Thomas Eugene Everhart | Academic Influence

Thomas Eugene Everhart's AcademicInfluence.com Rankings

Thomas Eugene Everhart

Physics

#3590

World Rank

#5064

Historical Rank

#1284

USA Rank

physics Degrees

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Physics

Thomas Eugene Everhart's Degrees

PhD Physics University of California, Berkeley
Bachelors Physics California Institute of Technology

Why Is Thomas Eugene Everhart Influential?

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According to Wikipedia, Thomas Eugene Everhart FREng is an American educator and physicist. His area of expertise is the physics of electron beams. Together with Richard F. M. Thornley he designed the Everhart–Thornley detector. These detectors are still in use in scanning electron microscopes, even though the first such detector was made available as early as 1956.

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Thomas Eugene Everhart's Published Works

Number of citations in a given year to any of this author's works

Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author

Published Works

Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials (1971) (765)
The scanning electron microscope. (1972) (364)
Wide-band detector for micro-microampere low-energy electron currents (1960) (340)
Simple calculation of energy distribution of low‐energy secondary electrons emitted from metals under electron bombardment (1974) (246)
Simple Theory Concerning the Reflection of Electrons from Solids (1960) (203)
Role of plasmon decay in secondary electron emission in the nearly-free-electron metals. Application to aluminum (1977) (103)
FAST-WAVE PROPAGATION IN PLASMA-FILLED WAVEGUIDES. (1962) (83)
Evaluation of Passivated Integrated Circuits Using the Scanning Electron Microscope (1964) (78)
A study of electron penetration in solids using a direct Monte Carlo approach (1980) (73)
Experimental and theoretical study of energy dissipation profiles of keV electrons in polymethylmethacrylate (1975) (55)
Point‐cathode electron sources‐electron optics of the initial diode region (1973) (53)
Simplified Analysis of Point-Cathode Electron Sources (1967) (50)
A novel method of semiconductor device measurements (1964) (45)
Measurement of structure in the energy distribution of slow secondary electrons from aluminum (1976) (44)
Modified contra-wound helix circuits for high-power traveling-wave tubes (1956) (38)
DIRECT MEASUREMENT OF THE DEPLETION LAYER WIDTH VARIATION VS APPLIED BIAS FOR A P‐N JUNCTION (1965) (35)
Automatic positioning of device electrodes using the scanning electron microscope (1965) (33)
Computer-controlled resist exposure in the scanning electron microscope (1972) (32)
Edge effect in high‐resolution scanning Auger‐electron microscopy (1978) (31)
Recent developments in scanning electron microscopy (1960) (29)
IDEALIZED SPATIAL EMISSION DISTRIBUTION OF SECONDARY ELECTRONS. (1972) (28)
A semiempirical stopping‐power formula for use in microprobe analysis (1978) (28)
Selective Electron‐Beam Irradiation of Metal‐Oxide‐Semiconductor Structures (1968) (26)
High resolution electron‐beam lithography on thin films (1979) (23)
Deflection—Modulation CRT display (1966) (23)
Microwave Communications (1968) (22)
Studying Neural Organization in Aplysia with the Scanning Electron Microscope (1969) (22)
ELECTRON BEAM CHANNELING IN SINGLE‐CRYSTAL SILICON BY SCANNING ELECTRON MICROSCOPY (1969) (19)
Wave propagation on multifilar helices (1956) (17)
Carrier profiles and collection efficiency in Gaussian p-n junctions under electron beam bombardment (1970) (16)
Basic Limitations in Microcircuit Fabrication Technology (1976) (14)
Study on voltage contrast in SEM (1979) (13)
Monte Carlo simulation of electron penetration through thin films of PMMA (1978) (13)
An electron beam activated switch and associated memory (1968) (11)
Point‐cathode electron sources‐Electron optics of the initial diode region: Errata and addendum (1974) (11)
Substrate thickness considerations in electron beam lithography (1980) (11)
The cytopathic effect of herpes simplex virus on HEp-2 cells as shown by scanning electron microscopy. (1974) (10)
Persistence pays off: Sir Charles Oatley and the scanning electron microscope (1996) (9)
A new conformal dry‐etch technique for submicrometer structuresa) (1981) (9)
High‐contrast registration marks for electron‐beam pattern exposure on (100) silicon (1978) (7)
2.4A Contrast Formation in the Scanning Electron Microscope (2004) (6)
Scanning Electron Microscope Investigation of Planar Diffused p‐n Junction Profiles near the Edge of a Diffusion Mask (1967) (5)
Microfabrication using a Computer-Controlled Scanning Transmission (1973) (5)
Frequency Dependence of the Diffusion Length for Excess Minority Carriers Generated with a Pulsed Electron Beam (1972) (4)
Concerning the Noise Figure of a Backward-Wave Amplifier (1955) (4)
2.4B∗ Wide-Band Detector for Micro-microampere Low-Energy Electron Currents† (2004) (3)
Advanced submicron research and technology development at the national submicron facility (1983) (2)
A novel method of nondestructive semiconductor device measurements (1963) (1)
Lateral spreads of energy dissipation profiles of 20-kV electrons in polymethylmethacrylate: Functional representation and its application to proximity effect (1981) (1)
Fundamental Limits of Lithography (1985) (1)
ELECTRON MICROPROBE DEVELOPMENTS FOR INTEGRATED CIRCUIT RESEARCH (1962) (0)
AN INVESTIGATION OF ELECTRON BEAM IRRADIATION EFFECTS ON METAL-OXIDE-SEMICONDUCTOR TRANSISTORS. PART I. (1966) (0)
Thin-Film Measurements in the Scanning Electron Microscope (1970) (0)
LIMITATIONS DUE TO ELECTRON SCATTERING IN ELECTRON BEAM LITHOGRAPHY. (1980) (0)
California Institute of Technology Annual Report 1995-96. The Everhart Decade (1997) (0)
The Inaugural Address (1988) (0)
A micron bit-size charge-storage device (1966) (0)
Cornell Continents Institute (1984) (0)
Abstract: Resumé of the U.S.-Japan Seminar on the Fundamentals of Scanning Electron Microscopy (1973) (0)
LIMITATIONS OF SPACE-TIME HARMONICS FOR MICROWAVE AMPLIFICATION (1962) (0)
ELECTRON PHYSICS OF TRAVELING WAVE TUBE DEVICES (1960) (0)
RESEARCH IN INTEGRATED CIRCUITS. (1964) (0)
Kilovolt electron energy dissipation vs. penetration distance in high atomic number materials. (1973) (0)
California Institute of Technology Annual Report 1987-88 (1988) (0)
THE BERKELEY SCANNING ELECTRON MICROSCOPE-I. (1966) (0)
Annual Report 1992-93, California Institute of Technology (1994) (0)
California Institute of Technology 1986-87 Annual Report (1985) (0)
From Microscopy to Microfabrication (1989) (0)
Conference of The American Vacuum Society Endorsed by : American Physical Society Endorsed by : Optical Society of America and Technical Co-sponsorship by : The Electron Devices Society of the Institute of Electrical and Electronic Engineers (2013) (0)
One in One Hundred: the Annual Report of Caltech's Centennial Year, 1991 (1992) (0)
California Institute of Technology 1994-95 Annual Report (1996) (0)

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