of the Si‐SiO2 barrier height on SiO2 thickness in MOS tunnel structures (1977) (44)
- Electromigration Damage in Thin Films due to Grain Boundary Grooving Processes (1971) (43)
- A Versatile Arc Melting Apparatus for Quenching Molten Metals and Ceramics (1971) (29)
- Grain‐boundary electromigration in thin films II. Tracer measurements in pure Au (1977) (27)
- Chapter 3 – Thin-Film Evaporation Processes (2002) (26)
- Chapter 3 – Physical Vapor Deposition (1992) (22)
- Chapter 9 – Mechanical Properties of Thin Films (1992) (21)
- Low temperature compound formation in CuSn thin film couples (1982) (21)
- Conversion‐electron Mössbauer spectroscopy of thin films (1976) (21)
- Chapter 12 – Metallurgical and Protective Coatings (1992) (20)
- Chapter 5 – Plasma and Ion Beam Processing of Thin Films (2002) (19)
- Chapter 12 – Mechanical Properties of Thin Films (2002) (18)
- Time-dependent void nucleation during electromigration☆ (1971) (18)
- Conversion electron Mössbauer study of amorphous FeSi thin films (1978) (18)
- 1 – INTRODUCTION TO MATERIALS SCIENCE AND ENGINEERING (1995) (17)
- Compound growth in platinum/tin-lead solder diffusion couples (1996) (17)
- Chapter 4 – Discharges, Plasmas, and Ion–Surface Interactions (2002) (15)
- Chapter 5 – Film Formation and Structure (1992) (14)
- Chapter 10 – Degradation and Failure of Electro-optical Materials and Devices (1998) (14)
- Reactions between tungsten and molybdenum thin films and polycrystalline diamond substrates (1996) (11)
- Lateral self-diffusion and electromigration in thin metal films (1975) (10)
- Grain‐boundary electromigration in thin films. I. Low‐temperature theory (1977) (10)
- A digital tracer scanner for studies of longitudinal self‐diffusion in thin films (1974) (10)
- Observation of a marker shift in a Cu-Sn thin film diffusion couple by Auger electron spectroscopy methods (1981) (10)
- Chapter 11 – Interdiffusion, Reactions, and Transformations in Thin Films (2002) (10)
- Growth rate and composition calibration of III/V materials on GaAs and InP using reflection high‐energy electron diffraction oscillations (1991) (10)
- Chapter 6 – Chemical Vapor Deposition (2002) (9)
- A dislocation dynamics study in alkali halides as revealed by deformation currents (1969) (9)
- Electronic Devices: How They Operate and Are Fabricated (2011) (8)
- Nucleation of small metal particles on ultrathin SiO2 films on Si (1974) (8)
- Chapter 10 – Characterization of Thin Films and Surfaces (2002) (8)
- Chapter 10 – Electrical and Magnetic Properties of Thin Films (1992) (7)
- Why are thin films different from the bulk? (1994) (7)
- Marker Motion during Electromigration in Thin Films (1972) (7)
- 15 – FAILURE AND RELIABILITY OF ELECTRONIC MATERIALS AND DEVICES (1995) (6)
- 9 – HOW ENGINEERING MATERIALS ARE STRENGTHENED AND TOUGHENED (1995) (6)
- Chapter 11 – Optical Properties of Thin Films (1992) (6)
- Gas‐Filled Bubbles in Ionic Solids (1969) (5)
- A new experimental technique for studying mass transport in liquid metals (1989) (5)
- 7 – MECHANICAL BEHAVIOR OF SOLIDS (1995) (4)
- Contact potential measurements on thin SiO2 films (1974) (4)
- Void marker motion during electromigration in SnIn thin films (1971) (4)
- Chapter 9 – Degradation of Contacts and Package Interconnections (1998) (4)
- Mass transport effects in centrifuged bilayer liquid metals (1984) (3)
- Deformation‐induced mössbauer spectra in NaCl (1973) (3)
- Chapter 8 – Epitaxy (2002) (3)
- 8 – MATERIALS PROCESSING AND FORMING OPERATIONS (1995) (3)
- Packaging Materials, Processes, and Stresses (2011) (3)
- Chapter 1 – An Overview of Electronic Devices and Their Reliability (1998) (3)
- 11 – ELECTRICAL PROPERTIES OF METALS, INSULATORS, AND DIELECTRICS (1995) (2)
- 6 – KINETICS OF MASS TRANSPORT AND PHASE TRANSFORMATIONS (1995) (2)
- Chapter 4 – Chemical Vapor Deposition (1992) (2)
- Solute effects in very dilute ternary CuMnSe alloys (1988) (2)
- Defects, Contaminants, and Yield (2011) (2)
- Microtexture Measurements of Aluminum VLSI Metallization (1995) (2)
- The Mathematics of Failure and Reliability (2015) (2)
- Chapter 11 – Characterization and Failure Analysis of Materials and Devices (1998) (2)
- Role of alloy valence on electromigration in thin tin alloy films (1976) (1)
- An Overview of Electronic Devices and Their Reliability (2011) (1)
- Chapter 8 – Interdiffusion and Reactions in Thin Films (1992) (1)
- Environmental Damage to Electronic Products (2011) (1)
- Experimental Measurements of Grain Boundary Rotation Toward Bamboo in Post-Pattern Annealing (1996) (1)
- Device to Produce Crystallographic Bubbles in Solids (1967) (1)
- Chapter 7 – Environmental Damage to Electronic Products (1998) (1)
- Chapter 13 – Modification of Surfaces and Films (1992) (1)
- Chapter 2 – Electronic Devices: How They Operate and Are Fabricated (1998) (1)
- Chapter 8 – Packaging Materials, Processes, and Stresses (1998) (1)
- Chapter 5 – Mass Transport–Induced Failure (1998) (1)
- 2 – ELECTRONS IN ATOMS AND SOLIDS: BONDING (1995) (1)
- Abstract: Conversion electron Mössbauer studies of amorphous Fe–Si thin films (1978) (1)
- Chapter 4 – The Mathematics of Failure and Reliability (1998) (1)
- 12 – SEMICONDUCTOR MATERIALS AND DEVICES: SCIENCE AND TECHNOLOGY (1995) (1)
- Characterization and Failure Analysis of Materials and Devices (1998) (1)
- Chapter 6 – Electronic Charge-Induced Damage (1998) (1)
- Electronic Charge-Induced Damage (2015) (1)
- 14 – MAGNETIC PROPERTIES OF MATERIALS (1995) (1)
- A note on electromigration-induced surface extrusions (1974) (0)
- 3 – STRUCTURE OF SOLIDS (1995) (0)
- Degradation and Failure of Electro-Optical Materials and Devices (2011) (0)
- Degradation of Contacts and Package Interconnections (2011) (0)
- / Network oxygen exchange during water diffusion in SiOa 00 ! > CO APR 131983 (2016) (0)
- Abstract: Contact potential measurement of the charge distribution in thin SiO2 films (1974) (0)
- Mass Transport-Induced Failure (2011) (0)
- TEM observations of early nucleation and growth stages in aluminum films on liquid gallium droplets (1994) (0)
- 5 – THERMODYNAMICS OF SOLIDS (1995) (0)
- Chapter 7 – Epitaxy (1992) (0)
- Future Directions and Reliability Issues (2011) (0)
- International Workshop on Thin Films Held in Iran (2003) (0)
- On a correlation between impurity diffusion in metals and electrical resistivity due to impurities (1967) (0)
- Chapter 3 – Defects, Contaminants and Yield (1998) (0)
- 13 – OPTICAL PROPERTIES OF MATERIALS (1995) (0)
- Chapter 14 – Emerging Thin-Film Materials and Applications (1992) (0)
- Chapter 12 – Future Directions and Reliability Issues (1998) (0)
- 4 – POLYMERS, GLASSES, CERAMICS, AND NONMETALLIC MIXTURES (1995) (0)
- 10 – DEGRADATION AND FAILURE OF STRUCTURAL MATERIALS (1995) (0)
- Deformation-Induced Môssbauer Spectra in NaCl (1973) (0)
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