Peter Nellist
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Materials Science
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Applied Physics
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Engineering Physics
Peter Nellist's Degrees
- Bachelors Physics University of Oxford
- PhD Materials Science Stanford University
Why Is Peter Nellist Influential?
(Suggest an Edit or Addition)According to Wikipedia, Peter David Nellist, is a British physicist and materials scientist, currently a professor in the Department of Materials at the University of Oxford. He is noted for pioneering new techniques in high-resolution electron microscopy.
Peter Nellist's Published Works
Number of citations in a given year to any of this author's works
Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author
Published Works
- Two-Dimensional Nanosheets Produced by Liquid Exfoliation of Layered Materials (2011) (5686)
- Direct Sub-Angstrom Imaging of a Crystal Lattice (2004) (461)
- Incoherent imaging using dynamically scattered coherent electrons (1999) (363)
- Scanning transmission electron microscopy : imaging and analysis (2011) (305)
- Smart Align—a new tool for robust non-rigid registration of scanning microscope data (2015) (304)
- Spectroscopic imaging of single atoms within a bulk solid. (2004) (279)
- Direct Imaging of the Atomic Configuration of Ultradispersed Catalysts (1996) (278)
- The principles and interpretation of annular dark-field Z-contrast imaging (2000) (260)
- Filled and glycosylated carbon nanotubes for in vivo radioemitter localization and imaging. (2010) (251)
- Progress in aberration-corrected scanning transmission electron microscopy. (2001) (212)
- Resolution beyond the 'information limit' in transmission electron microscopy (1995) (194)
- Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolution. (2015) (181)
- Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures (2016) (173)
- Direct observation of the core structures of threading dislocations in GaN (1998) (155)
- Towards sub-0.5 A electron beams. (2003) (155)
- Efficient phase contrast imaging in STEM using a pixelated detector. Part II: optimisation of imaging conditions. (2015) (155)
- Subangstrom Resolution by Underfocused Incoherent Transmission Electron Microscopy (1998) (135)
- Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope (2013) (130)
- The atomic origins of reduced critical currents at [001] tilt grain boundaries in YBa2Cu3O7−δ thin films (1998) (130)
- Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images. (2013) (118)
- Atomic-scale microstructure of metal halide perovskite (2020) (118)
- Experimental tests on double-resolution coherent imaging via STEM (1993) (112)
- Z-Contrast Scanning Transmission Electron Microscopy (1999) (101)
- Accurate structure determination from image reconstruction in ADF STEM (1998) (98)
- Scanning Transmission Electron Microscopy (2019) (90)
- Confocal operation of a transmission electron microscope with two aberration correctors (2006) (88)
- Electron ptychographic microscopy for three-dimensional imaging (2017) (80)
- HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis. (2004) (76)
- A non-syn-gas catalytic route to methanol production (2012) (69)
- Probing the bonding in nitrogen-doped graphene using electron energy loss spectroscopy. (2013) (67)
- Beyond the conventional information limit: the relevant coherence function (1994) (67)
- Crystal Structure of the ZrO Phase at Zirconium/Zirconium Oxide Interfaces** (2014) (64)
- Dialkyl sulfides: Novel passivating agents for gold nanoparticles (2002) (63)
- Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope (2009) (61)
- High Angle Dark Field STEM for Advanced Materials (1996) (61)
- Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution. (2017) (60)
- On the origin of transverse incoherence in Z-contrast STEM. (2001) (58)
- A Bloch wave analysis of optical sectioning in aberration-corrected STEM. (2007) (57)
- The Principles of STEM Imaging (2011) (57)
- Atomic-scale detection of organic molecules coupled to single-walled carbon nanotubes. (2007) (56)
- Investigation of the evolution of single domain (111)B CdTe films by molecular beam epitaxy on miscut (001)Si substrate (1998) (53)
- 2020 roadmap on solid-state batteries (2020) (52)
- Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning (2015) (52)
- Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scattering. (2008) (50)
- Low-dose phase retrieval of biological specimens using cryo-electron ptychography (2020) (49)
- Imaging Modes for Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope (2007) (48)
- Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering. (2008) (48)
- Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting. (2015) (47)
- 4D STEM: High efficiency phase contrast imaging using a fast pixelated detector (2015) (46)
- Low-Dose Aberration-Free Imaging of Li-Rich Cathode Materials at Various States of Charge Using Electron Ptychography. (2018) (43)
- Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping. (2017) (43)
- THREE-DIMENSIONAL ATOMIC STRUCTURE OF NiO- ZrO2(CUBIC) INTERFACES (1998) (42)
- Predicting the Oxygen-Binding Properties of Platinum Nanoparticle Ensembles by Combining High-Precision Electron Microscopy and Density Functional Theory. (2017) (42)
- Electron ptychography. I. Experimental demonstration beyond the conventional resolution limits (1998) (42)
- Unusual stacking variations in liquid-phase exfoliated transition metal dichalcogenides. (2014) (41)
- Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy. (2016) (40)
- Managing dose-, damage- and data-rates in multi-frame spectrum-imaging. (2018) (39)
- Doping-dependent nanofaceting on silicon nanowire surfaces (2009) (39)
- Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscope. (2010) (39)
- The mechanical properties of tungsten grown by chemical vapour deposition (2009) (39)
- The development of a 200 kV monochromated field emission electron source. (2014) (38)
- Observation of van der Waals Driven Self‐Assembly of MoSI Nanowires into a Low‐Symmetry Structure Using Aberration‐Corrected Electron Microscopy (2007) (37)
- From Nanocrystals to Nanorods: New Iron Oxide−Silica Nanocomposites from Metallorganic Precursors (2008) (37)
- Aberration measurement using the Ronchigram contrast transfer function. (2010) (36)
- ATOMISTIC STRUCTURE OF MISFIT DISLOCATIONS IN SrZrO3/SrTiO3 INTERFACES (1998) (36)
- Interdiffusion and barrier layer formation in thermally evaporated Mn/Cu heterostructures on SiO2 substrates (2011) (36)
- Chemical and structural investigation of the role of both Mn and Mn oxide in the formation of manganese silicate barrier layers on SiO2 (2011) (36)
- Structure and Bonding at Ni–ZrO2 (Cubic) Interfaces Formed by the Reduction of a NiO–ZrO2 (Cubic) Composite (1997) (33)
- The dissociation of the [a + c] dislocation in GaN (2013) (31)
- Hybrid statistics-simulations based method for atom-counting from ADF STEM images. (2017) (30)
- Interstitial Boron Atoms in Palladium Lattice of Industrial Type of Nano-catalyst: Properties and Structural Modifications. (2019) (30)
- Introduction to Scanning Transmission Electron Microscopy (2002) (29)
- Optimal ADF STEM imaging parameters for tilt-robust image quantification. (2015) (29)
- Phase reconstruction using fast binary 4D STEM data (2020) (29)
- High dose efficiency atomic resolution imaging via electron ptychography. (2019) (28)
- Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images. (2018) (28)
- Quantitative Energy-Dispersive X-Ray Analysis of Catalyst Nanoparticles Using a Partial Cross Section Approach (2016) (28)
- Enhanced Phase Contrast Transfer using Ptychography Combined with a Pre-Specimen Phase Plate in a Scanning Transmission Electron Microscope (2016) (27)
- Targeted T1 Magnetic Resonance Imaging Contrast Enhancement with Extraordinarily Small CoFe2O4 Nanoparticles (2019) (25)
- Subsampled STEM-ptychography (2018) (25)
- Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy (2014) (25)
- Quantitative STEM normalisation: The importance of the electron flux. (2015) (24)
- WS₂ 2D nanosheets in 3D nanoflowers. (2014) (24)
- Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride. (2014) (23)
- Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope (2000) (22)
- How flat is your detector? Non-uniform annular detector sensitivity in STEM quantification (2013) (22)
- Aberration-corrected scanning transmission electron microscopy: the potential for nano- and interface science (2003) (20)
- Contrast transfer and noise considerations in focused-probe electron ptychography. (2020) (19)
- Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy. (2020) (19)
- Impurity induced non-bulk stacking in chemically exfoliated h-BN nanosheets. (2013) (19)
- Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope (2012) (18)
- Analysis of nanometre‐sized pyrogenic particles in the scanning transmission electron microscope (1996) (18)
- Seeing with electrons (2005) (18)
- Scanning transmission electron microscopy investigations of self-forming diffusion barrier formation in Cu(Mn) alloys on SiO2 (2013) (18)
- Boron-mediated nanotube morphologies. (2012) (18)
- Atomic layer graphoepitaxy for single crystal heterostructures (1997) (17)
- Atomic Structure of a 36.8 (210) Tilt Grain Boundary in TiO2 (2005) (17)
- Towards quantitative analysis of core-shell catalyst nano-particles by aberration corrected high angle annular dark field STEM and EDX (2010) (16)
- Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. (2011) (16)
- High-Resolution TEM and the Application of Direct and Indirect Aberration Correction (2008) (16)
- Chemical and structural investigations of the interactions of Cu with MnSiO3 diffusion barrier layers (2012) (15)
- Direct imaging and chemical identification of the encapsulated metal atoms in bimetallic endofullerene peapods. (2010) (15)
- Single-step exfoliation and chemical functionalisation of graphene and hBN nanosheets with nickel phthalocyanine (2012) (14)
- ADF STEM imaging of screw dislocations viewed end-on (2010) (14)
- Aberration-corrected STEM: current performance and future directions (2006) (13)
- Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy. (2019) (13)
- Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM. (2018) (13)
- The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials. (2019) (13)
- Use of a hybrid silicon pixel (Medipix) detector as a STEM detector (2015) (12)
- Dependence of surface facet period on the diameter of nanowires. (2010) (11)
- Electron Microscopy and Analysis Group Conference 2011 (EMAG 2011) (2012) (11)
- Increasing Spatial Fidelity and SNR of 4D-STEM Using Multi-Frame Data Fusion (2021) (11)
- Chemical and structural investigations of the incorporation of metal manganese into ruthenium thin films for use as copper diffusion barrier layers (2012) (10)
- Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy (2008) (10)
- Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy. (2018) (10)
- Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy (2010) (9)
- Electron-optical sectioning for three-dimensional imaging of crystal defect structures (2017) (9)
- Ideal versus real: simulated annealing of experimentally derived and geometric platinum nanoparticles (2018) (9)
- Comparison of simulation methods for electronic structure calculations with experimental electron energy-loss spectra. (2003) (9)
- Three-dimensional elemental mapping of hollow Fe2O3@SiO2 mesoporous spheres using scanning confocal electron microscopy (2012) (9)
- Limitations of the dipole approximation in calculations for the scanning transmission electron microscope (1999) (8)
- Strain effects in core-shell PtCo nanoparticles: a comparison of experimental observations and computational modelling. (2020) (8)
- Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM (2016) (8)
- Atomic resolution comes into phase (2012) (8)
- Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes (2008) (8)
- Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset (2017) (8)
- Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy (2012) (7)
- Theoretical interpretation of electron energy‐loss spectroscopic images (2008) (7)
- Direct electron beam writing of nanostructures using passivated gold clusters (2000) (7)
- A Combined Experimental and Theoretical Approach to Atomic Structure and Segregation at Ceramic Interfaces (1999) (7)
- Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy. (2012) (6)
- Direct imaging of oxygen shifts associated with the oxygen redox of Li-rich layered oxides (2022) (6)
- 4D-STEM Imaging With the pnCCD (S)TEM-Camera (2015) (6)
- New possibilities with aberration-corrected electron microscopy (2009) (6)
- Morphology--composition correlations in carbon nanotubes synthesised with nitrogen and phosphorus containing precursors. (2015) (6)
- Materials Applications of Aberration-Corrected STEM (2004) (6)
- 3D elemental mapping with nanometer scale depth resolution via electron optical sectioning. (2017) (6)
- Direct Imaging of Charge Redistribution due to Bonding at Atomic Resolution via Electron Ptychography (2019) (6)
- Low-loss EELS of 2D boron nitride (2012) (6)
- Sub-Ångstrom Resolution through Aberration-Corrected STEM (2003) (5)
- Transmission Electron Microscopy: Overview and Challenges (2003) (5)
- Contrast in atomically resolved EF-SCEM imaging. (2013) (5)
- Self-assembly of LiMo3Se3 nanowire networks from nanoscale building-blocks in solution. (2012) (5)
- Testing the accuracy of the two-dimensional object model in HAADF STEM. (2014) (5)
- Evidence of High-Pressure Rhodium Sesquioxide in the Rhodium/γ-Alumina Catalytic System (2008) (5)
- An optical configuration for fastidious STEM detector calibration and the effect of the objective‐lens pre‐field (2018) (4)
- Quantification of ADF STEM images of molybdenum chalcogenide nanowires (2006) (4)
- Ultrafast Ptychography with 7500 Frames per Second (2019) (4)
- Significant Performance Improvement in n‐Channel Organic Field‐Effect Transistors with C60:C70 Co‐Crystals Induced by Poly(2‐ethyl‐2‐oxazoline) Nanodots (2021) (4)
- Experimental Setup for Energy-Filtered Scanning Confocal Electron Microscopy (EFSCEM) in a Double Aberration- Corrected Transmission Electron Microscope (2010) (4)
- Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope (2008) (3)
- Prospects for 3D Characterization of Materials by Aberration Corrected STEM and SCEM (2007) (3)
- Quantitative analysis of core-shell catalyst nanoparticles for industrial applications (2012) (3)
- The Ultimate Resolution in Aberration-Corrected STEM (2002) (3)
- Probing Atomic Scale Dynamics with STEM (2014) (3)
- The Scanning Transmission Electron Microscope (2017) (3)
- STEM Image Post-processing for Instability and Aberration Correction for Transfer Function Extension (2012) (3)
- Design and Testing of a Quadrupole/Octupole C3/C5 Aberration Corrector (2005) (3)
- Observation of metal nanoparticles at atomic resolution in Pt‐based cancer chemotherapeutics (2018) (3)
- Targeted T 1 Magnetic Resonance Imaging Contrast Enhancement with Extraordinarily Small CoFe 2 O 4 Nanoparticles (2019) (3)
- Processing and characterisation of Mo6S2I8 nanowires. (2010) (3)
- (S)TEM analysis of the interdiffusion and barrier layer formation in Mn/Cu heterostructures on SiO2 for interconnect technologies (2012) (3)
- Towards Z-Contrast Imaging in an Aberration-Corrected STEM (2000) (3)
- High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors (2015) (3)
- Orientational and translational ordering of sub-monolayer films of passivated multiply-twinned gold clusters (2000) (2)
- Low Dose Imaging by STEM Ptychography Using Pixelated STEM Detector (2018) (2)
- Theory and Simulations of STEM Imaging (2011) (2)
- Imaging and analysis of axial heterostructured silicon nanowires (2010) (2)
- The addition of aluminium and manganese to ruthenium liner layers for use as a copper diffusion barrier (2014) (2)
- High-precision atomic-scale strain mapping of nanoparticles from STEM images. (2022) (2)
- A dissociation mechanism for the [a+c] dislocation in GaN (2014) (2)
- Excited helium under high pressures in the bulk and in nanobubbles (2017) (2)
- Initial Results from Aberration Correction in STEM (2002) (2)
- Three-dimensional Electron Ptychography of Catalyst Nanoparticles using Combined HAADF STEM and Atom Counting (2019) (2)
- Electron Ptychography Using Fast Binary 4D STEM Data (2019) (2)
- Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy (2022) (2)
- Observation of depth-dependent atomic displacements related to dislocations in GaN by optical sectioning in the STEM (2014) (2)
- Mo 6 S 4.5 I 4.5 Nanowires: Structure Studies by HRTEM and Aberration Corrected STEM (2006) (2)
- Contrast Transfer and Noise Minimization in Electron Ptychography (2019) (2)
- Direct structure determination by atomic-resolution incoherent STEM imaging (1997) (2)
- Effect Of The Eshelby-Stroh Twist In Dislocations In GaN Imaged End-On (2012) (2)
- Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope (2017) (2)
- Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm (2022) (2)
- Quantitative techniques for aberration corrected HAADF STEM of nano-materials (2012) (2)
- Growth characteristics of Mn silicate barrier layers on SiO2 (2012) (2)
- Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial (2019) (1)
- Getting the Best from an Imperfect Detector - an Alternative Normalisation Procedure for Quantitative HAADF STEM (2014) (1)
- Determination of Atomic Structure at Surfaces and Interfaces by High-Resolution Stem (1996) (1)
- Quantitative Comparison of Phase Contrast Imaging in Conventional TEM Focal Series and STEM Ptychography (2016) (1)
- Direct visualization of electrical transport-induced alloy formation and composition changes in filled multi-wall carbon nanotubes by in situ scanning transmission electron microscopy (2017) (1)
- Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides (2015) (1)
- Measuring Single Electrons – What Does it Mean? (2019) (1)
- Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope (2009) (1)
- Structural quantification of nanoparticles by HAADF STEM (2014) (1)
- Procedure for 3D atomic resolution reconstructions using atom-counting and a Bayesian genetic algorithm (2021) (1)
- Direct Imaging of Oxygen Sub-lattice Deformation in Li-rich Cathode Material Using Electron Ptychography (2021) (1)
- Aberration-Corrected STEM: the Present and the Future (2001) (1)
- Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials (2012) (1)
- STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures (2014) (1)
- Advances in 2D, 3D and 4D STEM Image Data Analysis (2013) (1)
- Series ( S ) TEM analysis of the interdiffusion and barrier layer formation in Mn / Cu heterostructures on SiO 2 for interconnect technologies (2012) (1)
- Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design (2015) (1)
- Atomic Resolution Electron Energy Loss Spectroscopy of Interfaces (1997) (1)
- Focal Series Reconstruction in Annular Dark-Field STEM (2012) (1)
- Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science (2014) (1)
- Aberration-Corrected STEM for Elemental Mapping (2003) (1)
- Quantitative Information from Image Processing in ADF Stem (1997) (1)
- Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy (2008) (1)
- Combining ADF-EDX scattering cross-sections for elemental quantification of nanostructures (2021) (1)
- Depth sectioning using electron energy loss spectroscopy (2008) (1)
- Ultimate Resolution Limit for ADF-STEM (2003) (1)
- The Design and Performance of a Double Wien Filter Monochromator for Application in TEM (2013) (1)
- Quantitative structural and compositional characterisation of bimetallic fuel-cell catalyst nanoparticles using STEM (2015) (1)
- Nanoscale Structure/Property Correlation Through Aberration-Corrected Stem And Theory (2002) (1)
- IMAGE-RESOLUTION IMPROVEMENT USING COHERENT MICRODIFFRACTION IN STEM (1993) (1)
- Post-processing of STEM Data for Instability and Drift Compensation (2012) (1)
- Atomically resolved scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope (2014) (1)
- STEM Optical Sectioning for Imaging Screw Dislocations Core Structures in BCC Metals (2016) (1)
- Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors (2015) (1)
- Chromatic Confocal Electron Microscopy with a Finite Pinhole Size (2012) (1)
- The Potential for Greater Clarity Cryo-Electron Microscopy via Ptychography (2018) (1)
- STEM Aberration Correction: Where Next? (2002) (1)
- From High-precision Imaging to High-performance Computing: Leveraging ADF-STEM Atom-counting and DFT for Catalyst Nano-metrology (2017) (1)
- Introduction (2018) (0)
- Quantitative STEM of Catalyst Nanoparticles using ADF Imaging with Simultaneous EDS and EELS Spectroscopy. (2017) (0)
- Simulating Atomic Resolution STEM Images of Non-Periodic Samples (2008) (0)
- Phase Retrieval Quantitative Comparison Between Tilt-series Imaging in TEM and Position-resolved Coherent Diffractive Imaging in STEM (2017) (0)
- Improving the SNR of Atomic Resolution STEM EELS & EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging (2015) (0)
- Transmission electron imaging and diffraction characterisation of 2D nanomaterials (2014) (0)
- Towards accurate characterization of complex 3D structure with high depth resolution in a C/CrC nanocomposite (2010) (0)
- Maximising dose efficiencyin quantitative STEM to reveal the 3D atomic structure of nanomaterials (2018) (0)
- Energy-Filtered Scanning Confocal Electron Microscopy (2012) (0)
- A Comparison of Phase-retrieval Algorithms for Focused-probe Electron Ptychography (2017) (0)
- Aberration-corrected electron microscopy processing and imaging of novel organic and inorganic nanostructures (2010) (0)
- Towards sub-{Angstrom} resolution through incoherent imaging (1997) (0)
- Characterising and Minimising Damage Effects in Air- and Beam-sensitive Solid-state Li-ion Battery Materials (2022) (0)
- Fast Ptychographic Reconstruction for Sparse Binary Ptychography Data. (2022) (0)
- Extending the Limits of Fast Acquisition in TEM Tomography and 4D-STEM (2016) (0)
- Use of Partial Scattering EDX Cross-Sections to Quantify Light Elements in the STEM (2022) (0)
- Low-dose phase retrieval of biological specimens using cryo-electron ptychography (2020) (0)
- An Aberration-Corrected STEM for Diffraction Studies (2005) (0)
- Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope (2008) (0)
- Towards Sub-À Resolution Through Incoherent Imaging (1997) (0)
- Nanohalos: a manifestation of electron channelling in gold nanoparticles. (2012) (0)
- Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope (2010) (0)
- Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy (2008) (0)
- Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy (2010) (0)
- STEM Analysis Of Cu(Mn) Self-Forming Diffusion Barriers on SiO2 For Applications In The Semiconductor Industry (2012) (0)
- Low Dose Electron Ptychography for Cryo-biological Imaging (2020) (0)
- Fast Pixelated Detectors : A New Era for STEM (2018) (0)
- Quantification of a Heterogeneous Ruthenium Catalyst on Carbon-black using ADF Imaging (2015) (0)
- 3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM (2020) (0)
- On the visibility of "heavy" atoms in dark-field STEM (2012) (0)
- Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions. (2021) (0)
- Characterisation of Defects at Non-Polar GaN/InGaN Junctions in Novel Materials for Application in Light Emitting Diodes (2014) (0)
- Atomic resolution Z-contrast imaging of ultradispersed catalysts (1997) (0)
- Electron ptychographic microscopy for three-dimensional imaging (2017) (0)
- Quantification of ADF STEM Image Data for Nanoparticle Structure and Strain Measurements (2016) (0)
- 2. Scanning Transmission Electron Microscopy (2007) (0)
- Imaging Polymer Crystallinity and Grain Boundaries with STEM ptychography (2020) (0)
- Analysis of Phase Difference Variations for Strong Dynamical Objects Using Wigner Distribution Deconvolution Ptychography (2017) (0)
- Two-dimensional Object Functions and Three-dimensional Illumination Functions: their Validity, Interaction and Utility (2014) (0)
- Aberration-corrected scanning confocal electron microscopy for three-dimensional imaging and analysis of materials (2011) (0)
- Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM (2016) (0)
- Energy filtered scanning confocal electron microscopy (EF-SCEM) (2010) (0)
- A Quantitative Understanding of the Short Range Order in Disordered Rocksalt Cathode Materials (2022) (0)
- Three-dimensional Characterisation of Nanomaterials Using Aberration-Corrected STEM (2006) (0)
- Imaging Structural Defects and Associated Oxygen Positions in Li-rich Li1.2Ni0.13Mn0.54Co0.13O2 (2022) (0)
- Spatial Differentiation of Aluminium Siting by the Single-Atom Adsorption Sites in Zeolite by Electron Microscopy (2022) (0)
- Simultaneous imaging of light and heavy elements at atomic resolution using electron ptychography and fast pixelated detectors (2017) (0)
- Direct Visualization of Substitutional Li Doping in Supported Pt Nanoparticles and Their Ultra-selective Catalytic Hydrogenation Performance. (2021) (0)
- TEM investigations of industrial platinum on graphite catalyst systems: Image processing and particle morphology (2001) (0)
- Preface (2000) (0)
- Optical depth sectioning of metallic nanoparticles in the aberration-corrected scanning transmission electron microscope (2008) (0)
- Direct observations of atomic structures of defects in GaN by high-resolution Z-contrast STEM (1997) (0)
- Imaging and diffraction characterisation of 2D inorganic nanostructures (2012) (0)
- Scanning confocal electron microscopy (SCEM) (2010) (0)
- Electron ptychographic phase imaging using fast pixelated detectors (2017) (0)
- Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution (2016) (0)
- A Combined-Techniques Approach to Elucidating Crystalline Interface Atomic Structure (1996) (0)
- Quantitative structure determination of interfaces through Z-contrast imaging and electron energy loss spectroscopy (1996) (0)
- Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? (2015) (0)
- Mo6S9−xIx nanowires: structure studies by aberration corrected high resolution TEM and STEM (2008) (0)
- Depth Sensitive Atomic Resolution Spectroscopy and Imaging of Highly Strained YSZ/STO Epitaxial Heterostructures (2013) (0)
- Direct observation of threading dislocations in GaN by high-resolution Z-contrast imaging (1998) (0)
- Probe and object function reconstruction in incoherent stem imaging (1996) (0)
- Chirality in EELS: Progress and Applications (2009) (0)
- Imaging charge transfer in crystals using electron ptychography (2017) (0)
- Intracellular Elemental Mapping using Simultaneous EELS and EDS: A Combined Approach to Quantifying Na, K and Ca (2019) (0)
- Quantification of 3D Atomic Structures and Their Dynamics by Atom-Counting from an ADF STEM Image (2019) (0)
- Electron Microscopy and Analysis Group Conference 2013 (EMAG2013) (2014) (0)
- Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope (2012) (0)
- Investigation of Cobalt Oxidation States in PtCo Nanoparticles Using STEM-EELS (2019) (0)
- Microstructural characterisation of novel nitride nanostructures using electron microscopy (2014) (0)
- Investigating the Atomic Scale Superconducting Properties of Grain Boundaries in High-T(Sub c) Superconductors (1998) (0)
- Ptychographic Single Particle Analysis for Biological Science (2021) (0)
- Z-Contrast Imaging: Quantitative Aspects of the Dynamical Object Function. (2000) (0)
- Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope (2010) (0)
- Reliable Atomic-Resolution Observations of the Nanoscopic Properties of Hybrid Perovskite Thin Films (2019) (0)
- Image formation mechanisms in three-dimensional aberration-corrected scanning transmission electron microscopy (2008) (0)
- Optical Sectioning with Atomic Resolution Spectroscopy (2014) (0)
- Microscopy on Drugs: Characterization and Quantification of Pt-based Pharmaceuticals using the STEM. (2019) (0)
- Quantitative electron ptychography for simultaneous light and heavy elements atom counting (2021) (0)
- Electron microscopy and diffraction of defects, nanostructures, interfaces and amorphous materials Conference to mark the retirement of Professor David Cockayne FRS Oxford, 7 September 2009 (2010) (0)
- The Atomic-Scale Origins of Grain Boundary Superconducting Properties (1998) (0)
- Materials analysis by aberration-corrected STEM (2004) (0)
- Direct Observation of Threading Dislocations in Gan by High Resolution z-contrast imaging (1998) (0)
- Microanalysis at the atomic level (1995) (0)
- Aberration-corrected stem: towards the ultimate resolution for imaging and analysis (2002) (0)
- How Fast is Your Detector? The Effect of Temporal Response on Image Quality (2022) (0)
- Dopant Impurity Induced Nanofaceting on Silicon Nanowire Sidewalls (2010) (0)
- Quantitative Interpretation and Information Limits in Annular Dark-Field STEM Images (2000) (0)
- Experimental observation of the Eshelby-Stroh twist in dislocations in GaN imaged end-on (2012) (0)
- Applications of Low Dose Electron Ptychography. (2022) (0)
- Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures (2010) (0)
- The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM (2016) (0)
- Applications of focal-series data in scanning-transmission electron microscopy (2013) (0)
- Synthesis of mono- and few-layered n-type WSe2 from solid state inorganic precursors (2022) (0)
- 4D Analytical STEM with the pnCCD (2018) (0)
- Focused-probe STEM Ptychography: Developments and Opportunities (2020) (0)
- Position- ensitive STEM etectors for igh- ensitivity hase etection (2013) (0)
- Quantitative STEM for Bimetallic Catalyst Nanoparticles (2021) (0)
- Evaluation of Aberration-corrected Optical Sectioning for Exploring the Core Structure of ½[111] Screw Dislocations in BCC Metals (2017) (0)
- Atomic Scale Dynamics of a Manganese Oxide Phase Change Observed with STEM (2013) (0)
- What Do You Get If You Cross a Phase Object Approximation with a Dynamically Scattering Sample? (2020) (0)
- Atomic structure and properties of grain boundaries in ceramics through Z-contrast electron microscopy (1996) (0)
- A New Approach for 3D Quantitative STEM Using Defocus Corrected Electron Ptychography (2022) (0)
- STM and HRTEM of Nanostructures and Metal Nanocrystals on SrTiO3 (001) (2007) (0)
- Maximum Efficiency STEM Phase Contrast Imaging (2014) (0)
- Exploring the Limits of Focused-Probe STEM Ptychography (2018) (0)
- Understanding the crystallographic and microstructural properties of hybrid perovskite thin films through electron microscopy (2021) (0)
- Three-Dimensional Crystal Structure Mapping by Diffractive Scanning Confocal Electron Microscopy (SCEM) (2012) (0)
- Visualising the Three-dimensional Morphology and Surface Structure of Metallic Nanoparticles at Atomic Resolution by Automated HAADF STEM Atom Counting (2014) (0)
- The atomic-scale microstructure of metal halide perovskite elucidated via low-dose electron microscopy (2021) (0)
- Focused-Probe STEM Ptychography: Reconstruction Methods, Transfer Functions and Signal-to-Noise (2018) (0)
- Atomic resolution imaging of 2D nanomaterials (2012) (0)
- Processing and characterisation of Mo 6 S 2 I 8 nanowires w (2009) (0)
- Strain effects in core–shell PtCo nanoparticles: a comparison of experimental observations and computational modelling † (2020) (0)
- High Dose Efficiency Atomic Resolution Phase Imaging with Electron Ptychography (2018) (0)
- Advanced 4D STEM Imaging with the pnCCD (S)TEM Camera (2017) (0)
- Towards quantitative three-dimensional scanning confocal electron microscopy (2012) (0)
- Measuring the Hole State Anisotropy in MgB2 by High-Resolution Angular-Resolved Electron Energy-Loss Spectroscopy (2003) (0)
- Aberration corrected optical apparatus for charged particles (2003) (0)
- Using Advanced STEM Techniques to Unravel Key Issues in the Development of Next-Generation Nanostructures for Energy Storage (2017) (0)
- Design and Testing of a Quadrupole / Octupole C 3 / C 5 Aberration Corrector (2005) (0)
- dose-, damage- data-rates multi-frame spectrum-imaging. (2020) (0)
- Quantitative Sub-Angstrom Imaging Through ADF STEM (1998) (0)
- Position-sensitive STEM detectors for high-sensitivity phase detection (2013) (0)
- Direct observations of defect structures in optoelectronic materials by Z-contrast STEM (1998) (0)
- The Effect of Dynamical Scattering on Single-plane Phase Retrieval in Electron Ptychography (2022) (0)
- Three Dimensional Characterization of a Silica Hollow Sphere with an Iron Oxide Core by Annular Dark Field Scanning Confocal Electron Microscopy (2010) (0)
- A facile route to self-assembled Hg//MoSI nanowire networks (2010) (0)
- Three-dimensional atomic models from a single Z- contrast image: verification by electron tomography and opportunities † (2017) (0)
- Mapping the Chemistry Within, and the Strain Around, Al-alloy Precipitates at Atomic Resolution by Multi-frame Scanning Transmission Electron Microscopy (2017) (0)
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