Ondrej Krivanek

Ondrej Krivanek's AcademicInfluence.com Rankings

Ondrej Krivanek

Physics

#3957

World Rank

#5518

Historical Rank

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Physics

Why Is Ondrej Krivanek Influential?

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According to Wikipedia, Ondrej L. Krivanek is a Czech/British physicist resident in the United States, and a leading developer of electron-optical instrumentation. He won the Kavli Prize for Nanoscience in 2020 for his substantial innovations in atomic resolution electron microscopy.

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Ondrej Krivanek's Published Works

Number of citations in a given year to any of this author's works

Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author

Published Works

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy (2010) (1048)
Vibrational spectroscopy in the electron microscope (2014) (512)
Towards sub-Å electron beams (1999) (509)
Direct Sub-Angstrom Imaging of a Crystal Lattice (2004) (461)
Spectroscopic imaging of single atoms within a bulk solid. (2004) (279)
An electron microscope for the aberration-corrected era. (2008) (272)
Elnes of 3d transition-metal oxides. II, Variations with oxidation state and crystal structure (1990) (191)
Parallel detection electron spectrometer using quadrupole lenses (1987) (180)
Site-Specific Valence Determination by Electron Energy-Loss Spectroscopy (1982) (166)
Gentle STEM: ADF imaging and EELS at low primary energies $ (2010) (162)
Towards sub-0.5 A electron beams. (2003) (155)
Applications of slow-scan CCD cameras in transmission electron microscopy (1993) (148)
Lattice imaging of a grain boundary in crystalline germanium (1977) (133)
Design and first applications of a post-column imaging filter (1992) (129)
High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy (2009) (128)
Damage-free vibrational spectroscopy of biological materials in the electron microscope (2016) (113)
Identification of site-specific isotopic labels by vibrational spectroscopy in the electron microscope (2019) (112)
Monochromated STEM with a 30 meV-wide, atom-sized electron probe. (2013) (110)
Silicon-carbon bond inversions driven by 60-keV electrons in graphene. (2014) (105)
Developments in EELS instrumentation for spectroscopy and imaging (1991) (103)
Nanoscale momentum-resolved vibrational spectroscopy (2018) (103)
Elnes of 3d transition-metal oxides: I. Variations across the periodic table (1990) (102)
Progress in ultrahigh energy resolution EELS. (2019) (88)
Single atom identification by energy dispersive x-ray spectroscopy (2012) (81)
Applications of a post-column imaging filter in biology and materials science. (1993) (68)
An imaging filter for biological applications. (1995) (68)
Single-defect phonons imaged by electron microscopy (2021) (68)
Electron-Beam Mapping of Vibrational Modes with Nanometer Spatial Resolution. (2016) (67)
EELS atlas : a reference collection of electron energy loss spectra covering all stable elements (1983) (67)
Improvements in the X-Ray Analytical Capabilities of a Scanning Transmission Electron Microscope by Spherical-Aberration Correction (2006) (66)
Temperature Measurement by a Nanoscale Electron Probe Using Energy Gain and Loss Spectroscopy. (2018) (65)
EELS quantification near the single-atom detection level (1991) (65)
IMAGING OF THIN INTERGRANULAR PHASES BY HIGH RESOLUTION ELECTRON MICROSCOPY (1979) (65)
Single Atom Microscopy (2012) (58)
The structure of ultrathin oxide on silicon (1980) (55)
Electron energy loss spectroscopy as a probe of the local atomic environment (1982) (48)
Electron energy loss spectriscopy in glancing reflection from bulk crystals (1983) (46)
Three-fold astigmatism in high-resolution transmission electron microscopy (1994) (42)
Dedicated STEM for 200 to 40 keV operation (2011) (41)
Towards sub-10 meV energy resolution STEM-EELS (2014) (39)
Surface roughness scattering at the Si–SiO2 interface (1983) (39)
Characteristic energy losses from channeled 100 keV electrons (1982) (39)
Vibrational Spectroscopy of Water with High Spatial Resolution (2018) (39)
Hybrid pixel direct detector for electron energy loss spectroscopy. (2020) (38)
Orientation-dependent extended fine structure in electron-energy-loss spectra (1982) (34)
Effect of three-fold astigmatism on high resolution electron micrographs (1995) (30)
Surface roughness induced scattering and band tailing (1982) (29)
Scanning transmission electron microscopy: Albert Crewe's vision and beyond. (2012) (25)
The core structure of extrinsic stacking faults in silicon (1978) (25)
CHAPTER 3 – Advances in Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy (2008) (23)
Automated processing of parallel-detection EELS data (1991) (21)
An imaging filter for high voltage electron microscopy (1995) (20)
EELS in the Electron Microscope--A Review of Present Trends (1986) (20)
Synthesis of Electron Energy Loss Spectra for the Quantification of Detection Limits (2002) (19)
Elemental Mapping by Energy-Filtered Electron Microscopy (1994) (18)
Experimental and theoretical study of the detection limits in electron energy-loss spectroscopy (1999) (17)
The inelastic contribution to high resolution images of defects (1990) (17)
Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits (2012) (17)
Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python. (2019) (17)
Advances in Ultra-High Energy Resolution STEM-EELS (2018) (16)
Toward Single Mode, Atomic Size Electron Vortex Beams (2014) (15)
Atomic-Resolution STEM at Low Primary Energies (2011) (14)
Aberration correction in the STEM (2022) (14)
Aberration-corrected STEM: current performance and future directions (2006) (13)
Improved parallel-detection Electron-Energy-Loss Spectrometer (1989) (13)
Polarization Selectivity in Vibrational Electron-Energy-Loss Spectroscopy. (2019) (12)
Individual heteroatom identification with X-ray spectroscopy (2016) (11)
Toward Atomic-Scale Tomography: The ATOM Project (2011) (11)
A post-column imaging energy filter with a 20482-pixel slow-scan CCD camera (1998) (11)
Analytical electron microscopy at the atomic level with parallel electron energy loss spectroscopy (1990) (10)
On-Line Aberration Measurement and Correction in STEM (1997) (9)
Aberration-corrected Precession Electron Diffraction (2007) (9)
Structure of the InP/SiO2 interface (1985) (9)
Glass‐Free Grain Boundaries in BeSiN Ceramics (1979) (9)
A combined high‐resolution electron microscopy, x‐ray photoemission spectroscopy, and electrical properties study of the InP–SiO2 interface (1985) (9)
Ultra-High Vacuum Aberration-Corrected STEM for in-situ studies (2016) (9)
MTF restoration with slow-scan CCD cameras (1993) (8)
HREM imaging and microanalysis of a III-V semiconductor/oxide interface (1984) (8)
Brief history of the Cambridge STEM aberration correction project and its progeny. (2015) (8)
Optimizing the Nion STEM for In-Situ Experiments (2018) (7)
Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements (2014) (7)
Materials Applications of Aberration-Corrected STEM (2004) (6)
Applications of aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy to thin oxide films and interfaces (2010) (6)
X-ray Microanalysis and High Resolution Imaging of Ge-Au-Ni Metal Layers on Gallium Arsenide (1983) (6)
Temperature-dependent transmission extended electron energy-loss fine structure of aluminum (1989) (6)
Sub-1 eV resolution eels at energy losses greater than 1 keV (1985) (6)
Electron Energy Loss Spectroscopy of Surfaces and Interfaces (1981) (6)
Tuning High Order Geometric Aberrations in Quadrupole-Octupole Correctors (2014) (6)
Improving the STEM Spatial Resolution Limit (2018) (6)
Ultra-High Energy Resolution EELS (2017) (6)
Isotope-Resolved Electron Energy Loss Spectroscopy in a Monochromated Scanning Transmission Electron Microscope (2021) (6)
Sub-Ångstrom Resolution through Aberration-Corrected STEM (2003) (5)
Using Nion Swift for Data Collection, Analysis and Display (2014) (4)
High-Fidelity 4D-STEM Enabled by Live Processing at 15’000 Detector Frames Per Second (2021) (4)
Performance of the Gatan PEELS™ on the VG HB501 STEM (1989) (4)
High-resolution microanalysis of semiconductor interfaces (1985) (4)
Exploring phonon signals by high energy / high spatial resolution EELS (2014) (4)
Complete HREM autotuning using automated diffractogram analysis (1992) (4)
High resolution imaging of the interfacial region in metal‐insulator‐semiconductor and Schottky diodes (1983) (4)
Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM (2010) (3)
Temperature Measurement by a Nanoscale Electron Probe using Energy Gain and Loss Spectroscopy (2018) (3)
Monochromated STEM with high energy and spatial resolutions (2012) (3)
Design and Testing of a Quadrupole/Octupole C3/C5 Aberration Corrector (2005) (3)
Ultra-high Energy Resolution EELS (2020) (3)
STEM Aberration Correction: an Integrated Approach (2008) (3)
100,000 Diffraction Patterns per Second with Live Processing for 4D-STEM (2022) (3)
Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images (1993) (3)
Measurement of TEM primary energy with an electron energy-loss spectrometer (1995) (3)
Nion UltraSTEM: An Aberration-Corrected STEM for Imaging and Analysis (2005) (3)
Erratum: Damage-free vibrational spectroscopy of biological materials in the electron microscope (2016) (3)
Elemental mapping with a parallel-detection Electron Energy-Loss Spectrometer (1989) (2)
High resolution studies of glass‐crystal interfaces (1980) (2)
Comparison of Ptychography vs. Center-of-mass Analysis of Registered 4D-STEM Series (2020) (2)
MICROSTRUCTURE OF HOT-PRESSED AND SINTERED SILICON NITRIDES (1978) (2)
Hybrid Pixel EELS Detector: Low Noise, High Speed, and Large Dynamic Range (2020) (2)
High Energy Resolution Monochromated EELS-STEM System (2013) (2)
Advances in STEM and EELS: New Operation Modes, Detectors and Software (2019) (2)
Initial Results from Aberration Correction in STEM (2002) (2)
Aberration Correction in Electron Microscopy (2017) (2)
Progress in Ultra-High Energy Resolution EELS (2019) (2)
Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS (2014) (2)
Atomic-Resolution STEM at 60kV Primary Voltage (2008) (2)
Lattice Imaging of a High-Angle Grain Boundary in Germanium at 500kv (1977) (1)
Aberration-Corrected STEM for Elemental Mapping (2003) (1)
Damage-free Analysis of Biological Materials by Vibrational Spectroscopy in the EM (2020) (1)
Monochromatic STEM-EELS for Correlating the Atomic Structure and Optical Properties of Two-Dimensional Materials (2014) (1)
Nanoscale Structure/Property Correlation Through Aberration-Corrected Stem And Theory (2002) (1)
Stable and Flexible Side-Entry Stage for Nion STEMs (2017) (1)
High-stability, Highly Automated Double-eucentric (S)TEM Sample Stage (2006) (1)
Albert Crewe-inventor of the modern STEM. (2012) (1)
Single-defect phonons imaged by electron microscopy (2021) (1)
STEM Aberration Correction: Where Next? (2002) (1)
Advances in Atomic-resolution and Molecular-detection EELS (2017) (1)
Aberration Correctors, Monochromators, Spectrometers (2019) (1)
Zen-like Simplicity is Hard Work, and Other Secrets I Learned from Peter Swann (2015) (1)
Physical and Chemical Characterization of Interfaces by Electron Optical Methods (1981) (1)
Single Atom Microscopy (2012) (1)
Applications of Electron Energy Loss Spectroscopy in Materials Science (1980) (1)
Aberration-Corrected STEM (2009) (1)
Open-Source Python Scripting and Analysis with Nion Swift (2013) (1)
Progress in Aberration-Corrected STEM (2000) (1)
Platform Wars: Macintosh-Based Digitization Systems (1997) (0)
First-Principles Modeling of Vibrational Electron Energy Loss Spectra (2019) (0)
ELECTRON MICROSCOPY STUDIES OF GRAIN BOUNDARY SEGREGATION IN a A12O3 (1978) (0)
Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures (2010) (0)
Seeing into Materials with Aberration-corrected STEM and First- Principles Theory (2011) (0)
Materials analysis by aberration-corrected STEM (2004) (0)
Auto-adjustment of a transmission electron microscope energiefiltrierenden (1997) (0)
Exploring new frontiers with the Nion aberration-corrected STEM (2012) (0)
Instrumentation/Technique Developments in Gareth Thomas’s Research Group (2016) (0)
Probing Local Vibration Modes at Single Planar Defects by Vibrational Spectroscopy (2020) (0)
Revealing Biomineralization and SOM-Mineral Associations with Chemical Imaging Methods (2020) (0)
Towards topological spectroscopy in the electron microscope with atomic resolution (2018) (0)
Smarter than an iPhone: the emergence of the modern electron microscope (2017) (0)
THE STRUCTURE OF ULTRA-THIN OXIDE ON SILICON - eScholarship (2012) (0)
Parallel-Beam Diffraction and Direct Imaging in an Aberration-Corrected STEM (2012) (0)
Angle-Resolved Electron Energy Loss Spectroscopy (2020) (0)
Improving the Spatial and Energy Resolution of Aberration-Corrected STEM (2011) (0)
Improving the Spatial Resolution of Low-keV STEM with a Monochromator (2013) (0)
TEM, microdiffraction and electrical studies of buried SiO2 layers formed by high dose oxygen implantation (1983) (0)
Mrs Movers & Shakers (2020) (0)
Annular Dark-Field Imaging of Atomic Substitution in Single-Layer Materials (2010) (0)
Modelling of electron energy-loss spectroscopy detection limits (2022) (0)
Vibrational Spectroscopy of Liquid Water by Monochromated Aloof EELS (2018) (0)
Aberration corrected optical apparatus for charged particles (2003) (0)
John C.H. Spence – friend, teacher, mentor, scientific pioneer and visionary (2022) (0)
Advances in Momentum Resolved EELS (2021) (0)
Design and Testing of a Quadrupole / Octupole C 3 / C 5 Aberration Corrector (2005) (0)
5D-STEM: Live processing and display at 15,000 diffraction patterns per second (2021) (0)
Development of Computer Assisted Electron Microscopy (2003) (0)
Localized signals in vibrational STEM-EELS (2017) (0)
EELS in STEM: the “Swiss Army Knife” of Spectroscopy (2019) (0)
Congreso de la Asociación Argentina de Microscopía ( SAMIC 2016 ) Atomic-resolution studies of materials by monochromated , aberration-corrected STEM (2016) (0)
Synthesis of Electron Energy Loss Spectra and Application to Quantifying Detection Limits in Materials Science (1999) (0)
UltraSTEM Progress: Flexible Electron Optics, High-Performance Sample Stage (2007) (0)
Damage-Free Nanoscale Isotopic Analysis of Biological Materials with Vibrational Electron Spectroscopy (2019) (0)
An Aberration-Corrected STEM for Diffraction Studies (2005) (0)
Revealing Soil Organic Matter-mineral Associations with Advanced Chemical Imaging Methods (2020) (0)
Space- and Angle-Resolved Vibrational Spectroscopy to Probe the Local Phonon Modes at Planar Defects (2021) (0)
In-Situ Characterization of 2-Dim Materials at High Energy and Spatial Resolution (2019) (0)
Probing Biological Materials by Vibrational Analysis in the Electron Microscope (2022) (0)
Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy (2012) (0)
Electron energy loss spectroscopy in glancing reflection and other recent EELS developments (1983) (0)
Aberration Correction in Energy Loss Spectrometers and Monochromators (2009) (0)
Aberration correction in electron microscopy and spectroscopy (2021) (0)
SDD-EDS: Element Analysis of Nanostructures in TEM (2012) (0)
MT volume 29 issue 3 Cover and Front matter (2021) (0)
Transmission EXELFS: Temperature dependence (1989) (0)
Opportunities and Challenges in Ultra-High Energy Resolution EELS (2016) (0)
’A Priori’ synthesis of electron energy-loss spectra for detection limit quantification (2001) (0)
Atomic Resolution Mapping of Inequivalent O Sites in Complex Oxides (2009) (0)
Transition metal oxides revisited: ELNES of metal L2,3 and oxygen K edges (1989) (0)
HIGH RESOLUTION SCANNING AUGER MICROANALYSIS OF HIGH-STRENGTH SILICON CARBIDES (2012) (0)
Fine structure of inner shell electron energy loss edges of manganese oxides (1989) (0)
An Integrated Energy-Filtering TEM for The Life Sciences (1996) (0)
Modeling Vibrational EELS: From Bulk to Point Defects (2020) (0)

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Other Resources About Ondrej Krivanek

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What Schools Are Affiliated With Ondrej Krivanek?

Ondrej Krivanek is affiliated with the following schools:

University of Leeds
Arizona State University
University of Cambridge