Ryuichiro Shimizu
#141,617
Most Influential Person Now
Ryuichiro Shimizu's AcademicInfluence.com Rankings
Download Badge
Physics
Why Is Ryuichiro Shimizu Influential?
(Suggest an Edit or Addition)Ryuichiro Shimizu's Published Works
Number of citations in a given year to any of this author's works
Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author
Published Works
- Monte Carlo modelling of electron-solid interactions (1992) (301)
- Backscattering correction for quantitative Auger analysis: I. Monte Carlo calculations of backscattering factors for standard materials (1981) (254)
- Quantitative Analysis by Auger Electron Spectroscopy (1983) (232)
- A Monte Carlo modeling of electron interaction with solids including cascade secondary electron production (2006) (201)
- Dependence of coercivity on the anisotropy field in the Nd2Fe14B‐type sintered magnets (1987) (143)
- Monte Carlo Calculations on Electron Scattering in a Solid Target (1971) (141)
- A Monte Carlo approach to the direct simulation of electron penetration in solids (1976) (135)
- Monte Carlo study of secondary electron emission (2001) (115)
- Ion Beam Assisted Deposition of Metal Organic Films Using Focused Ion Beams (1984) (106)
- Computer simulation of atomic mixing during ion bombardment (1975) (105)
- A Monte Carlo calculation of low-energy secondary electron emission from metals (1974) (95)
- The Monte Carlo technique as applied to the fundamentals of EPMA and SEM (1972) (81)
- Round Robin computer simulation of ejection probability in sputtering (1989) (73)
- Monte Carlo Calculations of the Electron‐Sample Interactions in the Scanning Electron Microscope (1971) (73)
- A study of electron penetration in solids using a direct Monte Carlo approach (1980) (73)
- Dynamic observation of an atom-sized gold wire by phase electron microscopy. (2001) (72)
- Monte Carlo calculation approach to quantitative Auger electron spectroscopy (1980) (72)
- Secondary electron and backscattering measurements for polycrystalline copper with a spherical retarding-field analyser (1973) (70)
- Monte Carlo Simulations on Scattering of Bombarded Ions in Solids (1972) (70)
- Quantitative evaluation of spatial coherence of the electron beam from low temperature field emitters. (2004) (66)
- Experimental and theoretical study of energy dissipation profiles of keV electrons in polymethylmethacrylate (1975) (55)
- Reflection electron energy loss spectrum of surface plasmon excitation of Ag: A Monte Carlo study (2002) (54)
- Energy distribution measurements of transmitted electrons and Monte Carlo simulation for kilovolt electron (1975) (54)
- Secondary electron yield with primary electron beam of kilo‐electron‐volts (1974) (53)
- Auger and Secondary Electrons Excited by Backscattered Electrons (1974) (52)
- Angular distribution of Si atoms sputtered by keV Ar+ ions (1980) (52)
- Investigation on surface compositions of CuNi alloy under Ar + ion bombardment by ISS and in situ AES measurements (1980) (47)
- Initial oxidation studies on Fe(100) by means of photoelectric work function measurements combined with auger electron spectroscopy (1974) (45)
- Investigation of kilovolt electron energy dissipation in solids (1974) (45)
- Interaction Potential between He+ and Ti in a keV Range as Revealed by a Specialized Technique in Ion Scattering Spectroscopy (1982) (44)
- Measurement of structure in the energy distribution of slow secondary electrons from aluminum (1976) (44)
- Monte Carlo simulation of absolute secondary electron yield of Cu (2004) (43)
- Energy spectra of backscattered electrons in Auger electron spectroscopy: comparison of Monte Carlo simulations with experiment (2004) (43)
- Measurements of the energy distribution of backscattered kilovolt electrons with a spherical retarding-field energy analyser (1974) (41)
- Titanium Nitride Crystal Growth with Preferred Orientation by Dynamic Mixing Method (1987) (40)
- DIAMOND FILMS HETEROEPITAXIALLY GROWN ON PLATINUM (111) (1997) (39)
- Monte Carlo Simulation Approach to Sputtering in Multi-Component Targets (1985) (38)
- Quantitative AES analysis of coevaporated Cu/Ni films and the effects of ion sputtering on them: experiments at liquid nitrogen and room temperature (1978) (37)
- Computer simulation of knock-on effect under ion bombardment (1974) (36)
- Energy loss functions for electron energy loss spectroscopy (1999) (36)
- Study of preferential sputtering on binary alloy by in-situ Auger measurement of sputtered and sputter-deposited surfaces (1977) (35)
- Comments on “The equilibrium topography of sputtered amorphous solids” (1974) (35)
- Preferential sputtering of Cu-Ni alloys at low temperature using lower energy auger electron spectra∗☆ (1979) (35)
- Investigation of Electron Penetration and X-Ray Production in Solid Targets (1973) (34)
- Sputtering of Si with keV Ar+ Ions. I. Measurement and Monte Carlo Calculations of Sputtering Yield (1979) (34)
- Thickness and in-depth composition profile of altered layer caused on CuNi alloy surface due to preferential sputtering (1978) (33)
- Simulation of electron/solid interaction and its application to quantitative analysis by Auger electron spectroscopy (1988) (32)
- Theoretical study of the ultimate resolution in electron beam lithography by Monte Carlo simulation, including secondary electron generation: Energy dissipation profile in polymethylmethacrylate (1983) (31)
- Edge effect in high‐resolution scanning Auger‐electron microscopy (1978) (31)
- Practicality of the thermodynamic model for quantitative ion probe microanalysis of low alloy steels (1975) (30)
- Sputtering of Si with keV Ar+ Ions. II. Computer Simulation of Sputter Broadening Due to Ion Bombardment in Depth Profiling (1979) (30)
- Changes of Volume and Surface Compositions of Polymethylmethacrylate under Electron Beam Irradiation in Lithography (1985) (29)
- Application of Monte Carlo calculation to fundamentals of scanning Auger electron microscopy (1977) (29)
- MONTE CARLO SIMULATION OF X-RAY SPECTRA IN ELECTRON PROBE MICROANALYSIS : COMPARISON OF CONTINUUM WITH EXPERIMENT (1994) (28)
- A semiempirical stopping‐power formula for use in microprobe analysis (1978) (28)
- Wave field restoration using three-dimensional Fourier filtering method. (2001) (28)
- Fundamental Studies on Quantitative Analysis in Ion Probe Microanalyzer (1974) (28)
- Monte Carlo analysis of XPS and REELS spectra obtained at different take‐off angles (1992) (27)
- Computer simulation of damage processes during ion implantation (1987) (26)
- Measurements of reflected electron energy loss spectrometry and x‐ray photoelectron spectroscopy spectra for derivations of the energy loss function and source function for Au 4f photoelectrons (1995) (26)
- Dynamic Monte Carlo simulation of surface composition changes on TiC and AuCu under Ar + ion bombardment (1990) (24)
- Secondary Electron Emission from Aluminum by Argon and Oxygen Ion Bombardment below 3 keV (1983) (24)
- Evaluation of SIMS depth resolution using delta-doped multilayers and mixing–roughness-information depth model (2003) (24)
- Simultaneous measurements of photon and ion emissions from ion bombarded Al in an oxygen atmosphere (1977) (24)
- Scanning Electron Microscopic Observation of Metal Surfaces Eroded by Argon Ions (1974) (24)
- High resolution electron‐beam lithography on thin films (1979) (23)
- Observation of electron beam damage in thin‐film SiO2 on Si with scanning Auger electron microscope (1979) (23)
- Monte Carlo simulation of background in AES: a comparison with experiment (1995) (22)
- Theoretical study of the ultimate resolution of SEM (1989) (22)
- Determination of effective energy loss functions and x-ray photoelectron spectroscopy source functions for Si 2p photoelectrons from clean Si(111), oxygen-adsorbed Si(111) and SiO2 surfaces (1998) (22)
- Field Emission Pattern of LaB6-Single Crystal Tip (1975) (21)
- 8 nm Wide Line Fabrication in PMMA on Si Wafers by Electron Beam Exposure (1985) (21)
- Monte Carlo simulation study of electron interaction with solids and surfaces (2006) (20)
- Thermionic emission from single‐crystal LaB6 tips with [100], [110], [111], and [210] orientations (1980) (20)
- Highly stable single‐crystal LaB6 cathode for conventional electron microprobe instruments (1978) (20)
- Derivation of new energy-loss functions as applied to analysis of Si 2p XPS spectra (1996) (19)
- LEED-Work Function Studies on Fe (100) (1972) (19)
- Dynamic simulation of ion implantation with damaging processes included (1987) (19)
- Correction of Spherical Aberration in HREM Image Using Defocus-Modulation Image Processing (1992) (19)
- Nanofabrication of grating and dot patterns by electron holographic lithography (1995) (18)
- Comment on “Evaluation of concentration-depth profiles by sputtering in SIMS and AES” by S. Hofmann (1979) (18)
- Monte Carlo simulation on the behavior of energetic ions in polyatomic targets (1972) (17)
- Evaluation of correction accuracy of several schemes for AES matrix effect corrections (1990) (17)
- Atomic mixing in ion probe microanalysis (1975) (17)
- Backscattering correction factor for AuCu alloys in quantitative Auger analysis (1987) (17)
- Comparison of energy‐loss functions from REELS spectra with surface and bulk energy loss functions for Ag (2003) (17)
- Effective energy-loss functions for oxygen-adsorbed amorphous silicon surfaces (1999) (17)
- Development of a real-time defocus image modulation processing electron microscope. I. Construction (1999) (16)
- Approximation Formula of Cross-section for the Universal Potential Expression Proposed by Ziegler et al. (1984) (16)
- LaB6 single‐crystal tips as an electron source of high brightness (1975) (16)
- Auger Study of Preferential Sputtering for Cu–Ni Alloy Sample (1978) (16)
- Characterization of Sc–O/W(100) Surface as Schottky Emitter: Work Function Change for Activation Processing (2000) (15)
- Distorted surface and interface structures of catalytic gold nanoparticles observed by spherical aberration-free phase electron microscopy (2001) (15)
- Angular Distribution of Elastically Reflected Electrons from Au (1990) (15)
- Study on the Resolution of the Backscattered Electron Image by the Monte Carlo Method (1971) (15)
- Effect of heat treatment on grain‐boundary microstructure in Nd‐Fe‐B sintered magnet (1988) (15)
- Thermal field emission observation of single-crystal LaB6 (1990) (15)
- Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms (1999) (15)
- Initial Stage of Oxidation of Si(001)-2×1 Surface Studied by X-Ray Photoelectron Spectroscopy (1998) (15)
- Preferentially Oriented Crystal Growth in Dynamic Mixing Process–An Approach by Monte Carlo Simulation– (1990) (14)
- High Contrast Observation of Magnetic Domain with High Voltage SEM (1976) (14)
- Secondary Electron Measurement with Auger Electron Microprobe. I. Calibration of the CMA in the Low-Energy Region (1985) (14)
- On the Energy Distribution of Secondary Electrons Emitted from Metals (2008) (14)
- A compact electron‐gun evaporation source for highly stable evaporation of refractory metals (1993) (14)
- Characterization of a refractory surface at a high temperature applied to the Zr-O/W(100) system. On self-recovery function (1998) (14)
- Secondary and auger electron spectra of a Cu-Be alloy (1973) (13)
- Sequential ISS-AES measurement with scanning auger microprobe (1986) (13)
- Development of real-time defocus-modulation-type active image processing (DMAIP) for spherical-aberration-free TEM observation (1994) (13)
- Transmission electron microscope study of heteroepitaxial diamond on Pt (111) (1997) (13)
- Monte Carlo simulation of electron penetration through thin films of PMMA (1978) (13)
- A Stable High-Brightness Electron Gun with Zr/W-tip for Nanometer Lithography. I. Emission Properties in Schottky- and Thermal Field-Emission Regions (1985) (13)
- SEM observation and contrast mechanism of stacking faults in an epitaxial silicon layer (1974) (13)
- Surface science lettersISS measurement of surface composition of AuCu alloys by simultaneous ion bombardments with Ar+ and He + ions (1982) (13)
- Background formation in the low‐energy region in Auger electron spectroscopy (1994) (13)
- New energy loss functions for 1 keV electrons incident on clean and oxygen-adsorbed Si (111) surfaces (1998) (12)
- A New Type Edge Effect in High Resolution Scanning Electron Microscopy (1974) (12)
- Effects of Thermal Annealing for Restoration of UV Irradiation Damage during Plasma Etching Processes (2006) (12)
- A simple technique for the stroboscopic observation of magnetic domain response using scanning electron microscopy (1976) (12)
- Surface composition analyses of Co–Ni alloys under Ar+ ion bombardment by AES and ISS: A possible standard sample for surface chemical analysis (1989) (11)
- ASSESSMENT OF IMAGE FORMATION BY THREE-DIMENSIONAL POWER SPECTRUM IN TRANSMISSION ELECTRON MICROSCOPY (1991) (11)
- Investigation of Energy Dissipation of Electrons in Al- and Cu-Targets by Monte Carlo Method (1970) (11)
- Coercivity and Grain Boundary Morphology in Nd–Fe–B Sintered Magnets (1990) (11)
- Impurity concentrations on metal surfaces by auger electron spectroscopy (1973) (11)
- Surface orientation and structure of ion beam processed TiN films (1997) (11)
- Composition profiles at initial stage of altered layer formation on Cu‐Pt alloy surfaces under Ar+ ion bombardment (1995) (10)
- Development of a Novel Instrument for X-Ray Photoelectron Diffraction and Holography (2003) (10)
- Fabrication and resist exposure characteristics of 50 keV nanometer e‐beam lithography system (1985) (10)
- Transmission electron microscopy study of interface and internal defect structures of homoepitaxial diamond (1996) (10)
- Monte Carlo Simulations of the Behavior of Energetic Light Ions in Solids (1971) (10)
- The reliability of quantitative analysis with AES (1990) (10)
- Cross-Sectional Transmission Electron Microscopic Observation of Etch Hillocks and Etch Pits in LiTaO3 Single Crystal (2000) (10)
- Resolution in sputter depth profiling assessed by AlAs/GaAs superlattices (1995) (9)
- Spherical-aberration-free observation of TEM images by defocus-modulation image processing (1992) (9)
- Development of standards for surface analysis by ISO technical committee 201 on surface chemical analysis (1997) (9)
- Ion-Induced Sputtering (1983) (9)
- Scanning electron microscopy of charging effect on silicon (1975) (9)
- Effect of iodotrifluoromethane plasma for reducing ultraviolet light irradiation damage in dielectric film etching processes (2010) (9)
- Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer (2001) (9)
- Cross‐sectional transmission electron microscopy study of isolated diamond particles grown on a mirror‐polished Si substrate (1995) (9)
- 〈310〉Single-Crystal LaB6 as Thermal Field Emitter of High Brightness Electron Source (1991) (9)
- Monte‐Carlo simulation of spatial distribution of x‐rays in multi‐film targets. II: Spatial distribution of continuous x‐rays and temperature elevation in W/Al film targets (2005) (9)
- Continuum X-Ray Generation from W Film on Cu Substrate (2000) (9)
- Direct observation of thermionic emission pattern of hemispherical single‐crystal LaB6 (1981) (8)
- Analysis of the transition layer in silicon nitride films deposited by a low-pressure chemical vapour deposition (1999) (8)
- Monte‐Carlo simulation of x‐ray photoelectron emission from silver (2003) (8)
- Dynamic Monte Carlo simulation for depth profiling by ion-sputter etching: Application to the AlAs/GaAs multilayered system (1998) (8)
- Monte Carlo simulation of depth and lateral profiles of boron atoms implanted in polycrystalline silicon (1977) (8)
- Photoelectric Work Function Study on Iron (100) Surface Combined with Auger Electron Spectroscopy (1973) (8)
- EXPOSURE AND DEVELOPMENT SIMULATIONS FOR NANOMETER ELECTRON BEAM LITHOGRAPHY. (1983) (8)
- The dynamic response of magnetic domain walls to applied fields in yttrium orthoferrite, observed by a stroboscopic technique (1974) (8)
- Activities of ISO technical committee 201 on surface chemical analysis (1994) (8)
- Monte‐Carlo simulation of secondary electron emission by x‐ray irradiation—an application of x‐ray absorption near‐edge structure (XANES) (2004) (8)
- Real-time lock-in imaging by a newly developed high-speed image-processing charge coupled device video camera (2003) (8)
- Preferential sputtering of coevaporated Cu-Ni film associated with altered layer (1978) (8)
- Dynamic Monte Carlo simulation for SIMS depth profiling of delta-doped layer (1999) (8)
- In-depth surface composition of Al-Mg alloy under ion bombardment (1989) (8)
- Active Image Processing as Applied to High Resolution Electron Microscopy [I] Assessment of Misalignment and Its Correction (1990) (8)
- Transmission measurement of the absolute CMA: simulation and experiments (2007) (7)
- Third-order spherical aberration correction using multistage self-aligned quadrupole correction-lens systems. (2010) (7)
- Stroboscopic Observation of Magnetic Domain Wall Motion with a Light Emitting Diode (1973) (7)
- Comparison of Energy-Loss Functions from Reflection Electron Energy-Loss Spectroscopy Spectra with Surface and Bulk Energy-Loss Functions: in Case of Cu (2004) (7)
- Formation of Technical Committee 201 on Surface Chemical Analysis by the International Organization for Standardization (1993) (7)
- Technique of sequential surface analysis with ISS and AES (1988) (7)
- Quantitative microanalysis of individual particulates. I. Electron probe microanalysis of NBS‐glass particulates (1983) (7)
- Application of line‐sampling multiframe stroboscopy for dynamic observation of magnetic domains in Si steels (1985) (7)
- Spherical-aberration-free observation of profile images of the Au(011) surface by defocus-modulation image processing (1994) (7)
- The Effect of Ejection Angle in Ion-Beam Sputter Deposition of Superconducting Amorphous Beryllium Film (1990) (7)
- The influence of atomic wavefunctions on the spin polarisation and the differential cross section for electron impact excitation of mercury (1977) (7)
- Application of a Low Energy Ion Gun for High Resolution Depth Profiling (2003) (7)
- Angular distribution of X-ray photoelectrons emitted from silver (2005) (7)
- Unique source for scandium oxide layer deposition on tungsten for surface study of high electron emissivity (1999) (7)
- Effect of elastic scattering and cylindrical mirror analyser geometry on the evaluation of escape depths of auger electrons (1995) (7)
- Effective energy loss functions of Mo and Ta derived from reflection electron energy loss spectra (2007) (6)
- Studies of initial oxidation on silicon‐iron alloy (100) by means of work function and Auger electron spectroscopy (1973) (6)
- Surface structure analysis of Zr‐O/W(100) at high temperature by x‐ray photoelectron diffraction (2005) (6)
- Nanometer structure fabrication attained by a nanometer E-beam lithography system (NSF-1) (1985) (6)
- Preliminary experiments for development of real-time defocus-image modulation processing electron microscope (1998) (6)
- Theoretical background of defocus image modulation processing (DIMP) based on three dimensional optical transfer functions (3D-OTFs) (2001) (6)
- Line‐sampling multiframe stroboscopic technique for dynamic observation of periodic phenomena at low frequencies (1984) (6)
- Formation of Aluminum Nitride Film for High Power Soft X-Ray Source Using Ion-Beam Assisted Deposition Method (2005) (6)
- The effect of cooling on the development of composition profiles in Cu–Pt alloys under Ar+ ion bombardment (1994) (6)
- Evaluation of image drift correction by three-dimensional Fourier analysis (1999) (6)
- A novel approach to derive absorption coefficient of secondary electrons as applied to Ti and TiO2 (2006) (6)
- Dynamic processes of altered layer formation on alloy subsurface: a Monte Carlo simulation for Cu-Pt alloys (1995) (6)
- Mathematical background of defocus-modulation image processing (1994) (6)
- Scattering of Electrons from a Microanalyzer Target (1963) (5)
- Exafs and X-ray diffraction studies on the local structure of sputter-deposited amorphous SixTe1−x alloys (1990) (5)
- EXTRACTION OF SPHERICAL AND CHROMATIC ABERRATION-FREE INFORMATION BY FOCAL-DEPTH EXTENSION PROCESSING UNDER TILTED ILLUMINATION (1995) (5)
- An interpretation of quantitative analysis of Arthur and LePore for AlxGa1–xAs using AES (1981) (5)
- Ion Induced Auger Electron Emission from Al-Mg Alloy under Low Energy Argon Ion Bombardment (1985) (5)
- Characteristics of Al maskless patterning using focused ion beams (1985) (5)
- Evaluation of BN-delta-doped multilayer reference materials for shallow depth profiling in SIMS (2004) (5)
- Calculation of Electron Spin Polarization for Polarization Detector (1976) (5)
- Oxygen‐enhanced thermionic emission pattern of hemispherical single‐crystal LaB6 (1984) (5)
- Floating-type Compact Low-energy Ion Gun (2000) (5)
- Secondary ion generation mechanism studied by ISS-SIMS and work function measurements (1989) (5)
- Secondary electron energy spectra of single-crystal Fe(110) at various emission angles (1974) (5)
- Measurement of the Energy Distributions of Secondary Ions from Pure Metals and Alloys (1981) (5)
- Construction of a data base for secondary electron emission by a novel approach based on Monte Carlo simulations (Special Issue on Quantitative Surface Chemical Analysis in honor of Kazuhiro Yoshihara) (2006) (5)
- A relation of photoelectric work function with surface composition on 2.89wt% Si–Fe(100) single crystal (1972) (5)
- Monte Carlo Simulation for Auger Depth Profiling of GaAs/AlAs Superlattice Structure by Ar+ Ion Sputtering (1996) (5)
- Development of a novel CCD video camera incorporated with operational function for real-time image processing (2001) (5)
- Scanning electron microscope investigation of electric activity of stacking faults in silicon epitaxial layer (1975) (5)
- Monte Carlo Simulation of Secondary Electron Emission from Tungsten Surfaces with Various Work Functions as Applied to Sc/W Surfaces. (2000) (4)
- Stability of Beam Current of Single Crystal LaB6 Cathode in High Vacuum (1977) (4)
- Sequential SIMS-ISS analysis of oxygen-enhanced secondary ion generation (1988) (4)
- A New FFT Method for Numerical Reconstruction in Electron Holography (1991) (4)
- A Simple Calculation on Backscattering of Light Ions of KeV Energies (1971) (4)
- LETTER TO THE EDITOR: Secondary electron energy spectra from a Be layer evaporated on Cu (1974) (4)
- Nonlinear variation with applied field of the mobility of magnetic domain walls in yttrium orthoferrite (1973) (4)
- Surface composition of CoNi alloys under Ar+ ion bombardment (1989) (4)
- CuCl Microcrystallite-Doped SiO2 Glass Thin Films Prepared by RF Sputtering (1991) (4)
- Microfabricated Submicron Al-Filament Biprism as Applied to Electron Holography (1991) (4)
- Experimental Studies of Secondary Electron Emission of TiO2 and Ti (2006) (4)
- Analysis of Sputtered Neutrals by Nonresonant Multiphoton Ionization I. Development of Laser Ion Counting System with a Simple Time-of-Flight Measurement (1991) (4)
- Effective Resolution of Phase-contrast Images in X-ray Microscopy (2006) (4)
- Effective depths for surface excitation derived by reflection electron energy‐loss spectroscopy analysis (2004) (4)
- Simple line‐sampling apparatus for line frequency stroboscopic observation of periodic phenomena using scanning electron microscopy (1987) (4)
- Absolute energy calibration in Auger electron spectroscopy by using elastically backscattered primary electrons (2002) (4)
- 4H‐SiC/6H‐SiC interface structures studied by high‐resolution transmission electron microscopy (1993) (4)
- Experimental and theoretical studies on X-ray induced secondary electron yields in Ti and TiO2 (2006) (4)
- Dielectric breakdown mechanism in thick SiO/sub 2/ films revisited (2004) (4)
- Analysis of Sputtered Neutrals by Nonresonant Multiphoton Ionization. II. A Quantitative Composition Analysis of Cu-Al Alloy (1991) (4)
- Development of Coincidence Transmission Electron Microscope (I) Coincidence Image Construction System (1995) (3)
- Monte Carlo Simulation of Generations of Continuous and Characteristic X-Rays by Electron Impact (2000) (3)
- Surface characterization for sputter-cone formation on InP(100) (1998) (3)
- Database construction of secondary electron emission: Monte Carlo approach combined with supplementary experiment: special lecture, Korea-Japan symposium (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan) (2008) (3)
- Spin-Polarization and Differential Cross Section of Electron-Mercury Inelastic Scattering (1978) (3)
- Real-time observation of spherical aberration-free phase image using high-speed image processing CCD video camera. (2001) (3)
- Anisotropic Emission of Secondary Electrons from Fe(110) Single Crystal (1971) (3)
- Electron Impact Spectra of Mercury in Intermediate Energies (1978) (3)
- The Fringe Scanning Method as Numerical Reconstruction for Electron Holography (1990) (3)
- Influence of Native Oxides on the Reliability of Ultrathin Gate Oxide (1998) (3)
- Magnetic domain observation of induced anisotropy around scratches in Mn‐Zn ferrites using SEM (1976) (3)
- Monte Carlo Simulation of Multiple Inelastic Scatterings in Crystals (1976) (3)
- Auger Depth Profiles of a GaAs/AlAs Superlattice Structure Obtained with O2+ and Ar+ Ion Sputtering (1995) (3)
- Calculation of X-Ray Production in Alloy Targets by New Approach Using Monte Carlo Method (1970) (3)
- Light and Secondary Ion Emissions from Ion Bombarded Solid Surfaces (1974) (3)
- Active image processing as applied to high resolution electron microscopy [II] real-time phase-plateless electron phase microscopy by accelerating-voltage modulation (1994) (3)
- GMR In Corrugated Co/Cu Multilayers (1997) (3)
- Study by Monte‐Carlo simulation of resolution improvement by energy filtering in Bio‐TEM (2002) (3)
- Ghost Spectra and Rubbish Electrons in a CMA (2001) (3)
- Monte‐Carlo simulation of spatial distribution of characteristic x‐rays in multi‐film targets: source size of Al Kα x‐rays in W/Al film targets (2004) (3)
- High‐resolution Auger depth profiling by sub‐keV ion sputtering (2005) (3)
- Mechanism of increase in charge-pumping current of metal-nitride-oxide-silicon-field effect transistors during thick dielectric film etching using fluorocarbon gas plasma (2010) (3)
- Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum. (2001) (3)
- Monte Carlo simulation studies in Japan on interaction of charged particles with solids during those early days in 1960s-1970s (2005) (3)
- Oxygen adsorption and reaction on alpha-silicon (1999) (3)
- Quantitative analysis by auger electron spectroscopy : Monte Carlo calculations of electron backscattering effects (1981) (3)
- A New Bessel-Box Energy Analyzer for Sputtered Neutral Mass Spectrometry (1990) (3)
- Secondary electron emission from a Fe(110) single crystal (1973) (3)
- Study of Accumulation Effect of Bombarding N2+ Ions on Al Surface by Auger Electron Spectroscopy (2000) (2)
- Development of photoelectron spectro‐holography apparatus (2005) (2)
- Study on Zr–Si/W(100) Surface at High Temperatures by Reflection High Energy Electron Diffraction (1999) (2)
- Stroboscopic observation of magnetic domain wall motion in yttrium orthoferrite for the region of Walker's critical velocity (1974) (2)
- Ejection pattern of sputtered atoms from Cu(100) under 10 keV Ar+ ion bombardment (1989) (2)
- Monte Carlo simulation of spatial distribution of X rays in multifilm targets. III: optimum design as applied to W/Al‐film targets (2007) (2)
- Applicability of the Fano plot to secondary electron (SE) yield data (1976) (2)
- An Application of Square Wave Modulation Technique to Scanning Auger Electron Microscopy (1977) (2)
- Weibull Distribution of X-Ray Pulse-Height (1965) (2)
- Aberration Correction by Electron Holography Using Numerical Reconstruction Method (1990) (2)
- Cross-Sectional Transmission Electron Microscope Observation of Isolated Diamond Particles Heteroepitaxially Grown on Pt(111) Substrate (1998) (2)
- New Computer Simulation Software of Electron Trajectories for Evaluation of Magnetic Field Immersion-Type Field Emission Gun (2007) (2)
- Photoelectric work function and auger electron spectroscopy of 5.59 at% SiFe alloy (100) single crystals (1973) (2)
- Development of coincidence transmission electron microscope (II) Observation of coincidence electron microscopic image (1997) (2)
- Monte Carlo simulation of Auger electron spectroscopy and x‐ray photoelectron spectroscopy spectra (1992) (2)
- Background Information in Auger Electron Spectroscopy and Secondary Electron Emission Due to Cascade Process (1974) (2)
- Accumulation Effect of Bombarding N2+ Ions in Al for Crystal Growth of AlN Film (2000) (2)
- Preferential sputtering of TIC under keV Ar + ion bombardment: Simultaneous sputtering-ISS measurement with He + and Ar + ions (1983) (2)
- Working group report of database construction of secondary electron yield (2010) (2)
- Development of Quantitative Auger Electron Spectroscopy II (1990) (2)
- High-resolution spherical-aberration-free phase imaging by defocus image modulation processing under hollow-cone illumination : Experimental confirmation by optical microscopy (1997) (1)
- Determination of partially coherent parameters by lattice image contrast in TEM (1993) (1)
- Surface Analyzer Combining Secondary Ion Mass Spectrometry and Ion Scattering Spectrometry (1976) (1)
- Development of a Nanoprobe Cathodoluminescence Scanning Electron Microscope (1996) (1)
- Magnetic Domain Observation Technique using Scanning Electron Microscope:Application to Surface Damaged Layer Study of Mn-Zn Single Crystal Ferrites (1977) (1)
- Analysis of Sputtered Neutrals by Nonresonant Multiphoton Ionization. III. Change of the Velocity Distribution with Time after Sputtering (1991) (1)
- The f(χ)-Curves for FeKα and AlKα X-Rays in the Inclined EPMA Targets of Fe, Al and Fe-Al Alloy (1971) (1)
- Simultaneous Measurements of Photon and Secondary Ion Emissions from Ion-Bombarded Metal Surfaces (1979) (1)
- A Study on Electron Diffusion in X-ray Microanalyzer Specimen (1965) (1)
- Observation of Al surface during sputter-cleaning and annealing procedures under UHV-REM (1998) (1)
- Observation of GaAs(110) Surface Defect by Reflection Electron Holography (1990) (1)
- An advanced ionizing radiation monitoring network based on using SrI2(Eu)/MPPC module (2016) (1)
- Depth Distribution of Characteristic X-rays in EPMA Alloy Targets I. Angular Distribution and f(χ)-Curves of Fe K X-rays in Fe-Al Alloy Targets (1970) (1)
- Basis of Quantitative Auger Aualysis (1982) (1)
- Lateral spreads of energy dissipation profiles of 20-kV electrons in polymethylmethacrylate: Functional representation and its application to proximity effect (1981) (1)
- Enrichment of Al in the topmost surface of AlN crystalline film prepared by post‐irradiation (2001) (1)
- Basic Study of Quantitative Ion Scattering Spectroscopy. (1997) (1)
- CUCL MICROCRYSTALLINE-DOPED SIO3 GLASS THIN FILMS PREPARED BY RF SPUTTERING (1991) (1)
- Structural and optical properties of semiconducting microcrystallite-doped SiO2 glass films prepared by rf-sputtering (1991) (1)
- A Hybrid Monte Carlo Calculation Estimate of Angular Distribution of Sputtered Atoms for keV Proton Bombardment (1982) (1)
- Fourier analysis of HRTEM image deterioration caused by mechanical vibration. (2001) (1)
- Anti-Contamination Electron Biprism for Electron Holography (1988) (1)
- A Compact Cs-Evaporator for High Sensitivity SIMS (1979) (1)
- Synchronous modulation in scanning Auger electron microscopy. (1979) (1)
- Study of Defects and Strains on Cleaved GaAs (110) Surface by Reflection Electron Microscopy (1992) (1)
- A practical method for modulation of accelerating voltage for active modulation image processing electron microscopy (1994) (1)
- Fundamental studies of the LTE model using secondary ion and ion-induced photon emissions☆ (1979) (1)
- Atomic level characterization as applied to developing cathodes of high brightness (2003) (1)
- A phenomenological analysis of domain wall motion in magnetic materials with orthorhombic anisotropy (1975) (1)
- Calculations of electric fields by surface charge method for designing TFE gun (1991) (1)
- 2004 International Microprocesses and Nanotechnology Conference Committee Members (2004) (1)
- Application of Monte Carlo calculations to quantitative microanalysis of alloy systems (1972) (1)
- Development of Electron Probe Instrumentation during Those Early Days When Professor Castaing Visited Japan (1999) (1)
- Study of X‐ray absorption near‐edge structure with a photoemission electron microscope (2006) (1)
- The Background Subtraction Methods of Electron Spectroscopy (1994) (0)
- 8 nm Wide Line Fabrication in PMMA on Si Wafers by Electron Beam Exposure (1985) (0)
- Coma-free alignment of transmission electron microscope using through-tilt images (1995) (0)
- Surface properties of thermal field emitter (Zr-O/W (100)) as a new extension of high-temperature surface physics (1996) (0)
- Report of VAMAS-SCA-WG in Japan. (1988) (0)
- Surface Characterization of Zr - O/W System at ~ 1700 K (1996) (0)
- An Ion Beam Apparatus in the Range of keV-Energies (1973) (0)
- A novel compact ion gun system based on off-axis optics and a liquid metal ion source (1992) (0)
- Monte Carlo simulation for laser excition processes (1980) (0)
- Special Issue for the 25th Anniversary of the JSPS‐141 Committee on Microbeam Analysis (2001) (0)
- Reflection of keV Light Particles from Random Solids by Modified Single-Collision Model (1985) (0)
- Development of compact ultra-low energy ion gun (1998) (0)
- Analysis of type-II magnetic contrast from ferromagnetic thin films in the scanning electron microscopy (1983) (0)
- Distortion of Elastically Scattered Electron Energy Spectrum in a Retarding Field Type Spectrometer (1976) (0)
- Dynamic Observation of Ferromagnetic Domains by using Line-Sampling Strobo SEM (1988) (0)
- Losses of Grain-Oriented Three Percent Si-Fe with Very High Permeability (1985) (0)
- APPLICATION OF MONTE CARLO TECHNIQUE TO QUANTITATIVE AUGER ANALYSIS - APPROACH FOR QUANTITATIVE CORRECTION OF ELECTRON BACKSCATTERING EFFECT. (1981) (0)
- Combined Auger Electron Spectroscopy and Electron Impact Desorption Studies of the Interactions of Gases with Silicon Surfaces (2016) (0)
- TEM Study of the Interface Structure of CVD Diamond Heteroepitaxilly Grown on Pt(111) Substrate (1999) (0)
- A study of theoretical depth resolution of GaAs/AlAs reference material with low energy inert‐gas ions by Monte Carlo simulation (2007) (0)
- Outermost Surface Composition of Au-Cu Alloys Under Ion Bombardment of Different Current Densities of Ar+ Ions (1984) (0)
- Development of High Power Soft X-ray Source-AlN/Cu Target (2004) (0)
- Reconstruction of an ultrahigh vacuum reflection electron microscope for in-situ high temperature observation (1999) (0)
- Development of Radium Concentration Monitoring System based on Gamma-Ray Spectroscopy (2019) (0)
- Simple and rapid quantification of chromium, arsenic, and selenium in bituminous coal samples using a desktop energy dispersive X-ray fluorescence analyzer. (2021) (0)
- 45 Years in Monte Carlo Simulation for Microbeam Analysis - A personal retrospective review - (2011) (0)
- Surface Structure of Titanium Nitride Prepared by Ion Beam Irradiation and RF Sputtering Processes (1997) (0)
- Surface Characterization of Zr-O/W System at High Temperature (1994) (0)
- Quantitative Technigue in Auger Electron Spectroscopy (1975) (0)
- Electron Spectroscopy of SI Traceable; CMA as an Example (2006) (0)
- On the Preparation of TEM Specimens using Focused Ion Beam (1995) (0)
- Si(Li) detector and data processing system for accurate energy-dispersive X-ray microanalysis (1982) (0)
- Sputtering of Cu-Ni alloys at elevated temperature (1980) (0)
- Surface Structure of TiN Films by Ion Beam Processing (1996) (0)
- Dynamic observation of magnetic domains in amorphous ferromagnetic ribbons driven at line frequencies (1987) (0)
- DYNAMIC PROCESSES OF ALTERED LAYER FORMATION IN Cu-Pt ALLOYS UNDER ION BOMBARDMENT (1996) (0)
- Assessments of work function of Zr-O/W(100) cathode by Schottky and Fowler-Nordheim plots (1991) (0)
- Study on Zr–Si/W(100) Surface at High Temperatures by Combined Surface Analysis Techniques (1998) (0)
- Development of defocus-modulation type active image processing for electron microscopy (1990) (0)
- Initial Oxidation Studies on Iron Single Crystals by Means of Photoelectric Work Function Measurements Combined with Auger Electron Spectroscopy (1974) (0)
- Performance evaluation of the magnetic field immersion type field emission gun by boundary element method (2008) (0)
- PRINCIPLES AND APPLICATIONS OF DEFOCUS-IMAGE MODULATION PROCESSING ELECTRON MICROSCOPY (2003) (0)
- Metrological evaluation of signal formation in CD‐SEM—a quantitative computer simulation (2008) (0)
- Infrared light heating system for precise temperature control of specimen in reflection electron microscope (1996) (0)
- Cross-sectional TEM sample preparation by FIB. (1997) (0)
- Simulation of electron/solid interaction and application to quantitative analysis by electron spectroscopies (1988) (0)
- 2007International Microprocesses andNanotechnology Conference (2007) (0)
- Effects of CF3I Plasma for Reducing UV Irradiation Damage in Dielectric Film Etching Processes (2006) (0)
- A novel low energy ion gun for ultra-shallow dopant depth profiling (2002) (0)
- Dynamic observation of a microelectric field in an oxide superconducting material by electron interference microscopy (1994) (0)
- The magnetic domains in Co fine particles observed by Lorentz electron microscopy and electron holography (1992) (0)
- New Neutral- and Ion-Scattering Spectroscopy as Applied to Selective Adsorption of Hydrogen on Cu–Pt Alloy Surfaces (1998) (0)
- Transmission Electron Microscopic Study Of Heteroepitaxial Mechanism Of Cvd-Dlamond Grown On Pt(Lll) Substrate. (1999) (0)
- Use of oxygen bound with aluminum for Auger depth profiling of GaAs/AlAs superlattice structure (1998) (0)
- Determining the Composition of the Outermost Atomic Layers of Surfaces but Without Scratching the Surface): ISO/TC 201 Develops New Standards for Surface Chemical Analysis (1997) (0)
- Importance of VAMAS and ISO in Developing Reference Standards and Documentary Standards for Practical Surface Analysis (1998) (0)
- Highly Angular Resolved X-ray Photoelectron Diffraction Measurements by using the Diffraction Plane Aperture (2003) (0)
- Defocus-image modulation processing as applied to observation of unstained biological specimen (1999) (0)
- Ion Sputtering Effect on Alloy Surfaces. (1995) (0)
- Nanoprobe cathodoluminescence scanning electron microscope as applied to synthesized diamond (1999) (0)
- Reference Auger Electron Spectra with Work Function Corrected (2002) (0)
- A practical method for real-time active modulation electron microscopy : Optimization of driving-signal for active accelerating-voltage modulation (1997) (0)
- Digital integrator in scanning Auger electron microscopy (1980) (0)
- Practical improvement of MS-Xα molecular orbital calculation as applied to dissociation process of CO molecule (1995) (0)
- Development of accelerating-voltage modulator for real-time defocus image modulation processing electron microscope (1997) (0)
- AlN film growth under N/sub 2//sup +/ ion bombardment onto Al surface (1998) (0)
- Construction of RHEED-apparatus with high temperature sample holder (1991) (0)
- Direct Monte Carlo Simulation of kV Electron Scattering Processes-N(E) Spectra for Aluminum (2020) (0)
- Computer Simulation Analysis of the Planar Channeling Effect in Practical Ion Implantation (1988) (0)
- Microbeam analysis 2000 : proceedings of the Second Conference of the Internatinal Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (2000) (0)
- THE DEPTH DISTRIBUTION OF CHARACTERISTIC X-RAYS IN X-RAY MICROANALYZER TARGET. II. TRACER METHOD. (1966) (0)
- Optimization of voltage axis alignment in high-resolution electron microscopy (1999) (0)
- Inelastic Electron Scattering in Auger Electron Spectroscopy (1998) (0)
This paper list is powered by the following services:
What Schools Are Affiliated With Ryuichiro Shimizu?
Ryuichiro Shimizu is affiliated with the following schools:
