Yoshio Nishi

Q: What Schools Are Affiliated With Yoshio Nishi

Yoshio Nishi is affiliated with the following schools: University of Tokyo, Stanford University, Kyoto University

Yoshio Nishi's AcademicInfluence.com Rankings

Yoshio Nishi

Engineering

#4823

World Rank

#6044

Historical Rank

Applied Physics

#1273

World Rank

#1302

Historical Rank

Electrical Engineering

#1267

World Rank

#1357

Historical Rank

engineering Degrees

Download Badge

Engineering

Yoshio Nishi's Degrees

PhD Electrical Engineering Stanford University
Masters Electrical Engineering Stanford University
Bachelors Electrical Engineering Stanford University

Why Is Yoshio Nishi Influential?

(Suggest an Edit or Addition)

(See a Problem?)

Yoshio Nishi's Published Works

Number of citations in a given year to any of this author's works

Total number of citations to an author for the works they published in a given year. This highlights publication of the most important work(s) by the author

Published Works

Lithium ion secondary batteries; past 10 years and the future (2001) (685)
Preferential Growth of Semiconducting Single-Walled Carbon Nanotubes by a Plasma Enhanced CVD Method (2004) (475)
Handbook of Semiconductor Manufacturing Technology (2007) (437)
Ultra-high-yield growth of vertical single-walled carbon nanotubes: Hidden roles of hydrogen and oxygen. (2005) (406)
The structure and mechanical properties of sheets prepared from bacterial cellulose (1989) (378)
Olivine-type cathodes: Achievements and problems (2003) (357)
The structure and mechanical properties of sheets prepared from bacterial cellulose (1990) (340)
Achieving direct band gap in germanium through integration of Sn alloying and external strain (2013) (335)
Study of Silicon-Silicon Dioxide Structure by Electron Spin Resonance I (1971) (279)
The development of lithium ion secondary batteries. (2001) (234)
Kinetic Study of Hydrogen Evolution Reaction over Strained MoS2 with Sulfur Vacancies Using Scanning Electrochemical Microscopy. (2016) (212)
Bipolar resistive switching in polycrystalline TiO2 films (2007) (202)
Electronic correlation effects in reduced rutile TiO 2 within the LDA+U method (2010) (177)
DNA functionalization of carbon nanotubes for ultrathin atomic layer deposition of high kappa dielectrics for nanotube transistors with 60 mV/decade switching. (2006) (171)
Local Temperature Redistribution and Structural Transition During Joule‐Heating‐Driven Conductance Switching in VO2 (2013) (165)
Physical mechanisms of electron mobility enhancement in uniaxial stressed MOSFETs and impact of uniaxial stress engineering in ballistic regime (2005) (164)
Fermi level depinning in metal/Ge Schottky junction for metal source/drain Ge metal-oxide-semiconductor field-effect-transistor application (2009) (158)
Room temperature 1.6 microm electroluminescence from Ge light emitting diode on Si substrate. (2009) (156)
HfSe2 and ZrSe2: Two-dimensional semiconductors with native high-κ oxides (2017) (150)
Structural and Electrical Investigation of C60-Graphene Vertical Heterostructures. (2015) (135)
Monolithic 3D integration of logic and memory: Carbon nanotube FETs, resistive RAM, and silicon FETs (2014) (128)
High-mobility ultrathin strained Ge MOSFETs on bulk and SOI with low band-to-band tunneling leakage: experiments (2006) (124)
Multi-level control of conductive nano-filament evolution in HfO2 ReRAM by pulse-train operations. (2014) (116)
Impact of a Process Variation on Nanowire and Nanotube Device Performance (2007) (113)
Impact of Oxygen Vacancy Ordering on the Formation of a Conductive Filament in $\hbox{TiO}_{2}$ for Resistive Switching Memory (2011) (112)
Strained germanium thin film membrane on silicon substrate for optoelectronics. (2011) (108)
Physical origins of current and temperature controlled negative differential resistances in NbO2 (2017) (104)
Model of metallic filament formation and rupture in NiO for unipolar switching (2010) (104)
GeSn technology: Extending the Ge electronics roadmap (2011) (103)
Atomic Layer Deposition of Dielectrics on Ge and III–V Materials for Ultrahigh Performance Transistors (2009) (102)
Nature of germanium nanowire heteroepitaxy on silicon substrates (2006) (101)
Field-programmable rectification in rutile TiO2 crystals (2007) (99)
Experimental investigation of a PtSi source and drain field emission transistor (1995) (96)
ON-OFF switching mechanism of resistive–random–access–memories based on the formation and disruption of oxygen vacancy conducting channels (2012) (96)
Direct Observation of Localized Radial Oxygen Migration in Functioning Tantalum Oxide Memristors (2016) (94)
Monolithic 3D Integrated Circuits (2007) (92)
High Current Density and Low Thermal Conductivity of Atomically Thin Semimetallic WTe2. (2016) (90)
High-mobility low band-to-band-tunneling strained-Germanium double-gate heterostructure FETs: Simulations (2006) (90)
Measurement of bandgap energies in low-k organosilicates (2014) (86)
Conduction Channel Formation and Dissolution Due to Oxygen Thermophoresis/Diffusion in Hafnium Oxide Memristors. (2016) (84)
Electroluminescence from Strained Ge membranes and Implications for an Efficient Si-Compatible Laser (2012) (81)
Experimental study of biaxial and uniaxial strain effects on carrier mobility in bulk and ultrathin-body SOI MOSFETs (2004) (81)
Radical oxidation of germanium for interface gate dielectric GeO2 formation in metal-insulator-semiconductor gate stack (2009) (76)
First principles calculations of oxygen vacancy-ordering effects in resistance change memory materials incorporating binary transition metal oxides (2012) (75)
Sequential Electronic and Structural Transitions in VO2 Observed Using X‐ray Absorption Spectromicroscopy (2014) (73)
Contact engineering for organic semiconductor devices via Fermi level depinning at the metal-organic interface (2010) (69)
Resistive switching mechanisms in random access memory devices incorporating transition metal oxides: TiO2, NiO and Pr0.7Ca0.3MnO3 (2011) (68)
Controlling electric dipoles in nanodielectrics and its applications for enabling air-stable n-channel organic transistors. (2011) (66)
Prediction of semimetallic tetragonal Hf2O3 and Zr2O3 from first principles. (2012) (66)
Characteristics and mechanism of tunable work function gate electrodes using a bilayer metal structure on SiO/sub 2/ and HfO/sub 2/ (2005) (65)
Significance of the double-layer capacitor effect in polar rubbery dielectrics and exceptionally stable low-voltage high transconductance organic transistors (2015) (65)
Ab initio study of metal gate electrode work function (2005) (64)
Optimization of the $\hbox{Al}_{2}\hbox{O}_{3}/ \hbox{GaSb}$ Interface and a High-Mobility GaSb pMOSFET (2011) (64)
Nanoscale (∼10nm) 3D vertical ReRAM and NbO2 threshold selector with TiN electrode (2013) (64)
Measuring the capacitance of individual semiconductor nanowires for carrier mobility assessment. (2007) (63)
HfO2-Based RRAM: Electrode Effects, Ti/HfO2 Interface, Charge Injection, and Oxygen (O) Defects Diffusion Through Experiment and Ab Initio Calculations (2016) (61)
Oxygen migration during resistance switching and failure of hafnium oxide memristors (2017) (61)
Advances in Non-volatile Memory and Storage Technology (2014) (60)
Controlling uniformity of RRAM characteristics through the forming process (2012) (58)
Analytical ballistic theory of carbon nanotube transistors: Experimental validation, device physics, parameter extraction, and performance projection (2008) (58)
On the Origin of Low-Resistance State Retention Failure in HfO2-Based RRAM and Impact of Doping/Alloying (2015) (57)
Contact Engineering High Performance n-Type MoTe2 Transistors. (2019) (57)
Silicon-based photonic crystal nanocavity light emitters (2006) (55)
High-indium-content InGaAs metal-oxide-semiconductor capacitor with amorphous LaAlO3 gate dielectric (2007) (55)
Lithium-ion rechargeable cells with LiCoO2 and carbon electrodes (1993) (54)
Free Carrier Absorption in p-Type Silicon (1966) (53)
Redistribution of Diffused Boron in Silicon by Thermal Oxidation (1964) (53)
HfO2 gate dielectric on (NH4)2S passivated (100) GaAs grown by atomic layer deposition (2008) (53)
Grain boundary composition and conduction in HfO2: An ab initio study (2013) (53)
High-Performance Gate-All-Around GeOI p-MOSFETs Fabricated by Rapid Melt Growth Using Plasma Nitridation and ALD $\hbox{Al}_{2}\hbox{O}_{3}$ Gate Dielectric and Self-Aligned NiGe Contacts (2008) (51)
Electron Spin Resonance in SiO2 Grown on Silicon (1966) (50)
Resistive Switching Mechanism in $\hbox{Zn}_{x}\hbox{Cd}_{1 - x}\hbox{S}$ Nonvolatile Memory Devices (2007) (49)
Chemical Vapor-Deposited Hexagonal Boron Nitride as a Scalable Template for High-Performance Organic Field-Effect Transistors (2017) (48)
Interface trap evaluation of Pd/Al2O3/GaN metal oxide semiconductor capacitors and the influence of near-interface hydrogen (2013) (48)
Synchrotron radiation photoemission spectroscopic study of band offsets and interface self-cleaning by atomic layer deposited HfO2 on In0.53Ga0.47As and In0.52Al0.48As (2008) (48)
An Analytical Derivation of the Density of States, Effective Mass, and Carrier Density for Achiral Carbon Nanotubes (2008) (47)
Generalized mechanism of the resistance switching in binary-oxide-based resistive random-access memories (2013) (46)
Ab initio modeling of oxygen-vacancy formation in doped-HfOx RRAM: Effects of oxide phases, stoichiometry, and dopant concentrations (2015) (46)
Epitaxially grown strained pentacene thin film on graphene membrane. (2015) (45)
Direct band Ge photoluminescence near 1.6 μm coupled to Ge-on-Si microdisk resonators (2010) (43)
Ultra-thin and high-response transparent and flexible heater based on carbon nanotube film (2017) (43)
Fermi-level depinning in metal/Ge Schottky junction and its application to metal source/drain Ge NMOSFET (2008) (43)
An Integrated Phase Change Memory Cell With Ge Nanowire Diode For Cross-Point Memory (2007) (43)
Dopant selection rules for desired electronic structure and vacancy formation characteristics of TiO2 resistive memory (2013) (43)
Charge-dependent oxygen vacancy diffusion in Al2O3-based resistive-random-access-memories (2013) (43)
Film properties of MoSi2and their application to self-aligned MoSi2gate MOSFET (1980) (43)
A Combined Ab Initio and Experimental Study on the Nature of Conductive Filaments in ${\rm Pt}/{\rm Hf}{\rm O}_{2}/{\rm Pt}$ Resistive Random Access Memory (2014) (42)
Design and optimization methodology for 3D RRAM arrays (2013) (42)
Ferroelectric Switching Pathways and Energetics in (Hf,Zr)O2 (2017) (41)
High performance germanium n-MOSFET with antimony dopant activation beyond 1×1020 cm−3 (2010) (41)
Physical model of the impact of metal grain work function variability on emerging dual metal gate MOSFETs and its implication for SRAM reliability (2009) (41)
InxGa1-xSb channel p-metal-oxide-semiconductor field effect transistors: Effect of strain and heterostructure design (2011) (41)
High n-Type Antimony Dopant Activation in Germanium Using Laser Annealing for $\hbox{n}^{+}/\hbox{p}$ Junction Diode (2011) (41)
R&D Organization in Japanese and American Semiconductor Firms (1994) (41)
Development of high-k dielectric for antimonides and a sub 350°C III–V pMOSFET outperforming Germanium (2010) (40)
Low defect ultra-thin fully strained-Ge MOSFET on relaxed Si with high mobility and low band-to-band-tunneling (BTBT) (2005) (39)
Germanium In Situ Doped Epitaxial Growth on Si for High-Performance $\hbox{n}^{+}/\hbox{p}$-Junction Diode (2009) (38)
Arsenic-Dominated Chemistry in the Acid Cleaning of InGaAs and InAlAs Surfaces (2008) (38)
An Analytical Compact Circuit Model for Nanowire FET (2007) (38)
Solution-processed flexible organic transistors showing very-low subthreshold slope with a bilayer polymeric dielectric on plastic (2009) (36)
Towards high mobility GeSn channel nMOSFETs: Improved surface passivation using novel ozone oxidation method (2012) (35)
The effects of vacuum ultraviolet radiation on low-k dielectric films (2012) (35)
Optimization of the Al 2 O 3 / GaSb Interface and a High-Mobility GaSb pMOSFET (2011) (35)
Effect of oxide overlayer formation on the growth of gold catalyzed epitaxial silicon nanowires (2006) (33)
Filament-Induced Anisotropic Oxygen Vacancy Diffusion and Charge Trapping Effects in Hafnium Oxide RRAM (2016) (33)
Electrical Characteristics of Germanium $\hbox{n}^{+}/ \hbox{p}$ Junctions Obtained Using Rapid Thermal Annealing of Coimplanted P and Sb (2011) (33)
Charge Trapping in High-$k$Gate Stacks Due to the Bilayer Structure Itself (2006) (33)
Plasma damage effects on low-k porous organosilicate glass (2010) (33)
Power Optimization for SRAM and Its Scaling (2007) (32)
Time-dependent dielectric breakdown of plasma-exposed porous organosilicate glass (2012) (32)
Microscopic understanding of the low resistance state retention in HfO2 and HfAlO based RRAM (2014) (31)
Three-Dimensional Analysis of Particle Distribution on Filter Layers inside N95 Respirators by Deep Learning (2020) (31)
Cavity-enhanced direct band electroluminescence near 1550 nm from germanium microdisk resonator diode on silicon (2011) (31)
Experimental Study and Statistical Analysis of Solution-Shearing Processed Organic Transistors Based on an Asymmetric Small-Molecule Semiconductor (2009) (30)
Challenges and opportunities for future non-volatile memory technology (2011) (30)
Charge Trapping within UV and Vacuum UV Irradiated Low-k Porous Organosilicate Dielectrics (2010) (30)
Uniaxial Stress Engineering for High-Performance Ge NMOSFETs (2010) (29)
The effect of water uptake on the mechanical properties of low-k organosilicate glass (2013) (29)
Vacancy Cohesion-Isolation Phase Transition Upon Charge Injection and Removal in Binary Oxide-Based RRAM Filamentary-Type Switching (2013) (29)
Hot Forming to Improve Memory Window and Uniformity of Low-Power HfOx-Based RRAMs (2012) (29)
Plasmonic enhancement of emission from Si-nanocrystals (2008) (28)
In-operando synchronous time-multiplexed O K-edge x-ray absorption spectromicroscopy of functioning tantalum oxide memristors (2015) (28)
Effect of isochronal hydrogen annealing on surface roughness and threading dislocation density of epitaxial Ge films grown on Si (2010) (28)
High endurance performance of 1T1R HfOx based RRAM at low (<20μA) operative current and elevated (150°C) temperature (2011) (28)
GeSn channel nMOSFETs: Material potential and technological outlook (2012) (28)
Deep recombination centers in C u 2 ZnSnS e 4 revealed by screened-exchange hybrid density functional theory (2015) (27)
Temperature-dependent capacitance-voltage analysis of defects in Al2O3 gate dielectric stacks on GaN (2012) (27)
Ti-electrode effects of NiO based resistive switching memory with Ni insertion layer (2012) (27)
The development of lithium ion secondary batteries (1996) (26)
High quality single-crystal germanium-on-insulator on bulk Si substrates based on multistep lateral over-growth with hydrogen annealing (2010) (26)
An ultraclean tip-wear reduction scheme for ultrahigh density scanning probe-based data storage. (2010) (25)
High performance, uniaxially-strained, silicon and germanium, double-gate p-MOSFETs (2007) (25)
Physics in designing desirable ReRAM stack structure — Atomistic recipes based on oxygen chemical potential control and charge injection/removal (2012) (25)
Defect-induced bandgap narrowing in low-k dielectrics (2015) (25)
Engineering the metal gate electrode for controlling the threshold voltage of organic transistors (2012) (24)
Effects of ZrO2 doping on HfO2 resistive switching memory characteristics (2014) (24)
Integrating Phase-Change Memory Cell With Ge Nanowire Diode for Crosspoint Memory—Experimental Demonstration and Analysis (2008) (23)
Ultrathin (∼2nm) HfOx as the fundamental resistive switching element: Thickness scaling limit, stack engineering and 3D integration (2014) (23)
Electronic structure and stability of low symmetry Ta2O5polymorphs (2014) (23)
Transient dynamics of NbOx threshold switches explained by Poole-Frenkel based thermal feedback mechanism (2018) (23)
Effects of strain and interface on work function of a Nb-W metal gate system (2007) (23)
Dopant selection rules for extrinsic tunability of HfOx RRAM characteristics: A systematic study (2013) (23)
Spatially uniform resistance switching of low current, high endurance titanium-niobium-oxide memristors. (2017) (22)
Engineering of ferroelectric switching speed in Si doped HfO2 for high-speed 1T-FERAM application (2017) (22)
Reduction in reset current of unipolar NiO-based resistive switching through nickel interfacial layer (2010) (22)
Bilayer metal gate electrodes with tunable work function: Mechanism and proposed model (2010) (22)
The Effect of Oxygen on the Work Function of Tungsten Gate Electrodes in MOS Devices (2009) (21)
Low-Contact-Resistivity Nickel Germanide Contacts on n+Ge with Phosphorus/Antimony Co-Doping and Schottky Barrier Height Lowering (2012) (21)
p-Channel field-effect transistors based on C60 doped with molybdenum trioxide. (2013) (20)
Photonic Crystal and Plasmonic Silicon-Based Light Sources (2010) (20)
Germanium In Situ Doped Epitaxial Growth on Si for High-Performance n + / p-Junction Diode (2009) (20)
A semiclassical model of dielectric relaxation in glasses (2006) (20)
Effect of vacuum ultraviolet and ultraviolet Irradiation on capacitance-voltage characteristics of low-k-porous organosilicate dielectrics (2010) (20)
Development and characterization of high temperature stable Ta–W–Si–C amorphous metal gates (2010) (20)
Fir laser emissions from population inversion transition by TEA-CO2 laser pumping (1990) (19)
Hydrogen doping in HfO2 resistance change random access memory (2016) (19)
Limits of integrated-circuit manufacturing (2001) (19)
Effect of thermal insulation on the electrical characteristics of NbOx threshold switches (2018) (19)
Concept of polymer alloy electrolytes: towards room temperature operation of lithium–polymer batteries (2004) (19)
Low Temperature Germanium Growth on Silicon Oxide Using Boron Seed Layer and In Situ Dopant Activation (2010) (19)
Recent Progress in Resistance Change Memory (2008) (19)
Effects of plasma and vacuum-ultraviolet exposure on the mechanical properties of low-k porous organosilicate glass (2014) (19)
Investigation of the role of electrodes on the retention performance of HfOx based RRAM cells by experiments, atomistic simulations and device physical modeling (2013) (18)
Germanium Surface Cleaning with Hydrochloric Acid (2006) (18)
Invited) GeSn Channel n and p MOSFETs (2013) (18)
Fully inverted single-digit nanometer domains in ferroelectric films (2010) (18)
Electron spin resonance study of as-deposited and annealed (HfO2)x(SiO2)1−x high-κ dielectrics on Si (2007) (18)
First principles modeling of charged oxygen vacancy filaments in reduced TiO2-implications to the operation of non-volatile memory devices (2013) (18)
Photoluminescence from silicon dioxide photonic crystal cavities with embedded silicon nanocrystals (2010) (17)
Past, Present and Future of Lithium-Ion Batteries (2014) (17)
Investigation of the performance limits of III-V double-gate n-MOSFETs (2005) (17)
Effects of vacuum ultraviolet radiation on deposited and ultraviolet-cured low-k porous organosilicate glass (2011) (17)
The Dawn of Lithium-Ion Batteries (2016) (17)
Cross plane thermal conductance of graphene-metal interfaces (2014) (17)
3-D Resistive Memory Arrays: From Intrinsic Switching Behaviors to Optimization Guidelines (2015) (17)
Performance of the First Lithium Ion Battery and Its Process Technology (2007) (17)
H-treatment impact on conductive-filament formation and stability in Ta2O5-based resistive-switching memory cells (2015) (17)
Role of Hydrogen Ions in TiO2-Based Memory Devices (2011) (16)
High quality GeO2/Ge interface formed by SPA radical oxidation and uniaxial stress engineering for high performance Ge NMOSFETs (2006) (16)
A 1024-bit MNOS RAM using avalanche-tunnel injection (1975) (16)
Characterization of electronic structure of periodically strained graphene (2015) (16)
Passivation Studies of Germanium Surfaces (2007) (16)
Modeling resistive switching materials and devices across scales (2017) (16)
Effect of vacuum ultraviolet and ultraviolet irradiation on mobile charges in the bandgap of low-k-porous organosilicate dielectrics (2011) (16)
Novel Germanium n-MOSFETs With Raised Source/Drain on Selectively Grown Ge on Si for Monolithic Integration (2011) (15)
Defects in low-k organosilicate glass and their response to processing as measured with electron-spin resonance (2011) (15)
On the High-Field Transport and Uniaxial Stress Effect in Ge PFETs (2011) (15)
Ab initio study of Al-Ni bilayers on SiO2 : Implications to effective work function modulation in gate stacks (2009) (15)
Non-Destructive Measurement of Surface Concentrations and Junction Depths of Diffused Semiconductor Layers (1968) (15)
Asymmetry, Vacancy Engineering and Mechanism for Bipolar RRAM (2012) (15)
Surface charge sensing by altering the phase transition in VO2 (2014) (15)
Microsecond transient thermal behavior of HfOx-based resistive random access memory using a micro thermal stage (MTS) (2016) (14)
Theoretical Investigation Of Performance In Uniaxially- and Biaxially-Strained Si, SiGe and Ge Double-Gate p-MOSFETs (2006) (14)
Surface potential due to charge accumulation during vacuum ultraviolet exposure for high-k and low-k dielectrics (2010) (14)
HfO 2 /Ti Interface Mediated Conductive Filament Formation in RRAM: An Ab Initio Study (2018) (14)
Tuning the built-in electric field in ferroelectric Pb(Zr(0.2)Ti(0.8))O3 films for long-term stability of single-digit nanometer inverted domains. (2012) (14)
Effect of uniaxial-strain on Ge p-i-n photodiodes integrated on Si (2009) (13)
An atomic force microscope study of surface roughness of thin silicon films deposited on SiO/sub 2/ (2005) (13)
Theoretical study of the resistance switching mechanism in rutile TiO2−x for ReRAM: The role of oxygen vacancies and hydrogen impurities (2011) (13)
The effects of uniaxial and biaxial strain on the electronic structure of germanium (2016) (13)
Composite materials reinforced with polyoxymethylene whiskers (1982) (13)
Lithium Ion Secondary Batteries (1998) (13)
Identifying Ferroelectric Switching Pathways in HfO2: First Principles Calculations under Electric Fields (2017) (13)
Physical Guiding Principles for High Quality Resistive Random Access Memory Stack with Al2O3 Insertion Layer (2013) (13)
Image Charge and Dipole Combination Model for the Schottky Barrier Tuning at the Dopant Segregated Metal/Semiconductor Interface (2009) (13)
Towards high-speed, write-disturb tolerant 3D vertical RRAM arrays (2014) (13)
The nature of the defects generated from plasma exposure in pristine and ultraviolet-cured low-k organosilicate glass (2011) (12)
Effect of thermal annealing on charge exchange between oxygen interstitial defects within HfO2 and oxygen-deficient silicon centers within the SiO2/Si interface (2009) (12)
Band to Band Tunneling limited Off state Current in Ultra-thin Body Double Gate FETs with High Mobility Materials : III-V, Ge and strained Si/Ge (2006) (12)
Carbon Nanotube Quantum Capacitance for Nonlinear Terahertz Circuits (2009) (12)
(Invited) Physics and Device Technology of Silicon on Sapphire (1977) (12)
The development of lithium-ion secondary battery systems for EV and HEV (1998) (12)
Numerical simulation of vacuum-ultraviolet irradiation of dielectric layers (2010) (12)
Properties of Dopants in HfO x for Improving the Performance of Nonvolatile Memory (2017) (12)
Performance Prediction of Large-Scale 1S1R Resistive Memory Array Using Machine Learning (2015) (12)
Effects of vacuum ultraviolet and ultraviolet irradiation on ultrathin hafnium-oxide dielectric layers on "100…Si as measured with electron-spin resonance (2010) (11)
Surface Science of Catalyst Dynamics for Aligned Carbon Nanotube Synthesis on a Full-Scale Quartz Wafer (2009) (11)
Bandgap measurements of low-k porous organosilicate dielectrics using vacuum ultraviolet irradiation (2014) (11)
Copper interstitial recombination centers in Cu3N (2018) (11)
The effects of wet surface clean and in situ interlayer on In0.52Al0.48As metal-oxide-semiconductor characteristics (2010) (11)
Synthesis of TiO2 nanoframe and the prototype of a nanoframe solar cell (2010) (11)
First-principles study of carbon impurity effects in the pseudo-hexagonal Ta 2 O 5 (2016) (11)
Improved multi-level control of RRAM using pulse-train programming (2014) (11)
New Laser Emission from NH3 Optically-Pumped by TE–CO2 Laser (1982) (11)
GeSn Channel n and p MOSFETs (2012) (11)
Copper sulfide-based resistance change memory (2007) (11)
Bilayer metal gate electrodes with tunable work function: Adhesion and interface characterization (2010) (11)
Research on switching property of an oxide/copper sulfide hybrid memory (2008) (10)
Impact of electrode nature on the filament formation and variability in HfO2 RRAM (2014) (10)
Polaronic interactions between oxygen vacancies in rutile Ti O 2 (2017) (10)
Analysis of electrically biased paramagnetic defect centers in HfO2 and HfxSi1−xO2/(100)Si interfaces (2008) (10)
Analysis of the potential distribution in the channel region of a platinum silicided source/drain metal oxide semiconductor field effect transistor (1999) (10)
First-principles study of resistance switching in rutile TiO2 with oxygen vacancy (2008) (10)
Templated germanium nanowire synthesis using oriented mesoporous organosilicate thin films (2006) (10)
Changes to Charge and Defects in Dielectrics from Ion and Photon Fluences during Plasma Exposure (2011) (10)
HfO2/Ti Interface Mediated Conductive Filament Formation in RRAM: An Ab Initio Study (2018) (9)
Fabrication and characterization of CMOSFETs on porous silicon for novel device layer transfer (2005) (9)
Ab-Initio Modeling of the Resistance Switching Mechanism in RRAM Devices: Case Study of Hafnium Oxide (HfO 2 ) (2012) (9)
Study of Germanium Surface in Wet Chemical Solutions for Surface Cleaning Applications (2006) (9)
Study of Silicon-Silicon Dioxide Structure by Electron Spin Resonance II (1972) (9)
Many FIR Laser Emissions Pumped by a TEA-C02 Laser with Etalon Tuning (1987) (9)
Comparison of new technologies for VLSI: possibilities and limitations (1981) (9)
Effects of vacuum-ultraviolet irradiation on copper penetration into low-k dielectrics under bias-temperature stress (2015) (9)
Reflectance and substrate currents of dielectric layers under vacuum ultraviolet irradiation (2010) (8)
Analytical Model of Carbon Nanotube Electrostatics: Density of States, Effective Mass, Carrier Density, and Quantum Capacitance (2007) (8)
Halide Passivation of Germanium Nanowires (2006) (8)
Dielectric relaxation study of hydrogen exposure as a source of two-level systems in Al2O3 (2011) (8)
Effect of water uptake on the fracture behavior of low-k organosilicate glass (2014) (8)
Superior filament formation control in HfO2 based RRAM for high-performance low-power operation of 1 µA to 20 µA at +/− 1V (2012) (8)
Ab Initio Modeling of Schottky-Barrier Height Tuning by Yttrium at Nickel Silicide/Silicon Interface (2008) (8)
Amorphous thin film TaWSiC as a diffusion barrier for copper interconnects (2013) (8)
Role of nitrogen incorporation into Al2O3-based resistive random-access memory (2014) (8)
High performance n-MOSFETs with novel source/drain on selectively grown Ge on Si for monolithic integration (2009) (8)
Materials and Technologies for III-V MOSFETs (2010) (8)
Lithium ion secondary battery technologies, present and future (2000) (8)
Lithium-Ion Secondary Batteries with Gelled Polymer Electrolytes (2005) (7)
Hydrogen-Induced Oxygen Vacancy Bistability and Its Impact on RRAM Device Operation (2017) (7)
Film Properties of MoSi/sub 2/ and Their Application to Self-Aligned MoSi/sub 2/ Gate MOSFET (1980) (7)
Production, Property, and Application of Bacterial Cellulose. (1998) (7)
Two-Dimensional Nature of Diffused Layers and Certain Limitations in Scaling-Down Coplanar Structure (1982) (7)
The dependence of hot carrier degradation on AC stress waveforms (1988) (7)
Lithium ion rechargeable batteries (1993) (7)
Effect of the dielectric–substrate interface on charge accumulation from vacuum ultraviolet irradiation of low-k porous organosilicate dielectrics (2011) (7)
Fermi level depinning at metal-organic semiconductor interface for low-resistance Ohmic contacts (2009) (7)
Effect of vacuum-ultraviolet irradiation on the dielectric constant of low-k organosilicate dielectrics (2014) (7)
Effects of postgate dielectric treatment on germanium-based metal-oxide-semiconductor device by supercritical fluid technology. (2010) (7)
Development of High-k Dielectric for Antimonides and a sub 350 degree Celsius III-V pMOSFET Outperforming Germanium (2010) (7)
Hard HfB2 tip-coatings for ultrahigh density probe-based storage (2012) (7)
Carbonaceous Materials for Lithium Ion Secondary Battery Anodes (2000) (7)
Microscopic model for the kinetics of the reset process in HfO2 RRAM (2013) (7)
(Invited) Understanding the Switching Mechanism in RRAM Devices and the Dielectric Breakdown of Ultrathin High-k Gate Stacks from First Principles Calculations (2011) (6)
Challenge of nanoelectronic materials and devices toward new nonvolatile memories (2008) (6)
Atomically-thin HfSe2 transistors with native metal oxides (2016) (6)
Anomalous drain current in n-MOSFET's and its suppression by deep ion implantation (1978) (6)
Intrinsic limits of leakage current in self-heating-triggered threshold switches (2019) (6)
Strained-Si, Relaxed-Ge or Strained-(Si)Ge for Future Nanoscale p-MOSFETs? (2006) (6)
Research Update: Ab initio study on resistive memory device optimization trends: Dopant segregation effects and data retention in HfO2−x (2018) (6)
Invited) The Interplay between Electronic and Ionic Transport in the Resistive Switching Process of Random Access Memory Devices (2014) (6)
Damage Identification of CFRP Laminated Cantilever Beam by Using Neural Network (1997) (6)
Time-dependent dielectric breakdown measurements of porous organosilicate glass using mercury and solid metal probes (2014) (6)
Germanium on Insulator (GOI) Structure Using Hetero-Epitaxial Lateral Overgrowth on Silicon (2012) (6)
On the forming-free operation of HfOx based RRAM devices: Experiments and ab initio calculations (2013) (5)
Fluorophore-based sensor for oxygen radicals in processing plasmas (2015) (5)
New Far Infrared Laser Emissions from D2CO and H2CO Optically-Pumped by a TECO2 Laser (1984) (5)
The effects of vacuum-ultraviolet radiation on defects in low-k organosilicate glass (SiCOH) as measured with electron-spin resonance (2016) (5)
Doping technology for RRAM — Opportunities and challenges (2016) (5)
Suppression of Anomalous Drain Current in Short Channel MOSFET (1978) (5)
Possibility of hydrogen generation using supercritical water (2003) (5)
Two dimensional nature of diffused line capacitance in coplanar MOS structures (1980) (5)
Effects of ultraviolet (UV) irradiation in air and under vacuum on low-k dielectrics (2016) (5)
The Nature and Mechanism of Degradation in MNOS Read write Memory (1974) (5)
Lateral Nanoconcentrator Nanowire Multijunction Photovoltaic Cells (2009) (5)
Silicon on Sapphire technology (1976) (5)
Plasma and vacuum ultraviolet induced charging of SiO2 and HfO2 patterned structures (2012) (5)
High-field drift velocity of electrons in p-type silicon☆ (1970) (4)
Experimental demonstration of high source velocity and its enhancement by uniaxial stress in Ge PFETs (2010) (4)
(Invited) Characterizations of Direct Band Gap Photoluminescence and Electroluminescence from epi-Ge on Si (2010) (4)
Ultrafast Accelerated Retention Test Methodology for RRAM Using Micro Thermal Stage (2017) (4)
Impact of pulse rise time on programming of cross-point RRAM arrays (2014) (4)
Influence of porosity on electrical properties of low-k dielectrics irradiated with vacuum-ultraviolet radiation (2016) (4)
The shortest wavelength far-infrared laser line from CW CO2 laser pumped CH3OH and M-independent Stark splitting of laser lines (1983) (4)
Measurements of Schottky barrier at the low-k SiOC:H/Cu interface using vacuum ultraviolet photoemission spectroscopy (2015) (4)
Assignments of fir laser emissions from CH3OH optically pumped by an intra-cavity etalon tuned TEA-CO2 laser (1987) (4)
First-principles study of A-site substitution in ferroelectric bismuth titanate (2014) (4)
Effects of neutron irradiation of ultra-thin HfO2 films (2014) (4)
Measurement of the vacuum-ultraviolet absorption spectrum of low-k dielectrics using X-ray reflectivity (2018) (4)
Effects of vacuum ultraviolet irradiation on trapped charges and leakage currents of low-k organosilicate dielectrics (2015) (4)
Damage to low-k porous organosilicate glass from vacuum-ultraviolet irradiation (2011) (4)
Revolutionary Nanoelectronic Devices and Processes for Post 32nm CMOS Era (2009) (4)
Effect of Composition on Structural and Electrical Properties of Amorphous Ta-W-Si-C Metal Thin Films (2013) (4)
Power optimization of future transistors and a resulting global comparison standard (2004) (4)
P-Channel versus N-Channel in MOS-ICs of Submicron Channel Lengths (1980) (4)
An Intra. cavity-Etalon-Tuned TE-CO2 Laser and its Application to FIR Lasers (1984) (4)
A deep level in Zn-doped liquid phase epitaxial GaAs (1971) (4)
Quasi-passive and reconfigurable node for optical access network (2010) (3)
Performance and analytical modeling of Metal–Insulator-Metal Field Controlled Tunnel Transistors (2010) (3)
Carbon nanotube thermoelectric devices by direct printing: Toward wearable energy converters (2021) (3)
Epitaxial Deposition of Silicon by Pyrolysis of SiH4 (1967) (3)
Invited) Theoretical Design of Desirable Stack Structure for Resistive Random Access Memories (2013) (3)
Determination of Impurity Distribution in Silicon Epitaxial Film Using MOS Capacitor (1966) (3)
High-Performance Air-Stable Solution Processed Organic Transistors (2008) (3)
Avalanche-tunnel injection in MNOS transistor (1977) (3)
Structural and electrical characterization of CoTiN metal gates (2015) (3)
Low Dit optimized Interfacial Layer using High-Density Plasma Oxidation and Nitridation in Germanium High-κ Gate stack (2008) (3)
Erratum: Prediction of Semimetallic Tetragonal Hf 2 O 3 and Zr 2 O 3 from First Principles [Phys. Rev. Lett. 110, 065502 (2013)] (2015) (3)
Threshold Voltage and 1/f Noise Degradation in Carbon Nanotube Field Effect Transistors under Hot-Carrier Stress (2008) (3)
Nonthermal combined ultraviolet and vacuum-ultraviolet curing process for organosilicate dielectrics (2016) (3)
Theory and Experiments of the Impact of Work-Function Variability on Threshold Voltage Variability in MOS Devices (2012) (3)
First-principles investigation of the conductive filament configuration in rutile TiO 2-x ReRAM (2012) (3)
Design and materials selection for low power laterally actuating nanoelectromechanical relays (2012) (3)
HfO 2 gate dielectric on ( NH 4 ) 2 S passivated ( 100 ) GaAs grown by atomic layer deposition (2007) (3)
High Performance, Ultra-thin, Strained-Ge, Heterostructure FETs With High Mobility And Low Leakage (2006) (3)
Direct observation of the differences between Raman scatering and population inversion transition for their emission frequencies and pulse waveforms (1987) (3)
Improving the High Resistance State Retention Degradation of Al-Doped HfOx Based on Ab Initio Simulations (2017) (3)
New constraint for Vth optimization for sub 32nm node CMOS gates scaling (2005) (3)
A novel Bi-stable 1-transistor SRAM for high density embedded applications (2015) (3)
A 256 bit Nonvolatile Static Random Access Memory with MNOS Memory Transistors (1975) (3)
Two-dimensional porous silicon photonic crystal light emitters (2005) (3)
First principles guiding principles for the switching process in oxide ReRAM (2012) (3)
Analysis of Fatigue Behavior of High-density Polyethylene Based on Dynamic Viscoelastic and Small Angle Light Scattering Measurements during the Fatigue Process (1991) (2)
Physics in Charge Injection Induced On-Off Switching Mechanism of Oxide-Based Resistive Random Access Memory (ReRAM) and Superlattice GeTe/Sb2Te3 Phase Change Memory (PCM) (2013) (2)
Memristors: Direct Observation of Localized Radial Oxygen Migration in Functioning Tantalum Oxide Memristors (Adv. Mater. 14/2016) (2016) (2)
Electro-Thermally Coupled Power Optimization for Future Transistors and Its Applications (2007) (2)
Publisher's Note: “Defect-induced bandgap narrowing in low-k dielectrics” [Appl. Phys. Lett. 107, 082903 (2015)] (2015) (2)
Transmission of oxygen radicals through free-standing single-layer and multilayer silicon-nitride and silicon-dioxide films (2017) (2)
Modeling of resistive random access memory (RRAM) switching mechanisms and memory structures (2014) (2)
The effects of plasma exposure on low-k dielectric materials (2012) (2)
Tunable te-CO2 laser-pumped formaldehyde far-infrared lasers: Offsets, assignment, and superfluorescence (1985) (2)
Preparation of High-Strength Materials from Bacterial Cellulose (1991) (2)
Effect of thermal annealing on charge exchange between oxygen interstitial defects within HfO 2 and oxygen-deficient silicon centers within the SiO 2 / Si interface (2009) (2)
Extrinsic time-dependent dielectric breakdown of low-k organosilicate thin films from vacuum-ultraviolet irradiation (2017) (2)
Electric field dependent switching and degradation of Resistance Random Access Memory (2009) (2)
Amorphorized tantalum-nickel binary films for metal gate applications (2015) (2)
Multi-scale modeling of oxygen vacancies assisted charge transport in sub-stoichiometric TiOx for RRAM application (2014) (2)
Ultra shallow junctions with high dopant activation and GeO2 interfacial layer for gate dielectric in germanium MOSFETs (2010) (2)
Impact of hydrogen on the electroforming of Pr0.7Ca0.3MnO3 resistance-change memory devices (2009) (2)
Effect of Residual Stress on Hole Mobility of SOS MOS Devices (1978) (2)
Review on simulation of filamentary switching in binary metal oxide based RRAM devices (2014) (2)
Evaluating Strained/Relaxed-Ge, Strained-Si, Strained-SiGe For Future Nanoscale p-MOSFETs (2006) (2)
Electronic structures of Nb–W bulk and surface from first principles calculation (2008) (2)
Lattice and electronic effects in rutile TiO 2 containing charged oxygen defects from ab initio calculations (2009) (2)
Silicon faces the future (1995) (2)
The electronic structure of an S-pair in barrier-less metal/silicon junctions (2013) (2)
Charging response of back-end-of-the-line barrier dielectrics to VUV radiation (2012) (2)
Doping Trends in HfOx RRAM (2017) (2)
Formation of epitaxial Hf digermanide/Ge(001) contact and its crystalline properties (2018) (2)
A novel mode of write operation utilizing avalanche-tunnel injection in MNOS memory transistor (1972) (2)
1 K-bit nonvolatile semiconductor read/write RAM (1978) (2)
Semiconductor Interfaces and Their Implications to VLSI Device Reliability (1994) (2)
Process Integration and Electrical Properties of Bilayer Metal Gate/High-k MOSFETs (2007) (1)
A Bi-stable 1- /2-Transistor SRAM in 14 nm FinFET Technology for High Density / High Performance Embedded Applications (2018) (1)
Kinetics of Frenkel Defect Formation in TiO2 from First Principles (2013) (1)
Geoelectric Monitoring Studies for the Carbon Dioxide Geological Storage (2008) (1)
Carbonaceous Materials as an Anode of Secondary Batteries. (1995) (1)
Formation of epitaxial Hf germanide/Ge contacts for Schottky barrier height engineering (2017) (1)
Developing the electronics industry : a World Bank symposium (1993) (1)
IC technology R&D for the next century (1999) (1)
A Circuit Compatible Analytical Device Model for Nanowire FET Considering Ballistic and Drift-Diffusion Transport (2007) (1)
Invited) Mechanism Study of Reversible Resistivity Change in Oxide Thin Film (2015) (1)
The present and the future of nanoelectronics (2004) (1)
Increased photoluminescence from single-mode microwave annealing of N-type Ge-on-Si (2016) (1)
A semiconductor nanobridge biosensor for electrical detection of DNA hybridization (2008) (1)
Invited) Dielectric Damage (2014) (1)
A double-diffused MNOS transistor as a new non-volatile memory (1973) (1)
Thermal limitations of two-dimensional semi-metallic WTe2 devices (2016) (1)
Bidirectional Analog Conductance Modulation for RRAM-Based Neural Networks (2020) (1)
Measuring the volume charge in dielectric films using single frequency electro-acoustic waves (2014) (1)
Optimization of Light Emission from Silicon Nanocrystals Grown by PECVD (2010) (1)
ULSI technology toward the next century: driven by DRAMs or MPUs? (1992) (1)
The Simulation of a Gunn Diode with Temperature Effects (1972) (1)
Effect of IrO2 Spatial Distribution on the Stability and Charge Distribution of Ti1–xIrxO2 Alloys (2019) (1)
Resistive Switching in Transition Metal Oxide ReRAM Devices (2012) (1)
Contact Engineering of Trilayer Black Phosphorus With Scandium and Gold (2019) (1)
(Invited) Investigation of Frenkel-Pair Formation in HfO 2 and Its Influence on OxRAM Memory Reliability (2014) (1)
WTe2 as a two-dimensional (2D) metallic contact for 2D semiconductors (2016) (1)
An internally amplified signal SOI nano-bridge biosensor for electrical detection of DNA hybridization (2009) (1)
Technology and modeling for MOS IC/VLSI'S - state of the art - (1985) (1)
Germanium on insulator (GOI) structure locally grown on silicon using hetero epitaxial lateral overgrowth (2013) (1)
Ab initio modeling of resistive switching mechanism in binary metal oxides (2014) (1)
Surface photoconductivity of organosilicate glass dielectrics induced by vacuum-ultraviolet radiation (2013) (1)
Invited: Nonvolatile Semiconductor Memory (1977) (1)
Design and Optimization Methodology for 3 D RRAM Arrays (2013) (1)
Changes in Geophysical Observables Caused by Carbon Dioxide Injection Into Saline Aquifers (2008) (1)
Repeated Resistivity and GPR Surveys for the Monitoring of Water Content and Temperature in the Unsaturated Zone (2007) (1)
\emph{Ab initio} Calculations for Hydrogen-Doped HfO$_{2-x}$ RRAM (2014) (0)
MOSFETs and TFETs (2010) (0)
Non-Destructive Measurement of Surface Concentrations and Junction Depths of Diffused Semiconductor Layers (1970) (0)
Physics of ON-OFF Switching Mechanism of ReRAM via Oxygen Vacancy Based Conducting Channels (2013) (0)
Cmos scaling and nanoelectronics new materials and processes (2005) (0)
Integration Challenges and Opportunities of Nanoelectronic Devices (2009) (0)
Field-induced rectification in rutile single crystals. (2007) (0)
Modeling the Resistive Switching Process in Transition Metal Oxide Based Non-Volatile Memory Devices (2013) (0)
First-Principles Investigations of the Metal Doping Effects in TiO2 ReRAM (2012) (0)
Physical origins of current and temperature controlled negative differential resistances in NbO2 (2017) (0)
Plasmonic metal-insulator-metal structures for interaction with silicon nanocrystals (2009) (0)
Analysis of fatigue behavior of high‐density polyethylene based on dynamic viscoelastic and small angle light scattering measurements during the fatigue process (abstract) (1992) (0)
Session 16 Device technology — Insulator technology (1981) (0)
Oxygen vacancy mediated dielectric breakdown in ultrathin high-k gate dielectric stacks (2011) (0)
Standards Commonly Used in Semiconductor Manufacturing (2007) (0)
United States Patent ( 19 ) Iguchi et al . ( 54 ) BACTERIAL CELLULOSE-CONTAINING MOLDING (2017) (0)
Highly-strained Germanium as a gain medium for silicon-compatible lasers (2012) (0)
Carbon material and a nonaqueous, this material used electrochemical cell. (1990) (0)
Pulse-train measurement techniques: An RRAM test vehicle for in-depth physical understanding (2014) (0)
A New Non-Volatile Read Write Random Access Memory Operation by Means of Avalanche-Tunnel Injection in MNOS Transistor (1972) (0)
A CMOS-compatible boosted transistor having >2× drive current and low leakage current (2016) (0)
Secondary battery organic electrolyte. (1989) (0)
CMOS Scaling Limit and Nanoelectronics: New materials and processes beyond silicon (2006) (0)
Physical Guiding Principles for High Quality ReRAM Stack with Al2O3 O Vacancy Barrier Layer (2012) (0)
Technology roadmap and beyond (2003) (0)
Physical origins of ON-OFF switching in ReRAM via VO based conducting channels (2013) (0)
The effects of VUV radiation on low-k organosilicate glass (SiCOH) as measured with electron-spin resonance (2015) (0)
Analysis of Structure and Orientation of Vertical Germanium Single Crystal Nanowires on Silicon Substrates (2005) (0)
Direct band Ge photoluminescence at 1.6 μm coupled to Ge-on-Si microdisk resonators (2011) (0)
Separation of ion and photon damage effects on novel dielectric materials during plasma exposure (2011) (0)
Nanoelectronic materials and devices as new opportunity (2006) (0)
Quantum Capacitance Spectroscopy of Single Nanotube Molecules (2007) (0)
CMOS Scaling andon-Silicon Opportunities (2006) (0)
A 256bit Nonvolatile Static Random Access Memory with MNOS Memory Transistors : A-5: FIELD EFFECT TRANSISTORS (II) (1976) (0)
Plasmonic gratings for interaction with quantum emitters (2008) (0)
Edge-defined 90nm TFTs with adjustable V/sub T/ in a 3-D compatible process (2005) (0)
Characterizations of Direct Band Gap PL and EL from epi-Ge on Si (2010) (0)
Estimation of Bending Strength of CFRP Cross-Ply Laminates from Damping Capacity Using by Neural Network (1997) (0)
Theoretical investigation and analytical modelling of Metal Insulator Metal gate controlled tunnelling Transistor (2008) (0)
Effects of plasma exposure on defects in novel dielectric materials (2011) (0)
Ge on Insulator (GOI) Structure Using Ge Lateral Overgrowth (2012) (0)
Analytical ModelofCarbonNanotube Electrostatics: Density ofStates, Effective Mass, Carrier Density, andQuantumCapacitance (2007) (0)
Photoluminescence decay dynamics of silicon-rich silicon nitride film in photonic crystal nanocavity (2007) (0)
Technology Trends And Opportunities For Giga-scale Integration (1997) (0)
Synchrotron Radiation Photoemission Spectroscopic Study of Band Offsets and Interfacial Self-cleaning Mechanism in Atomic Layer Deposited HfO 2 on InGaAs and InAlAs (2008) (0)
First-principles modeling of the electron and ion transport in TiO$_{2}$ ReRAM (2013) (0)
Carbon Nanotube Transistors with 60mV/decade Switching and its Capacitance Measurement (2007) (0)
Effects of Ultraviolet Exposure on the current-voltage characteristics of high-k dielectric layers (2010) (0)
Impact of scaling and the scaling development environment (2007) (0)
NH4)2Sでパッシベートした(100)GaAs上に原子層堆積で成長させたHfO2ゲート絶縁体 (2008) (0)
BandtoBandTunneling limited Offstate Current inUltra-thin BodyDoubleGate FETswithHighMobility Materials :III-V, Geandstrained Si/Ge (2006) (0)
Based molding composition of bacterially produced cellulose. (1986) (0)
Experimental verification of physical models for defect states in crystalline and amorphous ultrathin dielectric films (2011) (0)
Quantum Capacitance Measurement for SWNT FET with Thin ALD High-k Dielectric (2007) (0)
Bandgap narrowing in low-k dielectrics (2015) (0)
Source/Drain Technology for Nanoscale MIS Field Effect Devices (2007) (0)
Scattering of Surface States at Steps Investigated with Curved Crystals (2010) (0)
On the Distribution of Impurities in Epitaxial Silicon Films (1964) (0)
Computational study toward micro electronics engineering (2012) (0)
Session 9 Device technology — MOS device isolation (1982) (0)
Study of the inversion layer mobility and the improvement in g m of MOS-FET (1968) (0)
Electro-Thermally Coupled Power Optimization for Future Transistors (2007) (0)
Monolithic 3DIntegrated Circuits (2007) (0)
First-Principles Study of Oxygen Vacancy and Hydrogen Impurity Effects in the Pseudo-Hexagonal Ta2O5 (2013) (0)
Two color oscillations of TE-CO2 laser and applications to two photon process of optically pumped FIR laser (1988) (0)
Formation of Donor Center in Silicon by Hot Proton Irradiation (1971) (0)
CMOS state of the arts and future potential (2006) (0)
Ultra high performance insulator channel transistor (2008) (0)
Cutting or stamping process of polyethylene with a high modulus of elasticity. (1988) (0)
Capacitance Measurement for FETs of Individual SWNTs with Altra-Thin ALD High-k Dielectric (2007) (0)
Protonic motion in Pr$_{0.7}$Ca$_{0.3}$MnO$_{3}$ thin films and its implications on resistance change properties (2011) (0)
Reactivity Improvement of Magnesium with Hydrogen by Carbon Nano-Material Mixing (2010) (0)
Investigation of the impact of hydrogen on the forming behavior of Pr$_{0.7}$Ca$_{0.3}$MnO$_{3}$ RF-sputtered thin films exhibiting Electric Pulse Induced Resistance change (2010) (0)
Ab initio Study of Metal Interfaces with HfO$_{2}$ and SiO$_{2}$: Work Function Modulation (2007) (0)
Ab initio Calculations for Hydrogen-Doped HfO2 -x RRAM (2014) (0)
Characterization of Nanostructured Materials” (2010) (0)
Study of the inversion layer mobility and the improvement in g m of MOSFET (1969) (0)
First-Principles Investigations of the Metal Doping Effects in TiO 2 ReRAM (2012) (0)
Incorporation of supply voltage and process variations in the power optimization for future transistors (2005) (0)
New universal physical model for the recoverable part of NBTI degradation (2009) (0)
Redistribution of Diffused Boron in Silicon by Thermal Oxidation (1964) (0)
Demonstration of Electroluminescence from Strained Ge Membrane LED (2012) (0)
SURFACE PASSIVATION AND JUNCTION ENGINEERING IN SILICON / GERMANIUM METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT- TRANSISTORS FOR HIGH PERFORMANCE APPLICATION A DISSERTATION SUBMITTED TO THE DEPARTMENT OF ELECTRICAL ENGINEERING AND THE COMMITTEE ON GRADUATE STUDIES OF STANFORD UNIVERSITY IN PARTIAL FULFIL (2011) (0)
A stability improvement of current gain in silicon planar transistors (1969) (0)
The effect of vacuum ultraviolet irradiation on the time-dependent dielectric breakdown of organosilicate dielectrics (2016) (0)
Ab initio modeling of interfacial oxygen defects in ultrathin high-k gate dielectric stacks (2009) (0)
Material for the anode and process for their preparation (1993) (0)
Quasi passive optical switch based on transition metal oxide device (2011) (0)
CMOS scaling and non-silicon opportunities (2006) (0)
Thin electronic card with IC chip and battery and process for their preparation. (1989) (0)
Silicon Nanocavity Based Light Sources (2011) (0)
Very High Performance, Ultrathin, Strained-Ge Channel, Heterostructure FETs with High Mobility and Low BTBT Leakage (2006) (0)
Understanding of switching phenomena in unipolar NiO-based RRAM (2010) (0)
Enhanced Impurity Redistribution for Silicided Source/Drain (1984) (0)
Impact ofhydrogen on the electrofonning of Pro.7Cao.3Mn03 resistance-change memory devices (2009) (0)
Graphene Template for Epitaxial Growth of Pentacene and C$_{60}$ Thin Film (2015) (0)
Silicon-Based IC Technology for Giga-Scale Integration Era (1997) (0)
A method of measuring the layer thickness of which is designed for a high resistivity layer of a Halbleiterplaettchens (1968) (0)
High Performance, Strained-Ge, Heterostructure p-MOSFETs (2007) (0)
A method and apparatus for purifying hydrogen sulphide gas (1974) (0)

This paper list is powered by the following services:

What Schools Are Affiliated With Yoshio Nishi?

Yoshio Nishi is affiliated with the following schools:

Yoshio Nishi's Academic­Influence.com Rankings

Yoshio Nishi's Degrees

Why Is Yoshio Nishi Influential?

Yoshio Nishi's Published Works

Published Works

What Schools Are Affiliated With Yoshio Nishi?

Yoshio Nishi's AcademicInfluence.com Rankings