Rudolf M. Tromp
#116,380
Most Influential Person Now
Dutch scientist
Rudolf M. Tromp's AcademicInfluence.com Rankings
Rudolf M. Trompengineering Degrees
Engineering
#3954
World Rank
#5101
Historical Rank
Photonics
#26
World Rank
#26
Historical Rank
Electrical Engineering
#1006
World Rank
#1082
Historical Rank
Rudolf M. Trompmathematics Degrees
Mathematics
#6031
World Rank
#8420
Historical Rank
Applied Mathematics
#188
World Rank
#208
Historical Rank
Measure Theory
#1076
World Rank
#1383
Historical Rank
Download Badge
Engineering Mathematics
Rudolf M. Tromp's Degrees
- PhD Physics University of Amsterdam
- Masters Applied Mathematics Delft University of Technology
- Bachelors Electrical Engineering Eindhoven University of Technology
Why Is Rudolf M. Tromp Influential?
(Suggest an Edit or Addition)According to Wikipedia, Dr. Rudolf Maria "Ruud" Tromp is a Dutch American scientist at IBM Research Division, Thomas J. Watson Research Center and a Physics Professor at Leiden University. Education He attended Petrus Canisius College The Lyceum .1982 Ph.D. in physics from the University of Utrecht 1982, completed a thesis on medium-energy ion scattering studies of the structure of silicon surfaces.
Rudolf M. Tromp's Published Works
Number of citations in a given year to any of this author's works
Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author
Published Works
- Large-area graphene single crystals grown by low-pressure chemical vapor deposition of methane on copper. (2011) (1171)
- Surfactants in epitaxial growth. (1989) (883)
- The influence of the surface migration of gold on the growth of silicon nanowires (2006) (778)
- Surface electronic structure of Si(111)-(7x7) resolved in real space. (1986) (752)
- Shape transition in growth of strained islands: Spontaneous formation of quantum wires. (1993) (675)
- Growth dynamics of pentacene thin films (2001) (642)
- Dynamic microscopy of nanoscale cluster growth at the solid–liquid interface (2003) (631)
- Coarsening of Self-Assembled Ge Quantum Dots on Si(001) (1998) (546)
- Scanning tunneling microscopy of Si(001). (1986) (501)
- Normal-mode and free-Air gravity constraints on lateral variations in velocity and density of Earth's mantle (1999) (466)
- Si(001) Dimer structure observed with scanning tunneling microscopy. (1985) (436)
- Transition States Between Pyramids and Domes During Ge/Si Island Growth. (1999) (376)
- Critical island size for layer-by-layer growth. (1994) (286)
- Influence of surfactants in Ge and Si epitaxy on Si(001). (1990) (253)
- High-temperature SiO2 decomposition at the SiO2/Si interface. (1985) (195)
- Cyclic growth of strain-relaxed islands. (1994) (184)
- Defect self-annihilation in surfactant-mediated epitaxial growth. (1991) (180)
- Thermodynamics and kinetics of graphene growth on SiC(0001). (2009) (174)
- Local electron states and surface geometry of Si(111)- sqrt 3 sqrt 3 Ag. (1987) (166)
- Instability-driven SiGe island growth (2000) (157)
- Atomic-scale transport in epitaxial graphene. (2012) (156)
- Control of Si nanowire growth by oxygen. (2006) (153)
- Ostwald ripening of two-dimensional islands on Si(001). (1996) (152)
- Microstructure and strain relief of Ge films grown layer by layer on Si(001). (1990) (152)
- A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design. (2010) (149)
- Step capillary waves and equilibrium island shapes on Si(001). (1994) (145)
- Electronic and geometric structure of Si(111)-(7×7) and Si(001) surfaces (1987) (144)
- Mechanical stresses in (sub)monolayer epitaxial films. (1990) (143)
- Pit formation during graphene synthesis on SiC(0001):In situelectron microscopy (2008) (142)
- Atomic and electronic contributions to Si(111)-(7 x 7) scanning-tunneling-microscopy images. (1986) (138)
- In situ ultrahigh vacuum transmission electron microscopy studies of hetero-epitaxial growth I. {Si(001) }/{Ge} (1996) (135)
- Low-energy electron microscopy (1994) (133)
- Local dimer exchange in surfactant-mediated epitaxial growth. (1992) (133)
- Structure of the Si(111)-CaF2 interface. (1988) (129)
- Near-surface damage and contamination after CF/sub 4//H/sub 2/ reactive ion etching of Si (1985) (128)
- Angle resolved detection of charged particles with a novel type toroidal electrostatic analyser (1982) (126)
- A photopatternable pentacene precursor for use in organic thin-film transistors. (2004) (108)
- Growth temperature dependence of interfacial abruptness in Si/Ge heteroepitaxy studied by Raman spectroscopy and medium energy ion scattering (1989) (106)
- Decoupling graphene from SiC(0001) via oxidation (2010) (105)
- The adsorption of Ag on the Si(111) 7 × 7 surface at room temperature studied by medium energy ion scattering, leed and aes (1984) (104)
- Role of surface electronic structure in thin film molecular ordering. (2005) (100)
- H coverage dependence of Si(001) homoepitaxy. (1994) (100)
- Are bare surfaces detrimental in epitaxial growth (1991) (99)
- Surface-stress-induced order in SiGe alloy films. (1990) (99)
- Imaging Pattern Formation in Surface Reactions from Ultrahigh Vacuum up to Atmospheric Pressures (1995) (98)
- Novel strain-induced defect in thin molecular-beam epitaxy layers. (1989) (96)
- Interdiffusion at the polyimide-Cu interface (1985) (95)
- Chemical potential maps and spatial correlations in 2D-island ripening on Si(001). (1995) (95)
- Metallization induced band bending of SrTiO3(100) and Ba0.7Sr0.3TiO3 (1997) (93)
- A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results. (2013) (93)
- Design of a new photo-emission/low-energy electron microscope for surface studies (1991) (93)
- Study of silicon contamination and near‐surface damage caused by CF4/H2 reactive ion etching (1984) (90)
- Structure analysis of Si(111)21 with low-energy electron diffraction (1984) (88)
- A new two-dimensional particle detector for a toroidal electrostatic analyzer (1991) (86)
- Theory and simulation of high-energy ion scattering experiments for structure analysis of surfaces and interfaces (1986) (85)
- Step Permeability and the Relaxation of Biperiodic Gratings on Si(001) (1997) (84)
- Monte carlo simulations of shadowing/blocking experiments for surface structure analysis (1983) (81)
- Ion-beam crystallography of clean and sulfur covered Ni(110) (1979) (78)
- Quantum States and Atomic Structure of Silicon Surfaces (1986) (74)
- Relaxation effects and thermal vibrations in a Pt(111) surface measured by medium energy ion scattering (1979) (72)
- Thin bismuth film as a template for pentacene growth (2005) (71)
- Ring clusters in transition-metal-silicon surface structures. (1992) (66)
- The effect of oxygen coverage on surface relaxation of Ni(110) measured by medium energy ion scattering (1979) (66)
- Wavy steps on Si(001). (1992) (65)
- Surfactant-mediated growth of Ge on Si(111). (1994) (65)
- Electronic states due to surface doping: Si(111)√3×√3B (1990) (63)
- THERMODYNAMICS OF NUCLEATION AND GROWTH (2002) (63)
- A scanning tunneling microscope for surface science studies (1986) (63)
- Fabrication of arrays of large step‐free regions on Si(001) (1996) (61)
- The nucleation of pentacene thin films (2004) (60)
- Thermal Adatoms on Si(001) (1998) (59)
- A New Low Energy Electron Microscope (1998) (59)
- Ion beam crystallography of silicon surfaces III. Si(111)-(7 × 7) (1985) (59)
- Ion beam crystallography at the Si(100) surface (1981) (59)
- Strain-relief mechanism in surfactant-grown epitaxial germanium films on Si(111). (1991) (59)
- Nucleation in Si(001) homoepitaxial growth. (1996) (57)
- On the structure of the laser irradiated Si(111)-(1 × 1) surface (1982) (56)
- Layered structures and epitaxy (1986) (54)
- Structure and composition of GaAs(001) surfaces. (1992) (54)
- A new UHV system for channeling/blocking analysis of solid surfaces and interfaces (1984) (52)
- Spatially-resolved structure and electronic properties of graphene on polycrystalline Ni. (2010) (52)
- Low-energy electron microscopy study of step mobilities on Si(001). (1996) (51)
- Phase coexistence during surface phase transitions. (2001) (51)
- Novel strategy for diameter-selective separation and functionalization of single-wall carbon nanotubes. (2008) (51)
- Ion beam crystallography of the Ni(110)−(2 × 1)O surface (1981) (50)
- Spectroscopy with the scanning tunnelling microscope: a critical review (1989) (50)
- A simple energy filter for low energy electron microscopy/photoelectron emission microscopy instruments (2009) (48)
- Shape oscillations in growth of small crystals. (1993) (48)
- Surfactant coverage and epitaxy of Ge on Ga‐terminated Si(111) (1993) (47)
- Si(111)-(2×1) Surface: Buckling, Chains, or Molecules? (1983) (46)
- A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM. (2012) (45)
- New mechanism for dislocation blocking in strained layer epitaxial growth (2000) (44)
- Ion beam crystallography of metal-silicon interfaces: Pd-Si(111) (1982) (44)
- Ion beam analysis of the reaction of Pd with Si(100) and Si(111) at room temperature (1983) (44)
- Surface Stress and Thermodynamic Nanoscale Size Selection (2002) (44)
- Surface stress and interface formation. (1993) (43)
- Relaxation mechanism of Ge islands/Si(001) at low temperature (1995) (42)
- Direct measurement of the growth mode of graphene on SiC(0001) and SiC(0001¯). (2011) (40)
- Nanoscale measurements of unoccupied band dispersion in few-layer graphene (2015) (40)
- Material reaction and silicide formation at the refractory metal/silicon interface (1986) (39)
- Intrinsic instability of aberration-corrected electron microscopes. (2012) (37)
- Step morphologies on small-miscut Si(001) surfaces. (1993) (36)
- In situ TEM study of the growth of Ge on Si(111) (1996) (36)
- Effect of the surface upon misfit dislocation velocities during the growth and annealing of SiGe/Si (001) heterostructures (1998) (36)
- Single-nucleus polycrystallization in thin film epitaxial growth. (2007) (35)
- Surface stress as a driving force for interfacial mixing. (1992) (35)
- Medipix 2 detector applied to low energy electron microscopy. (2009) (35)
- Interactions of Moving Dislocations in Semiconductors with Point, Line and Planar Defects (1999) (34)
- Measuring and correcting aberrations of a cathode objective lens. (2011) (34)
- Kinetic instability in the growth of CaF2 on Si(111). (1994) (33)
- Surface plasmon microscopy using an energy-filtered low energy electron microscope. (2008) (33)
- Phase formation sequence and domain structure : a low-energy-electron-microscopy study of the Si(111)-(√3×√3) Ag surface (1992) (33)
- Low-Energy Electron Microscopy of Surface Phase Transitions (2003) (32)
- Symmetry, structure, and step induced ordering of the Si(001)-(2 x 3)Ag surface. (1994) (31)
- Local electronic structure and surface geometry of Ag on Si(111) (1988) (31)
- High-temperature epitaxy of PtSi/Si(0 0 1) (1997) (31)
- Observation of buried interfaces with low energy electron microscopy. (1993) (31)
- Atomic structure of the arsenic-saturated Si(111) surface. (1988) (30)
- Surfactants in Si(111) homoepitaxy (1995) (30)
- In-situ transmission electron microscopy studies of the interaction between dislocations in strained SiGe/Si (001) heterostructures (2000) (29)
- Nucleation of Co silicide on H passivated Si(111) (1994) (29)
- Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy (2016) (28)
- Structure determination of the Si(111)-(2×1) surface with channeling and blocking (1984) (28)
- Ion beam crystallography of silicon surfaces (1981) (28)
- Tip electronic structure in scanning tunneling microscopy. (1988) (28)
- Aberrations of the cathode objective lens up to fifth order. (2012) (28)
- Imaging with a low-energy electron microscope (1993) (27)
- Growth dynamics of titanium silicide nanowires observed with low-energy electron microscopy (2002) (27)
- Low energy electron microscopy studies of Ge and Ag growth on Si(111) (1993) (27)
- The oxidation of Ni(100) studied by medium energy ion scattering (1981) (27)
- Elastic recoil detection for medium-energy ion scattering (1993) (25)
- Growth kinetics of CoSi2 and Ge islands observed with in situ transmission electron microscopy (1999) (25)
- Advances in In Situ Ultra-High Vacuum Electron Microscopy: Growth of SiGe on Si (2000) (25)
- Low-energy electron microscopy and spectroscopy with ESCHER: Status and prospects (2011) (24)
- Low temperature material reaction at the Ti/Si(111) interface (1986) (24)
- Noble-metal adsorption on Si(111): Medium-energy ion-scattering results for the Ag ( sqrt 3 x sqrt 3)R30 degrees reconstruction. (1989) (24)
- Thermal roughening of a thin film: A new type of roughening transition (2000) (24)
- Micrometer-scale band mapping of single silver islands in real and reciprocal space (2009) (23)
- CHEMICAL INTERACTIONS AT METAL-POLYMER INTERFACES. (1984) (23)
- Cu segregation at the Al(Cu)/Al2O3 interface (1996) (23)
- The Key Role of Very-Low-Energy-Electrons in Tin-based Molecular Resists for Extreme Ultraviolet Nanolithography. (2020) (23)
- Surface geometries from channeling and blocking (1983) (23)
- Strain Relief during Growth: CaF2 on Si(111). (1995) (22)
- Structure determination of the Ge(111)-c(2 x 8) surface by medium-energy ion scattering. (1988) (22)
- Subsurface relaxations in Si(111)-(7 × 7) structure models (1985) (21)
- The Si (100) surface: Symmetric or asymmetric dimers? (1981) (21)
- Measurement of surface stress during epitaxial growth of Ge on arsenic terminated Si(001) (1994) (21)
- Al on Si(111): Phase diagram and atomic mechanisms. (1996) (20)
- Influence of supersaturation on surface structure. (2002) (20)
- Atoms go underground (2003) (20)
- Titration of submonolayer Au growth on Si(111) (2014) (20)
- In situ transmission electron microscopy observations of the formation of self‐assembled Ge islands on Si (1998) (20)
- Atomic step distributions on annealed periodic Si(001) gratings (1997) (19)
- Low-Energy Electron Potentiometry: Contactless Imaging of Charge Transport on the Nanoscale (2015) (19)
- Relaxation and H coverage of ammonium fluoride treated Si(111) (1994) (19)
- Single-domain epitaxial silicene on diboride thin films (2016) (19)
- A quantitative ion-scattering study of the Ni(110) surface during the early stages of oxidation (1980) (19)
- Nonuniversal Transverse Electron Mean Free Path through Few-layer Graphene. (2019) (18)
- Intrinsic stacking domains in graphene on silicon carbide: A pathway for intercalation (2018) (17)
- Calculation of channelling and blocking effects for ion beam surface crystallography (1980) (17)
- Ga-As intermixing in GaAs(001) reconstructions. (1993) (17)
- Shape and stability of self-assembled surface domains (2004) (16)
- Critical role of surface steps in the alloying of Ge on Si(001). (2004) (15)
- Growth modes of Ge on GaAs(001) (1994) (15)
- Atomic-layer titration of surface reactions (1995) (15)
- Mechanical stresses in (sub)monolayer epitaxial films. (1990) (15)
- The thermal stability of very thin Pd2Si films on Si (1983) (14)
- Medium-energy-ion-scattering investigations of Si and Ge growth on GaAs(001)-c(2 x 8)/(2 x 4). (1993) (14)
- Low energy electron microscopy imaging using Medipix2 detector (2011) (13)
- Epitaxial Growth of Large Pentacene Crystals on Si(001) Surfaces Functionalized with Molecular Monolayers (2007) (13)
- Evidence for island growth on deposition of silver onto Si(111) 7 × 7 at room temperature (1983) (13)
- Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis. (2019) (13)
- Metastability in 2D self-assembling systems. (2007) (13)
- Imaging surface reactions with light (1996) (13)
- Structural perfection of the Si(111)-(1 x 1) As surface. (1988) (13)
- The Equilibrium Shape of Graphene Domains on Ni(111) (2013) (12)
- Hot electron emission lithography (1998) (12)
- Imaging pattern formation: Bridging the pressure gap (1995) (12)
- Ostwald Ripening of Self-Assembled Germanium Islands on Silicon(100) (1998) (12)
- Real-Time Microscopy of Two-Dimensional Critical Fluctuations: Disordering of the Si(113)-(3 x 1) Reconstruction. (1996) (12)
- Atomic step dynamics on periodic semiconductor surface structures (1999) (12)
- Low-energy electron (0-100eV) interaction with resists using LEEM (2015) (11)
- Spontaneous formation and growth of a new polytype on SiC(0001). (2009) (11)
- Selected-area diffraction and spectroscopy in LEEM and PEEM. (2012) (11)
- Imaging moiré deformation and dynamics in twisted bilayer graphene (2021) (10)
- Structural characterization of the Si(111)-CaF2 interface by high-resolution transmission electron microscopy. (1988) (10)
- Laser processing of UHV-deposited thin silicon films (1982) (10)
- Effects of surface oxide on the rapid thermal nitridation of Si(001) (1996) (10)
- The influence of distortions on apparent surface radiation damage cross sections in Si (1979) (10)
- eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument. (2015) (9)
- Quantifying work function differences using low-energy electron microscopy: The case of mixed-terminated strontium titanate. (2018) (9)
- Electrical transport across grain boundaries in graphene monolayers on SiC(0 0 0 1¯) (2018) (9)
- Temporal and lateral electron pulse compression by a compact spherical electrostatic capacitor. (2013) (9)
- Defocus in cathode lens instruments. (2017) (9)
- Controlled synthesis and decoupling of monolayer graphene on SiC(0001) (2014) (9)
- A simplified scanning tunneling microscope for surface science studies (1986) (8)
- Imaging hot-electron emission from metal-oxide-semiconductor structures. (1996) (8)
- Summary Abstract: High temperature decomposition of SiO2 at the Si/SiO2 interface (1986) (8)
- Falta et al. reply. (1993) (8)
- Charge Catastrophe and Dielectric Breakdown During Exposure of Organic Thin Films to Low-Energy Electron Radiation. (2017) (7)
- The stability of triangular 'droplet' phases on Si(111) (2002) (7)
- Island growth of Ge on Si(001) and CoSi2 on Si(111) studied with UHV electron microscopy (1999) (7)
- Characterization of the cathode objective lens by Real-Space Microspot Low Energy Electron Diffraction. (2013) (7)
- Optimization and stability of the contrast transfer function in aberration-corrected electron microscopy. (2013) (7)
- Design and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources. (2017) (7)
- Ion-beam crystallography of the GaSb (110) surface (1984) (7)
- Phase boundary fluctuations on Si(111) (2001) (7)
- A versatile ultra high vacuum sample stage with six degrees of freedom. (2013) (6)
- An adjustable electron achromat for cathode lens microscopy. (2015) (5)
- Hot Electron Emission Lithography: a method for efficient large area e-beam projection (1999) (5)
- Self-assembling surface stress domains far from equilibrium (2007) (5)
- Medium energy ion scattering investigation of homoepitaxy on H terminated Si(111) (1995) (5)
- Texture transformations in reactive metal films deposited upon amorphous substrates (2001) (5)
- Critical test of the structure of the ordered phase in epitaxially grown SixGe1-x films. (1993) (4)
- A simple in situ method to detect graphene formation at SiC surfaces (2011) (4)
- Aberration corrected spin polarized low energy electron microscope. (2020) (4)
- Surface morphology and alloy ordering in epitaxial growth of SiGe. (1993) (4)
- Structure study of Si(111)-(7×7) by channeling and blocking (1984) (4)
- Surface stress and interface formation. (1993) (4)
- Anisotropic Dry Etching of S1O 2 on Si and its Impact on Surface and Near-Surface Properties of the Substrate. (1986) (4)
- Catadioptric aberration correction in cathode lens microscopy. (2015) (4)
- Strain-driven mound formation of substrate under epitaxial nanoparticles. (2015) (4)
- Spectroscopy with the Low Energy Electron Microscope (2019) (4)
- Complementary LEEM and eV-TEM for imaging and spectroscopy. (2020) (3)
- Highly uniform step and terrace structures on SiC(0001) surfaces (2011) (3)
- Low Energy Electron Microscopy: A 10 Year Outlook (2008) (3)
- LOW-ENERGY ELECTRON MICROSCOPY FOR NANOSCALE CHARACTERIZATION (2011) (3)
- Differential reactivity of alkanethiols with Si(111)-Au 2D surface alloys (2015) (3)
- Kinetic instability in the growth of CaF2 on Si(111). (1994) (3)
- Enhancement of damage creation at metal-silicon interfaces during H+ and He+ irradiation (1983) (3)
- An investigation of the hydration properties of chemically vapour-deposited silicon dioxide films by means of ellipsometry (1977) (3)
- In situ Transmission Electron Microscopy of Copper Electrodeposition (2002) (2)
- Auger analyzer translation using ball bushings (1988) (2)
- Determination of the graphene growth mode on SiC(0001) and SiC(000-1) (2011) (2)
- Evaluation of a new model for the laser-irradiated Si(111)-(1×1) surface (1985) (2)
- Medium Energy Ion Scattering of Gr on SiC(0001) and Si(100) (2011) (2)
- Step Contours in the Development of Periodically Modulated Vicinal Surfaces (1996) (2)
- Quench-induced nematic textures of wormlike micelles. (1996) (2)
- The Origin of the Structural Phase Transition in the Growth of Ultra‐Thin Bi Films on Si(111) (2003) (2)
- In-Situ TEM Studies of the Interaction Between Dislocations in SiGe Heterostructures (1999) (2)
- Scanning Tunneling Microscopy and Spectroscopy of Semiconductor Surfaces (1986) (1)
- Medium energy ion scattering analysis of reactive ion etched Si(001) surfaces (1988) (1)
- Scanning Tunneling Microscopy of Semiconductor Surfaces and Interfaces (1988) (1)
- Application of electron and ion beam analysis techniques to microelectronics (1992) (1)
- Beem and UHV-TEM Studies of PtSi/Si(001) (1995) (1)
- Spectroscoping Imaging of Surfaces with Atomic Resolution (1988) (1)
- Structure of the Si (111) 2 × 1 Surface (1985) (1)
- Comment on "Role of hydrogen in C and Si(001) homoepitaxy" (1996) (1)
- Enhancing knowledge transfer and uptake in the design process of flood defenses (2017) (1)
- Si(001) Homoepitaxial Growth (1995) (1)
- Electronic states due to surface doping: Si(111) sqrt 3 x sqrt 3B. (1990) (1)
- Stacking domain morphology in epitaxial graphene on silicon carbide (2022) (1)
- Atomic and electronic imaging of semiconductor surfaces with scanning tunneling microscopy (2008) (1)
- Atomistic aspects of silicide reactions studied with STM (1993) (1)
- Ion beam crystallography of the Si(111)-(7×7) and (1×1) surfaces (1983) (1)
- Low-energy electron potentiometry. (2015) (1)
- Low-energy electron microscopy contrast of stacking boundaries: Comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide (2022) (1)
- Recent Developments in Scanning Tunneling Microscopy and Related Techniques (1988) (1)
- Materials Research Society Symposia Proceedings. Volume 56. Layered Structures and Epitaxy held in Boston, Massachusetts on 2-4 December 1985, (1986) (1)
- Growth and Stability of Bi films on Si(111) studied by LEEM (2003) (0)
- Advanced Electron Microscopy Characterization of Semiconductor Surface and Interface Processes (2002) (0)
- Optical Near-Field Electron Microscopy (2021) (0)
- Reprint of Low-energy electron potentiometry. (2017) (0)
- Visualizing deformations and dynamics of the moiré pattern in twisted bilayer graphene (2021) (0)
- A Simple Instrument for Measuring Surface Forces in Liquids (2015) (0)
- 11. Spectroscopy with the Low Energy Electron Microscope (2019) (0)
- Electron flow in polycrystalline graphene on C-face SiC (2013) (0)
- Si and Ge Nanowire Growth Mechanisms Observed using In Situ Microscopy (2006) (0)
- Summary Abstract: Imaging of surface atoms and their wave functions with the scanning tunneling microscope (1987) (0)
- Structural study of the phase evolution of 6H-SiC(0001) by low energy electron microscopy (2008) (0)
- High Resolution Ion Scattering Analysis of Semiconductor Surfaces and Interfaces (1985) (0)
- The Initiation of Graphene Growth on SiC(0001)-6H (2008) (0)
- Non-universal Transverse Electron Mean Free Path through Few-layer Graphene (2021) (0)
- Space charge effects and aberrations on electron pulse compression in a spherical electrostatic capacitor. (2017) (0)
- Quantitative Experimental Determination of The Effect of Dislocation - Dislocation Interactions on Strain Relaxation in Lattice Mismatched Heterostructures (1998) (0)
- Improved imaging in low energy electron microscopy and photo emission electron microscopy using Medipix2 pixel detector (2010) (0)
- So you have a degree in physics. Now what (2017) (0)
- Imaging of surface atoms and their wave functions with a scanning tunneling microscope (1986) (0)
- Preface: Cathode Lens Microscopy for Nanoscience (2011) (0)
- Structure Determination of the Si(111)-CaF 2 Interface (1989) (0)
- Low-Energy Electron Irradiation Damage in Few-Monolayer Pentacene Films (2021) (0)
- Electron transmission and mean free path in molybdenum disulfide at electron-volt energies (2023) (0)
- Growth of pentacene films investigated by LEEM and STM (2005) (0)
- Probing Graphene by Low-Energy Electrons under Non-normal Incidence (2015) (0)
- The Role of Step Curvature and Step Permeability in the Evolution of Periodic Arrays of Islands and Holes on Si(001) (1997) (0)
- Ion beam crystallography of the surface (1981) (0)
- Spectromicroscopic characterization of Ag surfaces by energy-filtered LEEM (2008) (0)
- Island growth from a surface instability in the GeSi system (2018) (0)
- Evidence for Island Growth on Deposition of Silver Onto Si(111)7 × 7 at Room Temperature (1982) (0)
- In situ observation of the graphene domain shape on Ni(111) single crystal films (2013) (0)
- Atomic Imaging of Surface Defects on Si (1986) (0)
- Imaging moiré deformation and dynamics in twisted bilayer graphene (2022) (0)
- Hydrocarbon implications of Karoo Supergroup turbidites and tectonics in northern Zimbabwe (1991) (0)
- Measuring chromatic aberration in LEEM/PEEM. (2019) (0)
- ABSTRACT: Brunei deepwater exploration; 3D seismic facies of low net-to-gross channel-levee systems on the Brunei slope (2000) (0)
- Imaging grain boundary scattering of graphene in real space (2012) (0)
- SHORTER CONTRIBUTIONS ' Plural Societies and the Ethics of Publishing 2 (2010) (0)
- Integrated Approach to Microwave Design (Sep. 1976 [T-MTT]) (1972) (0)
- EM of surface dynamics (1992) (0)
- Patterning Sn-based EUV resists with low-energy electrons (2019) (0)
- Phase formation sequence and domain structure: A low-energy-electron-microscopy study of the Si(111)-( sqrt 3 x sqrt 3 )Ag surface. (1992) (0)
- In Situ Studies with Low-Energy Electron Microscopy (1995) (0)
- Thin Bismuth Film as a Template for Growth of Highly Ordered Pentacene: STM and LEEM study (2005) (0)
- Integrated Approach to Microwaye Design (0)
- Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A. (1986) (0)
- Measurement of Surface Stress of (Sub)monolayer Epitaxial Films By Optical Deflection (1990) (0)
- LEEM imaging of the moiré pattern of twisted bilayer graphene (2020) (0)
- Atomic Scale Transport in Graphene on Stepped SiC(0001) Surfaces (2011) (0)
- Elastic Relaxation Driven Phase Boundary Bending (2003) (0)
- In Situ Electron Microscopy Studies of Surface Dynamical Processes (1998) (0)
- Novel Materials for Organic and Thin Film Electronics (2005) (0)
This paper list is powered by the following services:
Other Resources About Rudolf M. Tromp
What Schools Are Affiliated With Rudolf M. Tromp?
Rudolf M. Tromp is affiliated with the following schools:
